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1. Mashrafi, Sheikh. X-ray microscope performance enhancement through control architecture change.
Degree: MS, 0133, 2014, University of Illinois – Urbana-Champaign
URL: http://hdl.handle.net/2142/46671
Subjects/Keywords: control; Control Architecture; Advanced Photon Source (APS); Argonne National Laboratory (ANL); control algorithms; nanopositioning; nanopositioning devices; Early User Instrument (EUI); X-ray; optics; robust stability; bandwidth; resolution; disturbance rejection; noise attenuation; scanning probe microscope (SPM); closed-loop properties; Proportional Integral Derivative (PID); Glover-McFarlane h-infinity algorithm; 1DOF h-infinity controller; h-infinity; Glover-McFarlane controller; Keith Glover; Duncan McFarlane; controller; controller implementation; National Instruments (NI); CompactRIO; real-time controller; Field-Programmable Gate Array (FPGA); LabVIEW; biquads structures; closed-loop bandwidth; U.S. Department of Energy (DOE); Office of Science; DE-AC02-06CH11357; DE-SC0004283; Cross Power Spectral Density (CPSD); Power Spectral Density (PSD); Degree Of Freedom (DOF); Discrete-Time Fourier Transform (DTFT); Hardware Description language (HDL); High-Level Synthesis (HLS); Hard X-ray Nanoprobe (HXN); In Situ Nanoprobe (ISN); Laser Doppler Displacement Meter (LDDM); Physik Instrumente (PI); Reconfigurable Input/Output (RIO); Advanced Photon Source (APS) beamline; full-field imaging microscopy; fluorescence mapping; nanodiffraction; transmission imaging; reliability and repeatability of positioning systems; modeling uncertainties; insensitive modeling uncertainties; quantifying trade-offs; trade-offs; design flexibility; design methodology; feedforward; feedback; performance objectives; robustness; Advanced Photon Source (APS) user; beamline scientist; imaging resolution and bandwidth; imaging resolution; nanoprobe; model fitting; curve fitting; model reduction; feedback controllers; X-ray nanoprobe instrument; third-generation synchrotron radiation source; zone plate optics; zone plate; flexure stages; piezoelectric actuators stacks; flexure; Piezoelectric; high-stiffness stages; high-resolution weak-link stages; piezoelectric-transducer; sub-nanometer resolution; subnanometer; optical heterodyning; heterodyning; Optodyne; frequency-shifted laser beam; PID controller; digital to analog converter (DAC); analog input modules; digital input modules; analog output modules; cRIO-9118; Virtex-5; Virtex-5 LX110 FPGA chassis; NI-9223; NI-9402; NI-9263; System Identification; Identification; black-box identification; parametric model; non-parametric model; welch; pwelch; tfestimate; invfreqs; time domain data; band-limited uniform Gaussian white noise; band-limited; white noise; resonant peak; Balance Realization; minimal realization; controllability; observability; Experimental Frequency response; transfer function; Hankel singular values; Hankel norm; balanced truncation; noise histogram; Open Loop Resolution; closed Loop Resolution; Simulink simulation; LabVIEW simulation; discrete controller; continuous controllers; discrete; Tustin; tustins method; discretization; complementary sensitivity transfer function; sensitivity transfer function; robust stabilization; coprime factorization; Bezout identity; Bezout; stability margin; algebraic Riccati equation; Riccati equation; sub-optimal; suboptimal; sub-optimal controller; optimal controller; mixed-sensitivity optimization; sensitivity optimization; generalized framework; generalized controller framework; stabilizing controller; closed-loop objectives; generalized plant; nominal plant; linear fractional transformation; weighting transfer functions; weighted sensitivity; hinfsyn; bode integral law; waterbed effect; second waterbed formula; Skogestad; Poslethwaite; sensitivity weighting; sensitivity weighting transfer function; nanopositioner; nanopositioning device; nanopositioning system; second order sections; ASPE 28th Annual Meeting; American Society for Precision Engineering (ASPE); Synchrotron Radiation Instrumentation; Synchrotron; Nanoprobe Instrument
…estimated PSD for each segmented data, and then averages this PSD estimates. The pwelch function…
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APA (6th Edition):
Mashrafi, S. (2014). X-ray microscope performance enhancement through control architecture change. (Thesis). University of Illinois – Urbana-Champaign. Retrieved from http://hdl.handle.net/2142/46671
Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation
Chicago Manual of Style (16th Edition):
Mashrafi, Sheikh. “X-ray microscope performance enhancement through control architecture change.” 2014. Thesis, University of Illinois – Urbana-Champaign. Accessed December 07, 2019. http://hdl.handle.net/2142/46671.
Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation
MLA Handbook (7th Edition):
Mashrafi, Sheikh. “X-ray microscope performance enhancement through control architecture change.” 2014. Web. 07 Dec 2019.
Vancouver:
Mashrafi S. X-ray microscope performance enhancement through control architecture change. [Internet] [Thesis]. University of Illinois – Urbana-Champaign; 2014. [cited 2019 Dec 07]. Available from: http://hdl.handle.net/2142/46671.
Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation
Council of Science Editors:
Mashrafi S. X-ray microscope performance enhancement through control architecture change. [Thesis]. University of Illinois – Urbana-Champaign; 2014. Available from: http://hdl.handle.net/2142/46671
Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation