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You searched for subject:(multiple cell upset). Showing records 1 – 3 of 3 total matches.

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1. Tipton, Alan Douglas. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.

Degree: PhD, Electrical Engineering, 2008, Vanderbilt University

Soft errors in integrated circuits (ICs) are a critical problem facing state-of-the-art technologies. In both the terrestrial and space environment, the source of soft errors is charged particle interaction with ICs. This work examines the effects of multiple soft errors from a single particle interaction. In memory devices, clusters of physically adjacent soft errors are referred to as multiple cell upsets (MCUs). In this work, the impact of device orientation on the MCU response from accelerated heavy ion and neutron testing is analyzed. The size, shape, and probability of MCU are shown to depend on orientation for both particle types. The worst case MCU events occur at large angles of incidence. Additionally, heavy ions also exhibit a strong dependence on the ion's trajectory with respect to the SRAM layout for the size and shape of MCU events. Advisors/Committee Members: Robert A. Weller (committee member), Kalman Varga (committee member), Robert A. Reed (committee member), Lloyd W. Massengill (committee member), Ronald D. Schrimpf (chair).

Subjects/Keywords: SRAM; radiation effects; multiple cell upset; multiple bit upset; Heavy ions; Integrated circuits  – Effect of radiation on; softer errors; Neutrons; Radiation hardening

…39 14. The multiplecell upset cross section, σMCU , is plotted for both device… …densities places sensitive nodes closer together. 3 The Multiple Cell Upset When a charged… …called the critical charge, QCrit , of the circuit. The Multiple Cell Upset In this section… …20 CHAPTER III MULTIPLE CELL UPSET ANALYSIS In this chapter the methods used in this… …bits in the device under test unless stated otherwise. Multiple Cell Upset The SEUs in an… 

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tipton, A. D. (2008). On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;

Chicago Manual of Style (16th Edition):

Tipton, Alan Douglas. “On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.” 2008. Doctoral Dissertation, Vanderbilt University. Accessed November 14, 2019. http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;.

MLA Handbook (7th Edition):

Tipton, Alan Douglas. “On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.” 2008. Web. 14 Nov 2019.

Vancouver:

Tipton AD. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. [Internet] [Doctoral dissertation]. Vanderbilt University; 2008. [cited 2019 Nov 14]. Available from: http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;.

Council of Science Editors:

Tipton AD. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. [Doctoral Dissertation]. Vanderbilt University; 2008. Available from: http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;


Kyoto University / 京都大学

2. 古田, 潤. 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案.

Degree: 博士(情報学), 2014, Kyoto University / 京都大学

新制・課程博士

甲第18411号

情博第526号

Subjects/Keywords: ソフトエラー; 中性子; 冗長化フリップフロップ; Multiple Cell Upset (MCU); 寄生バイポーラ効果

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

古田, . (2014). 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案. (Thesis). Kyoto University / 京都大学. Retrieved from http://hdl.handle.net/2433/188870 ; http://dx.doi.org/10.14989/doctor.k18411

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

古田, 潤. “集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案.” 2014. Thesis, Kyoto University / 京都大学. Accessed November 14, 2019. http://hdl.handle.net/2433/188870 ; http://dx.doi.org/10.14989/doctor.k18411.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

古田, 潤. “集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案.” 2014. Web. 14 Nov 2019.

Vancouver:

古田 . 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案. [Internet] [Thesis]. Kyoto University / 京都大学; 2014. [cited 2019 Nov 14]. Available from: http://hdl.handle.net/2433/188870 ; http://dx.doi.org/10.14989/doctor.k18411.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

古田 . 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案. [Thesis]. Kyoto University / 京都大学; 2014. Available from: http://hdl.handle.net/2433/188870 ; http://dx.doi.org/10.14989/doctor.k18411

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Kyoto University

3. 古田, 潤. 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案 .

Degree: 2014, Kyoto University

Subjects/Keywords: ソフトエラー; 中性子; 冗長化フリップフロップ; Multiple Cell Upset (MCU); 寄生バイポーラ効果

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

古田, . (2014). 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案 . (Thesis). Kyoto University. Retrieved from http://hdl.handle.net/2433/188870

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

古田, 潤. “集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案 .” 2014. Thesis, Kyoto University. Accessed November 14, 2019. http://hdl.handle.net/2433/188870.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

古田, 潤. “集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案 .” 2014. Web. 14 Nov 2019.

Vancouver:

古田 . 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案 . [Internet] [Thesis]. Kyoto University; 2014. [cited 2019 Nov 14]. Available from: http://hdl.handle.net/2433/188870.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

古田 . 集積回路におけるシングルイベント効果の評価とソフトエラー耐性向上手法の提案 . [Thesis]. Kyoto University; 2014. Available from: http://hdl.handle.net/2433/188870

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

.