Advanced search options

Advanced Search Options 🞨

Browse by author name (“Author name starts with…”).

Find ETDs with:

in
/  
in
/  
in
/  
in

Written in Published in Earliest date Latest date

Sorted by

Results per page:

Sorted by: relevance · author · university · dateNew search

You searched for subject:(multiple bit upset). Showing records 1 – 2 of 2 total matches.

Search Limiters

Last 2 Years | English Only

No search limiters apply to these results.

▼ Search Limiters

1. Jiménez Olazábal, Andrés. Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture.

Degree: 2018, Universidad Carlos III de Madrid

Subjects/Keywords: Fault-tolerant systems; Error-Detection and Correction; EDAC; Single event upset; SEU; Multiple bit upset; MBU; Hardwired seed bits; HSB; Aeronautical Industry; Aeronáutica; Electrónica

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Jiménez Olazábal, A. (2018). Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture. (Thesis). Universidad Carlos III de Madrid. Retrieved from http://hdl.handle.net/10016/27401

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Jiménez Olazábal, Andrés. “Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture.” 2018. Thesis, Universidad Carlos III de Madrid. Accessed November 11, 2019. http://hdl.handle.net/10016/27401.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Jiménez Olazábal, Andrés. “Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture.” 2018. Web. 11 Nov 2019.

Vancouver:

Jiménez Olazábal A. Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture. [Internet] [Thesis]. Universidad Carlos III de Madrid; 2018. [cited 2019 Nov 11]. Available from: http://hdl.handle.net/10016/27401.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Jiménez Olazábal A. Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture. [Thesis]. Universidad Carlos III de Madrid; 2018. Available from: http://hdl.handle.net/10016/27401

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

2. Tipton, Alan Douglas. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.

Degree: PhD, Electrical Engineering, 2008, Vanderbilt University

Soft errors in integrated circuits (ICs) are a critical problem facing state-of-the-art technologies. In both the terrestrial and space environment, the source of soft errors is charged particle interaction with ICs. This work examines the effects of multiple soft errors from a single particle interaction. In memory devices, clusters of physically adjacent soft errors are referred to as multiple cell upsets (MCUs). In this work, the impact of device orientation on the MCU response from accelerated heavy ion and neutron testing is analyzed. The size, shape, and probability of MCU are shown to depend on orientation for both particle types. The worst case MCU events occur at large angles of incidence. Additionally, heavy ions also exhibit a strong dependence on the ion's trajectory with respect to the SRAM layout for the size and shape of MCU events. Advisors/Committee Members: Robert A. Weller (committee member), Kalman Varga (committee member), Robert A. Reed (committee member), Lloyd W. Massengill (committee member), Ronald D. Schrimpf (chair).

Subjects/Keywords: SRAM; radiation effects; multiple cell upset; multiple bit upset; Heavy ions; Integrated circuits  – Effect of radiation on; softer errors; Neutrons; Radiation hardening

…and MCU effects are termed single-bit upset (SBU) and multiple-bit upset (MBU… …x28;c) is a 4-bit event. (d) A 3 × 2 3-bit upset is illustrated… …39 14. The multiple–cell upset cross section, σMCU , is plotted for both device… …densities places sensitive nodes closer together. 3 The Multiple Cell Upset When a charged… …Electron Devices Engineering Council) standard where the bit upset nomenclature is reserved… 

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tipton, A. D. (2008). On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;

Chicago Manual of Style (16th Edition):

Tipton, Alan Douglas. “On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.” 2008. Doctoral Dissertation, Vanderbilt University. Accessed November 11, 2019. http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;.

MLA Handbook (7th Edition):

Tipton, Alan Douglas. “On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.” 2008. Web. 11 Nov 2019.

Vancouver:

Tipton AD. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. [Internet] [Doctoral dissertation]. Vanderbilt University; 2008. [cited 2019 Nov 11]. Available from: http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;.

Council of Science Editors:

Tipton AD. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. [Doctoral Dissertation]. Vanderbilt University; 2008. Available from: http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;

.