subject:(depth resolved)

Universiteit Utrecht

1. Vellinga, A.J. Morphodynamics of bedforms in a supercritical-flow regime: a depth-resolved numerical modelling approach.

Degree: 2014, Universiteit Utrecht

URL: http://dspace.library.uu.nl:8080/handle/1874/301315

► Both open-channel flows and density currents are able to create supercritical-flow bedforms. The morphodynamics of these supercritical-flow bedforms are, however, still poorly understood. This is… (more)

Subjects/Keywords: morphodynamic; supercritical; flow; bedform; bedforms; cyclic step; cyclic steps; RANS; depth-resolved; numerical; model

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APA (6^th Edition):

Vellinga, A. J. (2014). Morphodynamics of bedforms in a supercritical-flow regime: a depth-resolved numerical modelling approach. (Masters Thesis). Universiteit Utrecht. Retrieved from http://dspace.library.uu.nl:8080/handle/1874/301315

Chicago Manual of Style (16^th Edition):

Vellinga, A J. “Morphodynamics of bedforms in a supercritical-flow regime: a depth-resolved numerical modelling approach.” 2014. Masters Thesis, Universiteit Utrecht. Accessed January 27, 2021. http://dspace.library.uu.nl:8080/handle/1874/301315.

MLA Handbook (7^th Edition):

Vellinga, A J. “Morphodynamics of bedforms in a supercritical-flow regime: a depth-resolved numerical modelling approach.” 2014. Web. 27 Jan 2021.

Vancouver:

Vellinga AJ. Morphodynamics of bedforms in a supercritical-flow regime: a depth-resolved numerical modelling approach. [Internet] [Masters thesis]. Universiteit Utrecht; 2014. [cited 2021 Jan 27]. Available from: http://dspace.library.uu.nl:8080/handle/1874/301315.

Council of Science Editors:

Vellinga AJ. Morphodynamics of bedforms in a supercritical-flow regime: a depth-resolved numerical modelling approach. [Masters Thesis]. Universiteit Utrecht; 2014. Available from: http://dspace.library.uu.nl:8080/handle/1874/301315

Loughborough University

2. Fu, Jiawei. Identification of corneal mechanical properties using optical tomography and digital volume correlation.

Degree: PhD, 2014, Loughborough University

URL: http://hdl.handle.net/2134/14894

► This work presents an effective methodology for measuring the depth-resolved 3D full-field deformation of semitransparent, light scattering soft tissues such as vertebrate eye cornea. This… (more)

Subjects/Keywords: 616.07; Soft tissue; Depth-resolved strain; Optical coherence tomography; Constitutive parameters identification; Deformation measurement

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APA (6^th Edition):

Fu, J. (2014). Identification of corneal mechanical properties using optical tomography and digital volume correlation. (Doctoral Dissertation). Loughborough University. Retrieved from http://hdl.handle.net/2134/14894

Chicago Manual of Style (16^th Edition):

Fu, Jiawei. “Identification of corneal mechanical properties using optical tomography and digital volume correlation.” 2014. Doctoral Dissertation, Loughborough University. Accessed January 27, 2021. http://hdl.handle.net/2134/14894.

MLA Handbook (7^th Edition):

Fu, Jiawei. “Identification of corneal mechanical properties using optical tomography and digital volume correlation.” 2014. Web. 27 Jan 2021.

Vancouver:

Fu J. Identification of corneal mechanical properties using optical tomography and digital volume correlation. [Internet] [Doctoral dissertation]. Loughborough University; 2014. [cited 2021 Jan 27]. Available from: http://hdl.handle.net/2134/14894.

Council of Science Editors:

Fu J. Identification of corneal mechanical properties using optical tomography and digital volume correlation. [Doctoral Dissertation]. Loughborough University; 2014. Available from: http://hdl.handle.net/2134/14894

University of Florida

3. Tritinger, Amanda S. The Influence of Vertical Current Structure on Wind-Driven Surges in the Nearshore Region.

Degree: PhD, Coastal and Oceanographic Engineering - Civil and Coastal Engineering, 2019, University of Florida

URL: https://ufdc.ufl.edu/UFE0054288

► 2-Dimensional Depth-Integrated (2DDI) models are unable to represent the bottom stress in the nearshore region accurately, mainly because the bottom stress is computed with the… (more)

Subjects/Keywords: 2ddi – 3d – coastal – computational – depth-averaged – modeling – nearshore – storm-surge – vertically-resolved – wind-driven

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APA (6^th Edition):

Tritinger, A. S. (2019). The Influence of Vertical Current Structure on Wind-Driven Surges in the Nearshore Region. (Doctoral Dissertation). University of Florida. Retrieved from https://ufdc.ufl.edu/UFE0054288

Chicago Manual of Style (16^th Edition):

Tritinger, Amanda S. “The Influence of Vertical Current Structure on Wind-Driven Surges in the Nearshore Region.” 2019. Doctoral Dissertation, University of Florida. Accessed January 27, 2021. https://ufdc.ufl.edu/UFE0054288.

MLA Handbook (7^th Edition):

Tritinger, Amanda S. “The Influence of Vertical Current Structure on Wind-Driven Surges in the Nearshore Region.” 2019. Web. 27 Jan 2021.

Vancouver:

Tritinger AS. The Influence of Vertical Current Structure on Wind-Driven Surges in the Nearshore Region. [Internet] [Doctoral dissertation]. University of Florida; 2019. [cited 2021 Jan 27]. Available from: https://ufdc.ufl.edu/UFE0054288.

Council of Science Editors:

Tritinger AS. The Influence of Vertical Current Structure on Wind-Driven Surges in the Nearshore Region. [Doctoral Dissertation]. University of Florida; 2019. Available from: https://ufdc.ufl.edu/UFE0054288

Queensland University of Technology

4. Sundarajoo, Shankaran. Deep Raman Spectroscopy in the analytical forensic investigation of concealed substances.

Degree: 2012, Queensland University of Technology

URL: https://eprints.qut.edu.au/61022/

► Deep Raman Spectroscopy is a domain within Raman spectroscopy consisting of techniques that facilitate the depth profiling of diffusely scattering media. Such variants include Time-Resolved… (more)

Subjects/Keywords: Concealed substance; depth profiling; Deep Raman Spectroscopy; Spatially-offset Raman Spectroscopy (SORS); Time-resolved Spatially-offset Raman Spectroscopy; Time –resolved Raman Spectroscopy

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APA (6^th Edition):

Sundarajoo, S. (2012). Deep Raman Spectroscopy in the analytical forensic investigation of concealed substances. (Thesis). Queensland University of Technology. Retrieved from https://eprints.qut.edu.au/61022/

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16^th Edition):

Sundarajoo, Shankaran. “Deep Raman Spectroscopy in the analytical forensic investigation of concealed substances.” 2012. Thesis, Queensland University of Technology. Accessed January 27, 2021. https://eprints.qut.edu.au/61022/.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7^th Edition):

Sundarajoo, Shankaran. “Deep Raman Spectroscopy in the analytical forensic investigation of concealed substances.” 2012. Web. 27 Jan 2021.

Vancouver:

Sundarajoo S. Deep Raman Spectroscopy in the analytical forensic investigation of concealed substances. [Internet] [Thesis]. Queensland University of Technology; 2012. [cited 2021 Jan 27]. Available from: https://eprints.qut.edu.au/61022/.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Sundarajoo S. Deep Raman Spectroscopy in the analytical forensic investigation of concealed substances. [Thesis]. Queensland University of Technology; 2012. Available from: https://eprints.qut.edu.au/61022/

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

The Ohio State University

5. Rutkowski, Mitchell M. Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba_xSr_1-xTiO₃ Grown by Molecular Beam Epitaxy.

Degree: PhD, Physics, 2013, The Ohio State University

URL: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366299175

► Growth of BST films by MBE were carried out under a variety of oxidizing conditions and substrate temperatures. Typical oxygen pressures ranged from 0… (more)

▼ Growth of BST films by MBE were carried out under a variety of oxidizing conditions and substrate temperatures. Typical oxygen pressures ranged from 0 Torr, with the substrate feeding atomic oxygen into the growing film, up to 1E-6 Torr with the oxygen either being introduced as an ambient oxygen background or as activated plasma. Films were characterized in-house by x-ray photoemission spectroscopy (XPS), depth resolved cathodoluminescence spectroscopy, and x-ray diffraction while the fabrication of interdigitated capacitor (IDC) structures and subsequent dielectric measurements we performed at Naval Research Laboratories. To facilitate XPS measurements of pristine sample surfaces, an ultra-high vacuum transfer line was designed and built to transfer samples from the MBE growth chamber into the XPS analysis chamber without exposing the sample to air. Depth resolved cathodoluminescence spectroscopy (DRCLS) measurements reveal a strong dependence of the material’s electrically active defects on the growth parameters and chemical compositions. In particular, we see a large increase in the 2.55 eV and 2.95 eV emission intensity from the STO substrate for films grown with low oxygen pressures. It is known that the 2.55 eV and 2.95 eV emissions are related to oxygen vacancies, and it is shown that these defects are generated deep within the substrate by out diffusion of oxygen into the substrate. As we increase the oxygen pressure, we see an increase in the intensity of the 2.1 eV and 2.3 eV emission intensities, and we can understand this as the depopulation of a state within the bandgap of the material at 0.6 eV above the valence band allowing transitions from the oxygen vacancy and conduction band into this new state respectively. We then go on to show how an excess of Sr in reduced strontium titanate (STO) films can behave as an acceptor, depopulating this state and again leading to an increase in the 2.1 eV and 2.3 eV emissions. The utility of these defects is displayed by an observed strong positive correlation between the 2.3 eV emission and the Q of the material. By reducing carriers in the material we can reduce the dielectric loss and this is evident from our DRCLS spectra. We also see a strong dependence on the 1.9 eV emission intensity with the Ba/Sr which in turn depends on the oxygen background pressure (P(O2)) and shows a strong negative correlation with the tunability of the material Again, these results highlight the dependence of dielectric properties on the material defects generated during growth and the effectiveness of DRCLS to probe these defects. Control of material defects through MBE opens an avenue for the engineering of materials through defect management at the atomic level. Advisors/Committee Members: Brillson, Leonard (Advisor).

Subjects/Keywords: Physics; Molecular Beam Epitaxy; Native Point Defect; Thin Film Growth; Depth Resolved Cathodoluminescence Spectroscopy; Barium Strontium Titanate; Interdigitated Capacitors

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APA (6^th Edition):

Rutkowski, M. M. (2013). Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba_xSr_1-xTiO₃ Grown by Molecular Beam Epitaxy. (Doctoral Dissertation). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1366299175

Chicago Manual of Style (16^th Edition):

Rutkowski, Mitchell M. “Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba_xSr_1-xTiO₃ Grown by Molecular Beam Epitaxy.” 2013. Doctoral Dissertation, The Ohio State University. Accessed January 27, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=osu1366299175.

MLA Handbook (7^th Edition):

Rutkowski, Mitchell M. “Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba_xSr_1-xTiO₃ Grown by Molecular Beam Epitaxy.” 2013. Web. 27 Jan 2021.

Vancouver:

Rutkowski MM. Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba_xSr_1-xTiO₃ Grown by Molecular Beam Epitaxy. [Internet] [Doctoral dissertation]. The Ohio State University; 2013. [cited 2021 Jan 27]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366299175.

Council of Science Editors:

Rutkowski MM. Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba_xSr_1-xTiO₃ Grown by Molecular Beam Epitaxy. [Doctoral Dissertation]. The Ohio State University; 2013. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366299175

The Ohio State University

6. Asel, Thaddeus J. Nanoscale Characterization of Defects in Complex Oxides and Germanane.

Degree: PhD, Physics, 2018, The Ohio State University

URL: http://rave.ohiolink.edu/etdc/view?acc_num=osu1523982077791833

► Understanding the nature of atomic scale defects inside electronic materials can lead to new ways of eliminating them and thereby refining electronics for high performance.… (more)

▼ Understanding the nature of atomic scale defects inside electronic materials can lead to new ways of eliminating them and thereby refining electronics for high performance. Such defect engineering can create pathways of tuning electronic and magnetic properties for next-generation devices. An interesting class of materials are the complex oxides due to their numerous properties, such as a tunable dielectric constant, ferroelectricity, ferromagnetism, superconductivity, and high dielectric constants, they are studied for use in a variety of device applications. Similarly, two-dimensional (2D) materials have been of interest due to their dimensional limitations which allows them to exhibit new physical phenomena. It has been shown that these two classes of materials can work together as the ferroelectric properties of complex oxides can enhance the conduction in 2D materials. Depth-resolved Cathodoluminescence Spectroscopy (DRCLS) is a technique that is ideal for studying the origins of defects in these materials as well as offering a way to analyze the manipulation of defects to build next-generation devices.Ba0.5Sr0.5TiO3 films were grown on MgO (001) via molecular beam epitaxy (MBE) for microwave studies and annealed in air at various temperatures. DRCLS was used to measure relative defect concentrations of the films. It was determined that films annealed in air at 950 ºC contained significantly fewer oxygen vacancies. SrTiO3 (STO) grown via MBE was studied via DRCLS to measure the effects of the electric field on the defects. DRCLS revealed that when the sample was under 3.1 MV/cm the sample showed significant changes in the position of the oxygen vacancy that indicated a change in the position of the oxygen vacancy in the sample. DRCLS confirmed a lack of oxygen vacancies at a STO interface when compared to oxygen vacancies in the STO substrate on which the structure was grown. These experiments illustrate the ability to manipulate and reduce defects, and how it affects materials in device applications. We used DRCLS and surface photovoltage spectroscopy (SPS) to identify multiple mid-gap defect states in germanane, a 2D material with a direct band gap. By using a combination of chemical processing and comparison with DFT density of states calculations we were able to identify the origin of the defect states. DRCLS/SPS optical transitions yielded energy level positions 0.81 and 1.35 eV below the conduction band and 0.96 eV above the valence band within the 1.60 eV band gap that matched with DFT levels for Ge vacancies coordinated with H atoms. Varying the extent of de-intercalation we identified the nature of an additional state at EV+1.05 eV due to Ca between the GeCH3 layers. We used a photoluminescence spectroscopy (PLS) to observe how air and other gases affect band-to-band recombination in germanane. PLS exhibits a commonly observed 1.9 eV luminescence in air, which is quenched in vacuum and replaced by the 1.6 eV band gap emission. Gas-dependent studies reveal that H2O intercalation is the cause of the 1.9… Advisors/Committee Members: Brillson, Leonard (Advisor).

Subjects/Keywords: Physics; Condensed Matter Physics; Depth-Resolved Cathodoluminescence Spectroscopy, defects, complex oxides, germanane, 2D materials, Surface photovoltage Spectroscopy

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APA (6^th Edition):

Asel, T. J. (2018). Nanoscale Characterization of Defects in Complex Oxides and Germanane. (Doctoral Dissertation). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1523982077791833

Chicago Manual of Style (16^th Edition):

Asel, Thaddeus J. “Nanoscale Characterization of Defects in Complex Oxides and Germanane.” 2018. Doctoral Dissertation, The Ohio State University. Accessed January 27, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=osu1523982077791833.

MLA Handbook (7^th Edition):

Asel, Thaddeus J. “Nanoscale Characterization of Defects in Complex Oxides and Germanane.” 2018. Web. 27 Jan 2021.

Vancouver:

Asel TJ. Nanoscale Characterization of Defects in Complex Oxides and Germanane. [Internet] [Doctoral dissertation]. The Ohio State University; 2018. [cited 2021 Jan 27]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1523982077791833.

Council of Science Editors:

Asel TJ. Nanoscale Characterization of Defects in Complex Oxides and Germanane. [Doctoral Dissertation]. The Ohio State University; 2018. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1523982077791833

7. Fu, Jiawei. Identification of corneal mechanical properties using optical tomography and digital volume correlation : Identification de la mécanique de la cornée par la tomographie optique et la corrélation de volume numérique.

Degree: Docteur es, Systèmes Mécaniques et Matériaux, 2014, Troyes; Loughborough university

URL: http://www.theses.fr/2014TROY0013

►

Ce travail présente une méthodologie efficace pour mesurer le champ de déformation total en 3-D des tissus mous semi-transparents et diffusant la lumière, tels que… (more)

▼

Ce travail présente une méthodologie efficace pour mesurer le champ de déformation total en 3-D des tissus mous semi-transparents et diffusant la lumière, tels que la cornée de l'œil vertébré. Cela a été obtenu en utilisant la tomographie par cohérence optique couplée avec la corrélation volumique numérique sur des fantômes en caoutchouc de silicone et de la cornée porcine. Des tests de traction et des tests d'inflation postérieure ont été étudiés. Avant ces tests, l'effet du bruit et la décorrélation des speckles due à la déformation sont d'abord étudiés en utilisant des méthodes expérimentales et numériques. Le biais d'interpolation dans les résultats de déformation a été analysé. Deux approches efficaces ont été prises pour réduire le biais d'interpolation. Pour extraire les paramètres constitutifs des mesures de déformation 3-D, la méthode des champs virtuels a été étendue en 3-D. Les champs virtuels définis manuellement et les champs virtuels optimisés par morceaux ont été développés et comparés entre eux. Des efforts ont également été déployés pour corriger les distorsions induites par réfraction dans les reconstructions de la tomographie par cohérence optique. Des tests d'inclinaison des différents fantômes de silicone ont été introduits afin d’évaluer la performance de la méthode pour corriger les reconstructions distordues

This work presents an effective methodology for measuring the depth-resolved 3-D full-field deformation of semitransparent, light scattering soft tissues such as vertebrate eye cornea. This was obtained by performing digital volume correlation on optical coherence tomography volume reconstructions of silicone rubber phantoms and porcine cornea samples. Both the strip tensile tests and the posterior inflation tests have been studied. Prior to these tests, noise effect and strain induced speckle decorrelation were first studied using experimental and simulation methods. The interpolation bias in the strain results has also been analyzed. Two effective approaches have been introduced to reduce the interpolation bias. To extract material constitutive parameters from the 3-D full-field deformation measurements, the virtual fields method has been extended into 3-D. Both manually defined virtual fields and the optimized piecewise virtual fields have been developed and compared with each other. Efforts have also been made in developing a method to correct the refraction induced distortions in the optical coherence tomography reconstructions. Tilt tests of different silicone rubber phantoms have been implemented to evaluate the performance of the refraction correction method in correcting the distorted reconstructions

Advisors/Committee Members: Pierron, Fabrice (thesis director).

Subjects/Keywords: Tissu mou; Déformations (mécanique); Tomographie en cohérence optique; Identification; Contraintes (mécanique); Soft tissue; Depth-resolved strain; Optical coherence tomograhy; Constitutive parameters identification; Deformation measurement; 620

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APA (6^th Edition):

Fu, J. (2014). Identification of corneal mechanical properties using optical tomography and digital volume correlation : Identification de la mécanique de la cornée par la tomographie optique et la corrélation de volume numérique. (Doctoral Dissertation). Troyes; Loughborough university. Retrieved from http://www.theses.fr/2014TROY0013

Chicago Manual of Style (16^th Edition):

Fu, Jiawei. “Identification of corneal mechanical properties using optical tomography and digital volume correlation : Identification de la mécanique de la cornée par la tomographie optique et la corrélation de volume numérique.” 2014. Doctoral Dissertation, Troyes; Loughborough university. Accessed January 27, 2021. http://www.theses.fr/2014TROY0013.

MLA Handbook (7^th Edition):

Fu, Jiawei. “Identification of corneal mechanical properties using optical tomography and digital volume correlation : Identification de la mécanique de la cornée par la tomographie optique et la corrélation de volume numérique.” 2014. Web. 27 Jan 2021.

Vancouver:

Fu J. Identification of corneal mechanical properties using optical tomography and digital volume correlation : Identification de la mécanique de la cornée par la tomographie optique et la corrélation de volume numérique. [Internet] [Doctoral dissertation]. Troyes; Loughborough university; 2014. [cited 2021 Jan 27]. Available from: http://www.theses.fr/2014TROY0013.

Council of Science Editors:

Fu J. Identification of corneal mechanical properties using optical tomography and digital volume correlation : Identification de la mécanique de la cornée par la tomographie optique et la corrélation de volume numérique. [Doctoral Dissertation]. Troyes; Loughborough university; 2014. Available from: http://www.theses.fr/2014TROY0013

Loughborough University

8. Widjanarko, Taufiq. Hyperspectral interferometry for single-shot profilometry and depth-resolved displacement field measurement.

Degree: PhD, 2011, Loughborough University

URL: http://hdl.handle.net/2134/8349

► A new approach to the absolute measurement of two-dimensional optical path differences is presented in this thesis. The method, which incorporates a white light interferometer… (more)

Subjects/Keywords: 681; Hyperspectral interferometry; Single-shot measurement; Profilometry; Depth-resolved displacement field measurement; Absolute distance measurement; Phase measurement; Low coherence interferometry; Optical coherence tomography

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APA (6^th Edition):

Widjanarko, T. (2011). Hyperspectral interferometry for single-shot profilometry and depth-resolved displacement field measurement. (Doctoral Dissertation). Loughborough University. Retrieved from http://hdl.handle.net/2134/8349

Chicago Manual of Style (16^th Edition):

Widjanarko, Taufiq. “Hyperspectral interferometry for single-shot profilometry and depth-resolved displacement field measurement.” 2011. Doctoral Dissertation, Loughborough University. Accessed January 27, 2021. http://hdl.handle.net/2134/8349.

MLA Handbook (7^th Edition):

Widjanarko, Taufiq. “Hyperspectral interferometry for single-shot profilometry and depth-resolved displacement field measurement.” 2011. Web. 27 Jan 2021.

Vancouver:

Widjanarko T. Hyperspectral interferometry for single-shot profilometry and depth-resolved displacement field measurement. [Internet] [Doctoral dissertation]. Loughborough University; 2011. [cited 2021 Jan 27]. Available from: http://hdl.handle.net/2134/8349.

Council of Science Editors:

Widjanarko T. Hyperspectral interferometry for single-shot profilometry and depth-resolved displacement field measurement. [Doctoral Dissertation]. Loughborough University; 2011. Available from: http://hdl.handle.net/2134/8349

Georgia Tech

9. Diao, Jie. Development of Techniques to Quantify Chemical and Mechanical Modifications of Polymer Surfaces: Application to Chemical Mechanical Polishing.

Degree: PhD, Chemical Engineering, 2004, Georgia Tech

URL: http://hdl.handle.net/1853/7628

► This thesis is devoted to development of techniques to quantify chemical and mechanical influences during chemical mechanical polishing (CMP) near the surface of a polymer… (more)

Subjects/Keywords: Chemical mechanical polishing; Depth profile; Polymers; Optical properties; Angle resolved XPS

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APA (6^th Edition):

Diao, J. (2004). Development of Techniques to Quantify Chemical and Mechanical Modifications of Polymer Surfaces: Application to Chemical Mechanical Polishing. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/7628

Chicago Manual of Style (16^th Edition):

Diao, Jie. “Development of Techniques to Quantify Chemical and Mechanical Modifications of Polymer Surfaces: Application to Chemical Mechanical Polishing.” 2004. Doctoral Dissertation, Georgia Tech. Accessed January 27, 2021. http://hdl.handle.net/1853/7628.

MLA Handbook (7^th Edition):

Diao, Jie. “Development of Techniques to Quantify Chemical and Mechanical Modifications of Polymer Surfaces: Application to Chemical Mechanical Polishing.” 2004. Web. 27 Jan 2021.

Vancouver:

Diao J. Development of Techniques to Quantify Chemical and Mechanical Modifications of Polymer Surfaces: Application to Chemical Mechanical Polishing. [Internet] [Doctoral dissertation]. Georgia Tech; 2004. [cited 2021 Jan 27]. Available from: http://hdl.handle.net/1853/7628.

Council of Science Editors:

Diao J. Development of Techniques to Quantify Chemical and Mechanical Modifications of Polymer Surfaces: Application to Chemical Mechanical Polishing. [Doctoral Dissertation]. Georgia Tech; 2004. Available from: http://hdl.handle.net/1853/7628

University of Houston

10. Wang, Shang. Optical Coherence Tomography and Elastography for Tissue Characterization.

Degree: PhD, Biomedical Engineering, 2014, University of Houston

URL: http://hdl.handle.net/10657/4675

► This dissertation reports on the development of low-coherence optical imaging and measurement techniques, focusing on optical coherence elastographic techniques, to meet the growing demand for… (more)

▼ This dissertation reports on the development of low-coherence optical imaging and measurement techniques, focusing on optical coherence elastographic techniques, to meet the growing demand for noninvasive high-resolution tissue characterization with improved diagnosis and treatment of various diseases. The research work is mainly based on optical coherence tomography (OCT), a three-dimensional imaging modality that enables depth-resolved tissue imaging with micro-scale axial resolution. The dissertation work can be summarized in six aspects: 1) the development of an OCT-based computational method utilizing multi-dimensional information on tissue optical properties and structural features for resection margin delineation of soft tissue sarcomas; 2) the development of a combined ultrasound/OCT system and a spectral analyzing method for noninvasive rapid detection of depth-dependent elasticity in transparent samples, as an approach to probe the mechanical property gradient in the crystalline lens of the eye; 3) the development of a combined air-puff/OCT system that can be used for quantitative measurement of tissue elastic properties with the analysis of surface waves for noncontact intraoperative detection of soft-tissue tumors; 4) the development of shear wave imaging OCT (SWI-OCT), a noncontact low-coherence optical phase-based sensing technique that enables depth-resolved ultra-fast visualization of the low-amplitude elastic wave propagation in tissue, which provides direct information on tissue biomechanics, such as the corneal viscoelasticity; 5) the development of quantitative SWI-OCT for noncontact localized measurement of tissue elasticity, which can be used to conduct mechanical assessment of mouse myocardium, providing essential assistance to the studies on cardiac tissue engineering; and 6) the demonstration of an OCT en-face imaging and detection method for the remote monitoring of microparticles on gold surface under skin tissue, based on which an implantable continuous glucose sensing method can be implemented. These techniques and methods are demonstrated with the experiments performed on tissue-mimicking phantoms and biological samples, such as ex vivo human and animal tissues. The results of measurement and detection are verified through the comparisons with gold-standard tests or literature. This dissertation represents the frontier of the emerging research area of optical coherence elastography and is expected to contribute to the field of tissue characterization with both the biological and medical applications. Advisors/Committee Members: Larin, Kirill V. (advisor), Akay, Metin (committee member), Twa, Michael D. (committee member), Larina, Irina V. (committee member), Wood, Lowell T. (committee member).

Subjects/Keywords: Optical coherence tomography (OCT); Optical coherence elastography; Vision sciences; Tissue characterization; Image processing; Low-coherence optical phase imaging; Tissue biomechanics; Air puff; Ultrasound; Signal processing; Soft-tissue tumors; Cornea; Crystalline lens; Myocardium; Glucose sensing; Microparticles; Noncontact measurement; Young's modulus; Depth-resolved detection

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APA (6^th Edition):

Wang, S. (2014). Optical Coherence Tomography and Elastography for Tissue Characterization. (Doctoral Dissertation). University of Houston. Retrieved from http://hdl.handle.net/10657/4675

Chicago Manual of Style (16^th Edition):

Wang, Shang. “Optical Coherence Tomography and Elastography for Tissue Characterization.” 2014. Doctoral Dissertation, University of Houston. Accessed January 27, 2021. http://hdl.handle.net/10657/4675.

MLA Handbook (7^th Edition):

Wang, Shang. “Optical Coherence Tomography and Elastography for Tissue Characterization.” 2014. Web. 27 Jan 2021.

Vancouver:

Wang S. Optical Coherence Tomography and Elastography for Tissue Characterization. [Internet] [Doctoral dissertation]. University of Houston; 2014. [cited 2021 Jan 27]. Available from: http://hdl.handle.net/10657/4675.

Council of Science Editors:

Wang S. Optical Coherence Tomography and Elastography for Tissue Characterization. [Doctoral Dissertation]. University of Houston; 2014. Available from: http://hdl.handle.net/10657/4675

Loughborough University

11. Reichold, Tobias. Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements.

Degree: PhD, 2020, Loughborough University

URL: https://doi.org/10.26174/thesis.lboro.13259174.v1 ; https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.820024

► Surface profile and topography measurements of manufactured goods and components across all sectors of engineering are an integral component of a production process. Control measurements… (more)

Subjects/Keywords: hyperspectral; Interferometry; single-shot; imaging technique; Smooth surface; Profilometry; Areal; Rough Surface; speckle; roughness parameters; Depth-resolved; pinhole array; microlens arrays; 4f imaging; SLED; calibration; Stepped Surface; Tilted Surface; spectrum; spectra

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APA (6^th Edition):

Reichold, T. (2020). Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements. (Doctoral Dissertation). Loughborough University. Retrieved from https://doi.org/10.26174/thesis.lboro.13259174.v1 ; https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.820024

Chicago Manual of Style (16^th Edition):

Reichold, Tobias. “Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements.” 2020. Doctoral Dissertation, Loughborough University. Accessed January 27, 2021. https://doi.org/10.26174/thesis.lboro.13259174.v1 ; https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.820024.

MLA Handbook (7^th Edition):

Reichold, Tobias. “Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements.” 2020. Web. 27 Jan 2021.

Vancouver:

Reichold T. Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements. [Internet] [Doctoral dissertation]. Loughborough University; 2020. [cited 2021 Jan 27]. Available from: https://doi.org/10.26174/thesis.lboro.13259174.v1 ; https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.820024.

Council of Science Editors:

Reichold T. Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements. [Doctoral Dissertation]. Loughborough University; 2020. Available from: https://doi.org/10.26174/thesis.lboro.13259174.v1 ; https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.820024

12. Cho, Jihyun. CMOS Sensors for Time-Resolved Active Imaging.

Degree: PhD, Electrical Engineering, 2017, University of Michigan

URL: http://hdl.handle.net/2027.42/136950

► In the past decades, time-resolved imaging such as fluorescence lifetime or time-of-flight depth imaging has been extensively explored in biomedical and industrial fields because of… (more)

▼ In the past decades, time-resolved imaging such as fluorescence lifetime or time-of-flight depth imaging has been extensively explored in biomedical and industrial fields because of its non-invasive characterization of material properties and remote sensing capability. Many studies have shown its potential and effectiveness in applications such as cancer detection and tissue diagnoses from fluorescence lifetime imaging, and gesture/motion sensing and geometry sensing from time-of-flight imaging. Nonetheless, time-resolved imaging has not been widely adopted due to the high cost of the system and performance limits. The research presented in this thesis focuses on the implementation of low-cost real-time time-resolved imaging systems. Two image sensing schemes are proposed and implemented to address the major limitations. First, we propose a single-shot fluorescence lifetime image sensors for high speed and high accuracy imaging. To achieve high accuracy, previous approaches repeat the measurement for multiple sampling, resulting in long measurement time. On the other hand, the proposed method achieves both high speed and accuracy at the same time by employing a pixel-level processor that takes and compresses the multiple samples within a single measurement time. The pixels in the sensor take multiple samples from the fluorescent optical signal in sub-nanosecond resolution and compute the average photon arrival time of the optical signal. Thanks to the multiple sampling of the signal, the measurement is insensitive to the shape or the pulse-width of excitation, providing better accuracy and pixel uniformity than conventional rapid lifetime determination (RLD) methods. The proposed single-shot image sensor also improves the imaging speed by orders of magnitude compared to other conventional center-of-mass methods (CMM). Second, we propose a 3-D camera with a background light suppression scheme which is adaptable to various lighting conditions. Previous 3-D cameras are not operable in outdoor conditions because they suffer from measurement errors and saturation problems under high background light illumination. We propose a reconfigurable architecture with column-parallel discrete-time background light cancellation circuit. Implementing the processor at the column level allows an order of magnitude reduction in pixel size as compared to existing pixel-level processors. The column-level approach also provides reconfigurable operation modes for optimal performance in all lighting conditions. For example, the sensor can operate at the best frame-rate and resolution without the presence of background light. If the background light saturates the sensor or increases the shot noise, the sensor can adjust the resolution and frame-rate by pixel binning and superresolution techniques. This effectively enhances the well capacity of the pixel to compensate for the increase shot noise, and speeds up the frame processing to handle the excessive background light. A fabricated prototype sensor can suppress the background light more… Advisors/Committee Members: Yoon, Euisik (committee member), Mycek, Mary-Ann (committee member), Flynn, Michael (committee member), Wise, Kensall D (committee member).

Subjects/Keywords: time-resolved imaging; time-of-flight depth imaging; fluorescence lifetime imaging; center of mass method; background light suppression; CMOS image sensor; Engineering

…decades, time-resolved imaging such as fluorescence lifetime or time-offlight depth imaging has… …100 viii Fig. 5-13. (a) Measured depth and (b) RMS noise versus… …actual depth. ........................ 103 Fig. 5-14. Accuracy vs. BGL… …109 xi ABSTRACT CMOS Sensors for Time-Resolved Active Imaging by Jihyun Cho In the past… …imaging. Nonetheless, time-resolved imaging has not been widely adopted due to the high cost of…

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APA (6^th Edition):

Cho, J. (2017). CMOS Sensors for Time-Resolved Active Imaging. (Doctoral Dissertation). University of Michigan. Retrieved from http://hdl.handle.net/2027.42/136950

Chicago Manual of Style (16^th Edition):

Cho, Jihyun. “CMOS Sensors for Time-Resolved Active Imaging.” 2017. Doctoral Dissertation, University of Michigan. Accessed January 27, 2021. http://hdl.handle.net/2027.42/136950.

MLA Handbook (7^th Edition):

Cho, Jihyun. “CMOS Sensors for Time-Resolved Active Imaging.” 2017. Web. 27 Jan 2021.

Vancouver:

Cho J. CMOS Sensors for Time-Resolved Active Imaging. [Internet] [Doctoral dissertation]. University of Michigan; 2017. [cited 2021 Jan 27]. Available from: http://hdl.handle.net/2027.42/136950.

Council of Science Editors:

Cho J. CMOS Sensors for Time-Resolved Active Imaging. [Doctoral Dissertation]. University of Michigan; 2017. Available from: http://hdl.handle.net/2027.42/136950

13. Cox, Jonathan Wesley. Electronic and Optical Properties of Defects at Metal-ZnO Nanowire Contacts.

Degree: MS, Electrical and Computer Engineering, 2017, The Ohio State University

URL: http://rave.ohiolink.edu/etdc/view?acc_num=osu1492199033371717

► Zinc oxide (ZnO) has emerged as a promising wide bandgap material (3.35eV at 300K) for use in next-generation nanoelectronics and photonics, with important piezoelectric, pyroelectric,… (more)

▼ Zinc oxide (ZnO) has emerged as a promising wide bandgap material (3.35eV at 300K) for use in next-generation nanoelectronics and photonics, with important piezoelectric, pyroelectric, sensing, and optoelectronic properties. ZnO has seen specific application in ultraviolet (UV) photodetectors, UV lasers [1], hydrogen gas sensors [2, 3], surface acoustic wave devices, piezoelectric generators [4], and transparent thin-film transistors for displays [5]. Various forms of ZnO nanostructures, such as nanobelts, nanobows, and nanowires, and have all attracted significant attention due to their ease of fabrication, remarkable relative surface area, and low-dimensional nature [6, 7]. Nanowires of ZnO in particular can exhibit pinch-off of electrical current with surface charge-sensitive depletion depths that are on the order of the wire radius [8, 9]. In bulk ZnO, defects have been shown to strongly affect the behavior of metal contacts, by modifying band bending and allowing trap-assisted tunneling transport through the metal-ZnO Schottky barrier [10]. The electronic impact of native point defects becomes critical at the nanoscale, since their physical properties can dominate charge carrier transport and especially electronic contact behavior. In order to control the distribution of defects at the metal-nanowire interface, various forms of surface modification were investigated. We report the in-situ fabrication of both Ohmic and Schottky platinum (Pt) metal contacts to single ZnO nanowires prepared by pulsed laser deposition (PLD) and carbothermal vapor phase transport, using Ga-ion surface modification and both furnace and electron beam annealing. A Ga focused ion beam (FIB) was operated at 30 keV to implant nanowire surfaces before metallization for production of Ohmic contacts, and at 5 keV to gently mill the defect-rich outer annulus, promoting formation of Schottky contacts. Electron beam induced deposition (EBID) was used to pattern Pt metal contacts to the wires. The optical properties of defects at the nanowire surface and metal-nanowire interface were probed using depth-resolved cathodoluminesence spectroscopy (DRCLS). Results demonstrated that differences in native point defect distributions under the 30nm Pt contacts and into the bulk were correlated directly with Schottky versus Ohmic behavior exhibited in measured current-voltage characteristics. Depth profiles of DRCL spectra at and under Ga-implanted Ohmic contacts revealed interfacial segregation of copper on zinc site defects (Cu_Zn, 2.34eV), as well as zinc vacancies (V_Zn, 1.80eV). A depth profile of DRCL spectra at the interface of a Ga-milled area and 30nm Pt contact demonstrated that milling of the nanowire surface decreased the concentration of Cu_Zn by an order of magnitude, promoting the formation of Schottky contacts. A Schottky contact with 2 orders of magnitude rectification was fabricated to the thin end of a 50µm long tapered NW whose diameter increased linearly end-to-end, from 400nm to 1µm. To cause pinch-off,… Advisors/Committee Members: Brillson, Leonard (Advisor).

Subjects/Keywords: Electrical Engineering; ZnO; nanowires; electrical; optical; defects; contacts; Ohmic; Schottky; gallium; platinum; focused ion beam; FIB; scanning electron microscopy; SEM; depth-resolved cathodoluminescence spectroscopy; DRCLS; cathodoluminescence; spectroscopy

…the structures, depth-resolved cathodoluminescence spectroscopy (DRCLS) was used… …21 Figure 16. Depth profiles of CuZn and VO in Ga-milled versus untreated nanowire… …35 Figure 29. Depth profiles of the DRCL spectra next to contact 3 and 4… …increased depth of e-h pair creation [19], or an increased DRCLS probing depth. The low… …maximum depth of approximately 75 nm. Higher beam energies demonstrate that while the majority…

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APA (6^th Edition):

Cox, J. W. (2017). Electronic and Optical Properties of Defects at Metal-ZnO Nanowire Contacts. (Masters Thesis). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1492199033371717

Chicago Manual of Style (16^th Edition):

Cox, Jonathan Wesley. “Electronic and Optical Properties of Defects at Metal-ZnO Nanowire Contacts.” 2017. Masters Thesis, The Ohio State University. Accessed January 27, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=osu1492199033371717.

MLA Handbook (7^th Edition):

Cox, Jonathan Wesley. “Electronic and Optical Properties of Defects at Metal-ZnO Nanowire Contacts.” 2017. Web. 27 Jan 2021.

Vancouver:

Cox JW. Electronic and Optical Properties of Defects at Metal-ZnO Nanowire Contacts. [Internet] [Masters thesis]. The Ohio State University; 2017. [cited 2021 Jan 27]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1492199033371717.

Council of Science Editors:

Cox JW. Electronic and Optical Properties of Defects at Metal-ZnO Nanowire Contacts. [Masters Thesis]. The Ohio State University; 2017. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1492199033371717

14. Zhang, Zhichun. Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides.

Degree: PhD, Electrical and Computer Engineering, 2013, The Ohio State University

URL: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518

► Wide band gap semiconductors and oxides have attracted much attention in the last decade because of their various applications to next generation opto- and… (more)

▼ Wide band gap semiconductors and oxides have attracted much attention in the last decade because of their various applications to next generation opto- and micro-electronics. My research focuses on the process dependence of the defects and dopants in wide band gap semiconductors and oxides of high-k dielectrics, ZnO and MoS₂. Ultrahigh speed microelectronics demands high mobility semiconductors such as Ge. We are exploring how to process high-k oxides on Ge to minimize defects that trap charge. For Ge doped HfO₂, which has higher k value, combined X-ray absorption spectroscopy (XAS) and depth-resolved cathodoluminescence spectroscopy (DRCLS) measurements identified the defects in Ge doped HfO₂. Besides, DRCLS of GeO₂/Ge structure demonstrated that different annealing temperature will affect the defects at the GeO₂/Ge interface. Understanding the defects evolution under different process condition and controlling the defects density in the high-k dielectric gate stack will promote the development of nanoscale electronic devices. Wide band gap semiconductor ZnO (E_g = 3.4 eV) is a leading candidate for future opto- and micro-electronics due to its high exciton binding energy, thermochemical stability, environment compatibility, availability of high quality large substrates and potential applications for light-emitting devices and photovoltaics. However, as-grown un-doped ZnO is naturally n-type and controllable p-type doping is still not stable and reliable. The origin of the n-type conductivity is also controversial, so the ability to understand and control the intrinsic and impurity related defects in ZnO is essential. We used nanoscale DRCLS, secondary ion mass spectrometry (SIMS), surface photovoltage spectroscopy (SPS), transient surface photovoltage spectroscopy (TSPS), photoluminescence spectroscopy (PLS) and temperature-dependent Hall-effect (TDHE) measurements to investigate the strong process dependence of Li configuration and electrical property of Li-doped ZnO on thermal treatment, the passivation and doping effect of implanted H in ZnO, the mechanical polishing induced defects and passivation effect of post-polishing diluted HF etching. DRCLS reveals an inverse relationship between the optical emission densities of lithium on zinc sites versus zinc vacancy sites, demonstrating the time dependence of Li interstitials to combine with zinc vacancies in order to form substitutional Li acceptors. The critical annealing time and temperature was determined for lowest defect intensity and highest donor concentration of H implanted ZnO. Post polishing HF etching not only removes/passivates zinc vacancy (V_Zn) related defects, but also decreases oxygen vacancy (V_O) related defects by one order of magnitude. Understanding the process dependence of the H and Li configurations and properties in ZnO will provide guidance to control electrical property of ZnO, produce low resistivity in situ auto doped n-type ZnO bulk as… Advisors/Committee Members: Brillson, Leonard (Advisor).

Subjects/Keywords: Electrical Engineering; Nanotechnology; Nanoscience; Solid State Physics; Engineering; Wide band gap semiconductor; high-K dielectric; Zinc oxide; MoS2; depth-resolved cathodoluminescence spectroscopy; surface photovoltage spectroscopy; photoluminescence spectroscopy

…G. Lucovsky, and L. J. Brillson, “Nanoscale Depth-Resolved Electronic Properties of SiO2… …Chung, G. Lucovsky, and L. J. Brillson, “Nanoscale Depth-Resolved Electronic Properties of… …Nanoscale Depth-Resolved Electronic Properties of HfO2/RPAN/Ge and HfSiON/RPAN/Ge Gate Dielectrics… …26 2.2. Depth Resolved Cathodoluminescence Spectroscopy… …71 5.4. Nanometer scale depth-resolved distribution of Li acceptor…

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APA (6^th Edition):

Zhang, Z. (2013). Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides. (Doctoral Dissertation). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518

Chicago Manual of Style (16^th Edition):

Zhang, Zhichun. “Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides.” 2013. Doctoral Dissertation, The Ohio State University. Accessed January 27, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518.

MLA Handbook (7^th Edition):

Zhang, Zhichun. “Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides.” 2013. Web. 27 Jan 2021.

Vancouver:

Zhang Z. Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides. [Internet] [Doctoral dissertation]. The Ohio State University; 2013. [cited 2021 Jan 27]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518.

Council of Science Editors:

Zhang Z. Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides. [Doctoral Dissertation]. The Ohio State University; 2013. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518

15. Lin, Chung-Han. The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes.

Degree: PhD, Electrical and Computer Engineering, 2013, The Ohio State University

URL: http://rave.ohiolink.edu/etdc/view?acc_num=osu1371466261

► We use depth-resolved cathodoluminescence spectroscopy (DRCLS), Kelvin probe force microscopy (KPFM), and surface photovoltage spectroscopy (SPS) on a nanometer scale to map the temperature, stress,… (more)

▼ We use depth-resolved cathodoluminescence spectroscopy (DRCLS), Kelvin probe force microscopy (KPFM), and surface photovoltage spectroscopy (SPS) on a nanometer scale to map the temperature, stress, and defects inside GaN high electron mobility transistors (HEMTs). DRCLS maps temperature at localized depths, in particular within the two-dimensional electron gas (2DEG) region during device operation. KPFM maps surface electric potential across the device, revealing lower potential patches that decrease rapidly with increasing off-state stress. CL spectra acquired at these patches exhibit defect emissions that increase with both on- and off-state stress and that increase with decreasing surface potential. SPS also reveals features of deep level gap states generated after device operation that reduce near band edge (NBE) emission and increase surface band bending. These techniques also reveals that electronic defects form in AlGaN layer due to field-induced stress accompanied with the decrease of the surface potential and the increase of the gate leakage current. The splitting of the AlGaN emission and the enhancement of yellow and blue band luminescence indicate crystal quality deterioration caused by stress. Our nanoscale measurements are consistent with defect mainly generation by inverse piezoelectric field-induced stress at the gate edge on the drain side at high voltage.Our DRCLS, SPS, time-resolved SPS (t-SPS), current-voltage-temperature (I-V-T) shows that fast and thermal neutron preferentially affect device properties. Fast neutron will induce defects in GaN by recoil and displacement damage whereas thermal neutron tends to enhance the interaction between metal/semiconductor interfaces due to heat. Time-resolved surface photovoltage spectroscopy (t-SPS) results reveal a defect evolution of GaN under fast neutron irradiation that indicates low fast neutron dosage will enhance GaN properties a result which is confirmed by DRCLS results. XPS results show that Ti and Ni are more resistant than other metal but will interact with GaN at higher thermal neutron fluence. Our results show that fast and thermal neutrons are both detrimental electronic devices without proper protection. Advisors/Committee Members: Brillson, Leonard (Advisor).

Subjects/Keywords: Electrical Engineering; Materials Science; Nanotechnology; AlGaN/GaN HEMT; Kelvin force probe microscopy; defect characterization; depth-resolved cathodoluminescence spectroscopy; strain mapping; surface photovoltage spectroscopy; temperature mapping; radiation; Schottky diode; electrical characterization

…41 3.1 Depth resolved cathodoluminescence spectroscopy (DRCLS)… …of depth-resolved cathodoluminescence spectroscopy (DRCLS), atomic force… …45 3.3 Surface photovoltage spectroscopy and time-resolved surface photovoltage… …electron probing energy EB varies from 1 to 10 keV with 90° incident angle. The depth indicated… …light energy equal to E2. ....... 50 Figure 3.6 An example of time resolved SPS (t-SPS…

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APA (6^th Edition):

Lin, C. (2013). The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes. (Doctoral Dissertation). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1371466261

Chicago Manual of Style (16^th Edition):

Lin, Chung-Han. “The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes.” 2013. Doctoral Dissertation, The Ohio State University. Accessed January 27, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=osu1371466261.

MLA Handbook (7^th Edition):

Lin, Chung-Han. “The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes.” 2013. Web. 27 Jan 2021.

Vancouver:

Lin C. The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes. [Internet] [Doctoral dissertation]. The Ohio State University; 2013. [cited 2021 Jan 27]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1371466261.

Council of Science Editors:

Lin C. The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes. [Doctoral Dissertation]. The Ohio State University; 2013. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1371466261

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