Advanced search options

Advanced Search Options 🞨

Browse by author name (“Author name starts with…”).

Find ETDs with:

in
/  
in
/  
in
/  
in

Written in Published in Earliest date Latest date

Sorted by

Results per page:

Sorted by: relevance · author · university · dateNew search

You searched for subject:(Radiation Hardening By Design). Showing records 1 – 30 of 62408 total matches.

[1] [2] [3] [4] [5] … [2081]

Search Limiters

Last 2 Years | English Only

Degrees

Languages

Country

▼ Search Limiters


Vanderbilt University

1. Vibbert, Daniel Scott. An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes.

Degree: MS, Electrical Engineering, 2018, Vanderbilt University

 An enhancement to an existing radiation hardening by design (RHBD) technique is proposed. The technique, Sensitive Node Active Charge Cancellation (SNACC), protects sensitive A/MS circuit… (more)

Subjects/Keywords: single-event hardening; single-event transients; single-event effects; radiation hardening by design

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Vibbert, D. S. (2018). An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-08152018-130817/ ;

Chicago Manual of Style (16th Edition):

Vibbert, Daniel Scott. “An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes.” 2018. Masters Thesis, Vanderbilt University. Accessed April 20, 2019. http://etd.library.vanderbilt.edu/available/etd-08152018-130817/ ;.

MLA Handbook (7th Edition):

Vibbert, Daniel Scott. “An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes.” 2018. Web. 20 Apr 2019.

Vancouver:

Vibbert DS. An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes. [Internet] [Masters thesis]. Vanderbilt University; 2018. [cited 2019 Apr 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-08152018-130817/ ;.

Council of Science Editors:

Vibbert DS. An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes. [Masters Thesis]. Vanderbilt University; 2018. Available from: http://etd.library.vanderbilt.edu/available/etd-08152018-130817/ ;


University of Southern California

2. Haghi, Mahta. Modeling and mitigation of radiation-induced charge sharing effects in advanced electronics.

Degree: PhD, Electrical Engineering, 2012, University of Southern California

 As semiconductor industry continues to scale down to ever smaller feature sizes, radiation-induced soft errors are becoming a major concern for microelectronics reliability. A rising… (more)

Subjects/Keywords: radiation hardening by design; sub-micron CMOS; single event upset; single event transient; charge sharing

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Haghi, M. (2012). Modeling and mitigation of radiation-induced charge sharing effects in advanced electronics. (Doctoral Dissertation). University of Southern California. Retrieved from http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll3/id/17193/rec/4116

Chicago Manual of Style (16th Edition):

Haghi, Mahta. “Modeling and mitigation of radiation-induced charge sharing effects in advanced electronics.” 2012. Doctoral Dissertation, University of Southern California. Accessed April 20, 2019. http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll3/id/17193/rec/4116.

MLA Handbook (7th Edition):

Haghi, Mahta. “Modeling and mitigation of radiation-induced charge sharing effects in advanced electronics.” 2012. Web. 20 Apr 2019.

Vancouver:

Haghi M. Modeling and mitigation of radiation-induced charge sharing effects in advanced electronics. [Internet] [Doctoral dissertation]. University of Southern California; 2012. [cited 2019 Apr 20]. Available from: http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll3/id/17193/rec/4116.

Council of Science Editors:

Haghi M. Modeling and mitigation of radiation-induced charge sharing effects in advanced electronics. [Doctoral Dissertation]. University of Southern California; 2012. Available from: http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll3/id/17193/rec/4116

3. Wang, Haibin. STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS.

Degree: 2015, University of Saskatchewan

 Microelectronic devices and systems have been extensively utilized in a variety of radiation environments, ranging from the low-earth orbit to the ground level. A high-energy… (more)

Subjects/Keywords: Single event effects; Charge sharing; nano technology; flip-flop; Radiation Hardening By Design

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Wang, H. (2015). STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS. (Thesis). University of Saskatchewan. Retrieved from http://hdl.handle.net/10388/ETD-2015-08-2101

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Wang, Haibin. “STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS.” 2015. Thesis, University of Saskatchewan. Accessed April 20, 2019. http://hdl.handle.net/10388/ETD-2015-08-2101.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Wang, Haibin. “STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS.” 2015. Web. 20 Apr 2019.

Vancouver:

Wang H. STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS. [Internet] [Thesis]. University of Saskatchewan; 2015. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/10388/ETD-2015-08-2101.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Wang H. STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS. [Thesis]. University of Saskatchewan; 2015. Available from: http://hdl.handle.net/10388/ETD-2015-08-2101

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Arizona State University

4. Schlenvogt, Garrett James. Total Dose Effects and Hardening-by-Design Methodologies for Implantable Medical Devices.

Degree: MS, Electrical Engineering, 2010, Arizona State University

 Implantable medical device technology is commonly used by doctors for disease management, aiding to improve patient quality of life. However, it is possible for these… (more)

Subjects/Keywords: Electrical Engineering; charge pump; oxide-trapped charge; Radiation Effects; radiation hardening by design; Total Ionizing Dose

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Schlenvogt, G. J. (2010). Total Dose Effects and Hardening-by-Design Methodologies for Implantable Medical Devices. (Masters Thesis). Arizona State University. Retrieved from http://repository.asu.edu/items/8683

Chicago Manual of Style (16th Edition):

Schlenvogt, Garrett James. “Total Dose Effects and Hardening-by-Design Methodologies for Implantable Medical Devices.” 2010. Masters Thesis, Arizona State University. Accessed April 20, 2019. http://repository.asu.edu/items/8683.

MLA Handbook (7th Edition):

Schlenvogt, Garrett James. “Total Dose Effects and Hardening-by-Design Methodologies for Implantable Medical Devices.” 2010. Web. 20 Apr 2019.

Vancouver:

Schlenvogt GJ. Total Dose Effects and Hardening-by-Design Methodologies for Implantable Medical Devices. [Internet] [Masters thesis]. Arizona State University; 2010. [cited 2019 Apr 20]. Available from: http://repository.asu.edu/items/8683.

Council of Science Editors:

Schlenvogt GJ. Total Dose Effects and Hardening-by-Design Methodologies for Implantable Medical Devices. [Masters Thesis]. Arizona State University; 2010. Available from: http://repository.asu.edu/items/8683


Arizona State University

5. Hindman, Nathan David. Fully Automated Radiation Hardened by Design Circuit Construction.

Degree: PhD, Electrical Engineering, 2012, Arizona State University

 A fully automated logic design methodology for radiation hardened by design (RHBD) high speed logic using fine grained triple modular redundancy (TMR) is presented. The… (more)

Subjects/Keywords: Electrical engineering; Automated Design; Radiation Hardening

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Hindman, N. D. (2012). Fully Automated Radiation Hardened by Design Circuit Construction. (Doctoral Dissertation). Arizona State University. Retrieved from http://repository.asu.edu/items/15918

Chicago Manual of Style (16th Edition):

Hindman, Nathan David. “Fully Automated Radiation Hardened by Design Circuit Construction.” 2012. Doctoral Dissertation, Arizona State University. Accessed April 20, 2019. http://repository.asu.edu/items/15918.

MLA Handbook (7th Edition):

Hindman, Nathan David. “Fully Automated Radiation Hardened by Design Circuit Construction.” 2012. Web. 20 Apr 2019.

Vancouver:

Hindman ND. Fully Automated Radiation Hardened by Design Circuit Construction. [Internet] [Doctoral dissertation]. Arizona State University; 2012. [cited 2019 Apr 20]. Available from: http://repository.asu.edu/items/15918.

Council of Science Editors:

Hindman ND. Fully Automated Radiation Hardened by Design Circuit Construction. [Doctoral Dissertation]. Arizona State University; 2012. Available from: http://repository.asu.edu/items/15918


Georgia Tech

6. Sutton, Akil Khamisi. Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits.

Degree: PhD, Electrical and Computer Engineering, 2009, Georgia Tech

 Hydrocarbon exploration, global navigation satellite systems, computed tomography, and aircraft avionics are just a few examples of applications that require system operation at an ambient… (more)

Subjects/Keywords: Bit error rate testing; Displacement damage; Heterojunction bipolar transistor; Radiation effects; Radiation hardening by design; Silicon germanium; Single event upset; Ionization; Heterojunctions; Bipolar transistors; Logic circuits; Radiation hardening; Hardness; Germanium compounds; Silicon compounds; Extreme environments

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Sutton, A. K. (2009). Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/29778

Chicago Manual of Style (16th Edition):

Sutton, Akil Khamisi. “Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits.” 2009. Doctoral Dissertation, Georgia Tech. Accessed April 20, 2019. http://hdl.handle.net/1853/29778.

MLA Handbook (7th Edition):

Sutton, Akil Khamisi. “Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits.” 2009. Web. 20 Apr 2019.

Vancouver:

Sutton AK. Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits. [Internet] [Doctoral dissertation]. Georgia Tech; 2009. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/1853/29778.

Council of Science Editors:

Sutton AK. Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits. [Doctoral Dissertation]. Georgia Tech; 2009. Available from: http://hdl.handle.net/1853/29778


Vanderbilt University

7. Shetler, Kevin Joseph. Temperature and Total Ionizing Dose Characterization of a Voltage Reference in a 180 nm CMOS Technology.

Degree: MS, Electrical Engineering, 2016, Vanderbilt University

 A voltage reference is a critical component of analog and mixed signal systems because it provides a global signal used for a variety of system… (more)

Subjects/Keywords: TID; radiation-hardened-by-design

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Shetler, K. J. (2016). Temperature and Total Ionizing Dose Characterization of a Voltage Reference in a 180 nm CMOS Technology. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-04082016-164141/ ;

Chicago Manual of Style (16th Edition):

Shetler, Kevin Joseph. “Temperature and Total Ionizing Dose Characterization of a Voltage Reference in a 180 nm CMOS Technology.” 2016. Masters Thesis, Vanderbilt University. Accessed April 20, 2019. http://etd.library.vanderbilt.edu/available/etd-04082016-164141/ ;.

MLA Handbook (7th Edition):

Shetler, Kevin Joseph. “Temperature and Total Ionizing Dose Characterization of a Voltage Reference in a 180 nm CMOS Technology.” 2016. Web. 20 Apr 2019.

Vancouver:

Shetler KJ. Temperature and Total Ionizing Dose Characterization of a Voltage Reference in a 180 nm CMOS Technology. [Internet] [Masters thesis]. Vanderbilt University; 2016. [cited 2019 Apr 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-04082016-164141/ ;.

Council of Science Editors:

Shetler KJ. Temperature and Total Ionizing Dose Characterization of a Voltage Reference in a 180 nm CMOS Technology. [Masters Thesis]. Vanderbilt University; 2016. Available from: http://etd.library.vanderbilt.edu/available/etd-04082016-164141/ ;

8. Glorieux, Maximilien. Durcissement par conception (RHBD) et modélisation des évènements singuliers dans les circuits intégrés numériques en technologies Bulk 65 nm et FDSOI 28 nm : Radiation-Hardening-By-Design (RHDB) and modeling of single event effects in digital circuits manufactured in Bulk 65 nm and FDSOI 28 nm.

Degree: Docteur es, Micro et Nanoélectronique, 2014, Aix Marseille Université

La miniaturisation des circuits intégrés numériques tend à augmenter leur sensibilité aux radiations. Ainsi le rayonnement naturel peut induire des événements singuliers et porter atteinte… (more)

Subjects/Keywords: Microélectronique; Effets des radiations; Événement singuliers; Durcissement par conception; Conception de circuit numériques; Modélisation; Bascule robuste aux radiation; Aléa logique; Microelectronic; Radiation effects; Single event effet; Radiation hardening by design; Digital design; Modeling; Radiation hardened latch; Single event upset

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Glorieux, M. (2014). Durcissement par conception (RHBD) et modélisation des évènements singuliers dans les circuits intégrés numériques en technologies Bulk 65 nm et FDSOI 28 nm : Radiation-Hardening-By-Design (RHDB) and modeling of single event effects in digital circuits manufactured in Bulk 65 nm and FDSOI 28 nm. (Doctoral Dissertation). Aix Marseille Université. Retrieved from http://www.theses.fr/2014AIXM4725

Chicago Manual of Style (16th Edition):

Glorieux, Maximilien. “Durcissement par conception (RHBD) et modélisation des évènements singuliers dans les circuits intégrés numériques en technologies Bulk 65 nm et FDSOI 28 nm : Radiation-Hardening-By-Design (RHDB) and modeling of single event effects in digital circuits manufactured in Bulk 65 nm and FDSOI 28 nm.” 2014. Doctoral Dissertation, Aix Marseille Université. Accessed April 20, 2019. http://www.theses.fr/2014AIXM4725.

MLA Handbook (7th Edition):

Glorieux, Maximilien. “Durcissement par conception (RHBD) et modélisation des évènements singuliers dans les circuits intégrés numériques en technologies Bulk 65 nm et FDSOI 28 nm : Radiation-Hardening-By-Design (RHDB) and modeling of single event effects in digital circuits manufactured in Bulk 65 nm and FDSOI 28 nm.” 2014. Web. 20 Apr 2019.

Vancouver:

Glorieux M. Durcissement par conception (RHBD) et modélisation des évènements singuliers dans les circuits intégrés numériques en technologies Bulk 65 nm et FDSOI 28 nm : Radiation-Hardening-By-Design (RHDB) and modeling of single event effects in digital circuits manufactured in Bulk 65 nm and FDSOI 28 nm. [Internet] [Doctoral dissertation]. Aix Marseille Université 2014. [cited 2019 Apr 20]. Available from: http://www.theses.fr/2014AIXM4725.

Council of Science Editors:

Glorieux M. Durcissement par conception (RHBD) et modélisation des évènements singuliers dans les circuits intégrés numériques en technologies Bulk 65 nm et FDSOI 28 nm : Radiation-Hardening-By-Design (RHDB) and modeling of single event effects in digital circuits manufactured in Bulk 65 nm and FDSOI 28 nm. [Doctoral Dissertation]. Aix Marseille Université 2014. Available from: http://www.theses.fr/2014AIXM4725

9. Armstrong, Sarah E. Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices.

Degree: PhD, Electrical Engineering, 2011, Vanderbilt University

 High-speed communication systems employ a mix of signal types and circuit topologies in order to optimize efficient data propagation. Typical serializer-deserializer (SerDes) circuits include three… (more)

Subjects/Keywords: Communications Devices; Radiation Hardening by Design; Single-Event Effects

…x29; radiation-hardening-by-design (RHBD) of a high-speed communications device. A… …Radiation-Hardened by Design SE… …proximity as allowed by layout design rules. The circled area of the schematic indicates the… …and terrestrial radiation environments faced by personal computers or a video gaming systems… …circuit (IC) presents design challenges that are compounded when radiation robustness… 

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Armstrong, S. E. (2011). Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-12092011-021148/ ;

Chicago Manual of Style (16th Edition):

Armstrong, Sarah E. “Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices.” 2011. Doctoral Dissertation, Vanderbilt University. Accessed April 20, 2019. http://etd.library.vanderbilt.edu/available/etd-12092011-021148/ ;.

MLA Handbook (7th Edition):

Armstrong, Sarah E. “Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices.” 2011. Web. 20 Apr 2019.

Vancouver:

Armstrong SE. Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices. [Internet] [Doctoral dissertation]. Vanderbilt University; 2011. [cited 2019 Apr 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-12092011-021148/ ;.

Council of Science Editors:

Armstrong SE. Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices. [Doctoral Dissertation]. Vanderbilt University; 2011. Available from: http://etd.library.vanderbilt.edu/available/etd-12092011-021148/ ;


Delft University of Technology

10. Tan, J. 4T CMOS Active Pixel Sensors under Ionizing Radiation.

Degree: 2013, Delft University of Technology

 This thesis investigates the ionizing radiation effects on 4T pixels and the elementary in-pixel test devices with regard to the electrical performance and the optical… (more)

Subjects/Keywords: 4T Pixel; CMOS Image Sensor; Radiation-Hardening-by-Design; Dark Signal; Degradation Mechanism

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tan, J. (2013). 4T CMOS Active Pixel Sensors under Ionizing Radiation. (Doctoral Dissertation). Delft University of Technology. Retrieved from http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f

Chicago Manual of Style (16th Edition):

Tan, J. “4T CMOS Active Pixel Sensors under Ionizing Radiation.” 2013. Doctoral Dissertation, Delft University of Technology. Accessed April 20, 2019. http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f.

MLA Handbook (7th Edition):

Tan, J. “4T CMOS Active Pixel Sensors under Ionizing Radiation.” 2013. Web. 20 Apr 2019.

Vancouver:

Tan J. 4T CMOS Active Pixel Sensors under Ionizing Radiation. [Internet] [Doctoral dissertation]. Delft University of Technology; 2013. [cited 2019 Apr 20]. Available from: http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f.

Council of Science Editors:

Tan J. 4T CMOS Active Pixel Sensors under Ionizing Radiation. [Doctoral Dissertation]. Delft University of Technology; 2013. Available from: http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; urn:NBN:nl:ui:24-uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f ; http://resolver.tudelft.nl/uuid:12cb7563-45db-4824-bcf7-8f5af11ff52f


University of New Mexico

11. Devarapalli, Vallabh Srikanth. Circuit designs for low-power and SEU-hardened systems.

Degree: Electrical and Computer Engineering, 2009, University of New Mexico

 The desire to have smaller and faster portable devices is one of the primary motivations for technology scaling. Though advancements in device physics are moving… (more)

Subjects/Keywords: Low voltage integrated circuits – Design and construction; Radiation hardening.

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Devarapalli, V. S. (2009). Circuit designs for low-power and SEU-hardened systems. (Masters Thesis). University of New Mexico. Retrieved from http://hdl.handle.net/1928/9359

Chicago Manual of Style (16th Edition):

Devarapalli, Vallabh Srikanth. “Circuit designs for low-power and SEU-hardened systems.” 2009. Masters Thesis, University of New Mexico. Accessed April 20, 2019. http://hdl.handle.net/1928/9359.

MLA Handbook (7th Edition):

Devarapalli, Vallabh Srikanth. “Circuit designs for low-power and SEU-hardened systems.” 2009. Web. 20 Apr 2019.

Vancouver:

Devarapalli VS. Circuit designs for low-power and SEU-hardened systems. [Internet] [Masters thesis]. University of New Mexico; 2009. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/1928/9359.

Council of Science Editors:

Devarapalli VS. Circuit designs for low-power and SEU-hardened systems. [Masters Thesis]. University of New Mexico; 2009. Available from: http://hdl.handle.net/1928/9359

12. Walldén, Johan. Radiation Induced Effects in Electronic Devices and Radiation Hardening By Design Techniques.

Degree: The Institute of Technology, 2014, Linköping UniversityLinköping University

  The aim with this thesis has been to make a survey of radiation hardened electronics, explaining why and how radiation affects electronics and what… (more)

Subjects/Keywords: Radiation; Radiation Hardening By Design; RHBD; Displacement Damage; DDD; Total Ionizing

…33 4 Radiation Hardening by Design 4.1 35 Device level… …Integrated Circuit Radiation Hardening By Design Triple Modular Redundancy Dual Interlocked storage… …by radiation [19]. . . . . . . . . . . . . . . . . 18 3.8 Conceptual… …radiation induced leakage transistors by the enclosing gate… …and damages caused by radiation in electronic systems and how they can be protected. The… 

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Walldén, J. (2014). Radiation Induced Effects in Electronic Devices and Radiation Hardening By Design Techniques. (Thesis). Linköping UniversityLinköping University. Retrieved from http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-109343

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Walldén, Johan. “Radiation Induced Effects in Electronic Devices and Radiation Hardening By Design Techniques.” 2014. Thesis, Linköping UniversityLinköping University. Accessed April 20, 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-109343.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Walldén, Johan. “Radiation Induced Effects in Electronic Devices and Radiation Hardening By Design Techniques.” 2014. Web. 20 Apr 2019.

Vancouver:

Walldén J. Radiation Induced Effects in Electronic Devices and Radiation Hardening By Design Techniques. [Internet] [Thesis]. Linköping UniversityLinköping University; 2014. [cited 2019 Apr 20]. Available from: http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-109343.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Walldén J. Radiation Induced Effects in Electronic Devices and Radiation Hardening By Design Techniques. [Thesis]. Linköping UniversityLinköping University; 2014. Available from: http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-109343

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Arizona State University

13. Shambhulingaiah, Sandeep. Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation.

Degree: Electrical Engineering, 2015, Arizona State University

Subjects/Keywords: Electrical engineering; Flip-flop; Methodology; Multi node charge collection; Radiation hardening by design; Single Event Transient (SET); Single Event Upset (SEU)

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Shambhulingaiah, S. (2015). Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation. (Doctoral Dissertation). Arizona State University. Retrieved from http://repository.asu.edu/items/29650

Chicago Manual of Style (16th Edition):

Shambhulingaiah, Sandeep. “Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation.” 2015. Doctoral Dissertation, Arizona State University. Accessed April 20, 2019. http://repository.asu.edu/items/29650.

MLA Handbook (7th Edition):

Shambhulingaiah, Sandeep. “Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation.” 2015. Web. 20 Apr 2019.

Vancouver:

Shambhulingaiah S. Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation. [Internet] [Doctoral dissertation]. Arizona State University; 2015. [cited 2019 Apr 20]. Available from: http://repository.asu.edu/items/29650.

Council of Science Editors:

Shambhulingaiah S. Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation. [Doctoral Dissertation]. Arizona State University; 2015. Available from: http://repository.asu.edu/items/29650

14. Maillard, Pierre. Single event transient modeling and mitigation techniques for mixed-signal delay locked loop (DLL) and clock circuits.

Degree: PhD, Electrical Engineering, 2014, Vanderbilt University

 The purpose of this PhD work has been to investigate, model, test, develop and provide hardening techniques and guidelines for the mitigation of single event… (more)

Subjects/Keywords: Analog Mixed Signals; Delay Locked Loop; Radiation Hardening By Design; Single Event Transients

…means that the hardening solution can be applied to a circuit meeting the design specs and the… …hardening techniques for, analog DLLs. Therefore, it is critical that radiation2 hardened-by… …design (RHBD) DLLs, resilient to errors due to radiation effects, be developed for… …hardened-by-design (RHBD) techniques to mitigate single event transients in mixed… …performance and radiation response of the developed hardening techniques (implemented in RHBD… 

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Maillard, P. (2014). Single event transient modeling and mitigation techniques for mixed-signal delay locked loop (DLL) and clock circuits. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03292014-104403/ ;

Chicago Manual of Style (16th Edition):

Maillard, Pierre. “Single event transient modeling and mitigation techniques for mixed-signal delay locked loop (DLL) and clock circuits.” 2014. Doctoral Dissertation, Vanderbilt University. Accessed April 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03292014-104403/ ;.

MLA Handbook (7th Edition):

Maillard, Pierre. “Single event transient modeling and mitigation techniques for mixed-signal delay locked loop (DLL) and clock circuits.” 2014. Web. 20 Apr 2019.

Vancouver:

Maillard P. Single event transient modeling and mitigation techniques for mixed-signal delay locked loop (DLL) and clock circuits. [Internet] [Doctoral dissertation]. Vanderbilt University; 2014. [cited 2019 Apr 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03292014-104403/ ;.

Council of Science Editors:

Maillard P. Single event transient modeling and mitigation techniques for mixed-signal delay locked loop (DLL) and clock circuits. [Doctoral Dissertation]. Vanderbilt University; 2014. Available from: http://etd.library.vanderbilt.edu/available/etd-03292014-104403/ ;

15. Wang, Tao. Study of Single-Event Transient Effects on Analog Circuits.

Degree: 2011, University of Saskatchewan

Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecraft electronics. Transient effects on circuits and systems from high energetic particles… (more)

Subjects/Keywords: Integrated Circuit; Complementary Metal-Oxide-Semiconductor; Radiation-Hardening-by-Design; Single-Event Transient; Single-Event Effects

Radiation Absorbed Dose RHBD Radiation-Hardening-by-Design RF Radio Frequency xv RO Ring… …approach is called radiation-hardening-by-design (RHBD) [18]. The 3 RHBD… …hardening can be implemented at the process level by foundries to meet specified radiation… …expensive manufacturing processes. Radiation-hardening can also be achieved by designs at… …96 Figure 6.14 Output waveform of the PLL under SETs event with radiation hardened design… 

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Wang, T. (2011). Study of Single-Event Transient Effects on Analog Circuits. (Thesis). University of Saskatchewan. Retrieved from http://hdl.handle.net/10388/ETD-2011-08-45

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Wang, Tao. “Study of Single-Event Transient Effects on Analog Circuits.” 2011. Thesis, University of Saskatchewan. Accessed April 20, 2019. http://hdl.handle.net/10388/ETD-2011-08-45.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Wang, Tao. “Study of Single-Event Transient Effects on Analog Circuits.” 2011. Web. 20 Apr 2019.

Vancouver:

Wang T. Study of Single-Event Transient Effects on Analog Circuits. [Internet] [Thesis]. University of Saskatchewan; 2011. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/10388/ETD-2011-08-45.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Wang T. Study of Single-Event Transient Effects on Analog Circuits. [Thesis]. University of Saskatchewan; 2011. Available from: http://hdl.handle.net/10388/ETD-2011-08-45

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Arizona State University

16. Matush, Bradley. An Innovative Radiation Hardened By Design Flip-Flop.

Degree: MS, Electrical Engineering, 2010, Arizona State University

Radiation hardening by design (RHBD) has become a necessary practice when creating circuits to operate within radiated environments. While employing RHBD techniques has tradeoffs between… (more)

Subjects/Keywords: Electrical Engineering; Flip-Flop; Radiation Hardened By Design; Sequential Circuits

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Matush, B. (2010). An Innovative Radiation Hardened By Design Flip-Flop. (Masters Thesis). Arizona State University. Retrieved from http://repository.asu.edu/items/8782

Chicago Manual of Style (16th Edition):

Matush, Bradley. “An Innovative Radiation Hardened By Design Flip-Flop.” 2010. Masters Thesis, Arizona State University. Accessed April 20, 2019. http://repository.asu.edu/items/8782.

MLA Handbook (7th Edition):

Matush, Bradley. “An Innovative Radiation Hardened By Design Flip-Flop.” 2010. Web. 20 Apr 2019.

Vancouver:

Matush B. An Innovative Radiation Hardened By Design Flip-Flop. [Internet] [Masters thesis]. Arizona State University; 2010. [cited 2019 Apr 20]. Available from: http://repository.asu.edu/items/8782.

Council of Science Editors:

Matush B. An Innovative Radiation Hardened By Design Flip-Flop. [Masters Thesis]. Arizona State University; 2010. Available from: http://repository.asu.edu/items/8782


Universidade do Rio Grande do Sul

17. Ferreira, Ronaldo Rodrigues. The transactional HW/SW stack for fault tolerant embedded computing.

Degree: 2015, Universidade do Rio Grande do Sul

Fault tolerance implementation in embedded systems is challenging because the physical constraints of area occupation, power dissipation, and energy consumption of these systems. The need… (more)

Subjects/Keywords: Compiler design; Microeletrônica; Coverage; Sistemas embarcados; Tolerancia : Falhas; Error detection; Error recovery; Fault injection; Hardening by design; Latency; LLVM; Modular redundancy; Register file; Rollback; Single event effects; Soft error

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Ferreira, R. R. (2015). The transactional HW/SW stack for fault tolerant embedded computing. (Thesis). Universidade do Rio Grande do Sul. Retrieved from http://hdl.handle.net/10183/114607

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Ferreira, Ronaldo Rodrigues. “The transactional HW/SW stack for fault tolerant embedded computing.” 2015. Thesis, Universidade do Rio Grande do Sul. Accessed April 20, 2019. http://hdl.handle.net/10183/114607.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Ferreira, Ronaldo Rodrigues. “The transactional HW/SW stack for fault tolerant embedded computing.” 2015. Web. 20 Apr 2019.

Vancouver:

Ferreira RR. The transactional HW/SW stack for fault tolerant embedded computing. [Internet] [Thesis]. Universidade do Rio Grande do Sul; 2015. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/10183/114607.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Ferreira RR. The transactional HW/SW stack for fault tolerant embedded computing. [Thesis]. Universidade do Rio Grande do Sul; 2015. Available from: http://hdl.handle.net/10183/114607

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Arizona State University

18. Chellappa, Srivatsan. Radiation Hardened Clock Design.

Degree: Electrical Engineering, 2015, Arizona State University

Subjects/Keywords: Electrical engineering; Clock; Radiation Hardened by Design; VLSI

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Chellappa, S. (2015). Radiation Hardened Clock Design. (Doctoral Dissertation). Arizona State University. Retrieved from http://repository.asu.edu/items/34876

Chicago Manual of Style (16th Edition):

Chellappa, Srivatsan. “Radiation Hardened Clock Design.” 2015. Doctoral Dissertation, Arizona State University. Accessed April 20, 2019. http://repository.asu.edu/items/34876.

MLA Handbook (7th Edition):

Chellappa, Srivatsan. “Radiation Hardened Clock Design.” 2015. Web. 20 Apr 2019.

Vancouver:

Chellappa S. Radiation Hardened Clock Design. [Internet] [Doctoral dissertation]. Arizona State University; 2015. [cited 2019 Apr 20]. Available from: http://repository.asu.edu/items/34876.

Council of Science Editors:

Chellappa S. Radiation Hardened Clock Design. [Doctoral Dissertation]. Arizona State University; 2015. Available from: http://repository.asu.edu/items/34876


Vanderbilt University

19. Olson, Brian David. Single-Event Effect Mitigation in Pipelined Analog-to-Digital Converters.

Degree: PhD, Electrical Engineering, 2010, Vanderbilt University

 Analog-to-digital converters (ADCs) are necessary circuits in many space, military, and medical circuit applications. Intelligence, surveillance, reconnaissance, and communication missions all require high performance ADCs.… (more)

Subjects/Keywords: single-events; SEU; SEE; RHBD; radiation hardened by design; ADC; single-event effects; analog-to-digital converters

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Olson, B. D. (2010). Single-Event Effect Mitigation in Pipelined Analog-to-Digital Converters. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-12102010-152348/ ;

Chicago Manual of Style (16th Edition):

Olson, Brian David. “Single-Event Effect Mitigation in Pipelined Analog-to-Digital Converters.” 2010. Doctoral Dissertation, Vanderbilt University. Accessed April 20, 2019. http://etd.library.vanderbilt.edu/available/etd-12102010-152348/ ;.

MLA Handbook (7th Edition):

Olson, Brian David. “Single-Event Effect Mitigation in Pipelined Analog-to-Digital Converters.” 2010. Web. 20 Apr 2019.

Vancouver:

Olson BD. Single-Event Effect Mitigation in Pipelined Analog-to-Digital Converters. [Internet] [Doctoral dissertation]. Vanderbilt University; 2010. [cited 2019 Apr 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-12102010-152348/ ;.

Council of Science Editors:

Olson BD. Single-Event Effect Mitigation in Pipelined Analog-to-Digital Converters. [Doctoral Dissertation]. Vanderbilt University; 2010. Available from: http://etd.library.vanderbilt.edu/available/etd-12102010-152348/ ;


University of Oulu

20. Avellan, K. (Kari). Limit state design for strengthening foundations of historic buildings using pretested drilled spiral piles with special reference to St. John’s Church in Tartu.

Degree: 2011, University of Oulu

Abstract This thesis discusses strengthening foundations of historic buildings by means of pretested, end-jacked, steel piles; pretested, end-jacked drilled spiral steel piles, as well as… (more)

Subjects/Keywords: anastylosis principle; combined structural and geotechnical design in ULS; pretested drilled spiral piles; soil hardening by preloading piles and by end-jacking; anastylosis periaate; maanlujittuminen esikuormituksilla ja loppupuristuksilla; rakenne- ja geotekninen suunnittelu murtorajatilassa; spiraaliporapaalu

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Avellan, K. (. (2011). Limit state design for strengthening foundations of historic buildings using pretested drilled spiral piles with special reference to St. John’s Church in Tartu. (Doctoral Dissertation). University of Oulu. Retrieved from http://urn.fi/urn:isbn:9789514295775

Chicago Manual of Style (16th Edition):

Avellan, K (Kari). “Limit state design for strengthening foundations of historic buildings using pretested drilled spiral piles with special reference to St. John’s Church in Tartu.” 2011. Doctoral Dissertation, University of Oulu. Accessed April 20, 2019. http://urn.fi/urn:isbn:9789514295775.

MLA Handbook (7th Edition):

Avellan, K (Kari). “Limit state design for strengthening foundations of historic buildings using pretested drilled spiral piles with special reference to St. John’s Church in Tartu.” 2011. Web. 20 Apr 2019.

Vancouver:

Avellan K(. Limit state design for strengthening foundations of historic buildings using pretested drilled spiral piles with special reference to St. John’s Church in Tartu. [Internet] [Doctoral dissertation]. University of Oulu; 2011. [cited 2019 Apr 20]. Available from: http://urn.fi/urn:isbn:9789514295775.

Council of Science Editors:

Avellan K(. Limit state design for strengthening foundations of historic buildings using pretested drilled spiral piles with special reference to St. John’s Church in Tartu. [Doctoral Dissertation]. University of Oulu; 2011. Available from: http://urn.fi/urn:isbn:9789514295775


Vanderbilt University

21. Amusan, Oluwole Ayodele. Analysis of single event vulnerabilities in a 130 nm CMOS technology.

Degree: MS, Electrical Engineering, 2006, Vanderbilt University

 The amount of charge required to represent a logic state in CMOS digital circuits has been reduced dramatically with the scaling of supply voltage and… (more)

Subjects/Keywords: Metal oxide semiconductors Complementary  – Design and construction; deep submicron; Radiation hardening; Metal oxide semiconductors Complementary  – Effect of radiation on

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Amusan, O. A. (2006). Analysis of single event vulnerabilities in a 130 nm CMOS technology. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-09012006-114826/ ;

Chicago Manual of Style (16th Edition):

Amusan, Oluwole Ayodele. “Analysis of single event vulnerabilities in a 130 nm CMOS technology.” 2006. Masters Thesis, Vanderbilt University. Accessed April 20, 2019. http://etd.library.vanderbilt.edu/available/etd-09012006-114826/ ;.

MLA Handbook (7th Edition):

Amusan, Oluwole Ayodele. “Analysis of single event vulnerabilities in a 130 nm CMOS technology.” 2006. Web. 20 Apr 2019.

Vancouver:

Amusan OA. Analysis of single event vulnerabilities in a 130 nm CMOS technology. [Internet] [Masters thesis]. Vanderbilt University; 2006. [cited 2019 Apr 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-09012006-114826/ ;.

Council of Science Editors:

Amusan OA. Analysis of single event vulnerabilities in a 130 nm CMOS technology. [Masters Thesis]. Vanderbilt University; 2006. Available from: http://etd.library.vanderbilt.edu/available/etd-09012006-114826/ ;


Georgia Tech

22. Dunn, Aaron Yehudah. Radiation damage accumulation and associated mechanical hardening in thin films and bulk materials.

Degree: PhD, Mechanical Engineering, 2016, Georgia Tech

 The overall purpose of this dissertation is to develop a multi-scale framework that can simulate radiation defect accumulation across a broad range of time and… (more)

Subjects/Keywords: Radiation damage; Cluster dynamics; Stochastic cluster dynamics; Radiation hardening; Ion irradiation; Neutron irradiation

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Dunn, A. Y. (2016). Radiation damage accumulation and associated mechanical hardening in thin films and bulk materials. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/54959

Chicago Manual of Style (16th Edition):

Dunn, Aaron Yehudah. “Radiation damage accumulation and associated mechanical hardening in thin films and bulk materials.” 2016. Doctoral Dissertation, Georgia Tech. Accessed April 20, 2019. http://hdl.handle.net/1853/54959.

MLA Handbook (7th Edition):

Dunn, Aaron Yehudah. “Radiation damage accumulation and associated mechanical hardening in thin films and bulk materials.” 2016. Web. 20 Apr 2019.

Vancouver:

Dunn AY. Radiation damage accumulation and associated mechanical hardening in thin films and bulk materials. [Internet] [Doctoral dissertation]. Georgia Tech; 2016. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/1853/54959.

Council of Science Editors:

Dunn AY. Radiation damage accumulation and associated mechanical hardening in thin films and bulk materials. [Doctoral Dissertation]. Georgia Tech; 2016. Available from: http://hdl.handle.net/1853/54959


Georgia Tech

23. Lourenco, Nelson Estacio. Mitigation of transient radiation effects in advanced silicon-germanium technologies.

Degree: PhD, Electrical and Computer Engineering, 2016, Georgia Tech

 The need for flexible, low-cost electronics in extreme environment applications has brought silicon-germanium (SiGe) technologies into the spotlight, but the viable long-term capability of these… (more)

Subjects/Keywords: SiGe; Radiation; Hardening; Silicon-germanium; Single-event effects

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Lourenco, N. E. (2016). Mitigation of transient radiation effects in advanced silicon-germanium technologies. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/58187

Chicago Manual of Style (16th Edition):

Lourenco, Nelson Estacio. “Mitigation of transient radiation effects in advanced silicon-germanium technologies.” 2016. Doctoral Dissertation, Georgia Tech. Accessed April 20, 2019. http://hdl.handle.net/1853/58187.

MLA Handbook (7th Edition):

Lourenco, Nelson Estacio. “Mitigation of transient radiation effects in advanced silicon-germanium technologies.” 2016. Web. 20 Apr 2019.

Vancouver:

Lourenco NE. Mitigation of transient radiation effects in advanced silicon-germanium technologies. [Internet] [Doctoral dissertation]. Georgia Tech; 2016. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/1853/58187.

Council of Science Editors:

Lourenco NE. Mitigation of transient radiation effects in advanced silicon-germanium technologies. [Doctoral Dissertation]. Georgia Tech; 2016. Available from: http://hdl.handle.net/1853/58187


Wright State University

24. Pemberton, Thomas B. A Structured ASIC Approach to a Radiation Hardened by Design Digital Single Sideband Modulator for Digital Radio Frequency Memories.

Degree: MSEgr, Electrical Engineering, 2010, Wright State University

  Digital Radio Frequency Memories (DRFM) are widely used as modules in digital signal processing. These modules can provide several forms of signal manipulation and… (more)

Subjects/Keywords: Electrical Engineering; Engineering; Digital Signal Processing; Hilbert Filter; Radiation Hardening

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Pemberton, T. B. (2010). A Structured ASIC Approach to a Radiation Hardened by Design Digital Single Sideband Modulator for Digital Radio Frequency Memories. (Masters Thesis). Wright State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=wright1277861601

Chicago Manual of Style (16th Edition):

Pemberton, Thomas B. “A Structured ASIC Approach to a Radiation Hardened by Design Digital Single Sideband Modulator for Digital Radio Frequency Memories.” 2010. Masters Thesis, Wright State University. Accessed April 20, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=wright1277861601.

MLA Handbook (7th Edition):

Pemberton, Thomas B. “A Structured ASIC Approach to a Radiation Hardened by Design Digital Single Sideband Modulator for Digital Radio Frequency Memories.” 2010. Web. 20 Apr 2019.

Vancouver:

Pemberton TB. A Structured ASIC Approach to a Radiation Hardened by Design Digital Single Sideband Modulator for Digital Radio Frequency Memories. [Internet] [Masters thesis]. Wright State University; 2010. [cited 2019 Apr 20]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=wright1277861601.

Council of Science Editors:

Pemberton TB. A Structured ASIC Approach to a Radiation Hardened by Design Digital Single Sideband Modulator for Digital Radio Frequency Memories. [Masters Thesis]. Wright State University; 2010. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=wright1277861601


Universidade do Rio Grande do Sul

25. Leite, Franco Ripoll. Estudo e implementação de um microcontrolador tolerante à radiação.

Degree: 2009, Universidade do Rio Grande do Sul

Neste trabalho foi elaborado um microcontrolador 8051 tolerante à radiação, usando para isso técnicas de recomputação de instruções. A base para este trabalho foi a… (more)

Subjects/Keywords: 8051 microcontroller; Microcontroladores; Microprocessadores; Re-computation; Radiação; Radiation hardening; Bulk- BICS

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Leite, F. R. (2009). Estudo e implementação de um microcontrolador tolerante à radiação. (Thesis). Universidade do Rio Grande do Sul. Retrieved from http://hdl.handle.net/10183/18991

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Leite, Franco Ripoll. “Estudo e implementação de um microcontrolador tolerante à radiação.” 2009. Thesis, Universidade do Rio Grande do Sul. Accessed April 20, 2019. http://hdl.handle.net/10183/18991.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Leite, Franco Ripoll. “Estudo e implementação de um microcontrolador tolerante à radiação.” 2009. Web. 20 Apr 2019.

Vancouver:

Leite FR. Estudo e implementação de um microcontrolador tolerante à radiação. [Internet] [Thesis]. Universidade do Rio Grande do Sul; 2009. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/10183/18991.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Leite FR. Estudo e implementação de um microcontrolador tolerante à radiação. [Thesis]. Universidade do Rio Grande do Sul; 2009. Available from: http://hdl.handle.net/10183/18991

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Arkansas

26. Brady, John Davis. Radiation-Hardened Delay-Insensitive Asynchronous Circuits for Multi-Bit SEU Mitigation and Data-Retaining SEL Protection.

Degree: MSCmpE, 2014, University of Arkansas

Radiation can have highly damaging effects on circuitry, especially for space applications, if designed without radiation-hardening mechanisms. Delay-insensitive asynchronous circuits inherently have promising potentials… (more)

Subjects/Keywords: Asynchronous; Radiation Hardening; SEL Protection; SEU Mitigation; Digital Circuits

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Brady, J. D. (2014). Radiation-Hardened Delay-Insensitive Asynchronous Circuits for Multi-Bit SEU Mitigation and Data-Retaining SEL Protection. (Masters Thesis). University of Arkansas. Retrieved from https://scholarworks.uark.edu/etd/2299

Chicago Manual of Style (16th Edition):

Brady, John Davis. “Radiation-Hardened Delay-Insensitive Asynchronous Circuits for Multi-Bit SEU Mitigation and Data-Retaining SEL Protection.” 2014. Masters Thesis, University of Arkansas. Accessed April 20, 2019. https://scholarworks.uark.edu/etd/2299.

MLA Handbook (7th Edition):

Brady, John Davis. “Radiation-Hardened Delay-Insensitive Asynchronous Circuits for Multi-Bit SEU Mitigation and Data-Retaining SEL Protection.” 2014. Web. 20 Apr 2019.

Vancouver:

Brady JD. Radiation-Hardened Delay-Insensitive Asynchronous Circuits for Multi-Bit SEU Mitigation and Data-Retaining SEL Protection. [Internet] [Masters thesis]. University of Arkansas; 2014. [cited 2019 Apr 20]. Available from: https://scholarworks.uark.edu/etd/2299.

Council of Science Editors:

Brady JD. Radiation-Hardened Delay-Insensitive Asynchronous Circuits for Multi-Bit SEU Mitigation and Data-Retaining SEL Protection. [Masters Thesis]. University of Arkansas; 2014. Available from: https://scholarworks.uark.edu/etd/2299


Arizona State University

27. Ramamurthy, Chandarasekaran. Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures.

Degree: Electrical Engineering, 2017, Arizona State University

Subjects/Keywords: Electrical engineering; Aerospace engineering; Computer engineering; CAD; Circuit Design; IC Design; MNCC; Radiation Hardening; VLSI

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Ramamurthy, C. (2017). Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures. (Doctoral Dissertation). Arizona State University. Retrieved from http://repository.asu.edu/items/45554

Chicago Manual of Style (16th Edition):

Ramamurthy, Chandarasekaran. “Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures.” 2017. Doctoral Dissertation, Arizona State University. Accessed April 20, 2019. http://repository.asu.edu/items/45554.

MLA Handbook (7th Edition):

Ramamurthy, Chandarasekaran. “Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures.” 2017. Web. 20 Apr 2019.

Vancouver:

Ramamurthy C. Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures. [Internet] [Doctoral dissertation]. Arizona State University; 2017. [cited 2019 Apr 20]. Available from: http://repository.asu.edu/items/45554.

Council of Science Editors:

Ramamurthy C. Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures. [Doctoral Dissertation]. Arizona State University; 2017. Available from: http://repository.asu.edu/items/45554


University of Southern California

28. Naseer, Riaz. A framework for soft error tolerant SRAM design.

Degree: PhD, Electrical Engineering, 2008, University of Southern California

 With aggressive technology scaling, radiation-induced soft errors have become a major threat to microelectronics reliability. SRAM cells in deep sub-micron technologies particularly suffer most from… (more)

Subjects/Keywords: circuit design; error correcting codes; memory reliability; single event effects; soft errors; SRAM; radiation hardening

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Naseer, R. (2008). A framework for soft error tolerant SRAM design. (Doctoral Dissertation). University of Southern California. Retrieved from http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/127659/rec/192

Chicago Manual of Style (16th Edition):

Naseer, Riaz. “A framework for soft error tolerant SRAM design.” 2008. Doctoral Dissertation, University of Southern California. Accessed April 20, 2019. http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/127659/rec/192.

MLA Handbook (7th Edition):

Naseer, Riaz. “A framework for soft error tolerant SRAM design.” 2008. Web. 20 Apr 2019.

Vancouver:

Naseer R. A framework for soft error tolerant SRAM design. [Internet] [Doctoral dissertation]. University of Southern California; 2008. [cited 2019 Apr 20]. Available from: http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/127659/rec/192.

Council of Science Editors:

Naseer R. A framework for soft error tolerant SRAM design. [Doctoral Dissertation]. University of Southern California; 2008. Available from: http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/127659/rec/192


Vanderbilt University

29. Climer, Kara Elizabeth. Simulation-Based Study of Single Event Transients in a SiGe BiCMOS Low Power Operational Amplifier.

Degree: MS, Electrical Engineering, 2008, Vanderbilt University

 Energy depositions from highly ionized particles in space environments can induce transient current (voltage) pulses in microelectronic devices, called Single Event Effects (SEEs). This thesis… (more)

Subjects/Keywords: guard ring; SiGe HBT; single event effect (SEE); charge collection; Operational amplifiers; Radiation hardening; Heterojunctions  – Design and construction

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Climer, K. E. (2008). Simulation-Based Study of Single Event Transients in a SiGe BiCMOS Low Power Operational Amplifier. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-07252008-164559/ ;

Chicago Manual of Style (16th Edition):

Climer, Kara Elizabeth. “Simulation-Based Study of Single Event Transients in a SiGe BiCMOS Low Power Operational Amplifier.” 2008. Masters Thesis, Vanderbilt University. Accessed April 20, 2019. http://etd.library.vanderbilt.edu/available/etd-07252008-164559/ ;.

MLA Handbook (7th Edition):

Climer, Kara Elizabeth. “Simulation-Based Study of Single Event Transients in a SiGe BiCMOS Low Power Operational Amplifier.” 2008. Web. 20 Apr 2019.

Vancouver:

Climer KE. Simulation-Based Study of Single Event Transients in a SiGe BiCMOS Low Power Operational Amplifier. [Internet] [Masters thesis]. Vanderbilt University; 2008. [cited 2019 Apr 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-07252008-164559/ ;.

Council of Science Editors:

Climer KE. Simulation-Based Study of Single Event Transients in a SiGe BiCMOS Low Power Operational Amplifier. [Masters Thesis]. Vanderbilt University; 2008. Available from: http://etd.library.vanderbilt.edu/available/etd-07252008-164559/ ;


University of Newcastle

30. Dempsey, Claire Louise. Technology assessment and quality improvement in a clinical HDR brachytherapy setting.

Degree: PhD, 2014, University of Newcastle

Research Doctorate - Doctor of Philosophy (PhD)

High dose rate (HDR) brachytherapy is a form of radiation therapy in which the source of radiation is… (more)

Subjects/Keywords: brachytherapy; radiation oncology; cancer; thesis by publication

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Dempsey, C. L. (2014). Technology assessment and quality improvement in a clinical HDR brachytherapy setting. (Doctoral Dissertation). University of Newcastle. Retrieved from http://hdl.handle.net/1959.13/1055829

Chicago Manual of Style (16th Edition):

Dempsey, Claire Louise. “Technology assessment and quality improvement in a clinical HDR brachytherapy setting.” 2014. Doctoral Dissertation, University of Newcastle. Accessed April 20, 2019. http://hdl.handle.net/1959.13/1055829.

MLA Handbook (7th Edition):

Dempsey, Claire Louise. “Technology assessment and quality improvement in a clinical HDR brachytherapy setting.” 2014. Web. 20 Apr 2019.

Vancouver:

Dempsey CL. Technology assessment and quality improvement in a clinical HDR brachytherapy setting. [Internet] [Doctoral dissertation]. University of Newcastle; 2014. [cited 2019 Apr 20]. Available from: http://hdl.handle.net/1959.13/1055829.

Council of Science Editors:

Dempsey CL. Technology assessment and quality improvement in a clinical HDR brachytherapy setting. [Doctoral Dissertation]. University of Newcastle; 2014. Available from: http://hdl.handle.net/1959.13/1055829

[1] [2] [3] [4] [5] … [2081]

.