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You searched for subject:(Poole Frenkel). Showing records 1 – 8 of 8 total matches.

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University of California – Irvine

1. Pan, Deng. Carbon Nanotube Defects and Carbon Nanotube Composites.

Degree: Physics, 2014, University of California – Irvine

 A single-walled carbon nanotube (SWCNT) is a one-dimensional (1D) conductor that has been proposed as an ideal element for novel, nanoscale electronics. This dissertation studies… (more)

Subjects/Keywords: Physics; Nanotechnology; Condensed matter physics; carbon nanotube; composite; Cu; defect; Poole-Frenkel emission; thermal reduction

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Pan, D. (2014). Carbon Nanotube Defects and Carbon Nanotube Composites. (Thesis). University of California – Irvine. Retrieved from http://www.escholarship.org/uc/item/92m2256d

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Pan, Deng. “Carbon Nanotube Defects and Carbon Nanotube Composites.” 2014. Thesis, University of California – Irvine. Accessed September 21, 2020. http://www.escholarship.org/uc/item/92m2256d.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Pan, Deng. “Carbon Nanotube Defects and Carbon Nanotube Composites.” 2014. Web. 21 Sep 2020.

Vancouver:

Pan D. Carbon Nanotube Defects and Carbon Nanotube Composites. [Internet] [Thesis]. University of California – Irvine; 2014. [cited 2020 Sep 21]. Available from: http://www.escholarship.org/uc/item/92m2256d.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Pan D. Carbon Nanotube Defects and Carbon Nanotube Composites. [Thesis]. University of California – Irvine; 2014. Available from: http://www.escholarship.org/uc/item/92m2256d

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Penn State University

2. Kramer, Angela J. Modeling the Behavior of the Dielectric Properties in Low Formation Voltage Electrolytic Tantalum Capacitors .

Degree: 2011, Penn State University

 With the miniaturization of electronics, there is a continual demand for capacitive components to have greater capacitance per volume with low leakage currents. This research… (more)

Subjects/Keywords: electric field; Poole-Frenkel effect; specific charge; dielectric; tantalum pentoxide; tantalum; electrolytic capacitors; Schottky emission

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APA (6th Edition):

Kramer, A. J. (2011). Modeling the Behavior of the Dielectric Properties in Low Formation Voltage Electrolytic Tantalum Capacitors . (Thesis). Penn State University. Retrieved from https://submit-etda.libraries.psu.edu/catalog/11528

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Kramer, Angela J. “Modeling the Behavior of the Dielectric Properties in Low Formation Voltage Electrolytic Tantalum Capacitors .” 2011. Thesis, Penn State University. Accessed September 21, 2020. https://submit-etda.libraries.psu.edu/catalog/11528.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Kramer, Angela J. “Modeling the Behavior of the Dielectric Properties in Low Formation Voltage Electrolytic Tantalum Capacitors .” 2011. Web. 21 Sep 2020.

Vancouver:

Kramer AJ. Modeling the Behavior of the Dielectric Properties in Low Formation Voltage Electrolytic Tantalum Capacitors . [Internet] [Thesis]. Penn State University; 2011. [cited 2020 Sep 21]. Available from: https://submit-etda.libraries.psu.edu/catalog/11528.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Kramer AJ. Modeling the Behavior of the Dielectric Properties in Low Formation Voltage Electrolytic Tantalum Capacitors . [Thesis]. Penn State University; 2011. Available from: https://submit-etda.libraries.psu.edu/catalog/11528

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Oulu

3. Lappalainen, J. (Jyrki). Laser-ablation deposition and characterization of polycrystalline Nd-modified Pb(Zr,Ti)O3 thin films.

Degree: 1999, University of Oulu

 Abstract Nd-modified lead-zirconate-titanate (PNZT) thin films were deposited on MgO(100), Si(100) and Al2O3(1102) single-crystal substrates using the pulsed-laser-ablation technique with a XeCl excimer laser. The… (more)

Subjects/Keywords: PZT film; Poole-Frenkel mechanism; ferroelectric film; perovskite phases

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Lappalainen, J. (. (1999). Laser-ablation deposition and characterization of polycrystalline Nd-modified Pb(Zr,Ti)O3 thin films. (Doctoral Dissertation). University of Oulu. Retrieved from http://urn.fi/urn:isbn:9514254317

Chicago Manual of Style (16th Edition):

Lappalainen, J (Jyrki). “Laser-ablation deposition and characterization of polycrystalline Nd-modified Pb(Zr,Ti)O3 thin films.” 1999. Doctoral Dissertation, University of Oulu. Accessed September 21, 2020. http://urn.fi/urn:isbn:9514254317.

MLA Handbook (7th Edition):

Lappalainen, J (Jyrki). “Laser-ablation deposition and characterization of polycrystalline Nd-modified Pb(Zr,Ti)O3 thin films.” 1999. Web. 21 Sep 2020.

Vancouver:

Lappalainen J(. Laser-ablation deposition and characterization of polycrystalline Nd-modified Pb(Zr,Ti)O3 thin films. [Internet] [Doctoral dissertation]. University of Oulu; 1999. [cited 2020 Sep 21]. Available from: http://urn.fi/urn:isbn:9514254317.

Council of Science Editors:

Lappalainen J(. Laser-ablation deposition and characterization of polycrystalline Nd-modified Pb(Zr,Ti)O3 thin films. [Doctoral Dissertation]. University of Oulu; 1999. Available from: http://urn.fi/urn:isbn:9514254317


University of Alberta

4. Mohammadpour, Arash. Synthesis and Characterization of TiO2 Nanowire and Nanotube Arrays for Increased Optoelectronic Functionality.

Degree: PhD, Department of Electrical and Computer Engineering, 2014, University of Alberta

 The n-type semiconducting, vertically oriented TiO2 nanotube and nanowire arrays constitute a mechanically robust, high surface area, easily functionalized architecture with vectorial electron percolation pathways… (more)

Subjects/Keywords: electroless; multipodal; charge carrier transport; TiO2; semiconductor; anatase; time of flight; FRET; nanotube; large diameter; nanowire; poole frenkel; space charge limited current; rutile; electrochemical anodization; optoelectronic; fowler nordheim; hydrothermal

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APA (6th Edition):

Mohammadpour, A. (2014). Synthesis and Characterization of TiO2 Nanowire and Nanotube Arrays for Increased Optoelectronic Functionality. (Doctoral Dissertation). University of Alberta. Retrieved from https://era.library.ualberta.ca/files/ct435gd12d

Chicago Manual of Style (16th Edition):

Mohammadpour, Arash. “Synthesis and Characterization of TiO2 Nanowire and Nanotube Arrays for Increased Optoelectronic Functionality.” 2014. Doctoral Dissertation, University of Alberta. Accessed September 21, 2020. https://era.library.ualberta.ca/files/ct435gd12d.

MLA Handbook (7th Edition):

Mohammadpour, Arash. “Synthesis and Characterization of TiO2 Nanowire and Nanotube Arrays for Increased Optoelectronic Functionality.” 2014. Web. 21 Sep 2020.

Vancouver:

Mohammadpour A. Synthesis and Characterization of TiO2 Nanowire and Nanotube Arrays for Increased Optoelectronic Functionality. [Internet] [Doctoral dissertation]. University of Alberta; 2014. [cited 2020 Sep 21]. Available from: https://era.library.ualberta.ca/files/ct435gd12d.

Council of Science Editors:

Mohammadpour A. Synthesis and Characterization of TiO2 Nanowire and Nanotube Arrays for Increased Optoelectronic Functionality. [Doctoral Dissertation]. University of Alberta; 2014. Available from: https://era.library.ualberta.ca/files/ct435gd12d


Clemson University

5. Takeshita, Satoshi. MODELING OF SPACE-CHARGE-LIMITED CURRENT INJECTION INCORPORATING AN ADVANCED MODEL OF THE POOLE-FRENKEL EFFECT.

Degree: MS, Electrical Engineering, 2008, Clemson University

 The current flow due to Space-Charge-Limited (SCL) emission is well known and the associated current-voltage power law relationship can be observed in many materials, particularly… (more)

Subjects/Keywords: Poole-Frenkel Effect; Space-Charge-Limited Emission Theory; Electrical and Computer Engineering

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APA (6th Edition):

Takeshita, S. (2008). MODELING OF SPACE-CHARGE-LIMITED CURRENT INJECTION INCORPORATING AN ADVANCED MODEL OF THE POOLE-FRENKEL EFFECT. (Masters Thesis). Clemson University. Retrieved from https://tigerprints.clemson.edu/all_theses/473

Chicago Manual of Style (16th Edition):

Takeshita, Satoshi. “MODELING OF SPACE-CHARGE-LIMITED CURRENT INJECTION INCORPORATING AN ADVANCED MODEL OF THE POOLE-FRENKEL EFFECT.” 2008. Masters Thesis, Clemson University. Accessed September 21, 2020. https://tigerprints.clemson.edu/all_theses/473.

MLA Handbook (7th Edition):

Takeshita, Satoshi. “MODELING OF SPACE-CHARGE-LIMITED CURRENT INJECTION INCORPORATING AN ADVANCED MODEL OF THE POOLE-FRENKEL EFFECT.” 2008. Web. 21 Sep 2020.

Vancouver:

Takeshita S. MODELING OF SPACE-CHARGE-LIMITED CURRENT INJECTION INCORPORATING AN ADVANCED MODEL OF THE POOLE-FRENKEL EFFECT. [Internet] [Masters thesis]. Clemson University; 2008. [cited 2020 Sep 21]. Available from: https://tigerprints.clemson.edu/all_theses/473.

Council of Science Editors:

Takeshita S. MODELING OF SPACE-CHARGE-LIMITED CURRENT INJECTION INCORPORATING AN ADVANCED MODEL OF THE POOLE-FRENKEL EFFECT. [Masters Thesis]. Clemson University; 2008. Available from: https://tigerprints.clemson.edu/all_theses/473


Brno University of Technology

6. Pelčák, Jaromír. Transport elektrického náboje v tantalovém kondenzátoru: Transport of Electric Charge in Tantalum Capacitor.

Degree: 2018, Brno University of Technology

 The task of the thesis was studding of tantalum capacitors with solid electrolytes properties. Ta – Ta2O5 – MnO2 capacitor by its construction represents MIS… (more)

Subjects/Keywords: Transport; akumulace náboje; MIS struktura; tantalový kondenzátor; polární součástka; normální režim; reverzní režim; ekvivalentní náhradní obvod; ohmická složka; Poole-Frenkelův mechanismus; tunelový jev; frekvenční charakteristika.; Transport; charge accumulation; MIS structure; tantalum capacitor; polar component; normal mode; reverse mode; equivalent circuit diagram; ohmic segment; Poole-Frenkel mechanisms; tunnel effect; frequency characteristic.

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APA (6th Edition):

Pelčák, J. (2018). Transport elektrického náboje v tantalovém kondenzátoru: Transport of Electric Charge in Tantalum Capacitor. (Thesis). Brno University of Technology. Retrieved from http://hdl.handle.net/11012/11965

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Pelčák, Jaromír. “Transport elektrického náboje v tantalovém kondenzátoru: Transport of Electric Charge in Tantalum Capacitor.” 2018. Thesis, Brno University of Technology. Accessed September 21, 2020. http://hdl.handle.net/11012/11965.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Pelčák, Jaromír. “Transport elektrického náboje v tantalovém kondenzátoru: Transport of Electric Charge in Tantalum Capacitor.” 2018. Web. 21 Sep 2020.

Vancouver:

Pelčák J. Transport elektrického náboje v tantalovém kondenzátoru: Transport of Electric Charge in Tantalum Capacitor. [Internet] [Thesis]. Brno University of Technology; 2018. [cited 2020 Sep 21]. Available from: http://hdl.handle.net/11012/11965.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Pelčák J. Transport elektrického náboje v tantalovém kondenzátoru: Transport of Electric Charge in Tantalum Capacitor. [Thesis]. Brno University of Technology; 2018. Available from: http://hdl.handle.net/11012/11965

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of South Florida

7. Gaddipati, Surendra. Characterization of HfO2 Films for Flash Memory Applications.

Degree: 2004, University of South Florida

 The scaling of integrated circuits requires the use of alternative dielectric materials as the replacement for silicon dioxide in the submicron devices. The scaling limit… (more)

Subjects/Keywords: control oxide; high-k; hafnium oxide; poole-frenkel; conduction mechanism; American Studies; Arts and Humanities

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APA (6th Edition):

Gaddipati, S. (2004). Characterization of HfO2 Films for Flash Memory Applications. (Thesis). University of South Florida. Retrieved from https://scholarcommons.usf.edu/etd/1040

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Gaddipati, Surendra. “Characterization of HfO2 Films for Flash Memory Applications.” 2004. Thesis, University of South Florida. Accessed September 21, 2020. https://scholarcommons.usf.edu/etd/1040.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Gaddipati, Surendra. “Characterization of HfO2 Films for Flash Memory Applications.” 2004. Web. 21 Sep 2020.

Vancouver:

Gaddipati S. Characterization of HfO2 Films for Flash Memory Applications. [Internet] [Thesis]. University of South Florida; 2004. [cited 2020 Sep 21]. Available from: https://scholarcommons.usf.edu/etd/1040.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Gaddipati S. Characterization of HfO2 Films for Flash Memory Applications. [Thesis]. University of South Florida; 2004. Available from: https://scholarcommons.usf.edu/etd/1040

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


North Carolina State University

8. Hong, Joon Goo. Spectroscopic Study of Hafnium Silicate Alloys prepared by RPECVD: Comparisons between Conduction/Valence Band Offset Energies and Optical Band Gaps.

Degree: PhD, Materials Science and Engineering, 2003, North Carolina State University

 Aggressive scaling of devices has continued to improve MOSFET transistor performance. As lateral device dimensions continue to decrease, gate oxide thickness must be scaled down.… (more)

Subjects/Keywords: RPE-CVD. MOCVD; local bond; FTIR; Poole-Frenkel; nitridation; temperature dependent CV; IV; CV; electrical property; transition metal oxide; Optical Band Gap; Valence band; Conduction band; Hafnium Silicate; Spectroscopy; High k gate oxide

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APA (6th Edition):

Hong, J. G. (2003). Spectroscopic Study of Hafnium Silicate Alloys prepared by RPECVD: Comparisons between Conduction/Valence Band Offset Energies and Optical Band Gaps. (Doctoral Dissertation). North Carolina State University. Retrieved from http://www.lib.ncsu.edu/resolver/1840.16/2978

Chicago Manual of Style (16th Edition):

Hong, Joon Goo. “Spectroscopic Study of Hafnium Silicate Alloys prepared by RPECVD: Comparisons between Conduction/Valence Band Offset Energies and Optical Band Gaps.” 2003. Doctoral Dissertation, North Carolina State University. Accessed September 21, 2020. http://www.lib.ncsu.edu/resolver/1840.16/2978.

MLA Handbook (7th Edition):

Hong, Joon Goo. “Spectroscopic Study of Hafnium Silicate Alloys prepared by RPECVD: Comparisons between Conduction/Valence Band Offset Energies and Optical Band Gaps.” 2003. Web. 21 Sep 2020.

Vancouver:

Hong JG. Spectroscopic Study of Hafnium Silicate Alloys prepared by RPECVD: Comparisons between Conduction/Valence Band Offset Energies and Optical Band Gaps. [Internet] [Doctoral dissertation]. North Carolina State University; 2003. [cited 2020 Sep 21]. Available from: http://www.lib.ncsu.edu/resolver/1840.16/2978.

Council of Science Editors:

Hong JG. Spectroscopic Study of Hafnium Silicate Alloys prepared by RPECVD: Comparisons between Conduction/Valence Band Offset Energies and Optical Band Gaps. [Doctoral Dissertation]. North Carolina State University; 2003. Available from: http://www.lib.ncsu.edu/resolver/1840.16/2978

.