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You searched for subject:(Kelvin probe force microscopy). Showing records 1 – 30 of 12361 total matches.

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University of Waterloo

1. Lee, Geoffrey. Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope.

Degree: 2013, University of Waterloo

 The Kelvin Probe Force Microscope is a type of scanning probe instrument that is used to discern the different work functions of a sample. A… (more)

Subjects/Keywords: Kelvin Probe Force Microscopy; MEMS

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Lee, G. (2013). Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope. (Thesis). University of Waterloo. Retrieved from http://hdl.handle.net/10012/7452

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Lee, Geoffrey. “Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope.” 2013. Thesis, University of Waterloo. Accessed November 15, 2019. http://hdl.handle.net/10012/7452.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Lee, Geoffrey. “Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope.” 2013. Web. 15 Nov 2019.

Vancouver:

Lee G. Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope. [Internet] [Thesis]. University of Waterloo; 2013. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/10012/7452.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Lee G. Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope. [Thesis]. University of Waterloo; 2013. Available from: http://hdl.handle.net/10012/7452

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of California – Irvine

2. Sanderson, Robert Robert. Computational Methods as a Supplement to Atomic Force Microscopy.

Degree: Physics, 2017, University of California – Irvine

 The atomic force microscope (AFM) is a widespread tool for the study of surfaces, as it allows for the unobtrusive measurement of nanoscale topography. AFM… (more)

Subjects/Keywords: Physics; Materials Science; Atomic Force Microscopy; Atomic Force Spectroscopy; Computational Methods; Kelvin Probe Force Microscopy

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APA (6th Edition):

Sanderson, R. R. (2017). Computational Methods as a Supplement to Atomic Force Microscopy. (Thesis). University of California – Irvine. Retrieved from http://www.escholarship.org/uc/item/6wb31634

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Sanderson, Robert Robert. “Computational Methods as a Supplement to Atomic Force Microscopy.” 2017. Thesis, University of California – Irvine. Accessed November 15, 2019. http://www.escholarship.org/uc/item/6wb31634.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Sanderson, Robert Robert. “Computational Methods as a Supplement to Atomic Force Microscopy.” 2017. Web. 15 Nov 2019.

Vancouver:

Sanderson RR. Computational Methods as a Supplement to Atomic Force Microscopy. [Internet] [Thesis]. University of California – Irvine; 2017. [cited 2019 Nov 15]. Available from: http://www.escholarship.org/uc/item/6wb31634.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Sanderson RR. Computational Methods as a Supplement to Atomic Force Microscopy. [Thesis]. University of California – Irvine; 2017. Available from: http://www.escholarship.org/uc/item/6wb31634

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Waterloo

3. Drolle, Elizabeth. Biophysical Studies of Lipid Membranes and their Interactions with Amyloid Peptides.

Degree: 2015, University of Waterloo

 Amyloid beta peptides are known to form amyloid fibrils which are implicated in more than 20 currently incurable neurodegenerative diseases, including Alzheimer’s, Huntington’s and Parkinson’s.… (more)

Subjects/Keywords: Alzheimer's Disease; Atomic Force Microscopy; Nanoscale Biophysics; Amyloid Beta Peptide; Kelvin Probe Force Microscopy

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APA (6th Edition):

Drolle, E. (2015). Biophysical Studies of Lipid Membranes and their Interactions with Amyloid Peptides. (Thesis). University of Waterloo. Retrieved from http://hdl.handle.net/10012/9445

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Drolle, Elizabeth. “Biophysical Studies of Lipid Membranes and their Interactions with Amyloid Peptides.” 2015. Thesis, University of Waterloo. Accessed November 15, 2019. http://hdl.handle.net/10012/9445.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Drolle, Elizabeth. “Biophysical Studies of Lipid Membranes and their Interactions with Amyloid Peptides.” 2015. Web. 15 Nov 2019.

Vancouver:

Drolle E. Biophysical Studies of Lipid Membranes and their Interactions with Amyloid Peptides. [Internet] [Thesis]. University of Waterloo; 2015. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/10012/9445.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Drolle E. Biophysical Studies of Lipid Membranes and their Interactions with Amyloid Peptides. [Thesis]. University of Waterloo; 2015. Available from: http://hdl.handle.net/10012/9445

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Waterloo

4. Henderson, Robert Douglas Evert. Nanoscale physics of surfactant gene delivery.

Degree: 2016, University of Waterloo

 Medicine has met a revolution in the expansion of possibilities for therapy based upon synthetic gene delivery. Imagine the ability to correct problems of a… (more)

Subjects/Keywords: Physics; Biophysics; Atomic Force Microscopy; Kelvin Probe Force Microscopy; Gene delivery; Nanotechnology; Lipids; Monolayers; DNA

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APA (6th Edition):

Henderson, R. D. E. (2016). Nanoscale physics of surfactant gene delivery. (Thesis). University of Waterloo. Retrieved from http://hdl.handle.net/10012/10151

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Henderson, Robert Douglas Evert. “Nanoscale physics of surfactant gene delivery.” 2016. Thesis, University of Waterloo. Accessed November 15, 2019. http://hdl.handle.net/10012/10151.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Henderson, Robert Douglas Evert. “Nanoscale physics of surfactant gene delivery.” 2016. Web. 15 Nov 2019.

Vancouver:

Henderson RDE. Nanoscale physics of surfactant gene delivery. [Internet] [Thesis]. University of Waterloo; 2016. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/10012/10151.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Henderson RDE. Nanoscale physics of surfactant gene delivery. [Thesis]. University of Waterloo; 2016. Available from: http://hdl.handle.net/10012/10151

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Guelph

5. Birkenhauer, Eric. A Multifactor Analysis of Polymicrobial Wound Pathogenic Biofilms Using Conventional Assays, Nanoscale Imaging, and a Microfluidic Platform .

Degree: 2014, University of Guelph

 This thesis investigates Pseudomonas aeruginosa and methicillin-resistant Staphylococcus aureus (MRSA) pathogenic wound biofilms through a multifactor analysis. P. aeruginosa and MRSA are commonly found in… (more)

Subjects/Keywords: Pseudomonas aeruginosa; MRSA; Biofilms; Co-culture; Atomic Force Microscopy; Kelvin Probe Force Microscopy; Microfluidics

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APA (6th Edition):

Birkenhauer, E. (2014). A Multifactor Analysis of Polymicrobial Wound Pathogenic Biofilms Using Conventional Assays, Nanoscale Imaging, and a Microfluidic Platform . (Thesis). University of Guelph. Retrieved from https://atrium.lib.uoguelph.ca/xmlui/handle/10214/8630

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Birkenhauer, Eric. “A Multifactor Analysis of Polymicrobial Wound Pathogenic Biofilms Using Conventional Assays, Nanoscale Imaging, and a Microfluidic Platform .” 2014. Thesis, University of Guelph. Accessed November 15, 2019. https://atrium.lib.uoguelph.ca/xmlui/handle/10214/8630.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Birkenhauer, Eric. “A Multifactor Analysis of Polymicrobial Wound Pathogenic Biofilms Using Conventional Assays, Nanoscale Imaging, and a Microfluidic Platform .” 2014. Web. 15 Nov 2019.

Vancouver:

Birkenhauer E. A Multifactor Analysis of Polymicrobial Wound Pathogenic Biofilms Using Conventional Assays, Nanoscale Imaging, and a Microfluidic Platform . [Internet] [Thesis]. University of Guelph; 2014. [cited 2019 Nov 15]. Available from: https://atrium.lib.uoguelph.ca/xmlui/handle/10214/8630.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Birkenhauer E. A Multifactor Analysis of Polymicrobial Wound Pathogenic Biofilms Using Conventional Assays, Nanoscale Imaging, and a Microfluidic Platform . [Thesis]. University of Guelph; 2014. Available from: https://atrium.lib.uoguelph.ca/xmlui/handle/10214/8630

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of California – Irvine

6. Fuller, Elliot James. Scanning Probe Characterization of a One-Dimensional Conductor.

Degree: Physics, 2015, University of California – Irvine

 The International Roadmap for Semiconductor Devices calls for transistors that will extend into the low-dimensional regime. As electronic devices are shrunk to increasingly lowered dimensions,… (more)

Subjects/Keywords: Physics; Condensed matter physics; Nanoscience; carbon nanotube; defect scattering; electronic transport; Kelvin probe force microscopy; one-dimensional; scanning probe microscopy

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APA (6th Edition):

Fuller, E. J. (2015). Scanning Probe Characterization of a One-Dimensional Conductor. (Thesis). University of California – Irvine. Retrieved from http://www.escholarship.org/uc/item/9s994647

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Fuller, Elliot James. “Scanning Probe Characterization of a One-Dimensional Conductor.” 2015. Thesis, University of California – Irvine. Accessed November 15, 2019. http://www.escholarship.org/uc/item/9s994647.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Fuller, Elliot James. “Scanning Probe Characterization of a One-Dimensional Conductor.” 2015. Web. 15 Nov 2019.

Vancouver:

Fuller EJ. Scanning Probe Characterization of a One-Dimensional Conductor. [Internet] [Thesis]. University of California – Irvine; 2015. [cited 2019 Nov 15]. Available from: http://www.escholarship.org/uc/item/9s994647.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Fuller EJ. Scanning Probe Characterization of a One-Dimensional Conductor. [Thesis]. University of California – Irvine; 2015. Available from: http://www.escholarship.org/uc/item/9s994647

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Johannes Gutenberg Universität Mainz

7. Sun, Ling. Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy.

Degree: 2010, Johannes Gutenberg Universität Mainz

Conjugated polymers and conjugated polymer blends have attracted great interest due to their potential applications in biosensors and organic electronics. The sub-100 nm morphology of… (more)

Subjects/Keywords: PPy, Kelvin probe force microscopy, conductive AFM, conjugated polymer blends; Chemistry and allied sciences

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APA (6th Edition):

Sun, L. (2010). Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy. (Doctoral Dissertation). Johannes Gutenberg Universität Mainz. Retrieved from http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/

Chicago Manual of Style (16th Edition):

Sun, Ling. “Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy.” 2010. Doctoral Dissertation, Johannes Gutenberg Universität Mainz. Accessed November 15, 2019. http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/.

MLA Handbook (7th Edition):

Sun, Ling. “Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy.” 2010. Web. 15 Nov 2019.

Vancouver:

Sun L. Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy. [Internet] [Doctoral dissertation]. Johannes Gutenberg Universität Mainz; 2010. [cited 2019 Nov 15]. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/.

Council of Science Editors:

Sun L. Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy. [Doctoral Dissertation]. Johannes Gutenberg Universität Mainz; 2010. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/


Johannes Gutenberg Universität Mainz

8. Weber, Stefan. Electrical scanning probe microscopy on organic optoelectronic structures.

Degree: 2010, Johannes Gutenberg Universität Mainz

 In the field of organic optoelectronics, the nanoscale structure of the materials has huge im-pact on the device performance. Here, scanning force microscopy (SFM) techniques… (more)

Subjects/Keywords: Rasterkraftmikroskopie; organische Elektronik; Nanotechnologie; Kelvinsondenmikroskopie; Torsionmode; scanning force microscopy; organic electronics; nanotechnology; kelvin probe force microscopy; torsion mode; Physics

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APA (6th Edition):

Weber, S. (2010). Electrical scanning probe microscopy on organic optoelectronic structures. (Doctoral Dissertation). Johannes Gutenberg Universität Mainz. Retrieved from http://ubm.opus.hbz-nrw.de/volltexte/2010/2445/

Chicago Manual of Style (16th Edition):

Weber, Stefan. “Electrical scanning probe microscopy on organic optoelectronic structures.” 2010. Doctoral Dissertation, Johannes Gutenberg Universität Mainz. Accessed November 15, 2019. http://ubm.opus.hbz-nrw.de/volltexte/2010/2445/.

MLA Handbook (7th Edition):

Weber, Stefan. “Electrical scanning probe microscopy on organic optoelectronic structures.” 2010. Web. 15 Nov 2019.

Vancouver:

Weber S. Electrical scanning probe microscopy on organic optoelectronic structures. [Internet] [Doctoral dissertation]. Johannes Gutenberg Universität Mainz; 2010. [cited 2019 Nov 15]. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2010/2445/.

Council of Science Editors:

Weber S. Electrical scanning probe microscopy on organic optoelectronic structures. [Doctoral Dissertation]. Johannes Gutenberg Universität Mainz; 2010. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2010/2445/


Brno University of Technology

9. Mojrová, Barbora. Využití měřicí metody SPM v technologii výroby krystalických solárních článků .

Degree: 2013, Brno University of Technology

 Tato práce se zabývá využitím technik mikroskopie atomárních sil (AFM) a mikroskopie Kelvinovou sondou (KPFM) ve výrobě solárních článků. Obě techniky zjišťují požadované vlastnosti povrchu… (more)

Subjects/Keywords: Mikroskopie rastrující sondou; SPM; mikroskopie atomárních sil; AFM; mikroskopie Kelvinovou sondou; KPFM; solární článek.; Scanning Probe Microscopy; SPM; Atomic Force Microscopy; AFM; Kelvin Probe Force Microscopy; KPFM; Solar cell.

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APA (6th Edition):

Mojrová, B. (2013). Využití měřicí metody SPM v technologii výroby krystalických solárních článků . (Thesis). Brno University of Technology. Retrieved from http://hdl.handle.net/11012/27352

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Mojrová, Barbora. “Využití měřicí metody SPM v technologii výroby krystalických solárních článků .” 2013. Thesis, Brno University of Technology. Accessed November 15, 2019. http://hdl.handle.net/11012/27352.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Mojrová, Barbora. “Využití měřicí metody SPM v technologii výroby krystalických solárních článků .” 2013. Web. 15 Nov 2019.

Vancouver:

Mojrová B. Využití měřicí metody SPM v technologii výroby krystalických solárních článků . [Internet] [Thesis]. Brno University of Technology; 2013. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/11012/27352.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Mojrová B. Využití měřicí metody SPM v technologii výroby krystalických solárních článků . [Thesis]. Brno University of Technology; 2013. Available from: http://hdl.handle.net/11012/27352

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

10. Narchi, Paul. Investigation of crystalline silicon solar cells at the nano-scale using scanning probe microscopy techniques : Etude de cellules solaires en silicium cristallin à l'échelle nanométrique à l'aide de techniques de microscopie à sonde locale.

Degree: Docteur es, Physique, 2016, Paris Saclay

 Cette thèse s’intéresse à l’analyse de cellules silicium cristallin à l’échelle nanométrique, à l’aide de techniques de microscopie à sonde locale (SPM). En particulier, nous… (more)

Subjects/Keywords: Microscopie à sonde de Kelvin; Microscopie à force atomique à sonde conductrice; Cellules solaires; Silicium cristallin; Caractérisation Avancée; Microscopie Electronique; Kelvin Probe Force Microscopy; Conducting Probe Atomic Force Microscopy; Solar cells; Crystalline silicon; Advanced Characterization; Electron Microscopy

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APA (6th Edition):

Narchi, P. (2016). Investigation of crystalline silicon solar cells at the nano-scale using scanning probe microscopy techniques : Etude de cellules solaires en silicium cristallin à l'échelle nanométrique à l'aide de techniques de microscopie à sonde locale. (Doctoral Dissertation). Paris Saclay. Retrieved from http://www.theses.fr/2016SACLX085

Chicago Manual of Style (16th Edition):

Narchi, Paul. “Investigation of crystalline silicon solar cells at the nano-scale using scanning probe microscopy techniques : Etude de cellules solaires en silicium cristallin à l'échelle nanométrique à l'aide de techniques de microscopie à sonde locale.” 2016. Doctoral Dissertation, Paris Saclay. Accessed November 15, 2019. http://www.theses.fr/2016SACLX085.

MLA Handbook (7th Edition):

Narchi, Paul. “Investigation of crystalline silicon solar cells at the nano-scale using scanning probe microscopy techniques : Etude de cellules solaires en silicium cristallin à l'échelle nanométrique à l'aide de techniques de microscopie à sonde locale.” 2016. Web. 15 Nov 2019.

Vancouver:

Narchi P. Investigation of crystalline silicon solar cells at the nano-scale using scanning probe microscopy techniques : Etude de cellules solaires en silicium cristallin à l'échelle nanométrique à l'aide de techniques de microscopie à sonde locale. [Internet] [Doctoral dissertation]. Paris Saclay; 2016. [cited 2019 Nov 15]. Available from: http://www.theses.fr/2016SACLX085.

Council of Science Editors:

Narchi P. Investigation of crystalline silicon solar cells at the nano-scale using scanning probe microscopy techniques : Etude de cellules solaires en silicium cristallin à l'échelle nanométrique à l'aide de techniques de microscopie à sonde locale. [Doctoral Dissertation]. Paris Saclay; 2016. Available from: http://www.theses.fr/2016SACLX085


University of New South Wales

11. Levick, Katie. Microcharacterisation of bulk, ion beam processed and nanoparticle cadmium sulphide (CdS).

Degree: Physics, 2013, University of New South Wales

 Cadmium sulphide (CdS) is a II-VI semi-conductor with a direct band gap of 2.42 eV for the hexagonal crystal structure at room temperature. CdS is… (more)

Subjects/Keywords: Kelvin probe microscopy; Cadmium sulphide; CdS

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APA (6th Edition):

Levick, K. (2013). Microcharacterisation of bulk, ion beam processed and nanoparticle cadmium sulphide (CdS). (Masters Thesis). University of New South Wales. Retrieved from http://handle.unsw.edu.au/1959.4/53459 ; https://unsworks.unsw.edu.au/fapi/datastream/unsworks:12154/SOURCE02?view=true

Chicago Manual of Style (16th Edition):

Levick, Katie. “Microcharacterisation of bulk, ion beam processed and nanoparticle cadmium sulphide (CdS).” 2013. Masters Thesis, University of New South Wales. Accessed November 15, 2019. http://handle.unsw.edu.au/1959.4/53459 ; https://unsworks.unsw.edu.au/fapi/datastream/unsworks:12154/SOURCE02?view=true.

MLA Handbook (7th Edition):

Levick, Katie. “Microcharacterisation of bulk, ion beam processed and nanoparticle cadmium sulphide (CdS).” 2013. Web. 15 Nov 2019.

Vancouver:

Levick K. Microcharacterisation of bulk, ion beam processed and nanoparticle cadmium sulphide (CdS). [Internet] [Masters thesis]. University of New South Wales; 2013. [cited 2019 Nov 15]. Available from: http://handle.unsw.edu.au/1959.4/53459 ; https://unsworks.unsw.edu.au/fapi/datastream/unsworks:12154/SOURCE02?view=true.

Council of Science Editors:

Levick K. Microcharacterisation of bulk, ion beam processed and nanoparticle cadmium sulphide (CdS). [Masters Thesis]. University of New South Wales; 2013. Available from: http://handle.unsw.edu.au/1959.4/53459 ; https://unsworks.unsw.edu.au/fapi/datastream/unsworks:12154/SOURCE02?view=true


Université de Grenoble

12. Seiss, Martin. Caractérisation des processus élémentaires de croissance des cristaux de carbure de silicium non désorienté : Characterization of structural defects in wide band gap semiconductors.

Degree: Docteur es, Génie civil, 2013, Université de Grenoble

Le carbure de silicium est un semiconducteur prometteur pour les applications en électronique de température et de haute puissance. La croissance de SiC a été… (more)

Subjects/Keywords: Carbure de Silicium; Microscopie à force atomique conventionnelle; Microscopie électronique en transmission; Microscopie de biréfringence; Microscopie de résistance de contact; Microscopie à sonde Kelvin; Silicon carbide; Atomic force microscopy; Transmission electron microscopy; Birefringence microscopy; Surface spreading resistance microscopy; Kelvin probe force microscopy

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APA (6th Edition):

Seiss, M. (2013). Caractérisation des processus élémentaires de croissance des cristaux de carbure de silicium non désorienté : Characterization of structural defects in wide band gap semiconductors. (Doctoral Dissertation). Université de Grenoble. Retrieved from http://www.theses.fr/2013GRENI046

Chicago Manual of Style (16th Edition):

Seiss, Martin. “Caractérisation des processus élémentaires de croissance des cristaux de carbure de silicium non désorienté : Characterization of structural defects in wide band gap semiconductors.” 2013. Doctoral Dissertation, Université de Grenoble. Accessed November 15, 2019. http://www.theses.fr/2013GRENI046.

MLA Handbook (7th Edition):

Seiss, Martin. “Caractérisation des processus élémentaires de croissance des cristaux de carbure de silicium non désorienté : Characterization of structural defects in wide band gap semiconductors.” 2013. Web. 15 Nov 2019.

Vancouver:

Seiss M. Caractérisation des processus élémentaires de croissance des cristaux de carbure de silicium non désorienté : Characterization of structural defects in wide band gap semiconductors. [Internet] [Doctoral dissertation]. Université de Grenoble; 2013. [cited 2019 Nov 15]. Available from: http://www.theses.fr/2013GRENI046.

Council of Science Editors:

Seiss M. Caractérisation des processus élémentaires de croissance des cristaux de carbure de silicium non désorienté : Characterization of structural defects in wide band gap semiconductors. [Doctoral Dissertation]. Université de Grenoble; 2013. Available from: http://www.theses.fr/2013GRENI046


Cornell University

13. Nathan, Sarah. A PROOF-OF-CONCEPT EXPERIMENT TO INVESTIGATE FAST CHARGING TRANSIENTS BY SCANNING KELVIN PROBE MICROSCOPY AND 2) STUDIES ON BRIDGED RUTHENIUM COMPLEXES .

Degree: 2018, Cornell University

 Scanning kelvin probe microscopy has been to used to understand the operation of, and optimize the performance of both organic and inorganic photovolataic materials on… (more)

Subjects/Keywords: Analytical chemistry; Physical chemistry; Inorganic chemistry; Bioinorganic chemistry; Ru360; RuRed; Ruthenium; Scanning Kelvin Probe Force Microscopy

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APA (6th Edition):

Nathan, S. (2018). A PROOF-OF-CONCEPT EXPERIMENT TO INVESTIGATE FAST CHARGING TRANSIENTS BY SCANNING KELVIN PROBE MICROSCOPY AND 2) STUDIES ON BRIDGED RUTHENIUM COMPLEXES . (Thesis). Cornell University. Retrieved from http://hdl.handle.net/1813/59488

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Nathan, Sarah. “A PROOF-OF-CONCEPT EXPERIMENT TO INVESTIGATE FAST CHARGING TRANSIENTS BY SCANNING KELVIN PROBE MICROSCOPY AND 2) STUDIES ON BRIDGED RUTHENIUM COMPLEXES .” 2018. Thesis, Cornell University. Accessed November 15, 2019. http://hdl.handle.net/1813/59488.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Nathan, Sarah. “A PROOF-OF-CONCEPT EXPERIMENT TO INVESTIGATE FAST CHARGING TRANSIENTS BY SCANNING KELVIN PROBE MICROSCOPY AND 2) STUDIES ON BRIDGED RUTHENIUM COMPLEXES .” 2018. Web. 15 Nov 2019.

Vancouver:

Nathan S. A PROOF-OF-CONCEPT EXPERIMENT TO INVESTIGATE FAST CHARGING TRANSIENTS BY SCANNING KELVIN PROBE MICROSCOPY AND 2) STUDIES ON BRIDGED RUTHENIUM COMPLEXES . [Internet] [Thesis]. Cornell University; 2018. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/1813/59488.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Nathan S. A PROOF-OF-CONCEPT EXPERIMENT TO INVESTIGATE FAST CHARGING TRANSIENTS BY SCANNING KELVIN PROBE MICROSCOPY AND 2) STUDIES ON BRIDGED RUTHENIUM COMPLEXES . [Thesis]. Cornell University; 2018. Available from: http://hdl.handle.net/1813/59488

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Université de Grenoble

14. Spadafora, Evan. Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics.

Degree: Docteur es, Nanophysique, 2011, Université de Grenoble

La nanostructure et les propriétés électroniques de matériaux modèles pour le photovoltaïque organique, ont été étudiées en utilisant la Microscopie à Force Atomique en mode… (more)

Subjects/Keywords: AFM non contact; ,photovoltaïque organique; Auto-assemblages moléculaires; Microscopie à sonde de Kelvin; NC-AFM; Organic photovoltaics; MOLECULAR SELF-ASSEMBLIES; Kelvin Probe Force Microscopy; 530

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APA (6th Edition):

Spadafora, E. (2011). Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics. (Doctoral Dissertation). Université de Grenoble. Retrieved from http://www.theses.fr/2011GRENY050

Chicago Manual of Style (16th Edition):

Spadafora, Evan. “Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics.” 2011. Doctoral Dissertation, Université de Grenoble. Accessed November 15, 2019. http://www.theses.fr/2011GRENY050.

MLA Handbook (7th Edition):

Spadafora, Evan. “Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics.” 2011. Web. 15 Nov 2019.

Vancouver:

Spadafora E. Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics. [Internet] [Doctoral dissertation]. Université de Grenoble; 2011. [cited 2019 Nov 15]. Available from: http://www.theses.fr/2011GRENY050.

Council of Science Editors:

Spadafora E. Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics. [Doctoral Dissertation]. Université de Grenoble; 2011. Available from: http://www.theses.fr/2011GRENY050


The Ohio State University

15. Wu, Hao-Hsuan. Angle-Resolved X-Ray Photoemission Spectroscopy of Self-Assembled Polymer Films on AlGaN/GaN Field Effect Transistors.

Degree: MS, Electrical and Computer Engineering, 2011, The Ohio State University

 We used angle-resolved X-ray photoemission spectroscopy (AR-XPS), atomic force microscopy (AFM), and Kelvin probe force microscopy (KPFM) to characterize the chemical composition, depth distribution, and… (more)

Subjects/Keywords: Electrical Engineering; AlGaN; biosensor; heterojunction field effect transistor; HFET; X-ray Photoelectron Spectroscopy; atomic force microscopy; Kelvin probe force microscopy; 3-aminopropyltriethoxysilane (APTES); 3-aminopropyldimethylethoxysilane (APDMES)

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APA (6th Edition):

Wu, H. (2011). Angle-Resolved X-Ray Photoemission Spectroscopy of Self-Assembled Polymer Films on AlGaN/GaN Field Effect Transistors. (Masters Thesis). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1305639462

Chicago Manual of Style (16th Edition):

Wu, Hao-Hsuan. “Angle-Resolved X-Ray Photoemission Spectroscopy of Self-Assembled Polymer Films on AlGaN/GaN Field Effect Transistors.” 2011. Masters Thesis, The Ohio State University. Accessed November 15, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1305639462.

MLA Handbook (7th Edition):

Wu, Hao-Hsuan. “Angle-Resolved X-Ray Photoemission Spectroscopy of Self-Assembled Polymer Films on AlGaN/GaN Field Effect Transistors.” 2011. Web. 15 Nov 2019.

Vancouver:

Wu H. Angle-Resolved X-Ray Photoemission Spectroscopy of Self-Assembled Polymer Films on AlGaN/GaN Field Effect Transistors. [Internet] [Masters thesis]. The Ohio State University; 2011. [cited 2019 Nov 15]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1305639462.

Council of Science Editors:

Wu H. Angle-Resolved X-Ray Photoemission Spectroscopy of Self-Assembled Polymer Films on AlGaN/GaN Field Effect Transistors. [Masters Thesis]. The Ohio State University; 2011. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1305639462


INP Toulouse

16. Oger, Loïc. Corrosion sous contrainte et fragilisation par l'hydrogène d'alliages d'aluminium de la série 7xxx (Al-Zn-Mg) : identification des paramètres microstructuraux critiques pilotant l'endommagement à l'échelle locale. : Stress Corrosion Cracking and Hydrogen Embrittlement of a 7xxx (Al-Zn-Mg) aluminium alloy : identification of microstructural parameters controlling the damage at a local scale.

Degree: Docteur es, Science et Génie des Matériaux, 2017, INP Toulouse

Dans un contexte normatif toujours plus sévère concernant les rejets automobiles polluants, la substitution des aciers par des alliages d’aluminium dans les structures des véhicules… (more)

Subjects/Keywords: Alliages d'aluminium; Corrosion sous contrainte (CSC); Fragilisation par l'hydrogène (FPH); Scanning Kelvin Probe Force Microscopy (SKPFM); Optimisation métallurgique; Industrie automobile; Aluminium alloys; Stress corrosion cracking (SCC); Hydrogen embrittlement (HE); Scanning Kelvin Probe Force Microscopy (SKPFM); Metallurgical optimization; Automotive industry; 670

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APA (6th Edition):

Oger, L. (2017). Corrosion sous contrainte et fragilisation par l'hydrogène d'alliages d'aluminium de la série 7xxx (Al-Zn-Mg) : identification des paramètres microstructuraux critiques pilotant l'endommagement à l'échelle locale. : Stress Corrosion Cracking and Hydrogen Embrittlement of a 7xxx (Al-Zn-Mg) aluminium alloy : identification of microstructural parameters controlling the damage at a local scale. (Doctoral Dissertation). INP Toulouse. Retrieved from http://www.theses.fr/2017INPT0107

Chicago Manual of Style (16th Edition):

Oger, Loïc. “Corrosion sous contrainte et fragilisation par l'hydrogène d'alliages d'aluminium de la série 7xxx (Al-Zn-Mg) : identification des paramètres microstructuraux critiques pilotant l'endommagement à l'échelle locale. : Stress Corrosion Cracking and Hydrogen Embrittlement of a 7xxx (Al-Zn-Mg) aluminium alloy : identification of microstructural parameters controlling the damage at a local scale.” 2017. Doctoral Dissertation, INP Toulouse. Accessed November 15, 2019. http://www.theses.fr/2017INPT0107.

MLA Handbook (7th Edition):

Oger, Loïc. “Corrosion sous contrainte et fragilisation par l'hydrogène d'alliages d'aluminium de la série 7xxx (Al-Zn-Mg) : identification des paramètres microstructuraux critiques pilotant l'endommagement à l'échelle locale. : Stress Corrosion Cracking and Hydrogen Embrittlement of a 7xxx (Al-Zn-Mg) aluminium alloy : identification of microstructural parameters controlling the damage at a local scale.” 2017. Web. 15 Nov 2019.

Vancouver:

Oger L. Corrosion sous contrainte et fragilisation par l'hydrogène d'alliages d'aluminium de la série 7xxx (Al-Zn-Mg) : identification des paramètres microstructuraux critiques pilotant l'endommagement à l'échelle locale. : Stress Corrosion Cracking and Hydrogen Embrittlement of a 7xxx (Al-Zn-Mg) aluminium alloy : identification of microstructural parameters controlling the damage at a local scale. [Internet] [Doctoral dissertation]. INP Toulouse; 2017. [cited 2019 Nov 15]. Available from: http://www.theses.fr/2017INPT0107.

Council of Science Editors:

Oger L. Corrosion sous contrainte et fragilisation par l'hydrogène d'alliages d'aluminium de la série 7xxx (Al-Zn-Mg) : identification des paramètres microstructuraux critiques pilotant l'endommagement à l'échelle locale. : Stress Corrosion Cracking and Hydrogen Embrittlement of a 7xxx (Al-Zn-Mg) aluminium alloy : identification of microstructural parameters controlling the damage at a local scale. [Doctoral Dissertation]. INP Toulouse; 2017. Available from: http://www.theses.fr/2017INPT0107


University of Arizona

17. Grover, Ranjan. Characterizing Thermal and Chemical Properties of Materials at the Nanoscale Using Scanning Probe Microscopy .

Degree: 2006, University of Arizona

 Current magnetic data storage technology is encountering certain fundamental limitations that present roadblocks to its scalability to areal densities of 1 Tbit/in2 and beyond. Next… (more)

Subjects/Keywords: scanning thermal microsocpy; thermal microscopy; nanoscale thermal microscopy; kelvin probe force microscopy

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APA (6th Edition):

Grover, R. (2006). Characterizing Thermal and Chemical Properties of Materials at the Nanoscale Using Scanning Probe Microscopy . (Doctoral Dissertation). University of Arizona. Retrieved from http://hdl.handle.net/10150/195932

Chicago Manual of Style (16th Edition):

Grover, Ranjan. “Characterizing Thermal and Chemical Properties of Materials at the Nanoscale Using Scanning Probe Microscopy .” 2006. Doctoral Dissertation, University of Arizona. Accessed November 15, 2019. http://hdl.handle.net/10150/195932.

MLA Handbook (7th Edition):

Grover, Ranjan. “Characterizing Thermal and Chemical Properties of Materials at the Nanoscale Using Scanning Probe Microscopy .” 2006. Web. 15 Nov 2019.

Vancouver:

Grover R. Characterizing Thermal and Chemical Properties of Materials at the Nanoscale Using Scanning Probe Microscopy . [Internet] [Doctoral dissertation]. University of Arizona; 2006. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/10150/195932.

Council of Science Editors:

Grover R. Characterizing Thermal and Chemical Properties of Materials at the Nanoscale Using Scanning Probe Microscopy . [Doctoral Dissertation]. University of Arizona; 2006. Available from: http://hdl.handle.net/10150/195932

18. Roche, Roland. Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination.

Degree: Docteur es, Sciences des Matériaux, Physique, Chimie et Nanosciences, 2014, Aix Marseille Université

Afin de répondre à des besoins croissants en nano-caractérisation, nous avons développé une plateforme multifonctionnelle combinant des techniques de microscopie optique et de microscopies en… (more)

Subjects/Keywords: Développement instrumental; Microscopies à sondes locales (SPM); Microscopie à force atomique (AFM); Microscopie à sonde de Kelvin (KPFM); Matériaux organiques; Alignement énergétiques aux interfaces; Photovoltaïque; Instrumental developpment; Scannin prob microscopies (SPM); Atomic force microscopy (AFM); Kelvin probe force microscopy (KPFM); Organic materials; Interfacial energetic alignment; Photovoltaïc; 530

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APA (6th Edition):

Roche, R. (2014). Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination. (Doctoral Dissertation). Aix Marseille Université. Retrieved from http://www.theses.fr/2014AIXM4045

Chicago Manual of Style (16th Edition):

Roche, Roland. “Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination.” 2014. Doctoral Dissertation, Aix Marseille Université. Accessed November 15, 2019. http://www.theses.fr/2014AIXM4045.

MLA Handbook (7th Edition):

Roche, Roland. “Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination.” 2014. Web. 15 Nov 2019.

Vancouver:

Roche R. Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination. [Internet] [Doctoral dissertation]. Aix Marseille Université 2014. [cited 2019 Nov 15]. Available from: http://www.theses.fr/2014AIXM4045.

Council of Science Editors:

Roche R. Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination. [Doctoral Dissertation]. Aix Marseille Université 2014. Available from: http://www.theses.fr/2014AIXM4045


The Ohio State University

19. Doutt, Daniel R. THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE.

Degree: PhD, Physics, 2013, The Ohio State University

  ZnO has received renewed interest in recent years due to its exciting semiconductor properties and remarkable ability to grow nanostructures. As a wide band… (more)

Subjects/Keywords: Condensed Matter Physics; Electrical Engineering; Materials Science; Nanoscience; Physics; Solid State Physics; ZnO; GZO; Cathodoluminescence; Scanning Probe Microscopy; SPM; Atomic Force Microscopy; AFM; Kelvin Probe Force Microscopy; KPFM; Surface Photovoltage Spectroscopy; SPS; X-ray Photoemission Spectroscopy; XPS; Schottky Barriers; Surfaces and Interfaces

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APA (6th Edition):

Doutt, D. R. (2013). THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE. (Doctoral Dissertation). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639

Chicago Manual of Style (16th Edition):

Doutt, Daniel R. “THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE.” 2013. Doctoral Dissertation, The Ohio State University. Accessed November 15, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639.

MLA Handbook (7th Edition):

Doutt, Daniel R. “THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE.” 2013. Web. 15 Nov 2019.

Vancouver:

Doutt DR. THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE. [Internet] [Doctoral dissertation]. The Ohio State University; 2013. [cited 2019 Nov 15]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639.

Council of Science Editors:

Doutt DR. THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE. [Doctoral Dissertation]. The Ohio State University; 2013. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639


Université Catholique de Louvain

20. Yin, Jun. Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy.

Degree: 2016, Université Catholique de Louvain

 Electrification and electrostatic discharge (ESD) phenomena are known as serious risks in many applications, such as sophisticated microelectronic devices in electronics industry, in the chemical… (more)

Subjects/Keywords: Scanning Probe Microscopy (SPM); Stainless steel fiber; Polyester fiber; Charge decay; Charge contact electrification; Charge conduction and dissipation; Atomic Force Microscopy (AFM); Current Sensing AFM (CS-AFM); Kelvin Probe Force Microscopy (KPFM); I-V Spectroscopy; ResisCope module; Bekinox fiber

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APA (6th Edition):

Yin, J. (2016). Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy. (Thesis). Université Catholique de Louvain. Retrieved from http://hdl.handle.net/2078.1/182154

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Yin, Jun. “Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy.” 2016. Thesis, Université Catholique de Louvain. Accessed November 15, 2019. http://hdl.handle.net/2078.1/182154.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Yin, Jun. “Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy.” 2016. Web. 15 Nov 2019.

Vancouver:

Yin J. Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy. [Internet] [Thesis]. Université Catholique de Louvain; 2016. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/2078.1/182154.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Yin J. Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy. [Thesis]. Université Catholique de Louvain; 2016. Available from: http://hdl.handle.net/2078.1/182154

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

21. Fernandez Garrillo, Pablo Arturo. Développement de techniques de microscopie Kelvin hautement résolues et photomodulées pour l'étude de systèmes photovoltaïques : Development of highly resolved and photo-modulated Kelvin probe microscopy techniques for the study of photovoltaic systems.

Degree: Docteur es, Nanophysique, 2018, Grenoble Alpes

Cette thèse propose, décrit et utilise un ensemble de techniques basées sur la microscopie à force atomique sous ultravide pour la cartographie simultanée, à l'échelle… (more)

Subjects/Keywords: Recombinaison des porteurs de charge; Photovoltaïque; Microscopie à sonde de Kelvin; Microscopie à sonde local; Énergie solaire; Potentiel de surface; Charge carriers recombination; Photovoltaics; Kelvin probe force microscopy; Atomic force microscopy; Solar energy; Surface photovoltage; 530

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APA (6th Edition):

Fernandez Garrillo, P. A. (2018). Développement de techniques de microscopie Kelvin hautement résolues et photomodulées pour l'étude de systèmes photovoltaïques : Development of highly resolved and photo-modulated Kelvin probe microscopy techniques for the study of photovoltaic systems. (Doctoral Dissertation). Grenoble Alpes. Retrieved from http://www.theses.fr/2018GREAY031

Chicago Manual of Style (16th Edition):

Fernandez Garrillo, Pablo Arturo. “Développement de techniques de microscopie Kelvin hautement résolues et photomodulées pour l'étude de systèmes photovoltaïques : Development of highly resolved and photo-modulated Kelvin probe microscopy techniques for the study of photovoltaic systems.” 2018. Doctoral Dissertation, Grenoble Alpes. Accessed November 15, 2019. http://www.theses.fr/2018GREAY031.

MLA Handbook (7th Edition):

Fernandez Garrillo, Pablo Arturo. “Développement de techniques de microscopie Kelvin hautement résolues et photomodulées pour l'étude de systèmes photovoltaïques : Development of highly resolved and photo-modulated Kelvin probe microscopy techniques for the study of photovoltaic systems.” 2018. Web. 15 Nov 2019.

Vancouver:

Fernandez Garrillo PA. Développement de techniques de microscopie Kelvin hautement résolues et photomodulées pour l'étude de systèmes photovoltaïques : Development of highly resolved and photo-modulated Kelvin probe microscopy techniques for the study of photovoltaic systems. [Internet] [Doctoral dissertation]. Grenoble Alpes; 2018. [cited 2019 Nov 15]. Available from: http://www.theses.fr/2018GREAY031.

Council of Science Editors:

Fernandez Garrillo PA. Développement de techniques de microscopie Kelvin hautement résolues et photomodulées pour l'étude de systèmes photovoltaïques : Development of highly resolved and photo-modulated Kelvin probe microscopy techniques for the study of photovoltaic systems. [Doctoral Dissertation]. Grenoble Alpes; 2018. Available from: http://www.theses.fr/2018GREAY031


Universitat Autònoma de Barcelona

22. Aghamohammadi, Mahdieh. Nanoscale investigation and control of the interfacial properties of organic solar cells and organic thin-film transistors.

Degree: Departament de Física, 2016, Universitat Autònoma de Barcelona

 Thin-film and interface properties of organic semiconductors are among the most prominent aspects with regard to the overall performance of organic electronic devices. The interface… (more)

Subjects/Keywords: Organic solar cells; Células solares orgánicas; Cèllules solars orgàniques; Organic thin-film transistors; Transistores orgánicos de película delgada; Transistors orgànics de película prima; Kelvin probe force microscopy; Microscopia de sonda Kelvin; Microscopia de sonda Kelvin; Ciències Experimentals; 53

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APA (6th Edition):

Aghamohammadi, M. (2016). Nanoscale investigation and control of the interfacial properties of organic solar cells and organic thin-film transistors. (Thesis). Universitat Autònoma de Barcelona. Retrieved from http://hdl.handle.net/10803/392722

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Aghamohammadi, Mahdieh. “Nanoscale investigation and control of the interfacial properties of organic solar cells and organic thin-film transistors.” 2016. Thesis, Universitat Autònoma de Barcelona. Accessed November 15, 2019. http://hdl.handle.net/10803/392722.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Aghamohammadi, Mahdieh. “Nanoscale investigation and control of the interfacial properties of organic solar cells and organic thin-film transistors.” 2016. Web. 15 Nov 2019.

Vancouver:

Aghamohammadi M. Nanoscale investigation and control of the interfacial properties of organic solar cells and organic thin-film transistors. [Internet] [Thesis]. Universitat Autònoma de Barcelona; 2016. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/10803/392722.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Aghamohammadi M. Nanoscale investigation and control of the interfacial properties of organic solar cells and organic thin-film transistors. [Thesis]. Universitat Autònoma de Barcelona; 2016. Available from: http://hdl.handle.net/10803/392722

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

23. Polak, L. Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy .

Degree: 2017, Vrije Universiteit Amsterdam

Subjects/Keywords: Kelvin probe force microscopy; water splitting; NaTaO3; semiconductor surface; surface photovoltage

Page 1

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APA (6th Edition):

Polak, L. (2017). Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy . (Doctoral Dissertation). Vrije Universiteit Amsterdam. Retrieved from http://hdl.handle.net/1871/55270

Chicago Manual of Style (16th Edition):

Polak, L. “Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy .” 2017. Doctoral Dissertation, Vrije Universiteit Amsterdam. Accessed November 15, 2019. http://hdl.handle.net/1871/55270.

MLA Handbook (7th Edition):

Polak, L. “Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy .” 2017. Web. 15 Nov 2019.

Vancouver:

Polak L. Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy . [Internet] [Doctoral dissertation]. Vrije Universiteit Amsterdam; 2017. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/1871/55270.

Council of Science Editors:

Polak L. Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy . [Doctoral Dissertation]. Vrije Universiteit Amsterdam; 2017. Available from: http://hdl.handle.net/1871/55270

24. Polak, L. Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy.

Degree: Faculty of Sciences, 2017, NARCIS

Subjects/Keywords: Kelvin probe force microscopy; water splitting; NaTaO3; semiconductor surface; surface photovoltage

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APA (6th Edition):

Polak, L. (2017). Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy. (Doctoral Dissertation). NARCIS. Retrieved from https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; urn:nbn:nl:ui:31-1871/55270 ; c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; 1871/55270 ; urn:isbn:9789053832745 ; urn:nbn:nl:ui:31-1871/55270 ; https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed

Chicago Manual of Style (16th Edition):

Polak, L. “Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy.” 2017. Doctoral Dissertation, NARCIS. Accessed November 15, 2019. https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; urn:nbn:nl:ui:31-1871/55270 ; c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; 1871/55270 ; urn:isbn:9789053832745 ; urn:nbn:nl:ui:31-1871/55270 ; https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed.

MLA Handbook (7th Edition):

Polak, L. “Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy.” 2017. Web. 15 Nov 2019.

Vancouver:

Polak L. Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy. [Internet] [Doctoral dissertation]. NARCIS; 2017. [cited 2019 Nov 15]. Available from: https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; urn:nbn:nl:ui:31-1871/55270 ; c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; 1871/55270 ; urn:isbn:9789053832745 ; urn:nbn:nl:ui:31-1871/55270 ; https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed.

Council of Science Editors:

Polak L. Surface photovoltage mapping on water splitting NaTaO3 with Kelvin probe force microscopy. [Doctoral Dissertation]. NARCIS; 2017. Available from: https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; urn:nbn:nl:ui:31-1871/55270 ; c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed ; 1871/55270 ; urn:isbn:9789053832745 ; urn:nbn:nl:ui:31-1871/55270 ; https://research.vu.nl/en/publications/c1b4504f-a19f-4d5b-b3c2-8da00e28a0ed


Brno University of Technology

25. Kovařík, Martin. Analýza jednorozměrných struktur pomocí Kelvinovy silové mikroskopie .

Degree: 2017, Brno University of Technology

 Tato práce se zabývá využitím Kelvinovy silové mikroskopie (KPFM) při analýze 1D nanostruktur, konkrétně germaniových nanodrátů a nanotrubic ze sulfidu wolframičitého (WS2). První část této… (more)

Subjects/Keywords: Kelvinova silová mikroskopie; KPFM; nanodráty; nanotrubice; zlaté nanočástice; sulfid wolframičitý; WS2; Kelvin probe force microscopy; KPFM; nanowires; nanotubes; gold nanoparticles; tungsten disulfide; WS2

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Kovařík, M. (2017). Analýza jednorozměrných struktur pomocí Kelvinovy silové mikroskopie . (Thesis). Brno University of Technology. Retrieved from http://hdl.handle.net/11012/65045

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Kovařík, Martin. “Analýza jednorozměrných struktur pomocí Kelvinovy silové mikroskopie .” 2017. Thesis, Brno University of Technology. Accessed November 15, 2019. http://hdl.handle.net/11012/65045.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Kovařík, Martin. “Analýza jednorozměrných struktur pomocí Kelvinovy silové mikroskopie .” 2017. Web. 15 Nov 2019.

Vancouver:

Kovařík M. Analýza jednorozměrných struktur pomocí Kelvinovy silové mikroskopie . [Internet] [Thesis]. Brno University of Technology; 2017. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/11012/65045.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Kovařík M. Analýza jednorozměrných struktur pomocí Kelvinovy silové mikroskopie . [Thesis]. Brno University of Technology; 2017. Available from: http://hdl.handle.net/11012/65045

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Université de Grenoble

26. Fuchs, Franz. Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy.

Degree: Docteur es, Nanophysique, 2014, Université de Grenoble

Pour cette thèse, des systèmes donneur-accepteur (DA) modèles pour le photovoltaïque organique ont été étudiés par microscopie à force atomique en mode non contact (nc-AFM)… (more)

Subjects/Keywords: AFM non contact; Microscopie à Sonde de Kelvin; Matériaux Pi-Conjugués; Interfaces Donneur-Accepteur; Microscopie à Effet Tunnel; Photovoltaïque Organique; Non-contact AFM; Kelvin Probe Force Microscopy; Pi-Conjugated Materials; Donor-Acceptor Interfaces; Scanning Tunneling Microscopy; Organic Photovoltaics; 530

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APA (6th Edition):

Fuchs, F. (2014). Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy. (Doctoral Dissertation). Université de Grenoble. Retrieved from http://www.theses.fr/2014GRENY036

Chicago Manual of Style (16th Edition):

Fuchs, Franz. “Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy.” 2014. Doctoral Dissertation, Université de Grenoble. Accessed November 15, 2019. http://www.theses.fr/2014GRENY036.

MLA Handbook (7th Edition):

Fuchs, Franz. “Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy.” 2014. Web. 15 Nov 2019.

Vancouver:

Fuchs F. Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy. [Internet] [Doctoral dissertation]. Université de Grenoble; 2014. [cited 2019 Nov 15]. Available from: http://www.theses.fr/2014GRENY036.

Council of Science Editors:

Fuchs F. Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy. [Doctoral Dissertation]. Université de Grenoble; 2014. Available from: http://www.theses.fr/2014GRENY036


Université de Neuchâtel

27. Dominé, Didier. The role of front electrodes and intermediate reflectors in the optoelectronic properties of high-efficiency micromorph solar cells.

Degree: 2009, Université de Neuchâtel

 On the road towards silicon thin-film photovoltaic modules with a conversion efficiency of 10%, the micromorph tandem solar cell is a promising candidate. Two ingredients… (more)

Subjects/Keywords: scanning Kelvin probe microscopy

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APA (6th Edition):

Dominé, D. (2009). The role of front electrodes and intermediate reflectors in the optoelectronic properties of high-efficiency micromorph solar cells. (Thesis). Université de Neuchâtel. Retrieved from http://doc.rero.ch/record/17471

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Dominé, Didier. “The role of front electrodes and intermediate reflectors in the optoelectronic properties of high-efficiency micromorph solar cells.” 2009. Thesis, Université de Neuchâtel. Accessed November 15, 2019. http://doc.rero.ch/record/17471.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Dominé, Didier. “The role of front electrodes and intermediate reflectors in the optoelectronic properties of high-efficiency micromorph solar cells.” 2009. Web. 15 Nov 2019.

Vancouver:

Dominé D. The role of front electrodes and intermediate reflectors in the optoelectronic properties of high-efficiency micromorph solar cells. [Internet] [Thesis]. Université de Neuchâtel; 2009. [cited 2019 Nov 15]. Available from: http://doc.rero.ch/record/17471.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Dominé D. The role of front electrodes and intermediate reflectors in the optoelectronic properties of high-efficiency micromorph solar cells. [Thesis]. Université de Neuchâtel; 2009. Available from: http://doc.rero.ch/record/17471

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Louisiana State University

28. Kelley, Algernon Tremayne. Applying scanning probe microscopy for the investigation of molecular self-assembly mechanisms and properties of designed nanomaterials.

Degree: PhD, Chemistry, 2009, Louisiana State University

 Scanning probe microscopy (SPM) for conducting surface characterizations of nanomaterials and molecular self-assembly processes is emerging as an important contribution in nanotechnology, especially towards the… (more)

Subjects/Keywords: Nanoparticle; Scanning Probe Lithography; Aomic Force Microscopy

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APA (6th Edition):

Kelley, A. T. (2009). Applying scanning probe microscopy for the investigation of molecular self-assembly mechanisms and properties of designed nanomaterials. (Doctoral Dissertation). Louisiana State University. Retrieved from etd-11112009-102005 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1083

Chicago Manual of Style (16th Edition):

Kelley, Algernon Tremayne. “Applying scanning probe microscopy for the investigation of molecular self-assembly mechanisms and properties of designed nanomaterials.” 2009. Doctoral Dissertation, Louisiana State University. Accessed November 15, 2019. etd-11112009-102005 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1083.

MLA Handbook (7th Edition):

Kelley, Algernon Tremayne. “Applying scanning probe microscopy for the investigation of molecular self-assembly mechanisms and properties of designed nanomaterials.” 2009. Web. 15 Nov 2019.

Vancouver:

Kelley AT. Applying scanning probe microscopy for the investigation of molecular self-assembly mechanisms and properties of designed nanomaterials. [Internet] [Doctoral dissertation]. Louisiana State University; 2009. [cited 2019 Nov 15]. Available from: etd-11112009-102005 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1083.

Council of Science Editors:

Kelley AT. Applying scanning probe microscopy for the investigation of molecular self-assembly mechanisms and properties of designed nanomaterials. [Doctoral Dissertation]. Louisiana State University; 2009. Available from: etd-11112009-102005 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1083

29. Smith, Gregory J. Nanoscale Manipulation of Surfaces and Interfaces: Engineering Electrical Properties Through Nanofabrication.

Degree: PhD, Chemistry, 2013, University of Kansas

 Nanotechnology interest and research has increased dramatically over the last decade, but there remain fundamental limitations and barriers to the fabrication of ever smaller devices.… (more)

Subjects/Keywords: Physical chemistry; Nanoscience; Nanotechnology; Atomic force microscopy; Graphite; Kelvin probe force microscopy; Metallic nanowire; Nanofabrication; Nanolithography

…nanolithography (DPN) is a so called additive scanning probe microscopy technique that is… …utilizes other scanning probe microscopy lithographic methods. Using an AFM, surface chemistry… …and B) lateral force image. This shows the ability to form arbitrarily shaped patterns… …probe lithography, 636-642, Copyright (2001), with permission from Elsevier… …recorded, while an AC bias is supplied to the tip. This bias causes the tip to feel a force from… 

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APA (6th Edition):

Smith, G. J. (2013). Nanoscale Manipulation of Surfaces and Interfaces: Engineering Electrical Properties Through Nanofabrication. (Doctoral Dissertation). University of Kansas. Retrieved from http://hdl.handle.net/1808/14218

Chicago Manual of Style (16th Edition):

Smith, Gregory J. “Nanoscale Manipulation of Surfaces and Interfaces: Engineering Electrical Properties Through Nanofabrication.” 2013. Doctoral Dissertation, University of Kansas. Accessed November 15, 2019. http://hdl.handle.net/1808/14218.

MLA Handbook (7th Edition):

Smith, Gregory J. “Nanoscale Manipulation of Surfaces and Interfaces: Engineering Electrical Properties Through Nanofabrication.” 2013. Web. 15 Nov 2019.

Vancouver:

Smith GJ. Nanoscale Manipulation of Surfaces and Interfaces: Engineering Electrical Properties Through Nanofabrication. [Internet] [Doctoral dissertation]. University of Kansas; 2013. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/1808/14218.

Council of Science Editors:

Smith GJ. Nanoscale Manipulation of Surfaces and Interfaces: Engineering Electrical Properties Through Nanofabrication. [Doctoral Dissertation]. University of Kansas; 2013. Available from: http://hdl.handle.net/1808/14218


Georgia Tech

30. Remmert, Jessica Lynn. Nano Thermal and Contact Potential Analysis with Heated Probe Tips.

Degree: MS, Mechanical Engineering, 2007, Georgia Tech

 This work describes two closed-loop atomic force microscopy methods that utilize the heated silicon probe to interrogate surfaces. The first method identifies the softening temperatures… (more)

Subjects/Keywords: Atomic force microscopy; Heated silicon cantilever; Local thermal analysis; Contact potential analysis; Kelvin probe; Atomic force microscopy; Probes (Electronic instruments)

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APA (6th Edition):

Remmert, J. L. (2007). Nano Thermal and Contact Potential Analysis with Heated Probe Tips. (Masters Thesis). Georgia Tech. Retrieved from http://hdl.handle.net/1853/14585

Chicago Manual of Style (16th Edition):

Remmert, Jessica Lynn. “Nano Thermal and Contact Potential Analysis with Heated Probe Tips.” 2007. Masters Thesis, Georgia Tech. Accessed November 15, 2019. http://hdl.handle.net/1853/14585.

MLA Handbook (7th Edition):

Remmert, Jessica Lynn. “Nano Thermal and Contact Potential Analysis with Heated Probe Tips.” 2007. Web. 15 Nov 2019.

Vancouver:

Remmert JL. Nano Thermal and Contact Potential Analysis with Heated Probe Tips. [Internet] [Masters thesis]. Georgia Tech; 2007. [cited 2019 Nov 15]. Available from: http://hdl.handle.net/1853/14585.

Council of Science Editors:

Remmert JL. Nano Thermal and Contact Potential Analysis with Heated Probe Tips. [Masters Thesis]. Georgia Tech; 2007. Available from: http://hdl.handle.net/1853/14585

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