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You searched for subject:(Flip flop hardening). Showing records 1 – 4 of 4 total matches.

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1. Wang, Haibin. STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS.

Degree: 2015, University of Saskatchewan

 Microelectronic devices and systems have been extensively utilized in a variety of radiation environments, ranging from the low-earth orbit to the ground level. A high-energy… (more)

Subjects/Keywords: Single event effects; Charge sharing; nano technology; flip-flop; Radiation Hardening By Design

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APA (6th Edition):

Wang, H. (2015). STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS. (Thesis). University of Saskatchewan. Retrieved from http://hdl.handle.net/10388/ETD-2015-08-2101

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Wang, Haibin. “STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS.” 2015. Thesis, University of Saskatchewan. Accessed March 03, 2021. http://hdl.handle.net/10388/ETD-2015-08-2101.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Wang, Haibin. “STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS.” 2015. Web. 03 Mar 2021.

Vancouver:

Wang H. STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS. [Internet] [Thesis]. University of Saskatchewan; 2015. [cited 2021 Mar 03]. Available from: http://hdl.handle.net/10388/ETD-2015-08-2101.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Wang H. STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS. [Thesis]. University of Saskatchewan; 2015. Available from: http://hdl.handle.net/10388/ETD-2015-08-2101

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Arizona State University

2. Gujja, Aditya. Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft-Error Mitigation.

Degree: Electrical Engineering, 2015, Arizona State University

 An integrated methodology combining redundant clock tree synthesis and pulse clocked latches mitigates both single event upsets (SEU) and single event transients (SET) with reduced… (more)

Subjects/Keywords: Electrical engineering; Flip-Flop; multiple node charge collection; single event transient; single event upset; temporal hardening; triple mode redundancy

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APA (6th Edition):

Gujja, A. (2015). Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft-Error Mitigation. (Masters Thesis). Arizona State University. Retrieved from http://repository.asu.edu/items/36471

Chicago Manual of Style (16th Edition):

Gujja, Aditya. “Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft-Error Mitigation.” 2015. Masters Thesis, Arizona State University. Accessed March 03, 2021. http://repository.asu.edu/items/36471.

MLA Handbook (7th Edition):

Gujja, Aditya. “Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft-Error Mitigation.” 2015. Web. 03 Mar 2021.

Vancouver:

Gujja A. Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft-Error Mitigation. [Internet] [Masters thesis]. Arizona State University; 2015. [cited 2021 Mar 03]. Available from: http://repository.asu.edu/items/36471.

Council of Science Editors:

Gujja A. Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft-Error Mitigation. [Masters Thesis]. Arizona State University; 2015. Available from: http://repository.asu.edu/items/36471


Arizona State University

3. Shambhulingaiah, Sandeep. Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation.

Degree: Electrical Engineering, 2015, Arizona State University

Subjects/Keywords: Electrical engineering; Flip-flop; Methodology; Multi node charge collection; Radiation hardening by design; Single Event Transient (SET); Single Event Upset (SEU)

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Shambhulingaiah, S. (2015). Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation. (Doctoral Dissertation). Arizona State University. Retrieved from http://repository.asu.edu/items/29650

Chicago Manual of Style (16th Edition):

Shambhulingaiah, Sandeep. “Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation.” 2015. Doctoral Dissertation, Arizona State University. Accessed March 03, 2021. http://repository.asu.edu/items/29650.

MLA Handbook (7th Edition):

Shambhulingaiah, Sandeep. “Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation.” 2015. Web. 03 Mar 2021.

Vancouver:

Shambhulingaiah S. Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation. [Internet] [Doctoral dissertation]. Arizona State University; 2015. [cited 2021 Mar 03]. Available from: http://repository.asu.edu/items/29650.

Council of Science Editors:

Shambhulingaiah S. Methodical Design Approaches to Multiple Node Collection Robustness for Flip-Flop Soft Error MItigation. [Doctoral Dissertation]. Arizona State University; 2015. Available from: http://repository.asu.edu/items/29650

4. Campbell, Keith A. Robust and reliable hardware accelerator design through high-level synthesis.

Degree: PhD, Electrical & Computer Engr, 2017, University of Illinois – Urbana-Champaign

 System-on-chip design is becoming increasingly complex as technology scaling enables more and more functionality on a chip. This scaling-driven complexity has resulted in a variety… (more)

Subjects/Keywords: High-level synthesis (HLS); Automation; Error detection; Scheduling; Binding; Compiler transformation; Compiler optimization; Pipelining; Modulo arithmetic; Modulo-3; Logic optimization; State machine; Datapath; Control logic; Shadow datapath; Modulo datapath; Low cost; High performance; Electrical bug; Aliasing; Stuck-at fault; Soft error; Timing error; Checkpointing; Rollback; Recovery; Pre-silicon validation; Post-silicon validation; Pre-silicon debug; Post-silicon debug; Accelerator; System on a chip; Signature generation; Execution signature; Execution hash; Logic bug; Nondeterministic bug; Masked error; Circuit reliability; Hot spot; Wear out; Silent data corruption; Observability; Detection latency; Mixed datapath; Diversity; Checkpoint corruption; Error injection; Error removal; Quick Error Detection (QED); Hybrid Quick Error Detection (H-QED); Instrumentation; Hybrid co-simulation; Hardware/software; Integration testing; Hybrid tracing; Hybrid hashing; Source-code localization; Software debugging tool; Valgrind; Clang sanitizer; Clang static analyzer; Cppcheck; Root cause analysis; Execution tracing; Realtime error detection; Simulation trigger; Nonintrusive; Address conversion; Undefined behavior; High-level synthesis (HLS) bug; Detection coverage; Gate-level architecture; Mersenne modulus; Full adder; Half adder; Quarter adder; Wraparound; Modulo reducer; Modulo adder; Modulo multiplier; Modulo comparator; Cross-layer; Algorithm; Instruction; Architecture; Logic synthesis; Physical design; Algorithm-based fault tolerance (ABFT); Error detection by duplicated instructions (EDDI); Parity; Flip-flop hardening; Layout design through error-aware transistor positioning dual interlocked storage cell (LEAP-DICE); Cost-effective; Place-and-route; Field programmable gate array (FPGA) emulation; Application specific integrated circuit (ASIC); Field programmable gate array (FPGA); Energy; Area; Latency

…design. Flip-flop hardening techniques [36,37] have been proposed to address soft… …units. While razor logic, flip-flop hardening, and parity are limited to certain kinds of… …flop to a latch flip-flop that it misses the latch window. The result is that the wrong value… …can be latched at the latch flip-flop; when this occurs it is known as a timing error. We… …can model this timing error as a bit flip at the latch flip-flop, given these four… 

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Campbell, K. A. (2017). Robust and reliable hardware accelerator design through high-level synthesis. (Doctoral Dissertation). University of Illinois – Urbana-Champaign. Retrieved from http://hdl.handle.net/2142/99294

Chicago Manual of Style (16th Edition):

Campbell, Keith A. “Robust and reliable hardware accelerator design through high-level synthesis.” 2017. Doctoral Dissertation, University of Illinois – Urbana-Champaign. Accessed March 03, 2021. http://hdl.handle.net/2142/99294.

MLA Handbook (7th Edition):

Campbell, Keith A. “Robust and reliable hardware accelerator design through high-level synthesis.” 2017. Web. 03 Mar 2021.

Vancouver:

Campbell KA. Robust and reliable hardware accelerator design through high-level synthesis. [Internet] [Doctoral dissertation]. University of Illinois – Urbana-Champaign; 2017. [cited 2021 Mar 03]. Available from: http://hdl.handle.net/2142/99294.

Council of Science Editors:

Campbell KA. Robust and reliable hardware accelerator design through high-level synthesis. [Doctoral Dissertation]. University of Illinois – Urbana-Champaign; 2017. Available from: http://hdl.handle.net/2142/99294

.