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University: Vanderbilt University

You searched for subject:(Errors). Showing records 1 – 16 of 16 total matches.

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Vanderbilt University

1. Loehr, Abbey Marie. Don't make the same mistake twice: Examining the relationship between memory for errors and learning.

Degree: PhD, Psychology, 2018, Vanderbilt University

 Committing errors is a common part of the learning process, and current evidence suggests that committing errors can be beneficial for learning, at least for… (more)

Subjects/Keywords: middle-school; mediation; perseveration errors; mathematics

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APA (6th Edition):

Loehr, A. M. (2018). Don't make the same mistake twice: Examining the relationship between memory for errors and learning. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-06262018-115110/ ;

Chicago Manual of Style (16th Edition):

Loehr, Abbey Marie. “Don't make the same mistake twice: Examining the relationship between memory for errors and learning.” 2018. Doctoral Dissertation, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-06262018-115110/ ;.

MLA Handbook (7th Edition):

Loehr, Abbey Marie. “Don't make the same mistake twice: Examining the relationship between memory for errors and learning.” 2018. Web. 20 Oct 2019.

Vancouver:

Loehr AM. Don't make the same mistake twice: Examining the relationship between memory for errors and learning. [Internet] [Doctoral dissertation]. Vanderbilt University; 2018. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-06262018-115110/ ;.

Council of Science Editors:

Loehr AM. Don't make the same mistake twice: Examining the relationship between memory for errors and learning. [Doctoral Dissertation]. Vanderbilt University; 2018. Available from: http://etd.library.vanderbilt.edu/available/etd-06262018-115110/ ;


Vanderbilt University

2. Armstrong, Gail Elizabeth. Nurses' Perceived Skills and Attitudes About Update Safety Concepts: Associations with Medication Administration Errors and Practices.

Degree: PhD, Nursing Science, 2016, Vanderbilt University

 Healthcare organizations have incorporated updated safety principles in the analysis of errors and updating of norms, policies and standards. Error is an ongoing concern in… (more)

Subjects/Keywords: medication administration errors; safety; medication administration practices; patient safety

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APA (6th Edition):

Armstrong, G. E. (2016). Nurses' Perceived Skills and Attitudes About Update Safety Concepts: Associations with Medication Administration Errors and Practices. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03222016-204532/ ;

Chicago Manual of Style (16th Edition):

Armstrong, Gail Elizabeth. “Nurses' Perceived Skills and Attitudes About Update Safety Concepts: Associations with Medication Administration Errors and Practices.” 2016. Doctoral Dissertation, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03222016-204532/ ;.

MLA Handbook (7th Edition):

Armstrong, Gail Elizabeth. “Nurses' Perceived Skills and Attitudes About Update Safety Concepts: Associations with Medication Administration Errors and Practices.” 2016. Web. 20 Oct 2019.

Vancouver:

Armstrong GE. Nurses' Perceived Skills and Attitudes About Update Safety Concepts: Associations with Medication Administration Errors and Practices. [Internet] [Doctoral dissertation]. Vanderbilt University; 2016. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03222016-204532/ ;.

Council of Science Editors:

Armstrong GE. Nurses' Perceived Skills and Attitudes About Update Safety Concepts: Associations with Medication Administration Errors and Practices. [Doctoral Dissertation]. Vanderbilt University; 2016. Available from: http://etd.library.vanderbilt.edu/available/etd-03222016-204532/ ;


Vanderbilt University

3. Mahatme, Nihaar Nilesh. Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation.

Degree: MS, Electrical Engineering, 2011, Vanderbilt University

 Single Event Effects (SEE) in combinational logic circuits, caused due radiation particle strikes are a major concern for modern high-speed devices. The frequency dependence of… (more)

Subjects/Keywords: combinational logic circuits; high speed circuits; radiation effects; single event effects; soft errors

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APA (6th Edition):

Mahatme, N. N. (2011). Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-12062011-113559/ ;

Chicago Manual of Style (16th Edition):

Mahatme, Nihaar Nilesh. “Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation.” 2011. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-12062011-113559/ ;.

MLA Handbook (7th Edition):

Mahatme, Nihaar Nilesh. “Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation.” 2011. Web. 20 Oct 2019.

Vancouver:

Mahatme NN. Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation. [Internet] [Masters thesis]. Vanderbilt University; 2011. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-12062011-113559/ ;.

Council of Science Editors:

Mahatme NN. Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation. [Masters Thesis]. Vanderbilt University; 2011. Available from: http://etd.library.vanderbilt.edu/available/etd-12062011-113559/ ;


Vanderbilt University

4. Kou, Lingbo. Impact of process variations on soft error sensitivity of 32-nm VLSI circuits in near-threshold region.

Degree: MS, Electrical Engineering, 2014, Vanderbilt University

 Power consumption has become a major concern of integrated circuit (IC) design. Reducing the supply voltage to the near-threshold region is one method to reduce… (more)

Subjects/Keywords: flip-flop; radiation-induced soft errors; sram; near-threshold voltage; critical charge; process variations; reliability

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APA (6th Edition):

Kou, L. (2014). Impact of process variations on soft error sensitivity of 32-nm VLSI circuits in near-threshold region. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-04082014-141041/ ;

Chicago Manual of Style (16th Edition):

Kou, Lingbo. “Impact of process variations on soft error sensitivity of 32-nm VLSI circuits in near-threshold region.” 2014. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-04082014-141041/ ;.

MLA Handbook (7th Edition):

Kou, Lingbo. “Impact of process variations on soft error sensitivity of 32-nm VLSI circuits in near-threshold region.” 2014. Web. 20 Oct 2019.

Vancouver:

Kou L. Impact of process variations on soft error sensitivity of 32-nm VLSI circuits in near-threshold region. [Internet] [Masters thesis]. Vanderbilt University; 2014. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-04082014-141041/ ;.

Council of Science Editors:

Kou L. Impact of process variations on soft error sensitivity of 32-nm VLSI circuits in near-threshold region. [Masters Thesis]. Vanderbilt University; 2014. Available from: http://etd.library.vanderbilt.edu/available/etd-04082014-141041/ ;


Vanderbilt University

5. McNeer, Elizabeth Ann. Evaluating Chart Review Strategies Using Electronic Health Record Data in the Context of Risk Prediction Modeling.

Degree: MS, Biostatistics, 2018, Vanderbilt University

 Chart reviews are often needed to collect or adjudicate information for retrospective studies in the absence of reliable research databases. For studies with smaller sample… (more)

Subjects/Keywords: chart review; sampling strategies; electronic health records; risk prediction modeling; data errors

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APA (6th Edition):

McNeer, E. A. (2018). Evaluating Chart Review Strategies Using Electronic Health Record Data in the Context of Risk Prediction Modeling. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-07022018-124724/ ;

Chicago Manual of Style (16th Edition):

McNeer, Elizabeth Ann. “Evaluating Chart Review Strategies Using Electronic Health Record Data in the Context of Risk Prediction Modeling.” 2018. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-07022018-124724/ ;.

MLA Handbook (7th Edition):

McNeer, Elizabeth Ann. “Evaluating Chart Review Strategies Using Electronic Health Record Data in the Context of Risk Prediction Modeling.” 2018. Web. 20 Oct 2019.

Vancouver:

McNeer EA. Evaluating Chart Review Strategies Using Electronic Health Record Data in the Context of Risk Prediction Modeling. [Internet] [Masters thesis]. Vanderbilt University; 2018. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-07022018-124724/ ;.

Council of Science Editors:

McNeer EA. Evaluating Chart Review Strategies Using Electronic Health Record Data in the Context of Risk Prediction Modeling. [Masters Thesis]. Vanderbilt University; 2018. Available from: http://etd.library.vanderbilt.edu/available/etd-07022018-124724/ ;


Vanderbilt University

6. Limbrick, Daniel Brian. Mitigation of Radiation-induced Soft Errors Using Temporal Embedded Signature Monitoring.

Degree: MS, Electrical Engineering, 2009, Vanderbilt University

 Soft errors can alter the correct execution of code within a microprocessor, particularly if control logic is compromised. This thesis addresses the vulnerability of a… (more)

Subjects/Keywords: signature monitoring; control flow; architectural reliability; soft errors

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APA (6th Edition):

Limbrick, D. B. (2009). Mitigation of Radiation-induced Soft Errors Using Temporal Embedded Signature Monitoring. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-12042009-004054/ ;

Chicago Manual of Style (16th Edition):

Limbrick, Daniel Brian. “Mitigation of Radiation-induced Soft Errors Using Temporal Embedded Signature Monitoring.” 2009. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-12042009-004054/ ;.

MLA Handbook (7th Edition):

Limbrick, Daniel Brian. “Mitigation of Radiation-induced Soft Errors Using Temporal Embedded Signature Monitoring.” 2009. Web. 20 Oct 2019.

Vancouver:

Limbrick DB. Mitigation of Radiation-induced Soft Errors Using Temporal Embedded Signature Monitoring. [Internet] [Masters thesis]. Vanderbilt University; 2009. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-12042009-004054/ ;.

Council of Science Editors:

Limbrick DB. Mitigation of Radiation-induced Soft Errors Using Temporal Embedded Signature Monitoring. [Masters Thesis]. Vanderbilt University; 2009. Available from: http://etd.library.vanderbilt.edu/available/etd-12042009-004054/ ;


Vanderbilt University

7. Gadlage, Matthew John. Impact of Temperature on Single-Event Transients in Deep Submicrometer Bulk and Silicon-On-Insulator Digital CMOS Technologies.

Degree: PhD, Electrical Engineering, 2010, Vanderbilt University

 Single-event transients (SETs) are a significant reliability issue for space-based electronic systems. A single-event transient is a radiation-induced glitch in an electronic circuit caused by… (more)

Subjects/Keywords: radiation effects; space environment; soft errors; heavy ions; single event effects; single event transients; silicon-on-insulator; temperature

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APA (6th Edition):

Gadlage, M. J. (2010). Impact of Temperature on Single-Event Transients in Deep Submicrometer Bulk and Silicon-On-Insulator Digital CMOS Technologies. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03262010-102121/ ;

Chicago Manual of Style (16th Edition):

Gadlage, Matthew John. “Impact of Temperature on Single-Event Transients in Deep Submicrometer Bulk and Silicon-On-Insulator Digital CMOS Technologies.” 2010. Doctoral Dissertation, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03262010-102121/ ;.

MLA Handbook (7th Edition):

Gadlage, Matthew John. “Impact of Temperature on Single-Event Transients in Deep Submicrometer Bulk and Silicon-On-Insulator Digital CMOS Technologies.” 2010. Web. 20 Oct 2019.

Vancouver:

Gadlage MJ. Impact of Temperature on Single-Event Transients in Deep Submicrometer Bulk and Silicon-On-Insulator Digital CMOS Technologies. [Internet] [Doctoral dissertation]. Vanderbilt University; 2010. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03262010-102121/ ;.

Council of Science Editors:

Gadlage MJ. Impact of Temperature on Single-Event Transients in Deep Submicrometer Bulk and Silicon-On-Insulator Digital CMOS Technologies. [Doctoral Dissertation]. Vanderbilt University; 2010. Available from: http://etd.library.vanderbilt.edu/available/etd-03262010-102121/ ;

8. Mahatme, Nihaar Nilesh. Design Techniques for Power-Aware Combinational Logic SER Mitigation.

Degree: PhD, Electrical Engineering, 2014, Vanderbilt University

 Ensuring low power operation is a major challenge for designers in the era of portable devices, cloud computing and networked sensor systems. Concomitantly, combinational logic… (more)

Subjects/Keywords: combinational logic; circuit reliability; soft errors

…222 Appendix C : Frequency Threshold for Combinational Logic Soft Errors… …13 Figure 1-8 Predictions that indicate logic soft errors could be problem with increasing… …15 Figure 1-9 Predictions that indicate logic soft errors could be problem with technology… …Figure A2-1 Logic errors increase with frequency. [Buch-97] defined a frequency… …threshold (encircled above) at which logic errors would exceed flip-flop errors. Beyond… 

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APA (6th Edition):

Mahatme, N. N. (2014). Design Techniques for Power-Aware Combinational Logic SER Mitigation. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-12092014-230739/ ;

Chicago Manual of Style (16th Edition):

Mahatme, Nihaar Nilesh. “Design Techniques for Power-Aware Combinational Logic SER Mitigation.” 2014. Doctoral Dissertation, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-12092014-230739/ ;.

MLA Handbook (7th Edition):

Mahatme, Nihaar Nilesh. “Design Techniques for Power-Aware Combinational Logic SER Mitigation.” 2014. Web. 20 Oct 2019.

Vancouver:

Mahatme NN. Design Techniques for Power-Aware Combinational Logic SER Mitigation. [Internet] [Doctoral dissertation]. Vanderbilt University; 2014. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-12092014-230739/ ;.

Council of Science Editors:

Mahatme NN. Design Techniques for Power-Aware Combinational Logic SER Mitigation. [Doctoral Dissertation]. Vanderbilt University; 2014. Available from: http://etd.library.vanderbilt.edu/available/etd-12092014-230739/ ;


Vanderbilt University

9. Srinivasan, Varadarajan. Mitigation Of Soft Errors In ASIC-Based and FPGA-Based Logic Circuits.

Degree: MS, Electrical Engineering, 2006, Vanderbilt University

 With ever decreasing device feature sizes, subsequent generations of semiconductor logic circuits are more vulnerable to ionizing radiation effects when compared to their predecessors. Single… (more)

Subjects/Keywords: SEUTool; Error Detection and Correction; Arithmetic and Logic Unit (ALU); FPGA; ASIC; Soft Errors

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APA (6th Edition):

Srinivasan, V. (2006). Mitigation Of Soft Errors In ASIC-Based and FPGA-Based Logic Circuits. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03272006-092638/ ;

Chicago Manual of Style (16th Edition):

Srinivasan, Varadarajan. “Mitigation Of Soft Errors In ASIC-Based and FPGA-Based Logic Circuits.” 2006. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03272006-092638/ ;.

MLA Handbook (7th Edition):

Srinivasan, Varadarajan. “Mitigation Of Soft Errors In ASIC-Based and FPGA-Based Logic Circuits.” 2006. Web. 20 Oct 2019.

Vancouver:

Srinivasan V. Mitigation Of Soft Errors In ASIC-Based and FPGA-Based Logic Circuits. [Internet] [Masters thesis]. Vanderbilt University; 2006. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03272006-092638/ ;.

Council of Science Editors:

Srinivasan V. Mitigation Of Soft Errors In ASIC-Based and FPGA-Based Logic Circuits. [Masters Thesis]. Vanderbilt University; 2006. Available from: http://etd.library.vanderbilt.edu/available/etd-03272006-092638/ ;


Vanderbilt University

10. Campion, Jr., Thomas Richmond. Improving Provider-to-Provider Communication: Evaluation of a Computerized Inpatient Sign-out Tool.

Degree: MS, Biomedical Informatics, 2007, Vanderbilt University

 Physiciansâ use of a computerized inpatient sign-out tool has been shown to reduce the risk of preventable adverse events. The researcher evaluated sign-out software usage… (more)

Subjects/Keywords: Medical records  – Data processing; Medical errors  – Prevention; care provider order entry; sign-out; handoff; electronic medical record; Communication in medicine

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APA (6th Edition):

Campion, Jr., T. R. (2007). Improving Provider-to-Provider Communication: Evaluation of a Computerized Inpatient Sign-out Tool. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-09042007-115611/ ;

Chicago Manual of Style (16th Edition):

Campion, Jr., Thomas Richmond. “Improving Provider-to-Provider Communication: Evaluation of a Computerized Inpatient Sign-out Tool.” 2007. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-09042007-115611/ ;.

MLA Handbook (7th Edition):

Campion, Jr., Thomas Richmond. “Improving Provider-to-Provider Communication: Evaluation of a Computerized Inpatient Sign-out Tool.” 2007. Web. 20 Oct 2019.

Vancouver:

Campion, Jr. TR. Improving Provider-to-Provider Communication: Evaluation of a Computerized Inpatient Sign-out Tool. [Internet] [Masters thesis]. Vanderbilt University; 2007. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-09042007-115611/ ;.

Council of Science Editors:

Campion, Jr. TR. Improving Provider-to-Provider Communication: Evaluation of a Computerized Inpatient Sign-out Tool. [Masters Thesis]. Vanderbilt University; 2007. Available from: http://etd.library.vanderbilt.edu/available/etd-09042007-115611/ ;

11. Chatterjee, Indranil. Single-event charge collection and upset in 65-nm and 40-nm dual- and triple-well bulk CMOS SRAMS.

Degree: MS, Electrical Engineering, 2012, Vanderbilt University

 CMOS technologies can be either dual-well or triple-well. Triple-well technology has several advantages compared to dual-well technology in terms of electrical performance. Differences in the… (more)

Subjects/Keywords: Soft-errors; Single-Event Upset Reversal; Heavy Ion Irradiation; Triple-well; Dual-well; Single-Event Effects

…Figure Page No. 30 Frequency of errors with respect to location for alpha particle… …46 40 Maximum cluster size of recorded errors (checkerboard pattern) for dual… …47 41 Schematic showing the frequency of errors vs. well tap in the SRAM cell… …48 42 Frequency of errors with respect to location for Ar ion (LET: 8.34 MeVcm2/mg… …49 43 Frequency of errors with respect to location for Ar ion (LET: 8.34 MeVcm2/mg… 

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APA (6th Edition):

Chatterjee, I. (2012). Single-event charge collection and upset in 65-nm and 40-nm dual- and triple-well bulk CMOS SRAMS. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03252012-195135/ ;

Chicago Manual of Style (16th Edition):

Chatterjee, Indranil. “Single-event charge collection and upset in 65-nm and 40-nm dual- and triple-well bulk CMOS SRAMS.” 2012. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03252012-195135/ ;.

MLA Handbook (7th Edition):

Chatterjee, Indranil. “Single-event charge collection and upset in 65-nm and 40-nm dual- and triple-well bulk CMOS SRAMS.” 2012. Web. 20 Oct 2019.

Vancouver:

Chatterjee I. Single-event charge collection and upset in 65-nm and 40-nm dual- and triple-well bulk CMOS SRAMS. [Internet] [Masters thesis]. Vanderbilt University; 2012. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03252012-195135/ ;.

Council of Science Editors:

Chatterjee I. Single-event charge collection and upset in 65-nm and 40-nm dual- and triple-well bulk CMOS SRAMS. [Masters Thesis]. Vanderbilt University; 2012. Available from: http://etd.library.vanderbilt.edu/available/etd-03252012-195135/ ;

12. Kiddie, Bradley Thomas. Layout-Based Fault Injection for Combinational Logic in Nanometer Technologies.

Degree: MS, Electrical Engineering, 2012, Vanderbilt University

 As feature sizes and operating voltages decrease, single-event transients from particle strikes in logic circuits become more probable. Much literature is available on the effects… (more)

Subjects/Keywords: reliability; radiation-induced faults; single-event transient; multiple transient faults; soft errors; combinational logic; layout

…the probability of errors occurring at the output of a combinational circuit increases with… …helps mitigate this effect and contribute fewer errors. These more complex cases will show… …increasingly vulnerable to logic errors [3, 18]. In the study of fault propagation, several… …potentially join together at a later gate, which could mitigate errors or magnify them. The level of… …physical adjacency. A single particle strike will cause one or more errors in a single localized… 

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APA (6th Edition):

Kiddie, B. T. (2012). Layout-Based Fault Injection for Combinational Logic in Nanometer Technologies. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03262012-131128/ ;

Chicago Manual of Style (16th Edition):

Kiddie, Bradley Thomas. “Layout-Based Fault Injection for Combinational Logic in Nanometer Technologies.” 2012. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03262012-131128/ ;.

MLA Handbook (7th Edition):

Kiddie, Bradley Thomas. “Layout-Based Fault Injection for Combinational Logic in Nanometer Technologies.” 2012. Web. 20 Oct 2019.

Vancouver:

Kiddie BT. Layout-Based Fault Injection for Combinational Logic in Nanometer Technologies. [Internet] [Masters thesis]. Vanderbilt University; 2012. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03262012-131128/ ;.

Council of Science Editors:

Kiddie BT. Layout-Based Fault Injection for Combinational Logic in Nanometer Technologies. [Masters Thesis]. Vanderbilt University; 2012. Available from: http://etd.library.vanderbilt.edu/available/etd-03262012-131128/ ;

13. Qiu, Hao. Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors.

Degree: MS, Electrical Engineering, 2017, Vanderbilt University

 Hardware implementations of Object-Tracking Algorithms are susceptible to radiation-induced soft errors. The thesis analyzes the results of fault emulation experiments conducted on register-transfer level on… (more)

Subjects/Keywords: object-tracking; Radiation-induced faults; cross-layered reliability analysis; field-programmable gate arrays; soft errors

…issues of modern electronics, such as radiation-induced soft errors. When energetic particles… …errors. Furthermore, the chance of charge sharing among multiple devices increases, then single… …object-tracking algorithm, instead of analyzing errors within the configuration bits of the… 

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APA (6th Edition):

Qiu, H. (2017). Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03262017-152441/ ;

Chicago Manual of Style (16th Edition):

Qiu, Hao. “Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors.” 2017. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03262017-152441/ ;.

MLA Handbook (7th Edition):

Qiu, Hao. “Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors.” 2017. Web. 20 Oct 2019.

Vancouver:

Qiu H. Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors. [Internet] [Masters thesis]. Vanderbilt University; 2017. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03262017-152441/ ;.

Council of Science Editors:

Qiu H. Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors. [Masters Thesis]. Vanderbilt University; 2017. Available from: http://etd.library.vanderbilt.edu/available/etd-03262017-152441/ ;

14. Toomey, Corey Thomas. Statistical fault injection and analysis at the register transfer level using the Verilog procedural interface.

Degree: MS, Electrical Engineering, 2011, Vanderbilt University

 Soft errors are becoming an increasingly important issue in todayâs microelectronics industry. With decreasing transistor sizes and increasing transistor counts, it is simply not efficient… (more)

Subjects/Keywords: Register Transfer Level; Fault Injection; Architectural Vulnerability Factor; Soft Errors; Single Event; Verilog Procedural Interface; Statistical Fault Injection

…In our case, AVF is represented as the number of errors detected divided by the number of… …user to have real time detection of errors as well as real time detection of error… …and number of errors detected per module. Figure 4 represents the data for level one of the… …number of errors that were detected given a fault injected in that module. From the graph one… …can see that both Module1 and Module2 have the largest number of detected errors. Also of… 

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APA (6th Edition):

Toomey, C. T. (2011). Statistical fault injection and analysis at the register transfer level using the Verilog procedural interface. (Masters Thesis). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-04082011-122234/ ;

Chicago Manual of Style (16th Edition):

Toomey, Corey Thomas. “Statistical fault injection and analysis at the register transfer level using the Verilog procedural interface.” 2011. Masters Thesis, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-04082011-122234/ ;.

MLA Handbook (7th Edition):

Toomey, Corey Thomas. “Statistical fault injection and analysis at the register transfer level using the Verilog procedural interface.” 2011. Web. 20 Oct 2019.

Vancouver:

Toomey CT. Statistical fault injection and analysis at the register transfer level using the Verilog procedural interface. [Internet] [Masters thesis]. Vanderbilt University; 2011. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-04082011-122234/ ;.

Council of Science Editors:

Toomey CT. Statistical fault injection and analysis at the register transfer level using the Verilog procedural interface. [Masters Thesis]. Vanderbilt University; 2011. Available from: http://etd.library.vanderbilt.edu/available/etd-04082011-122234/ ;

15. Kim, Daejin. Three Essays On Market Microstructure.

Degree: PhD, Management, 2014, Vanderbilt University

 My dissertation consists of three essays. The first essay develops a price impact function when competitive market makers are risk-averse. The essay proves that price… (more)

Subjects/Keywords: Exchange-traded-funds; Bid-ask spread decomposition model; Price discovery; Merger Arbitrage; Price reversal; Mergers and Acquisitions; Price impact; Market Microstructure; Liquidity; Liquidity premium; Tracking errors; Volatility

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Kim, D. (2014). Three Essays On Market Microstructure. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-03242014-180122/ ;

Chicago Manual of Style (16th Edition):

Kim, Daejin. “Three Essays On Market Microstructure.” 2014. Doctoral Dissertation, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-03242014-180122/ ;.

MLA Handbook (7th Edition):

Kim, Daejin. “Three Essays On Market Microstructure.” 2014. Web. 20 Oct 2019.

Vancouver:

Kim D. Three Essays On Market Microstructure. [Internet] [Doctoral dissertation]. Vanderbilt University; 2014. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-03242014-180122/ ;.

Council of Science Editors:

Kim D. Three Essays On Market Microstructure. [Doctoral Dissertation]. Vanderbilt University; 2014. Available from: http://etd.library.vanderbilt.edu/available/etd-03242014-180122/ ;

16. Tipton, Alan Douglas. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.

Degree: PhD, Electrical Engineering, 2008, Vanderbilt University

 Soft errors in integrated circuits (ICs) are a critical problem facing state-of-the-art technologies. In both the terrestrial and space environment, the source of soft errors(more)

Subjects/Keywords: SRAM; radiation effects; multiple cell upset; multiple bit upset; Heavy ions; Integrated circuits  – Effect of radiation on; softer errors; Neutrons; Radiation hardening

…84 41. Ratio of uncorrectable EDAC errors to all bit errors versus LET for the Cassini… …uncorrectable errors. . . . . . . . . . . . . . . . 86 42. Ne ions incident at 0… …The interactions of charged particles with semiconductor devices may lead to logic errors in… …increased the susceptibility of ICs to radiation induced soft errors in state-of-the-art… …errors occur. SER not only depends on the device susceptibility to ionizing 2 radiation, but… 

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tipton, A. D. (2008). On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;

Chicago Manual of Style (16th Edition):

Tipton, Alan Douglas. “On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.” 2008. Doctoral Dissertation, Vanderbilt University. Accessed October 20, 2019. http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;.

MLA Handbook (7th Edition):

Tipton, Alan Douglas. “On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits.” 2008. Web. 20 Oct 2019.

Vancouver:

Tipton AD. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. [Internet] [Doctoral dissertation]. Vanderbilt University; 2008. [cited 2019 Oct 20]. Available from: http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;.

Council of Science Editors:

Tipton AD. On the Impact of Device Orientation on the Multiple Cell Upset Radiation Response in Nanoscale Integrated Circuits. [Doctoral Dissertation]. Vanderbilt University; 2008. Available from: http://etd.library.vanderbilt.edu/available/etd-11132008-162941/ ;

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