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You searched for subject:(Ellipsometry). Showing records 1 – 30 of 274 total matches.

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Penn State University

1. St John, David Benjamin. Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices.

Degree: 2012, Penn State University

 The commercial market for uncooled infrared imaging devices has expanded in the last several decades, following the declassification of pulse-biased microbolometer-based focal plane arrays (FPAs)… (more)

Subjects/Keywords: PECVD; silicon; germanium; infrared; ellipsometry; spectroscopic ellipsometry; infrared ellipsometry; microbolometer

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

St John, D. B. (2012). Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices. (Thesis). Penn State University. Retrieved from https://submit-etda.libraries.psu.edu/catalog/16148

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

St John, David Benjamin. “Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices.” 2012. Thesis, Penn State University. Accessed March 04, 2021. https://submit-etda.libraries.psu.edu/catalog/16148.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

St John, David Benjamin. “Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices.” 2012. Web. 04 Mar 2021.

Vancouver:

St John DB. Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices. [Internet] [Thesis]. Penn State University; 2012. [cited 2021 Mar 04]. Available from: https://submit-etda.libraries.psu.edu/catalog/16148.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

St John DB. Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices. [Thesis]. Penn State University; 2012. Available from: https://submit-etda.libraries.psu.edu/catalog/16148

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Universiteit Utrecht

2. Diamantopoulou, S. Design and Performance Analysis of the Poly-polarimeter.

Degree: 2012, Universiteit Utrecht

 The purpose of the current thesis is to present the design and performance analysis of a versatile ellipsometer called ”The Poly-polarimeter” . Its primary purpose… (more)

Subjects/Keywords: instrumentation; polarimetry; ellipsometry; Mueller Matrix

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APA (6th Edition):

Diamantopoulou, S. (2012). Design and Performance Analysis of the Poly-polarimeter. (Masters Thesis). Universiteit Utrecht. Retrieved from http://dspace.library.uu.nl:8080/handle/1874/254282

Chicago Manual of Style (16th Edition):

Diamantopoulou, S. “Design and Performance Analysis of the Poly-polarimeter.” 2012. Masters Thesis, Universiteit Utrecht. Accessed March 04, 2021. http://dspace.library.uu.nl:8080/handle/1874/254282.

MLA Handbook (7th Edition):

Diamantopoulou, S. “Design and Performance Analysis of the Poly-polarimeter.” 2012. Web. 04 Mar 2021.

Vancouver:

Diamantopoulou S. Design and Performance Analysis of the Poly-polarimeter. [Internet] [Masters thesis]. Universiteit Utrecht; 2012. [cited 2021 Mar 04]. Available from: http://dspace.library.uu.nl:8080/handle/1874/254282.

Council of Science Editors:

Diamantopoulou S. Design and Performance Analysis of the Poly-polarimeter. [Masters Thesis]. Universiteit Utrecht; 2012. Available from: http://dspace.library.uu.nl:8080/handle/1874/254282


Leiden University

3. Boudewijn, Thom. Ellipsometry based study of the optical properties of thin molybdenum germanium films.

Degree: 2020, Leiden University

Ellipsometry measurements were done on thin amorphous MoGe layers with a Ge content of 20%. Capping the MoGe layer with at least 20 nm of… (more)

Subjects/Keywords: Ellipsometry; Molybdenum-germanium; Optical properties

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APA (6th Edition):

Boudewijn, T. (2020). Ellipsometry based study of the optical properties of thin molybdenum germanium films. (Masters Thesis). Leiden University. Retrieved from http://hdl.handle.net/1887/133691

Chicago Manual of Style (16th Edition):

Boudewijn, Thom. “Ellipsometry based study of the optical properties of thin molybdenum germanium films.” 2020. Masters Thesis, Leiden University. Accessed March 04, 2021. http://hdl.handle.net/1887/133691.

MLA Handbook (7th Edition):

Boudewijn, Thom. “Ellipsometry based study of the optical properties of thin molybdenum germanium films.” 2020. Web. 04 Mar 2021.

Vancouver:

Boudewijn T. Ellipsometry based study of the optical properties of thin molybdenum germanium films. [Internet] [Masters thesis]. Leiden University; 2020. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/1887/133691.

Council of Science Editors:

Boudewijn T. Ellipsometry based study of the optical properties of thin molybdenum germanium films. [Masters Thesis]. Leiden University; 2020. Available from: http://hdl.handle.net/1887/133691


Dalhousie University

4. Galbraith, Justine. Photoelastic properties of oxide and non-oxide glasses.

Degree: PhD, Department of Physics & Atmospheric Science, 2014, Dalhousie University

 An unperturbed piece of glass is optically isotropic. Birefringence can be induced by breaking this symmetry, for example by applying a uniaxial stress to the… (more)

Subjects/Keywords: Glass; Photoelasticity; Brillouin scattering; Ellipsometry

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APA (6th Edition):

Galbraith, J. (2014). Photoelastic properties of oxide and non-oxide glasses. (Doctoral Dissertation). Dalhousie University. Retrieved from http://hdl.handle.net/10222/56012

Chicago Manual of Style (16th Edition):

Galbraith, Justine. “Photoelastic properties of oxide and non-oxide glasses.” 2014. Doctoral Dissertation, Dalhousie University. Accessed March 04, 2021. http://hdl.handle.net/10222/56012.

MLA Handbook (7th Edition):

Galbraith, Justine. “Photoelastic properties of oxide and non-oxide glasses.” 2014. Web. 04 Mar 2021.

Vancouver:

Galbraith J. Photoelastic properties of oxide and non-oxide glasses. [Internet] [Doctoral dissertation]. Dalhousie University; 2014. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/10222/56012.

Council of Science Editors:

Galbraith J. Photoelastic properties of oxide and non-oxide glasses. [Doctoral Dissertation]. Dalhousie University; 2014. Available from: http://hdl.handle.net/10222/56012


Universiteit Utrecht

5. Albada, B.L. van. Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight.

Degree: 2013, Universiteit Utrecht

Ellipsometry is a non-contact, extremely accurate technique for characterising thin films, which over the past decades have become vital in a host of applications. However,… (more)

Subjects/Keywords: ellipsometry; polarisation; optical fibers; surface characterisation

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APA (6th Edition):

Albada, B. L. v. (2013). Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight. (Masters Thesis). Universiteit Utrecht. Retrieved from http://dspace.library.uu.nl:8080/handle/1874/283700

Chicago Manual of Style (16th Edition):

Albada, B L van. “Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight.” 2013. Masters Thesis, Universiteit Utrecht. Accessed March 04, 2021. http://dspace.library.uu.nl:8080/handle/1874/283700.

MLA Handbook (7th Edition):

Albada, B L van. “Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight.” 2013. Web. 04 Mar 2021.

Vancouver:

Albada BLv. Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight. [Internet] [Masters thesis]. Universiteit Utrecht; 2013. [cited 2021 Mar 04]. Available from: http://dspace.library.uu.nl:8080/handle/1874/283700.

Council of Science Editors:

Albada BLv. Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight. [Masters Thesis]. Universiteit Utrecht; 2013. Available from: http://dspace.library.uu.nl:8080/handle/1874/283700


University of Alberta

6. Foroughi Abari, Ali. Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates.

Degree: PhD, Department of Chemical and Materials Engineering, 2012, University of Alberta

 Atomic layer deposition (ALD) is a powerful ultra-thin film deposition technique that uses sequential self-limiting surface reactions to provide conformal atomic scale film growth. Deposition… (more)

Subjects/Keywords: Ellipsometry; Atomic Layer Deposition; Thin Film

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APA (6th Edition):

Foroughi Abari, A. (2012). Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates. (Doctoral Dissertation). University of Alberta. Retrieved from https://era.library.ualberta.ca/files/zw12z615t

Chicago Manual of Style (16th Edition):

Foroughi Abari, Ali. “Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates.” 2012. Doctoral Dissertation, University of Alberta. Accessed March 04, 2021. https://era.library.ualberta.ca/files/zw12z615t.

MLA Handbook (7th Edition):

Foroughi Abari, Ali. “Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates.” 2012. Web. 04 Mar 2021.

Vancouver:

Foroughi Abari A. Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates. [Internet] [Doctoral dissertation]. University of Alberta; 2012. [cited 2021 Mar 04]. Available from: https://era.library.ualberta.ca/files/zw12z615t.

Council of Science Editors:

Foroughi Abari A. Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates. [Doctoral Dissertation]. University of Alberta; 2012. Available from: https://era.library.ualberta.ca/files/zw12z615t


McMaster University

7. Rowe, Ernest. Optical Constants by Ellipsometry.

Degree: MSc, 1969, McMaster University

The standard technique of ellipsometry allows the determination of the optical constants of a substrate material provided either the surface is free of an… (more)

Subjects/Keywords: Optical Constants; Ellipsometry

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APA (6th Edition):

Rowe, E. (1969). Optical Constants by Ellipsometry. (Masters Thesis). McMaster University. Retrieved from http://hdl.handle.net/11375/20080

Chicago Manual of Style (16th Edition):

Rowe, Ernest. “Optical Constants by Ellipsometry.” 1969. Masters Thesis, McMaster University. Accessed March 04, 2021. http://hdl.handle.net/11375/20080.

MLA Handbook (7th Edition):

Rowe, Ernest. “Optical Constants by Ellipsometry.” 1969. Web. 04 Mar 2021.

Vancouver:

Rowe E. Optical Constants by Ellipsometry. [Internet] [Masters thesis]. McMaster University; 1969. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/11375/20080.

Council of Science Editors:

Rowe E. Optical Constants by Ellipsometry. [Masters Thesis]. McMaster University; 1969. Available from: http://hdl.handle.net/11375/20080


Vilnius University

8. Balevičiūtė, Ieva. Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications.

Degree: Dissertation, Chemistry, 2014, Vilnius University

The objectives of this efforts was to develop spectroscopic ellipsometry method for investigation of optical properties: (i) of multi-layered nanostructures used for Bovine leukaemia virus… (more)

Subjects/Keywords: Spectroscopic; Ellipsometry; Nanostructures; Biojutikliai; Spektroskopinė; Elipsometrija

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APA (6th Edition):

Balevičiūtė, I. (2014). Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications. (Doctoral Dissertation). Vilnius University. Retrieved from http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;

Chicago Manual of Style (16th Edition):

Balevičiūtė, Ieva. “Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications.” 2014. Doctoral Dissertation, Vilnius University. Accessed March 04, 2021. http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;.

MLA Handbook (7th Edition):

Balevičiūtė, Ieva. “Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications.” 2014. Web. 04 Mar 2021.

Vancouver:

Balevičiūtė I. Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications. [Internet] [Doctoral dissertation]. Vilnius University; 2014. [cited 2021 Mar 04]. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;.

Council of Science Editors:

Balevičiūtė I. Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications. [Doctoral Dissertation]. Vilnius University; 2014. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;


Colorado State University

9. Smith, Westcott P. Spectroscopic ellipsometry as a process control tool for manufacturing cadmium telluride thin film photovoltaic devices.

Degree: PhD, Mechanical Engineering, 2013, Colorado State University

 In recent decades, there has been concern regarding the sustainability of fossil fuels. One of the more promising alternatives is Cadmium Telluride (CdTe) thin–film photovoltaic… (more)

Subjects/Keywords: cadmium; ellipsometry; quality; spectroscopic; telluride; tellurium

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APA (6th Edition):

Smith, W. P. (2013). Spectroscopic ellipsometry as a process control tool for manufacturing cadmium telluride thin film photovoltaic devices. (Doctoral Dissertation). Colorado State University. Retrieved from http://hdl.handle.net/10217/78869

Chicago Manual of Style (16th Edition):

Smith, Westcott P. “Spectroscopic ellipsometry as a process control tool for manufacturing cadmium telluride thin film photovoltaic devices.” 2013. Doctoral Dissertation, Colorado State University. Accessed March 04, 2021. http://hdl.handle.net/10217/78869.

MLA Handbook (7th Edition):

Smith, Westcott P. “Spectroscopic ellipsometry as a process control tool for manufacturing cadmium telluride thin film photovoltaic devices.” 2013. Web. 04 Mar 2021.

Vancouver:

Smith WP. Spectroscopic ellipsometry as a process control tool for manufacturing cadmium telluride thin film photovoltaic devices. [Internet] [Doctoral dissertation]. Colorado State University; 2013. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/10217/78869.

Council of Science Editors:

Smith WP. Spectroscopic ellipsometry as a process control tool for manufacturing cadmium telluride thin film photovoltaic devices. [Doctoral Dissertation]. Colorado State University; 2013. Available from: http://hdl.handle.net/10217/78869


University of Illinois – Urbana-Champaign

10. Darrow, Michael Cole. Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices.

Degree: MS, Materials Science and Engineering, 2017, University of Illinois – Urbana-Champaign

 Spectroscopic ellipsometry (SE) is a non-contact, non-destructive characterization technique for probing the optical properties of thin films. With the advent of second-generation solar cells, SE… (more)

Subjects/Keywords: Ellipsometry; Cadmium telluride (CdTe); Dielectric modeling; Photovoltaics

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APA (6th Edition):

Darrow, M. C. (2017). Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices. (Thesis). University of Illinois – Urbana-Champaign. Retrieved from http://hdl.handle.net/2142/97503

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Darrow, Michael Cole. “Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices.” 2017. Thesis, University of Illinois – Urbana-Champaign. Accessed March 04, 2021. http://hdl.handle.net/2142/97503.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Darrow, Michael Cole. “Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices.” 2017. Web. 04 Mar 2021.

Vancouver:

Darrow MC. Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices. [Internet] [Thesis]. University of Illinois – Urbana-Champaign; 2017. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/2142/97503.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Darrow MC. Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices. [Thesis]. University of Illinois – Urbana-Champaign; 2017. Available from: http://hdl.handle.net/2142/97503

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Minnesota

11. Dement, Dana. Complex Refractive Index Modeling and Nanoscale Patterning of Solid-State Colloidal Quantum Dots for Nanophotonic Applications.

Degree: PhD, Material Science and Engineering, 2019, University of Minnesota

 The small size of photoluminescent, nanocrystal quantum dots (QDs) leads to a variety of unique optical properties that are well-suited to many optoelectronic devices and… (more)

Subjects/Keywords: Ellipsometry; Nanocrystals; Nanopatterning; Quantum Dots; Refractive Index

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APA (6th Edition):

Dement, D. (2019). Complex Refractive Index Modeling and Nanoscale Patterning of Solid-State Colloidal Quantum Dots for Nanophotonic Applications. (Doctoral Dissertation). University of Minnesota. Retrieved from http://hdl.handle.net/11299/206299

Chicago Manual of Style (16th Edition):

Dement, Dana. “Complex Refractive Index Modeling and Nanoscale Patterning of Solid-State Colloidal Quantum Dots for Nanophotonic Applications.” 2019. Doctoral Dissertation, University of Minnesota. Accessed March 04, 2021. http://hdl.handle.net/11299/206299.

MLA Handbook (7th Edition):

Dement, Dana. “Complex Refractive Index Modeling and Nanoscale Patterning of Solid-State Colloidal Quantum Dots for Nanophotonic Applications.” 2019. Web. 04 Mar 2021.

Vancouver:

Dement D. Complex Refractive Index Modeling and Nanoscale Patterning of Solid-State Colloidal Quantum Dots for Nanophotonic Applications. [Internet] [Doctoral dissertation]. University of Minnesota; 2019. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/11299/206299.

Council of Science Editors:

Dement D. Complex Refractive Index Modeling and Nanoscale Patterning of Solid-State Colloidal Quantum Dots for Nanophotonic Applications. [Doctoral Dissertation]. University of Minnesota; 2019. Available from: http://hdl.handle.net/11299/206299


University of Toledo

12. Li, Jian. Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications.

Degree: PhD, Physics, 2010, University of Toledo

  Spectroscopic ellipsometry (SE) is a powerful tool to characterize multilayered thinfilms, providing structural parameters and materials optical properties over a widespectral range. Further analyses… (more)

Subjects/Keywords: Physics; ellipsometry; photovoltaic

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APA (6th Edition):

Li, J. (2010). Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications. (Doctoral Dissertation). University of Toledo. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944

Chicago Manual of Style (16th Edition):

Li, Jian. “Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications.” 2010. Doctoral Dissertation, University of Toledo. Accessed March 04, 2021. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944.

MLA Handbook (7th Edition):

Li, Jian. “Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications.” 2010. Web. 04 Mar 2021.

Vancouver:

Li J. Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications. [Internet] [Doctoral dissertation]. University of Toledo; 2010. [cited 2021 Mar 04]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944.

Council of Science Editors:

Li J. Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications. [Doctoral Dissertation]. University of Toledo; 2010. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944


Texas State University – San Marcos

13. Waxler, Chad Lawrence. Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing.

Degree: MS, Physics, 2013, Texas State University – San Marcos

 In this study, we investigate the surface morphology and optical properties of silicon nanoparticles formed on a silicon-on-insulator substrate by thermal annealing of a thin… (more)

Subjects/Keywords: Silicon Nanoparticles Ellipsometry Oxidation Thermal Annealing; Nanosilicon; Nanostructured materials; Nanotechnology; Silicon – Analysis; Nanochemistry; Ellipsometry

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APA (6th Edition):

Waxler, C. L. (2013). Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing. (Masters Thesis). Texas State University – San Marcos. Retrieved from https://digital.library.txstate.edu/handle/10877/4564

Chicago Manual of Style (16th Edition):

Waxler, Chad Lawrence. “Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing.” 2013. Masters Thesis, Texas State University – San Marcos. Accessed March 04, 2021. https://digital.library.txstate.edu/handle/10877/4564.

MLA Handbook (7th Edition):

Waxler, Chad Lawrence. “Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing.” 2013. Web. 04 Mar 2021.

Vancouver:

Waxler CL. Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing. [Internet] [Masters thesis]. Texas State University – San Marcos; 2013. [cited 2021 Mar 04]. Available from: https://digital.library.txstate.edu/handle/10877/4564.

Council of Science Editors:

Waxler CL. Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing. [Masters Thesis]. Texas State University – San Marcos; 2013. Available from: https://digital.library.txstate.edu/handle/10877/4564

14. Cicerrella, Elizabeth. Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry.

Degree: PhD, 2006, Oregon Health Sciences University

Subjects/Keywords: Ellipsometry; Dielectrics  – Optical properties; Ellipsometry; high-K dielectrics; Bandgaps

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APA (6th Edition):

Cicerrella, E. (2006). Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry. (Doctoral Dissertation). Oregon Health Sciences University. Retrieved from doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2

Chicago Manual of Style (16th Edition):

Cicerrella, Elizabeth. “Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry.” 2006. Doctoral Dissertation, Oregon Health Sciences University. Accessed March 04, 2021. doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2.

MLA Handbook (7th Edition):

Cicerrella, Elizabeth. “Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry.” 2006. Web. 04 Mar 2021.

Vancouver:

Cicerrella E. Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry. [Internet] [Doctoral dissertation]. Oregon Health Sciences University; 2006. [cited 2021 Mar 04]. Available from: doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2.

Council of Science Editors:

Cicerrella E. Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry. [Doctoral Dissertation]. Oregon Health Sciences University; 2006. Available from: doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2


Dalhousie University

15. Author Not Available. AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY.

Degree: MS, Department of Physics & Atmospheric Science, 2011, Dalhousie University

 A novel method to detect and quantify the growth of the solid electrolyte interphase (SEI) on battery electrode materials using in-situ spectroscopic ellipsometry (SE) is… (more)

Subjects/Keywords: ellipsometry; in-situ; lithium-ion batteries; thin film electrodes

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APA (6th Edition):

Available, A. N. (2011). AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY. (Masters Thesis). Dalhousie University. Retrieved from http://hdl.handle.net/10222/14076

Chicago Manual of Style (16th Edition):

Available, Author Not. “AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY.” 2011. Masters Thesis, Dalhousie University. Accessed March 04, 2021. http://hdl.handle.net/10222/14076.

MLA Handbook (7th Edition):

Available, Author Not. “AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY.” 2011. Web. 04 Mar 2021.

Vancouver:

Available AN. AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY. [Internet] [Masters thesis]. Dalhousie University; 2011. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/10222/14076.

Council of Science Editors:

Available AN. AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY. [Masters Thesis]. Dalhousie University; 2011. Available from: http://hdl.handle.net/10222/14076


University of Rochester

16. Zhang, Aizhong. Dynamic characterization of ocular surface with thermography and macroscopic imaging ellipsometry.

Degree: PhD, 2017, University of Rochester

 Visual acuity and comfort is strongly influenced by the homogeneity and integrity of the ocular tear film. The tear film is established with each blink… (more)

Subjects/Keywords: Ocular surface; Dry eye; Tear film; Thermography; Ellipsometry.

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APA (6th Edition):

Zhang, A. (2017). Dynamic characterization of ocular surface with thermography and macroscopic imaging ellipsometry. (Doctoral Dissertation). University of Rochester. Retrieved from http://hdl.handle.net/1802/33008

Chicago Manual of Style (16th Edition):

Zhang, Aizhong. “Dynamic characterization of ocular surface with thermography and macroscopic imaging ellipsometry.” 2017. Doctoral Dissertation, University of Rochester. Accessed March 04, 2021. http://hdl.handle.net/1802/33008.

MLA Handbook (7th Edition):

Zhang, Aizhong. “Dynamic characterization of ocular surface with thermography and macroscopic imaging ellipsometry.” 2017. Web. 04 Mar 2021.

Vancouver:

Zhang A. Dynamic characterization of ocular surface with thermography and macroscopic imaging ellipsometry. [Internet] [Doctoral dissertation]. University of Rochester; 2017. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/1802/33008.

Council of Science Editors:

Zhang A. Dynamic characterization of ocular surface with thermography and macroscopic imaging ellipsometry. [Doctoral Dissertation]. University of Rochester; 2017. Available from: http://hdl.handle.net/1802/33008


Penn State University

17. Motyka, Michael. Effects of Microstructure and Oxidation State of Multi-valent Vanadium Oxide Thin Films for use in Infrared Microbolometers.

Degree: 2012, Penn State University

 Uncooled, resistive bolometry has been a widely used method to detect infrared radiation for several years. The thermistor in the material heats up upon absorbing… (more)

Subjects/Keywords: Vanadium oxide; thin films; spectroscopic ellipsometry; thin film deposition; magnetron sputtering

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APA (6th Edition):

Motyka, M. (2012). Effects of Microstructure and Oxidation State of Multi-valent Vanadium Oxide Thin Films for use in Infrared Microbolometers. (Thesis). Penn State University. Retrieved from https://submit-etda.libraries.psu.edu/catalog/16059

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Motyka, Michael. “Effects of Microstructure and Oxidation State of Multi-valent Vanadium Oxide Thin Films for use in Infrared Microbolometers.” 2012. Thesis, Penn State University. Accessed March 04, 2021. https://submit-etda.libraries.psu.edu/catalog/16059.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Motyka, Michael. “Effects of Microstructure and Oxidation State of Multi-valent Vanadium Oxide Thin Films for use in Infrared Microbolometers.” 2012. Web. 04 Mar 2021.

Vancouver:

Motyka M. Effects of Microstructure and Oxidation State of Multi-valent Vanadium Oxide Thin Films for use in Infrared Microbolometers. [Internet] [Thesis]. Penn State University; 2012. [cited 2021 Mar 04]. Available from: https://submit-etda.libraries.psu.edu/catalog/16059.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Motyka M. Effects of Microstructure and Oxidation State of Multi-valent Vanadium Oxide Thin Films for use in Infrared Microbolometers. [Thesis]. Penn State University; 2012. Available from: https://submit-etda.libraries.psu.edu/catalog/16059

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Penn State University

18. Shay, Dennis Patrick. Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices.

Degree: 2014, Penn State University

 The maximum electrostatic energy density of a capacitor is a function of the relative permittivity (εr) and the square of the dielectric breakdown strength (Eb).… (more)

Subjects/Keywords: Dielectric; Energy Density; Ceramic; Impedance Spectroscopy; Breakdown Strength; Ellipsometry; Power Electronics

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APA (6th Edition):

Shay, D. P. (2014). Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices. (Thesis). Penn State University. Retrieved from https://submit-etda.libraries.psu.edu/catalog/21810

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Shay, Dennis Patrick. “Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices.” 2014. Thesis, Penn State University. Accessed March 04, 2021. https://submit-etda.libraries.psu.edu/catalog/21810.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Shay, Dennis Patrick. “Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices.” 2014. Web. 04 Mar 2021.

Vancouver:

Shay DP. Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices. [Internet] [Thesis]. Penn State University; 2014. [cited 2021 Mar 04]. Available from: https://submit-etda.libraries.psu.edu/catalog/21810.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Shay DP. Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices. [Thesis]. Penn State University; 2014. Available from: https://submit-etda.libraries.psu.edu/catalog/21810

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Leiden University

19. Klink, Danielle van. Optical properties of amorphous thin-film MoGe.

Degree: 2019, Leiden University

 An optimal design of a superconducting single photon detector depends on the optical properties of the superconducting material. Here we describe transmission and reflection measurements… (more)

Subjects/Keywords: superconducting single photon detector; SSPD; MoGe; Ellipsometry; Reflection; Transmission; thin-film

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APA (6th Edition):

Klink, D. v. (2019). Optical properties of amorphous thin-film MoGe. (Masters Thesis). Leiden University. Retrieved from http://hdl.handle.net/1887/72442

Chicago Manual of Style (16th Edition):

Klink, Danielle van. “Optical properties of amorphous thin-film MoGe.” 2019. Masters Thesis, Leiden University. Accessed March 04, 2021. http://hdl.handle.net/1887/72442.

MLA Handbook (7th Edition):

Klink, Danielle van. “Optical properties of amorphous thin-film MoGe.” 2019. Web. 04 Mar 2021.

Vancouver:

Klink Dv. Optical properties of amorphous thin-film MoGe. [Internet] [Masters thesis]. Leiden University; 2019. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/1887/72442.

Council of Science Editors:

Klink Dv. Optical properties of amorphous thin-film MoGe. [Masters Thesis]. Leiden University; 2019. Available from: http://hdl.handle.net/1887/72442


North Carolina State University

20. Wu, Tao. Formation and properties of surface-anchored polymer assemblies with tunable physico-chemical characteristics.

Degree: PhD, Chemical Engineering, 2003, North Carolina State University

 We describe two new methodologies leading to the formation of novel surface-anchored polymer assemblies on solid substrates. While the main goal is to understand the… (more)

Subjects/Keywords: ellipsometry; gradients; surface-anchored polymers

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APA (6th Edition):

Wu, T. (2003). Formation and properties of surface-anchored polymer assemblies with tunable physico-chemical characteristics. (Doctoral Dissertation). North Carolina State University. Retrieved from http://www.lib.ncsu.edu/resolver/1840.16/3866

Chicago Manual of Style (16th Edition):

Wu, Tao. “Formation and properties of surface-anchored polymer assemblies with tunable physico-chemical characteristics.” 2003. Doctoral Dissertation, North Carolina State University. Accessed March 04, 2021. http://www.lib.ncsu.edu/resolver/1840.16/3866.

MLA Handbook (7th Edition):

Wu, Tao. “Formation and properties of surface-anchored polymer assemblies with tunable physico-chemical characteristics.” 2003. Web. 04 Mar 2021.

Vancouver:

Wu T. Formation and properties of surface-anchored polymer assemblies with tunable physico-chemical characteristics. [Internet] [Doctoral dissertation]. North Carolina State University; 2003. [cited 2021 Mar 04]. Available from: http://www.lib.ncsu.edu/resolver/1840.16/3866.

Council of Science Editors:

Wu T. Formation and properties of surface-anchored polymer assemblies with tunable physico-chemical characteristics. [Doctoral Dissertation]. North Carolina State University; 2003. Available from: http://www.lib.ncsu.edu/resolver/1840.16/3866

21. Vauselle, Alexandre. Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments.

Degree: Docteur es, Optique, photonique et traitement d’image, 2013, Aix Marseille Université

L’industrie des nanotechnologies est un monde en constante évolution. Les améliorations dans les techniques de fabrication permettent de définir des composants de plus en plus… (more)

Subjects/Keywords: Nanotechnologie; Ellipsométrie; Scatterométrie; Rugosité; Diffusion; Nanotechnology; Ellipsometry; Scatterometry; Roughness; Scattering

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APA (6th Edition):

Vauselle, A. (2013). Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments. (Doctoral Dissertation). Aix Marseille Université. Retrieved from http://www.theses.fr/2013AIXM4345

Chicago Manual of Style (16th Edition):

Vauselle, Alexandre. “Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments.” 2013. Doctoral Dissertation, Aix Marseille Université. Accessed March 04, 2021. http://www.theses.fr/2013AIXM4345.

MLA Handbook (7th Edition):

Vauselle, Alexandre. “Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments.” 2013. Web. 04 Mar 2021.

Vancouver:

Vauselle A. Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments. [Internet] [Doctoral dissertation]. Aix Marseille Université 2013. [cited 2021 Mar 04]. Available from: http://www.theses.fr/2013AIXM4345.

Council of Science Editors:

Vauselle A. Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments. [Doctoral Dissertation]. Aix Marseille Université 2013. Available from: http://www.theses.fr/2013AIXM4345


University of Delaware

22. Imbrenda, Dominic. Optical and electrical properties of narrow gap germanium-tin alloys with high tin contents for middle and far infrared applications.

Degree: PhD, University of Delaware, Department of Electrical and Computer Engineering, 2018, University of Delaware

 Germanium-Tin (GeSn) alloys have received considerable attention because of the interesting electronic properties they possess. The offer a potential route to a direct bandgap group… (more)

Subjects/Keywords: Pure sciences; Applied sciences; Physical sciences; Dielectric function; Ellipsometry; Semiconductors

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APA (6th Edition):

Imbrenda, D. (2018). Optical and electrical properties of narrow gap germanium-tin alloys with high tin contents for middle and far infrared applications. (Doctoral Dissertation). University of Delaware. Retrieved from http://udspace.udel.edu/handle/19716/23993

Chicago Manual of Style (16th Edition):

Imbrenda, Dominic. “Optical and electrical properties of narrow gap germanium-tin alloys with high tin contents for middle and far infrared applications.” 2018. Doctoral Dissertation, University of Delaware. Accessed March 04, 2021. http://udspace.udel.edu/handle/19716/23993.

MLA Handbook (7th Edition):

Imbrenda, Dominic. “Optical and electrical properties of narrow gap germanium-tin alloys with high tin contents for middle and far infrared applications.” 2018. Web. 04 Mar 2021.

Vancouver:

Imbrenda D. Optical and electrical properties of narrow gap germanium-tin alloys with high tin contents for middle and far infrared applications. [Internet] [Doctoral dissertation]. University of Delaware; 2018. [cited 2021 Mar 04]. Available from: http://udspace.udel.edu/handle/19716/23993.

Council of Science Editors:

Imbrenda D. Optical and electrical properties of narrow gap germanium-tin alloys with high tin contents for middle and far infrared applications. [Doctoral Dissertation]. University of Delaware; 2018. Available from: http://udspace.udel.edu/handle/19716/23993


Vilnius Pedagogical University

23. Girkantaitė, Rasa. ErMnO3 monokristalo optinių savybių tyrimas.

Degree: Master, Physics, 2008, Vilnius Pedagogical University

Tirta ErMnO3 optinės savybės: apskaičiuotos dielektrinių skvarbų spektrinės priklausomybės, optinių šuolių energijos, lūžio ir sugerties rodikliai. Tyrimai atlikti elipsometru, dielektrinė funkcija apskaičiuojama pagal vienašio kristalo… (more)

Subjects/Keywords: Manganitai; Elipsometrija; Optinės savybes; Manganites; Ellipsometry; Optical properties

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APA (6th Edition):

Girkantaitė, Rasa. (2008). ErMnO3 monokristalo optinių savybių tyrimas. (Masters Thesis). Vilnius Pedagogical University. Retrieved from http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

Chicago Manual of Style (16th Edition):

Girkantaitė, Rasa. “ErMnO3 monokristalo optinių savybių tyrimas.” 2008. Masters Thesis, Vilnius Pedagogical University. Accessed March 04, 2021. http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;.

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

MLA Handbook (7th Edition):

Girkantaitė, Rasa. “ErMnO3 monokristalo optinių savybių tyrimas.” 2008. Web. 04 Mar 2021.

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

Vancouver:

Girkantaitė, Rasa. ErMnO3 monokristalo optinių savybių tyrimas. [Internet] [Masters thesis]. Vilnius Pedagogical University; 2008. [cited 2021 Mar 04]. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;.

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

Council of Science Editors:

Girkantaitė, Rasa. ErMnO3 monokristalo optinių savybių tyrimas. [Masters Thesis]. Vilnius Pedagogical University; 2008. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete


New Jersey Institute of Technology

24. Standard, Eric C. Analysis of far-infrared optical spectra of multiferroics.

Degree: PhD, Federated Physics Department, 2014, New Jersey Institute of Technology

  The optical spectra of multiferroic crystals Dy3Fe5O12, Tb3Fe5O12, and four hexagonal RMnO3 (5D= Er, Tm, Yb, Lu) are studied using intense bright synchrotonic light… (more)

Subjects/Keywords: Ellipsometry; Hexagonal manganite; Multi ferroic; Magnon; Electromagnon; Transmission; Other Physics

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APA (6th Edition):

Standard, E. C. (2014). Analysis of far-infrared optical spectra of multiferroics. (Doctoral Dissertation). New Jersey Institute of Technology. Retrieved from https://digitalcommons.njit.edu/dissertations/168

Chicago Manual of Style (16th Edition):

Standard, Eric C. “Analysis of far-infrared optical spectra of multiferroics.” 2014. Doctoral Dissertation, New Jersey Institute of Technology. Accessed March 04, 2021. https://digitalcommons.njit.edu/dissertations/168.

MLA Handbook (7th Edition):

Standard, Eric C. “Analysis of far-infrared optical spectra of multiferroics.” 2014. Web. 04 Mar 2021.

Vancouver:

Standard EC. Analysis of far-infrared optical spectra of multiferroics. [Internet] [Doctoral dissertation]. New Jersey Institute of Technology; 2014. [cited 2021 Mar 04]. Available from: https://digitalcommons.njit.edu/dissertations/168.

Council of Science Editors:

Standard EC. Analysis of far-infrared optical spectra of multiferroics. [Doctoral Dissertation]. New Jersey Institute of Technology; 2014. Available from: https://digitalcommons.njit.edu/dissertations/168


University of South Florida

25. Veisi, Zeinab. Responsive Coatings and Functional Systems from Pectin Polysaccharides.

Degree: 2019, University of South Florida

 Pectin polysaccharides provide promising potential as all-natural, non-toxic “green” coatings. Pectin polysaccharides have been drawing growing attention as elements of stimuli-responsive systems and as source… (more)

Subjects/Keywords: Thin Coatings; Responsive Hydrogels; Natural Materials; ATR-FTIR; Ellipsometry; Chemical Engineering

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APA (6th Edition):

Veisi, Z. (2019). Responsive Coatings and Functional Systems from Pectin Polysaccharides. (Thesis). University of South Florida. Retrieved from https://scholarcommons.usf.edu/etd/8421

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Veisi, Zeinab. “Responsive Coatings and Functional Systems from Pectin Polysaccharides.” 2019. Thesis, University of South Florida. Accessed March 04, 2021. https://scholarcommons.usf.edu/etd/8421.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Veisi, Zeinab. “Responsive Coatings and Functional Systems from Pectin Polysaccharides.” 2019. Web. 04 Mar 2021.

Vancouver:

Veisi Z. Responsive Coatings and Functional Systems from Pectin Polysaccharides. [Internet] [Thesis]. University of South Florida; 2019. [cited 2021 Mar 04]. Available from: https://scholarcommons.usf.edu/etd/8421.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Veisi Z. Responsive Coatings and Functional Systems from Pectin Polysaccharides. [Thesis]. University of South Florida; 2019. Available from: https://scholarcommons.usf.edu/etd/8421

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Univerzitet u Beogradu

26. Jakovljević, Milka. 1983-. Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije.

Degree: Elektrotehnički fakultet, 2016, Univerzitet u Beogradu

Elektrotehnika / Electrical engineering

Sa najnovijim razvojem nanotehnologije došlo je do ponovnog interesovanja za polje plazmonike. Nanoplazmonika povezuje fotoniku sa nanonaukama tako što konfinira svetlost… (more)

Subjects/Keywords: plasmon polariton; fishnet nanostructures; ellipsometry; nanophotonics; plasmonic resonances

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APA (6th Edition):

Jakovljević, M. 1. (2016). Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije. (Thesis). Univerzitet u Beogradu. Retrieved from https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Jakovljević, Milka 1983-. “Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije.” 2016. Thesis, Univerzitet u Beogradu. Accessed March 04, 2021. https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Jakovljević, Milka 1983-. “Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije.” 2016. Web. 04 Mar 2021.

Vancouver:

Jakovljević M1. Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije. [Internet] [Thesis]. Univerzitet u Beogradu; 2016. [cited 2021 Mar 04]. Available from: https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Jakovljević M1. Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije. [Thesis]. Univerzitet u Beogradu; 2016. Available from: https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

27. Walsh, Adrian. Electrical characterisation of emerging photo anodes suited to water dissociation with an applied bias.

Degree: 2018, University College Cork

 One of the pivotal challenges of the 21st century is to develop alternative energy sources to replace the inevitable depletion of fossil fuels. One candidate… (more)

Subjects/Keywords: Atomic layer deposition; Thin films; MOS characterisation; Ellipsometry; Metal oxide

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APA (6th Edition):

Walsh, A. (2018). Electrical characterisation of emerging photo anodes suited to water dissociation with an applied bias. (Thesis). University College Cork. Retrieved from http://hdl.handle.net/10468/6787

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Walsh, Adrian. “Electrical characterisation of emerging photo anodes suited to water dissociation with an applied bias.” 2018. Thesis, University College Cork. Accessed March 04, 2021. http://hdl.handle.net/10468/6787.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Walsh, Adrian. “Electrical characterisation of emerging photo anodes suited to water dissociation with an applied bias.” 2018. Web. 04 Mar 2021.

Vancouver:

Walsh A. Electrical characterisation of emerging photo anodes suited to water dissociation with an applied bias. [Internet] [Thesis]. University College Cork; 2018. [cited 2021 Mar 04]. Available from: http://hdl.handle.net/10468/6787.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Walsh A. Electrical characterisation of emerging photo anodes suited to water dissociation with an applied bias. [Thesis]. University College Cork; 2018. Available from: http://hdl.handle.net/10468/6787

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


New Jersey Institute of Technology

28. Basistyy, Roman. Mueller matrix spectroscopic ellipsometry of multiferroics.

Degree: PhD, Physics, 2015, New Jersey Institute of Technology

  Multiferroics, materials which possess several ferroic orders, are the focus of research in recent years. Among these materials are oxide crystals, such as, for… (more)

Subjects/Keywords: Mueller matrix; Multiferroics; Spectroscopy; Ellipsometry; Phonons; Magnons; Other Physics

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APA (6th Edition):

Basistyy, R. (2015). Mueller matrix spectroscopic ellipsometry of multiferroics. (Doctoral Dissertation). New Jersey Institute of Technology. Retrieved from https://digitalcommons.njit.edu/dissertations/97

Chicago Manual of Style (16th Edition):

Basistyy, Roman. “Mueller matrix spectroscopic ellipsometry of multiferroics.” 2015. Doctoral Dissertation, New Jersey Institute of Technology. Accessed March 04, 2021. https://digitalcommons.njit.edu/dissertations/97.

MLA Handbook (7th Edition):

Basistyy, Roman. “Mueller matrix spectroscopic ellipsometry of multiferroics.” 2015. Web. 04 Mar 2021.

Vancouver:

Basistyy R. Mueller matrix spectroscopic ellipsometry of multiferroics. [Internet] [Doctoral dissertation]. New Jersey Institute of Technology; 2015. [cited 2021 Mar 04]. Available from: https://digitalcommons.njit.edu/dissertations/97.

Council of Science Editors:

Basistyy R. Mueller matrix spectroscopic ellipsometry of multiferroics. [Doctoral Dissertation]. New Jersey Institute of Technology; 2015. Available from: https://digitalcommons.njit.edu/dissertations/97


University of Victoria

29. FitzGerald, William. Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride.

Degree: Department of Chemistry, 2017, University of Victoria

 The infrared portion of the electro-magnetic spectrum is a challenging region in which to perform optical techniques, limited by both device efficiency and availability. In… (more)

Subjects/Keywords: applied optics; polarimetry; ellipsometry; electro-optic materials; CZT; cadmium zinc telluride

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

FitzGerald, W. (2017). Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride. (Thesis). University of Victoria. Retrieved from https://dspace.library.uvic.ca//handle/1828/8900

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

FitzGerald, William. “Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride.” 2017. Thesis, University of Victoria. Accessed March 04, 2021. https://dspace.library.uvic.ca//handle/1828/8900.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

FitzGerald, William. “Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride.” 2017. Web. 04 Mar 2021.

Vancouver:

FitzGerald W. Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride. [Internet] [Thesis]. University of Victoria; 2017. [cited 2021 Mar 04]. Available from: https://dspace.library.uvic.ca//handle/1828/8900.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

FitzGerald W. Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride. [Thesis]. University of Victoria; 2017. Available from: https://dspace.library.uvic.ca//handle/1828/8900

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Arizona State University

30. Xu, Chi. Synthesis and Band Gap Engineering in Ge1-x-ySixSny Materials for Near-IR Wavelength Applications.

Degree: PhD, Physics, 2013, Arizona State University

 This thesis describes the fabrication of several new classes of Ge1-x-ySixSny materials with the required compositions and crystal quality to engineer the band gaps above… (more)

Subjects/Keywords: Physics; Materials Science; Chemistry; band gap; devices; ellipsometry; epitaxy; Germanium; GeSiSn

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Xu, C. (2013). Synthesis and Band Gap Engineering in Ge1-x-ySixSny Materials for Near-IR Wavelength Applications. (Doctoral Dissertation). Arizona State University. Retrieved from http://repository.asu.edu/items/20982

Chicago Manual of Style (16th Edition):

Xu, Chi. “Synthesis and Band Gap Engineering in Ge1-x-ySixSny Materials for Near-IR Wavelength Applications.” 2013. Doctoral Dissertation, Arizona State University. Accessed March 04, 2021. http://repository.asu.edu/items/20982.

MLA Handbook (7th Edition):

Xu, Chi. “Synthesis and Band Gap Engineering in Ge1-x-ySixSny Materials for Near-IR Wavelength Applications.” 2013. Web. 04 Mar 2021.

Vancouver:

Xu C. Synthesis and Band Gap Engineering in Ge1-x-ySixSny Materials for Near-IR Wavelength Applications. [Internet] [Doctoral dissertation]. Arizona State University; 2013. [cited 2021 Mar 04]. Available from: http://repository.asu.edu/items/20982.

Council of Science Editors:

Xu C. Synthesis and Band Gap Engineering in Ge1-x-ySixSny Materials for Near-IR Wavelength Applications. [Doctoral Dissertation]. Arizona State University; 2013. Available from: http://repository.asu.edu/items/20982

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