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You searched for subject:(Ellipsometry). Showing records 1 – 30 of 245 total matches.

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University of Toledo

1. Li, Jian. Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications.

Degree: PhD, Physics, 2010, University of Toledo

  Spectroscopic ellipsometry (SE) is a powerful tool to characterize multilayered thinfilms, providing structural parameters and materials optical properties over a widespectral range. Further analyses… (more)

Subjects/Keywords: Physics; ellipsometry; photovoltaic

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APA (6th Edition):

Li, J. (2010). Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications. (Doctoral Dissertation). University of Toledo. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944

Chicago Manual of Style (16th Edition):

Li, Jian. “Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications.” 2010. Doctoral Dissertation, University of Toledo. Accessed August 17, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944.

MLA Handbook (7th Edition):

Li, Jian. “Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications.” 2010. Web. 17 Aug 2019.

Vancouver:

Li J. Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications. [Internet] [Doctoral dissertation]. University of Toledo; 2010. [cited 2019 Aug 17]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944.

Council of Science Editors:

Li J. Real Time Spectroscopic Ellipsometry Studies of Thin Film Materials and Structures for Photovoltaic Applications. [Doctoral Dissertation]. University of Toledo; 2010. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1262965944


Universiteit Utrecht

2. Diamantopoulou, S. Design and Performance Analysis of the Poly-polarimeter.

Degree: 2012, Universiteit Utrecht

 The purpose of the current thesis is to present the design and performance analysis of a versatile ellipsometer called ”The Poly-polarimeter” . Its primary purpose… (more)

Subjects/Keywords: instrumentation; polarimetry; ellipsometry; Mueller Matrix

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APA (6th Edition):

Diamantopoulou, S. (2012). Design and Performance Analysis of the Poly-polarimeter. (Masters Thesis). Universiteit Utrecht. Retrieved from http://dspace.library.uu.nl:8080/handle/1874/254282

Chicago Manual of Style (16th Edition):

Diamantopoulou, S. “Design and Performance Analysis of the Poly-polarimeter.” 2012. Masters Thesis, Universiteit Utrecht. Accessed August 17, 2019. http://dspace.library.uu.nl:8080/handle/1874/254282.

MLA Handbook (7th Edition):

Diamantopoulou, S. “Design and Performance Analysis of the Poly-polarimeter.” 2012. Web. 17 Aug 2019.

Vancouver:

Diamantopoulou S. Design and Performance Analysis of the Poly-polarimeter. [Internet] [Masters thesis]. Universiteit Utrecht; 2012. [cited 2019 Aug 17]. Available from: http://dspace.library.uu.nl:8080/handle/1874/254282.

Council of Science Editors:

Diamantopoulou S. Design and Performance Analysis of the Poly-polarimeter. [Masters Thesis]. Universiteit Utrecht; 2012. Available from: http://dspace.library.uu.nl:8080/handle/1874/254282


Dalhousie University

3. Galbraith, Justine. Photoelastic properties of oxide and non-oxide glasses.

Degree: PhD, Department of Physics & Atmospheric Science, 2014, Dalhousie University

 An unperturbed piece of glass is optically isotropic. Birefringence can be induced by breaking this symmetry, for example by applying a uniaxial stress to the… (more)

Subjects/Keywords: Glass; Photoelasticity; Brillouin scattering; Ellipsometry

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APA (6th Edition):

Galbraith, J. (2014). Photoelastic properties of oxide and non-oxide glasses. (Doctoral Dissertation). Dalhousie University. Retrieved from http://hdl.handle.net/10222/56012

Chicago Manual of Style (16th Edition):

Galbraith, Justine. “Photoelastic properties of oxide and non-oxide glasses.” 2014. Doctoral Dissertation, Dalhousie University. Accessed August 17, 2019. http://hdl.handle.net/10222/56012.

MLA Handbook (7th Edition):

Galbraith, Justine. “Photoelastic properties of oxide and non-oxide glasses.” 2014. Web. 17 Aug 2019.

Vancouver:

Galbraith J. Photoelastic properties of oxide and non-oxide glasses. [Internet] [Doctoral dissertation]. Dalhousie University; 2014. [cited 2019 Aug 17]. Available from: http://hdl.handle.net/10222/56012.

Council of Science Editors:

Galbraith J. Photoelastic properties of oxide and non-oxide glasses. [Doctoral Dissertation]. Dalhousie University; 2014. Available from: http://hdl.handle.net/10222/56012


Drexel University

4. Bruzzese, Dominic G. Use of spectroscopic ellipsometry and modeling in determining composition and thickness of barium strontium titanate thin films.

Degree: 2010, Drexel University

Significant advances have been made in the understanding of ferroelectrics since they were first observed in Rochelle salt by Valasek, in 1920 [1]. Recently investigated… (more)

Subjects/Keywords: Materials engineering; Thin films; Ellipsometry

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APA (6th Edition):

Bruzzese, D. G. (2010). Use of spectroscopic ellipsometry and modeling in determining composition and thickness of barium strontium titanate thin films. (Thesis). Drexel University. Retrieved from http://hdl.handle.net/1860/3298

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Bruzzese, Dominic G. “Use of spectroscopic ellipsometry and modeling in determining composition and thickness of barium strontium titanate thin films.” 2010. Thesis, Drexel University. Accessed August 17, 2019. http://hdl.handle.net/1860/3298.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Bruzzese, Dominic G. “Use of spectroscopic ellipsometry and modeling in determining composition and thickness of barium strontium titanate thin films.” 2010. Web. 17 Aug 2019.

Vancouver:

Bruzzese DG. Use of spectroscopic ellipsometry and modeling in determining composition and thickness of barium strontium titanate thin films. [Internet] [Thesis]. Drexel University; 2010. [cited 2019 Aug 17]. Available from: http://hdl.handle.net/1860/3298.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Bruzzese DG. Use of spectroscopic ellipsometry and modeling in determining composition and thickness of barium strontium titanate thin films. [Thesis]. Drexel University; 2010. Available from: http://hdl.handle.net/1860/3298

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Alberta

5. Foroughi Abari, Ali. Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates.

Degree: PhD, Department of Chemical and Materials Engineering, 2012, University of Alberta

 Atomic layer deposition (ALD) is a powerful ultra-thin film deposition technique that uses sequential self-limiting surface reactions to provide conformal atomic scale film growth. Deposition… (more)

Subjects/Keywords: Ellipsometry; Atomic Layer Deposition; Thin Film

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APA (6th Edition):

Foroughi Abari, A. (2012). Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates. (Doctoral Dissertation). University of Alberta. Retrieved from https://era.library.ualberta.ca/files/zw12z615t

Chicago Manual of Style (16th Edition):

Foroughi Abari, Ali. “Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates.” 2012. Doctoral Dissertation, University of Alberta. Accessed August 17, 2019. https://era.library.ualberta.ca/files/zw12z615t.

MLA Handbook (7th Edition):

Foroughi Abari, Ali. “Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates.” 2012. Web. 17 Aug 2019.

Vancouver:

Foroughi Abari A. Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates. [Internet] [Doctoral dissertation]. University of Alberta; 2012. [cited 2019 Aug 17]. Available from: https://era.library.ualberta.ca/files/zw12z615t.

Council of Science Editors:

Foroughi Abari A. Atomic Layer Deposition of Metal Oxide Thin Films on Metallic Substrates. [Doctoral Dissertation]. University of Alberta; 2012. Available from: https://era.library.ualberta.ca/files/zw12z615t


University of Toledo

6. Shan, Ambalanath. Expanded Beam Spectroscopic Ellipsometer for High Speed Mapping of PhotovoltaicMaterials.

Degree: PhD, Electrical Engineering, 2017, University of Toledo

 As a result of recent advances in photovoltaics technology, renewable energy generated by the sun has become a viable alternative to traditional sources of energy.… (more)

Subjects/Keywords: Electrical Engineering; Ellipsometry, Expanded-Beam, Device Structure

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APA (6th Edition):

Shan, A. (2017). Expanded Beam Spectroscopic Ellipsometer for High Speed Mapping of PhotovoltaicMaterials. (Doctoral Dissertation). University of Toledo. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=toledo1493306189501021

Chicago Manual of Style (16th Edition):

Shan, Ambalanath. “Expanded Beam Spectroscopic Ellipsometer for High Speed Mapping of PhotovoltaicMaterials.” 2017. Doctoral Dissertation, University of Toledo. Accessed August 17, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1493306189501021.

MLA Handbook (7th Edition):

Shan, Ambalanath. “Expanded Beam Spectroscopic Ellipsometer for High Speed Mapping of PhotovoltaicMaterials.” 2017. Web. 17 Aug 2019.

Vancouver:

Shan A. Expanded Beam Spectroscopic Ellipsometer for High Speed Mapping of PhotovoltaicMaterials. [Internet] [Doctoral dissertation]. University of Toledo; 2017. [cited 2019 Aug 17]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1493306189501021.

Council of Science Editors:

Shan A. Expanded Beam Spectroscopic Ellipsometer for High Speed Mapping of PhotovoltaicMaterials. [Doctoral Dissertation]. University of Toledo; 2017. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1493306189501021


Vilnius University

7. Balevičiūtė, Ieva. Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications.

Degree: Dissertation, Chemistry, 2014, Vilnius University

The objectives of this efforts was to develop spectroscopic ellipsometry method for investigation of optical properties: (i) of multi-layered nanostructures used for Bovine leukaemia virus… (more)

Subjects/Keywords: Spectroscopic; Ellipsometry; Nanostructures; Biojutikliai; Spektroskopinė; Elipsometrija

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APA (6th Edition):

Balevičiūtė, I. (2014). Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications. (Doctoral Dissertation). Vilnius University. Retrieved from http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;

Chicago Manual of Style (16th Edition):

Balevičiūtė, Ieva. “Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications.” 2014. Doctoral Dissertation, Vilnius University. Accessed August 17, 2019. http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;.

MLA Handbook (7th Edition):

Balevičiūtė, Ieva. “Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications.” 2014. Web. 17 Aug 2019.

Vancouver:

Balevičiūtė I. Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications. [Internet] [Doctoral dissertation]. Vilnius University; 2014. [cited 2019 Aug 17]. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;.

Council of Science Editors:

Balevičiūtė I. Spectroscopic ellipsometry of multilayer nanostructures used in biosensors applications. [Doctoral Dissertation]. Vilnius University; 2014. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2014~D_20141010_114733-30633 ;


University of Toledo

8. Stoke, Jason A. Spectroscopic ellipsometry analysis of the component layers of hydrogenated amorphous silicon triple junction solar cells.

Degree: MS, Physics, 2008, University of Toledo

  The work described in this thesis is part of an ongoing project to improve the performance of hydrogenated silicon (a-Si:H) based triple junction solar… (more)

Subjects/Keywords: Physics; amorphous silicon; ellipsometry; PECVD; photovoltaics; semiconductor

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APA (6th Edition):

Stoke, J. A. (2008). Spectroscopic ellipsometry analysis of the component layers of hydrogenated amorphous silicon triple junction solar cells. (Masters Thesis). University of Toledo. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=toledo1222351957

Chicago Manual of Style (16th Edition):

Stoke, Jason A. “Spectroscopic ellipsometry analysis of the component layers of hydrogenated amorphous silicon triple junction solar cells.” 2008. Masters Thesis, University of Toledo. Accessed August 17, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1222351957.

MLA Handbook (7th Edition):

Stoke, Jason A. “Spectroscopic ellipsometry analysis of the component layers of hydrogenated amorphous silicon triple junction solar cells.” 2008. Web. 17 Aug 2019.

Vancouver:

Stoke JA. Spectroscopic ellipsometry analysis of the component layers of hydrogenated amorphous silicon triple junction solar cells. [Internet] [Masters thesis]. University of Toledo; 2008. [cited 2019 Aug 17]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1222351957.

Council of Science Editors:

Stoke JA. Spectroscopic ellipsometry analysis of the component layers of hydrogenated amorphous silicon triple junction solar cells. [Masters Thesis]. University of Toledo; 2008. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1222351957


Universiteit Utrecht

9. Albada, B.L. van. Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight.

Degree: 2013, Universiteit Utrecht

Ellipsometry is a non-contact, extremely accurate technique for characterising thin films, which over the past decades have become vital in a host of applications. However,… (more)

Subjects/Keywords: ellipsometry; polarisation; optical fibers; surface characterisation

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APA (6th Edition):

Albada, B. L. v. (2013). Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight. (Masters Thesis). Universiteit Utrecht. Retrieved from http://dspace.library.uu.nl:8080/handle/1874/283700

Chicago Manual of Style (16th Edition):

Albada, B L van. “Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight.” 2013. Masters Thesis, Universiteit Utrecht. Accessed August 17, 2019. http://dspace.library.uu.nl:8080/handle/1874/283700.

MLA Handbook (7th Edition):

Albada, B L van. “Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight.” 2013. Web. 17 Aug 2019.

Vancouver:

Albada BLv. Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight. [Internet] [Masters thesis]. Universiteit Utrecht; 2013. [cited 2019 Aug 17]. Available from: http://dspace.library.uu.nl:8080/handle/1874/283700.

Council of Science Editors:

Albada BLv. Full-fiber ellipsometry: the (im)possibility of eliminating line-of-sight. [Masters Thesis]. Universiteit Utrecht; 2013. Available from: http://dspace.library.uu.nl:8080/handle/1874/283700


McMaster University

10. Rowe, Ernest. Optical Constants by Ellipsometry.

Degree: MSc, 1969, McMaster University

The standard technique of ellipsometry allows the determination of the optical constants of a substrate material provided either the surface is free of an… (more)

Subjects/Keywords: Optical Constants; Ellipsometry

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APA (6th Edition):

Rowe, E. (1969). Optical Constants by Ellipsometry. (Masters Thesis). McMaster University. Retrieved from http://hdl.handle.net/11375/20080

Chicago Manual of Style (16th Edition):

Rowe, Ernest. “Optical Constants by Ellipsometry.” 1969. Masters Thesis, McMaster University. Accessed August 17, 2019. http://hdl.handle.net/11375/20080.

MLA Handbook (7th Edition):

Rowe, Ernest. “Optical Constants by Ellipsometry.” 1969. Web. 17 Aug 2019.

Vancouver:

Rowe E. Optical Constants by Ellipsometry. [Internet] [Masters thesis]. McMaster University; 1969. [cited 2019 Aug 17]. Available from: http://hdl.handle.net/11375/20080.

Council of Science Editors:

Rowe E. Optical Constants by Ellipsometry. [Masters Thesis]. McMaster University; 1969. Available from: http://hdl.handle.net/11375/20080


University of Illinois – Urbana-Champaign

11. Darrow, Michael Cole. Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices.

Degree: MS, Materials Science and Engineering, 2017, University of Illinois – Urbana-Champaign

 Spectroscopic ellipsometry (SE) is a non-contact, non-destructive characterization technique for probing the optical properties of thin films. With the advent of second-generation solar cells, SE… (more)

Subjects/Keywords: Ellipsometry; Cadmium telluride (CdTe); Dielectric modeling; Photovoltaics

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APA (6th Edition):

Darrow, M. C. (2017). Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices. (Thesis). University of Illinois – Urbana-Champaign. Retrieved from http://hdl.handle.net/2142/97503

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Darrow, Michael Cole. “Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices.” 2017. Thesis, University of Illinois – Urbana-Champaign. Accessed August 17, 2019. http://hdl.handle.net/2142/97503.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Darrow, Michael Cole. “Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices.” 2017. Web. 17 Aug 2019.

Vancouver:

Darrow MC. Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices. [Internet] [Thesis]. University of Illinois – Urbana-Champaign; 2017. [cited 2019 Aug 17]. Available from: http://hdl.handle.net/2142/97503.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Darrow MC. Spectroscopic ellipsometry and dielectric modeling of thin film CdTe/CdS photovoltaic devices. [Thesis]. University of Illinois – Urbana-Champaign; 2017. Available from: http://hdl.handle.net/2142/97503

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Texas State University – San Marcos

12. Waxler, Chad Lawrence. Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing.

Degree: MS, Physics, 2013, Texas State University – San Marcos

 In this study, we investigate the surface morphology and optical properties of silicon nanoparticles formed on a silicon-on-insulator substrate by thermal annealing of a thin… (more)

Subjects/Keywords: Silicon Nanoparticles Ellipsometry Oxidation Thermal Annealing; Nanosilicon; Nanostructured materials; Nanotechnology; Silicon – Analysis; Nanochemistry; Ellipsometry

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APA (6th Edition):

Waxler, C. L. (2013). Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing. (Masters Thesis). Texas State University – San Marcos. Retrieved from https://digital.library.txstate.edu/handle/10877/4564

Chicago Manual of Style (16th Edition):

Waxler, Chad Lawrence. “Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing.” 2013. Masters Thesis, Texas State University – San Marcos. Accessed August 17, 2019. https://digital.library.txstate.edu/handle/10877/4564.

MLA Handbook (7th Edition):

Waxler, Chad Lawrence. “Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing.” 2013. Web. 17 Aug 2019.

Vancouver:

Waxler CL. Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing. [Internet] [Masters thesis]. Texas State University – San Marcos; 2013. [cited 2019 Aug 17]. Available from: https://digital.library.txstate.edu/handle/10877/4564.

Council of Science Editors:

Waxler CL. Ellipsometric Analysis of Silicon Nanoparticles Formed by Thermal Annealing. [Masters Thesis]. Texas State University – San Marcos; 2013. Available from: https://digital.library.txstate.edu/handle/10877/4564

13. St John, David Benjamin. Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices.

Degree: PhD, Materials Science and Engineering, 2012, Penn State University

 The commercial market for uncooled infrared imaging devices has expanded in the last several decades, following the declassification of pulse-biased microbolometer-based focal plane arrays (FPAs)… (more)

Subjects/Keywords: PECVD; silicon; germanium; infrared; ellipsometry; spectroscopic ellipsometry; infrared ellipsometry; microbolometer

…components used in ellipsometry. The plane of incidence is defined as the plane through which the… 

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APA (6th Edition):

St John, D. B. (2012). Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices. (Doctoral Dissertation). Penn State University. Retrieved from https://etda.libraries.psu.edu/catalog/16148

Chicago Manual of Style (16th Edition):

St John, David Benjamin. “Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices.” 2012. Doctoral Dissertation, Penn State University. Accessed August 17, 2019. https://etda.libraries.psu.edu/catalog/16148.

MLA Handbook (7th Edition):

St John, David Benjamin. “Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices.” 2012. Web. 17 Aug 2019.

Vancouver:

St John DB. Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices. [Internet] [Doctoral dissertation]. Penn State University; 2012. [cited 2019 Aug 17]. Available from: https://etda.libraries.psu.edu/catalog/16148.

Council of Science Editors:

St John DB. Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices. [Doctoral Dissertation]. Penn State University; 2012. Available from: https://etda.libraries.psu.edu/catalog/16148

14. Cicerrella, Elizabeth. Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry.

Degree: PhD, 2006, Oregon Health Sciences University

Subjects/Keywords: Ellipsometry; Dielectrics  – Optical properties; Ellipsometry; high-K dielectrics; Bandgaps

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APA (6th Edition):

Cicerrella, E. (2006). Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry. (Doctoral Dissertation). Oregon Health Sciences University. Retrieved from doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2

Chicago Manual of Style (16th Edition):

Cicerrella, Elizabeth. “Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry.” 2006. Doctoral Dissertation, Oregon Health Sciences University. Accessed August 17, 2019. doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2.

MLA Handbook (7th Edition):

Cicerrella, Elizabeth. “Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry.” 2006. Web. 17 Aug 2019.

Vancouver:

Cicerrella E. Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry. [Internet] [Doctoral dissertation]. Oregon Health Sciences University; 2006. [cited 2019 Aug 17]. Available from: doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2.

Council of Science Editors:

Cicerrella E. Dielectric functions and optical bandgaps of high-K dielectrics by far ultraviolet spectroscopic ellipsometry. [Doctoral Dissertation]. Oregon Health Sciences University; 2006. Available from: doi:10.6083/M4QN64NB ; http://digitalcommons.ohsu.edu/etd/2


University of Florida

15. Fabre, Roxane. Biomolecules Immobilization on Zirconium Phosphonate Surfaces Studied by Surface Plasmon Resonance Enhanced Ellipsometry.

Degree: PhD, Chemistry, 2010, University of Florida

 Membrane proteins are both structurally and functionally diverse. Present in biological membranes, their functions, mainly transport, signaling and surface recognition, depend on cell type and… (more)

Subjects/Keywords: Cell membranes; Ellipsometry; Fluorescence; Kinetics; Lipid bilayers; Lipids; Phosphates; Phosphonic acids; Signals; Zirconium; ellipsometry, lipid, membrane, phosphonate, protein, spr, zirconium

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APA (6th Edition):

Fabre, R. (2010). Biomolecules Immobilization on Zirconium Phosphonate Surfaces Studied by Surface Plasmon Resonance Enhanced Ellipsometry. (Doctoral Dissertation). University of Florida. Retrieved from http://ufdc.ufl.edu/UFE0041940

Chicago Manual of Style (16th Edition):

Fabre, Roxane. “Biomolecules Immobilization on Zirconium Phosphonate Surfaces Studied by Surface Plasmon Resonance Enhanced Ellipsometry.” 2010. Doctoral Dissertation, University of Florida. Accessed August 17, 2019. http://ufdc.ufl.edu/UFE0041940.

MLA Handbook (7th Edition):

Fabre, Roxane. “Biomolecules Immobilization on Zirconium Phosphonate Surfaces Studied by Surface Plasmon Resonance Enhanced Ellipsometry.” 2010. Web. 17 Aug 2019.

Vancouver:

Fabre R. Biomolecules Immobilization on Zirconium Phosphonate Surfaces Studied by Surface Plasmon Resonance Enhanced Ellipsometry. [Internet] [Doctoral dissertation]. University of Florida; 2010. [cited 2019 Aug 17]. Available from: http://ufdc.ufl.edu/UFE0041940.

Council of Science Editors:

Fabre R. Biomolecules Immobilization on Zirconium Phosphonate Surfaces Studied by Surface Plasmon Resonance Enhanced Ellipsometry. [Doctoral Dissertation]. University of Florida; 2010. Available from: http://ufdc.ufl.edu/UFE0041940


Dalhousie University

16. Author Not Available. AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY.

Degree: MS, Department of Physics & Atmospheric Science, 2011, Dalhousie University

 A novel method to detect and quantify the growth of the solid electrolyte interphase (SEI) on battery electrode materials using in-situ spectroscopic ellipsometry (SE) is… (more)

Subjects/Keywords: ellipsometry; in-situ; lithium-ion batteries; thin film electrodes

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APA (6th Edition):

Available, A. N. (2011). AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY. (Masters Thesis). Dalhousie University. Retrieved from http://hdl.handle.net/10222/14076

Chicago Manual of Style (16th Edition):

Available, Author Not. “AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY.” 2011. Masters Thesis, Dalhousie University. Accessed August 17, 2019. http://hdl.handle.net/10222/14076.

MLA Handbook (7th Edition):

Available, Author Not. “AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY.” 2011. Web. 17 Aug 2019.

Vancouver:

Available AN. AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY. [Internet] [Masters thesis]. Dalhousie University; 2011. [cited 2019 Aug 17]. Available from: http://hdl.handle.net/10222/14076.

Council of Science Editors:

Available AN. AN IN-SITU INVESTIGATION OF SOLID ELECTROLYTE INTERPHASE FORMATION ON ELECTRODE MATERIALS FOR LITHIUM-ION BATTERIES USING SPECTROSCOPIC ELLIPSOMETRY. [Masters Thesis]. Dalhousie University; 2011. Available from: http://hdl.handle.net/10222/14076


Univerzitet u Beogradu

17. Jakovljević, Milka. 1983-. Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije.

Degree: Elektrotehnički fakultet, 2016, Univerzitet u Beogradu

Elektrotehnika / Electrical engineering

Sa najnovijim razvojem nanotehnologije došlo je do ponovnog interesovanja za polje plazmonike. Nanoplazmonika povezuje fotoniku sa nanonaukama tako što konfinira svetlost… (more)

Subjects/Keywords: plasmon polariton; fishnet nanostructures; ellipsometry; nanophotonics; plasmonic resonances

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APA (6th Edition):

Jakovljević, M. 1. (2016). Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije. (Thesis). Univerzitet u Beogradu. Retrieved from https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Jakovljević, Milka 1983-. “Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije.” 2016. Thesis, Univerzitet u Beogradu. Accessed August 17, 2019. https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Jakovljević, Milka 1983-. “Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije.” 2016. Web. 17 Aug 2019.

Vancouver:

Jakovljević M1. Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije. [Internet] [Thesis]. Univerzitet u Beogradu; 2016. [cited 2019 Aug 17]. Available from: https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Jakovljević M1. Proučavanje plazmonskih nanostruktura korišćenjem spektroskopske elipsometrije. [Thesis]. Univerzitet u Beogradu; 2016. Available from: https://fedorabg.bg.ac.rs/fedora/get/o:11612/bdef:Content/get

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Toledo

18. Sainju, Deepak. Spectroscopic Ellipsometry Studies of Ag and ZnO Thin Films and Their Interfaces for Thin Film Photovoltaics.

Degree: PhD, Physics, 2015, University of Toledo

 Many modern optical and electronic devices, including photovoltaic devices, consist of multilayered thin film structures. Spectroscopic ellipsometry (SE) is a critically important characterization technique for… (more)

Subjects/Keywords: Solid State Physics; Physics; Optics; Ellipsometry, Photovoltaics, Ag, ZnO, ZnOAl

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APA (6th Edition):

Sainju, D. (2015). Spectroscopic Ellipsometry Studies of Ag and ZnO Thin Films and Their Interfaces for Thin Film Photovoltaics. (Doctoral Dissertation). University of Toledo. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430326934

Chicago Manual of Style (16th Edition):

Sainju, Deepak. “Spectroscopic Ellipsometry Studies of Ag and ZnO Thin Films and Their Interfaces for Thin Film Photovoltaics.” 2015. Doctoral Dissertation, University of Toledo. Accessed August 17, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430326934.

MLA Handbook (7th Edition):

Sainju, Deepak. “Spectroscopic Ellipsometry Studies of Ag and ZnO Thin Films and Their Interfaces for Thin Film Photovoltaics.” 2015. Web. 17 Aug 2019.

Vancouver:

Sainju D. Spectroscopic Ellipsometry Studies of Ag and ZnO Thin Films and Their Interfaces for Thin Film Photovoltaics. [Internet] [Doctoral dissertation]. University of Toledo; 2015. [cited 2019 Aug 17]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430326934.

Council of Science Editors:

Sainju D. Spectroscopic Ellipsometry Studies of Ag and ZnO Thin Films and Their Interfaces for Thin Film Photovoltaics. [Doctoral Dissertation]. University of Toledo; 2015. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430326934


University of Toledo

19. Koirala, Prakash. Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: from Materials and Interfaces to Solar Cells.

Degree: PhD, Physics, 2015, University of Toledo

 Spectroscopic ellipsometry (SE) in the mid-infrared to ultraviolet range has been implemented in order to develop and evaluate optimization procedures for CdTe solar cells at… (more)

Subjects/Keywords: Physics; CdTe Photovoltaics, CdTe Metrology, Spectroscopic Ellipsometry, QE Simulation

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APA (6th Edition):

Koirala, P. (2015). Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: from Materials and Interfaces to Solar Cells. (Doctoral Dissertation). University of Toledo. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430488231

Chicago Manual of Style (16th Edition):

Koirala, Prakash. “Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: from Materials and Interfaces to Solar Cells.” 2015. Doctoral Dissertation, University of Toledo. Accessed August 17, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430488231.

MLA Handbook (7th Edition):

Koirala, Prakash. “Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: from Materials and Interfaces to Solar Cells.” 2015. Web. 17 Aug 2019.

Vancouver:

Koirala P. Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: from Materials and Interfaces to Solar Cells. [Internet] [Doctoral dissertation]. University of Toledo; 2015. [cited 2019 Aug 17]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430488231.

Council of Science Editors:

Koirala P. Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: from Materials and Interfaces to Solar Cells. [Doctoral Dissertation]. University of Toledo; 2015. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1430488231


University of Cincinnati

20. Pantelic, Nebojsa. Mass Transport Properties in Thin Ion-exchange Polymer Films and Related Phenomena.

Degree: PhD, Arts and Sciences : Chemistry, 2007, University of Cincinnati

 Thin ion-exchange polymer films (henceforth polyelectrolytes) have recently acquired substantial research interest. This is due in large part to the great promise demonstrated by the… (more)

Subjects/Keywords: Thin ion-exchange polymer films; spectroscopic ellipsometry; diffusion; sensor

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APA (6th Edition):

Pantelic, N. (2007). Mass Transport Properties in Thin Ion-exchange Polymer Films and Related Phenomena. (Doctoral Dissertation). University of Cincinnati. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=ucin1179174207

Chicago Manual of Style (16th Edition):

Pantelic, Nebojsa. “Mass Transport Properties in Thin Ion-exchange Polymer Films and Related Phenomena.” 2007. Doctoral Dissertation, University of Cincinnati. Accessed August 17, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1179174207.

MLA Handbook (7th Edition):

Pantelic, Nebojsa. “Mass Transport Properties in Thin Ion-exchange Polymer Films and Related Phenomena.” 2007. Web. 17 Aug 2019.

Vancouver:

Pantelic N. Mass Transport Properties in Thin Ion-exchange Polymer Films and Related Phenomena. [Internet] [Doctoral dissertation]. University of Cincinnati; 2007. [cited 2019 Aug 17]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=ucin1179174207.

Council of Science Editors:

Pantelic N. Mass Transport Properties in Thin Ion-exchange Polymer Films and Related Phenomena. [Doctoral Dissertation]. University of Cincinnati; 2007. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=ucin1179174207


Georgia Tech

21. Sprinkle, Michael W. Epitaxial graphene on silicon carbide: low-vacuum growth, characterization, and device fabrication.

Degree: PhD, Physics, 2010, Georgia Tech

 In the past several years, epitaxial graphene on silicon carbide has been transformed from an academic curiosity of social scientists to a leading candidate material… (more)

Subjects/Keywords: Rotational stacking; Growth; Epitaxial; Ellipsometry; Graphene; Silicon carbide; Graphene; Epitaxy

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APA (6th Edition):

Sprinkle, M. W. (2010). Epitaxial graphene on silicon carbide: low-vacuum growth, characterization, and device fabrication. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/34735

Chicago Manual of Style (16th Edition):

Sprinkle, Michael W. “Epitaxial graphene on silicon carbide: low-vacuum growth, characterization, and device fabrication.” 2010. Doctoral Dissertation, Georgia Tech. Accessed August 17, 2019. http://hdl.handle.net/1853/34735.

MLA Handbook (7th Edition):

Sprinkle, Michael W. “Epitaxial graphene on silicon carbide: low-vacuum growth, characterization, and device fabrication.” 2010. Web. 17 Aug 2019.

Vancouver:

Sprinkle MW. Epitaxial graphene on silicon carbide: low-vacuum growth, characterization, and device fabrication. [Internet] [Doctoral dissertation]. Georgia Tech; 2010. [cited 2019 Aug 17]. Available from: http://hdl.handle.net/1853/34735.

Council of Science Editors:

Sprinkle MW. Epitaxial graphene on silicon carbide: low-vacuum growth, characterization, and device fabrication. [Doctoral Dissertation]. Georgia Tech; 2010. Available from: http://hdl.handle.net/1853/34735


Penn State University

22. Shay, Dennis Patrick. Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices.

Degree: PhD, Materials Science and Engineering, 2014, Penn State University

 The maximum electrostatic energy density of a capacitor is a function of the relative permittivity (εr) and the square of the dielectric breakdown strength (Eb).… (more)

Subjects/Keywords: Dielectric; Energy Density; Ceramic; Impedance Spectroscopy; Breakdown Strength; Ellipsometry; Power Electronics

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APA (6th Edition):

Shay, D. P. (2014). Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices. (Doctoral Dissertation). Penn State University. Retrieved from https://etda.libraries.psu.edu/catalog/21810

Chicago Manual of Style (16th Edition):

Shay, Dennis Patrick. “Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices.” 2014. Doctoral Dissertation, Penn State University. Accessed August 17, 2019. https://etda.libraries.psu.edu/catalog/21810.

MLA Handbook (7th Edition):

Shay, Dennis Patrick. “Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices.” 2014. Web. 17 Aug 2019.

Vancouver:

Shay DP. Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices. [Internet] [Doctoral dissertation]. Penn State University; 2014. [cited 2019 Aug 17]. Available from: https://etda.libraries.psu.edu/catalog/21810.

Council of Science Editors:

Shay DP. Development and Characterization of High Temperature, High Energy Density Dielectric Materials to Establish Routes towards Power Electronics Capacitive Devices. [Doctoral Dissertation]. Penn State University; 2014. Available from: https://etda.libraries.psu.edu/catalog/21810


University of Toledo

23. Tan, Xinxuan. Applications of Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Window Layers to Back Contacts.

Degree: PhD, Physics, 2017, University of Toledo

 Spectroscopic ellipsometry (SE) is a powerful tool for non-destructive evaluation of thin films consisting of single layers or multilayers on substrates. For such thin films,… (more)

Subjects/Keywords: Physics; Ellipsometry; CdSO; CdTe solar cell; novel back contacts

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APA (6th Edition):

Tan, X. (2017). Applications of Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Window Layers to Back Contacts. (Doctoral Dissertation). University of Toledo. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=toledo1513371404463035

Chicago Manual of Style (16th Edition):

Tan, Xinxuan. “Applications of Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Window Layers to Back Contacts.” 2017. Doctoral Dissertation, University of Toledo. Accessed August 17, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1513371404463035.

MLA Handbook (7th Edition):

Tan, Xinxuan. “Applications of Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Window Layers to Back Contacts.” 2017. Web. 17 Aug 2019.

Vancouver:

Tan X. Applications of Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Window Layers to Back Contacts. [Internet] [Doctoral dissertation]. University of Toledo; 2017. [cited 2019 Aug 17]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1513371404463035.

Council of Science Editors:

Tan X. Applications of Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Window Layers to Back Contacts. [Doctoral Dissertation]. University of Toledo; 2017. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=toledo1513371404463035


University of Victoria

24. FitzGerald, William. Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride.

Degree: Department of Chemistry, 2017, University of Victoria

 The infrared portion of the electro-magnetic spectrum is a challenging region in which to perform optical techniques, limited by both device efficiency and availability. In… (more)

Subjects/Keywords: applied optics; polarimetry; ellipsometry; electro-optic materials; CZT; cadmium zinc telluride

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APA (6th Edition):

FitzGerald, W. (2017). Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride. (Thesis). University of Victoria. Retrieved from https://dspace.library.uvic.ca//handle/1828/8900

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

FitzGerald, William. “Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride.” 2017. Thesis, University of Victoria. Accessed August 17, 2019. https://dspace.library.uvic.ca//handle/1828/8900.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

FitzGerald, William. “Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride.” 2017. Web. 17 Aug 2019.

Vancouver:

FitzGerald W. Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride. [Internet] [Thesis]. University of Victoria; 2017. [cited 2019 Aug 17]. Available from: https://dspace.library.uvic.ca//handle/1828/8900.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

FitzGerald W. Broadband IR stokes polarimetry for the electro-optic characterization of cadmium zinc telluride. [Thesis]. University of Victoria; 2017. Available from: https://dspace.library.uvic.ca//handle/1828/8900

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Linköping University

25. Magnusson, Roger. Mueller matrix ellipsometry on advanced nanostructures.

Degree: Chemistry and Biology, 2008, Linköping University

Ellipsometry is an optical technique used for studies of thin films and surfaces. The technique is based on measurement and analysis of the changes… (more)

Subjects/Keywords: Ellipsometry; Jones formalism; Stokes formalism; Mueller formalism; Physics; Fysik

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APA (6th Edition):

Magnusson, R. (2008). Mueller matrix ellipsometry on advanced nanostructures. (Thesis). Linköping University. Retrieved from http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-10698

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Magnusson, Roger. “Mueller matrix ellipsometry on advanced nanostructures.” 2008. Thesis, Linköping University. Accessed August 17, 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-10698.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Magnusson, Roger. “Mueller matrix ellipsometry on advanced nanostructures.” 2008. Web. 17 Aug 2019.

Vancouver:

Magnusson R. Mueller matrix ellipsometry on advanced nanostructures. [Internet] [Thesis]. Linköping University; 2008. [cited 2019 Aug 17]. Available from: http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-10698.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Magnusson R. Mueller matrix ellipsometry on advanced nanostructures. [Thesis]. Linköping University; 2008. Available from: http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-10698

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

26. Vauselle, Alexandre. Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments.

Degree: Docteur es, Optique, photonique et traitement d’image, 2013, Aix Marseille Université

L’industrie des nanotechnologies est un monde en constante évolution. Les améliorations dans les techniques de fabrication permettent de définir des composants de plus en plus… (more)

Subjects/Keywords: Nanotechnologie; Ellipsométrie; Scatterométrie; Rugosité; Diffusion; Nanotechnology; Ellipsometry; Scatterometry; Roughness; Scattering

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APA (6th Edition):

Vauselle, A. (2013). Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments. (Doctoral Dissertation). Aix Marseille Université. Retrieved from http://www.theses.fr/2013AIXM4345

Chicago Manual of Style (16th Edition):

Vauselle, Alexandre. “Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments.” 2013. Doctoral Dissertation, Aix Marseille Université. Accessed August 17, 2019. http://www.theses.fr/2013AIXM4345.

MLA Handbook (7th Edition):

Vauselle, Alexandre. “Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments.” 2013. Web. 17 Aug 2019.

Vancouver:

Vauselle A. Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments. [Internet] [Doctoral dissertation]. Aix Marseille Université 2013. [cited 2019 Aug 17]. Available from: http://www.theses.fr/2013AIXM4345.

Council of Science Editors:

Vauselle A. Métrologie des dimensions critiques : scatterométrie et développements avancés : Metrology of critical dimension : scatterometry and advanced developments. [Doctoral Dissertation]. Aix Marseille Université 2013. Available from: http://www.theses.fr/2013AIXM4345

27. Jiménez, J. Hydrogen-free SiCN films obtained by electron cyclotron resonance plasma: a study of composition, optical and luminescent properties.

Degree: 2018, Electrochemical Society

Subjects/Keywords: Cathodoluminescence; Ellipsometry; Silicon Compounds; Física

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APA (6th Edition):

Jiménez, J. (2018). Hydrogen-free SiCN films obtained by electron cyclotron resonance plasma: a study of composition, optical and luminescent properties. (Thesis). Electrochemical Society. Retrieved from http://hdl.handle.net/10486/13948

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Jiménez, J. “Hydrogen-free SiCN films obtained by electron cyclotron resonance plasma: a study of composition, optical and luminescent properties.” 2018. Thesis, Electrochemical Society. Accessed August 17, 2019. http://hdl.handle.net/10486/13948.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Jiménez, J. “Hydrogen-free SiCN films obtained by electron cyclotron resonance plasma: a study of composition, optical and luminescent properties.” 2018. Web. 17 Aug 2019.

Vancouver:

Jiménez J. Hydrogen-free SiCN films obtained by electron cyclotron resonance plasma: a study of composition, optical and luminescent properties. [Internet] [Thesis]. Electrochemical Society; 2018. [cited 2019 Aug 17]. Available from: http://hdl.handle.net/10486/13948.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Jiménez J. Hydrogen-free SiCN films obtained by electron cyclotron resonance plasma: a study of composition, optical and luminescent properties. [Thesis]. Electrochemical Society; 2018. Available from: http://hdl.handle.net/10486/13948

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Vilnius Pedagogical University

28. Girkantaitė, Rasa. ErMnO3 monokristalo optinių savybių tyrimas.

Degree: Master, Physics, 2008, Vilnius Pedagogical University

Tirta ErMnO3 optinės savybės: apskaičiuotos dielektrinių skvarbų spektrinės priklausomybės, optinių šuolių energijos, lūžio ir sugerties rodikliai. Tyrimai atlikti elipsometru, dielektrinė funkcija apskaičiuojama pagal vienašio kristalo… (more)

Subjects/Keywords: Manganitai; Elipsometrija; Optinės savybes; Manganites; Ellipsometry; Optical properties

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APA (6th Edition):

Girkantaitė, Rasa. (2008). ErMnO3 monokristalo optinių savybių tyrimas. (Masters Thesis). Vilnius Pedagogical University. Retrieved from http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

Chicago Manual of Style (16th Edition):

Girkantaitė, Rasa. “ErMnO3 monokristalo optinių savybių tyrimas.” 2008. Masters Thesis, Vilnius Pedagogical University. Accessed August 17, 2019. http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;.

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

MLA Handbook (7th Edition):

Girkantaitė, Rasa. “ErMnO3 monokristalo optinių savybių tyrimas.” 2008. Web. 17 Aug 2019.

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

Vancouver:

Girkantaitė, Rasa. ErMnO3 monokristalo optinių savybių tyrimas. [Internet] [Masters thesis]. Vilnius Pedagogical University; 2008. [cited 2019 Aug 17]. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;.

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete

Council of Science Editors:

Girkantaitė, Rasa. ErMnO3 monokristalo optinių savybių tyrimas. [Masters Thesis]. Vilnius Pedagogical University; 2008. Available from: http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2008~D_20080924_184014-24660 ;

Note: this citation may be lacking information needed for this citation format:
Author name may be incomplete


Linköping University

29. Rybka, Marcin. Optical properties of MAX-phase materials.

Degree: Applied Optics, 2010, Linköping University

    MAX-phase materials are a new type of material class. These materials are potentiallyt echnologically important as they show unique physical properties due to… (more)

Subjects/Keywords: MAX; spectroscopic ellipsometry; optical properties; dielectric function; NATURAL SCIENCES; NATURVETENSKAP

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Rybka, M. (2010). Optical properties of MAX-phase materials. (Thesis). Linköping University. Retrieved from http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-60008

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Rybka, Marcin. “Optical properties of MAX-phase materials.” 2010. Thesis, Linköping University. Accessed August 17, 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-60008.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Rybka, Marcin. “Optical properties of MAX-phase materials.” 2010. Web. 17 Aug 2019.

Vancouver:

Rybka M. Optical properties of MAX-phase materials. [Internet] [Thesis]. Linköping University; 2010. [cited 2019 Aug 17]. Available from: http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-60008.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Rybka M. Optical properties of MAX-phase materials. [Thesis]. Linköping University; 2010. Available from: http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-60008

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of South Florida

30. Khan, Ridita Rahman. Modeling, Simulation and Characterization of Optoelectronic Properties of 2D-3D CoO-ATO Nano Structures.

Degree: 2017, University of South Florida

 Devices for converting solar energy to electrical energy are not considerably efficient, though there are abundant renewable solar energy sources. Therefore there is a continuous… (more)

Subjects/Keywords: Absorption-efficiency; Nano fiber membrane; Thin film; Photovoltaic cell; Ellipsometry; Engineering

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Khan, R. R. (2017). Modeling, Simulation and Characterization of Optoelectronic Properties of 2D-3D CoO-ATO Nano Structures. (Thesis). University of South Florida. Retrieved from https://scholarcommons.usf.edu/etd/7414

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Khan, Ridita Rahman. “Modeling, Simulation and Characterization of Optoelectronic Properties of 2D-3D CoO-ATO Nano Structures.” 2017. Thesis, University of South Florida. Accessed August 17, 2019. https://scholarcommons.usf.edu/etd/7414.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Khan, Ridita Rahman. “Modeling, Simulation and Characterization of Optoelectronic Properties of 2D-3D CoO-ATO Nano Structures.” 2017. Web. 17 Aug 2019.

Vancouver:

Khan RR. Modeling, Simulation and Characterization of Optoelectronic Properties of 2D-3D CoO-ATO Nano Structures. [Internet] [Thesis]. University of South Florida; 2017. [cited 2019 Aug 17]. Available from: https://scholarcommons.usf.edu/etd/7414.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Khan RR. Modeling, Simulation and Characterization of Optoelectronic Properties of 2D-3D CoO-ATO Nano Structures. [Thesis]. University of South Florida; 2017. Available from: https://scholarcommons.usf.edu/etd/7414

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

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