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You searched for subject:(Design for reliability). Showing records 1 – 20 of 20 total matches.

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University of Southern California

1. Huang, Zhaofeng. Design-for-reliability starting from conceptual design.

Degree: PhD, Mechanical Engineering, 2010, University of Southern California

Design-For-Reliability (DFR) has been studied in various literature articles and engineering text books, however, there are few studies that systematically address Design-For-Reliability definition, theoretical foundation,… (more)

Subjects/Keywords: design engineering; design-for-reliability; embodiment design; function design; reliability engineering

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APA (6th Edition):

Huang, Z. (2010). Design-for-reliability starting from conceptual design. (Doctoral Dissertation). University of Southern California. Retrieved from http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/422735/rec/1875

Chicago Manual of Style (16th Edition):

Huang, Zhaofeng. “Design-for-reliability starting from conceptual design.” 2010. Doctoral Dissertation, University of Southern California. Accessed September 20, 2019. http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/422735/rec/1875.

MLA Handbook (7th Edition):

Huang, Zhaofeng. “Design-for-reliability starting from conceptual design.” 2010. Web. 20 Sep 2019.

Vancouver:

Huang Z. Design-for-reliability starting from conceptual design. [Internet] [Doctoral dissertation]. University of Southern California; 2010. [cited 2019 Sep 20]. Available from: http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/422735/rec/1875.

Council of Science Editors:

Huang Z. Design-for-reliability starting from conceptual design. [Doctoral Dissertation]. University of Southern California; 2010. Available from: http://digitallibrary.usc.edu/cdm/compoundobject/collection/p15799coll127/id/422735/rec/1875


Georgia Tech

2. Cha, Soonyoung. Frontend reliability analysis and modeling from device to integrated circuits for reliability and yield enhancement system.

Degree: PhD, Electrical and Computer Engineering, 2017, Georgia Tech

 The objective of this research is to extract NBTI and GOBD model parameters to enable the estimation of the degradation and the remaining life of… (more)

Subjects/Keywords: Design for reliability and yield enhancement; Device-level and system-level reliability modeling

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APA (6th Edition):

Cha, S. (2017). Frontend reliability analysis and modeling from device to integrated circuits for reliability and yield enhancement system. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/59748

Chicago Manual of Style (16th Edition):

Cha, Soonyoung. “Frontend reliability analysis and modeling from device to integrated circuits for reliability and yield enhancement system.” 2017. Doctoral Dissertation, Georgia Tech. Accessed September 20, 2019. http://hdl.handle.net/1853/59748.

MLA Handbook (7th Edition):

Cha, Soonyoung. “Frontend reliability analysis and modeling from device to integrated circuits for reliability and yield enhancement system.” 2017. Web. 20 Sep 2019.

Vancouver:

Cha S. Frontend reliability analysis and modeling from device to integrated circuits for reliability and yield enhancement system. [Internet] [Doctoral dissertation]. Georgia Tech; 2017. [cited 2019 Sep 20]. Available from: http://hdl.handle.net/1853/59748.

Council of Science Editors:

Cha S. Frontend reliability analysis and modeling from device to integrated circuits for reliability and yield enhancement system. [Doctoral Dissertation]. Georgia Tech; 2017. Available from: http://hdl.handle.net/1853/59748


Université de Grenoble

3. Fall, Diarga. Techniques de tolérance aux fautes : conception des circuits fiables dans les technologies avancées : Fault tolerant techniques for the design of reliable circuits in advanved process nodes.

Degree: Docteur es, Sciences et technologie industrielles, 2013, Université de Grenoble

En approchant leurs limites ultimes, les technologies de silicium sont affectées par divers problèmes qui rendent de plus en plus difficile la poursuite de la… (more)

Subjects/Keywords: Fiabilité; Variabilité; Vieillissement; Conception pour la fiabilité; Conception pour la variabilité; Tolérance aux fautes; Reliability; Variability; Aging; Design for reliability; Design for variability; Fault tolerance

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APA (6th Edition):

Fall, D. (2013). Techniques de tolérance aux fautes : conception des circuits fiables dans les technologies avancées : Fault tolerant techniques for the design of reliable circuits in advanved process nodes. (Doctoral Dissertation). Université de Grenoble. Retrieved from http://www.theses.fr/2013GRENT030

Chicago Manual of Style (16th Edition):

Fall, Diarga. “Techniques de tolérance aux fautes : conception des circuits fiables dans les technologies avancées : Fault tolerant techniques for the design of reliable circuits in advanved process nodes.” 2013. Doctoral Dissertation, Université de Grenoble. Accessed September 20, 2019. http://www.theses.fr/2013GRENT030.

MLA Handbook (7th Edition):

Fall, Diarga. “Techniques de tolérance aux fautes : conception des circuits fiables dans les technologies avancées : Fault tolerant techniques for the design of reliable circuits in advanved process nodes.” 2013. Web. 20 Sep 2019.

Vancouver:

Fall D. Techniques de tolérance aux fautes : conception des circuits fiables dans les technologies avancées : Fault tolerant techniques for the design of reliable circuits in advanved process nodes. [Internet] [Doctoral dissertation]. Université de Grenoble; 2013. [cited 2019 Sep 20]. Available from: http://www.theses.fr/2013GRENT030.

Council of Science Editors:

Fall D. Techniques de tolérance aux fautes : conception des circuits fiables dans les technologies avancées : Fault tolerant techniques for the design of reliable circuits in advanved process nodes. [Doctoral Dissertation]. Université de Grenoble; 2013. Available from: http://www.theses.fr/2013GRENT030


Delft University of Technology

4. Tarashioon, S. A Systematic Approach to Address the Reliability of Solid State Lighting Drivers.

Degree: 2014, Delft University of Technology

 Solid State Lighting (SSL) technology is a new technology based on light emitting diodes as light sources. This technology due to its several outstanding characteristics… (more)

Subjects/Keywords: Solid State Lighting; Reliability; Design for Reliability; Physics of Failure; Reliability Simulation

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APA (6th Edition):

Tarashioon, S. (2014). A Systematic Approach to Address the Reliability of Solid State Lighting Drivers. (Doctoral Dissertation). Delft University of Technology. Retrieved from http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355

Chicago Manual of Style (16th Edition):

Tarashioon, S. “A Systematic Approach to Address the Reliability of Solid State Lighting Drivers.” 2014. Doctoral Dissertation, Delft University of Technology. Accessed September 20, 2019. http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355.

MLA Handbook (7th Edition):

Tarashioon, S. “A Systematic Approach to Address the Reliability of Solid State Lighting Drivers.” 2014. Web. 20 Sep 2019.

Vancouver:

Tarashioon S. A Systematic Approach to Address the Reliability of Solid State Lighting Drivers. [Internet] [Doctoral dissertation]. Delft University of Technology; 2014. [cited 2019 Sep 20]. Available from: http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355.

Council of Science Editors:

Tarashioon S. A Systematic Approach to Address the Reliability of Solid State Lighting Drivers. [Doctoral Dissertation]. Delft University of Technology; 2014. Available from: http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; urn:NBN:nl:ui:24-uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355 ; http://resolver.tudelft.nl/uuid:27edfcca-3cc9-4bdb-88e5-6e6019783355


Wayne State University

5. Cao, Dingzhou. Novel models and algorithms for systems reliability modeling and optimization.

Degree: PhD, Industrial and Manufacturing Engineering, 2011, Wayne State University

  Recent growth in the scale and complexity of products and technologies in the defense and other industries is challenging product development, realization, and sustainment… (more)

Subjects/Keywords: Continuous Time Bayesian Networks; CTBN; Design For Reliability; Epsilon Constraint Method; RAM Modeling; System Design Optimization; Industrial Engineering

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APA (6th Edition):

Cao, D. (2011). Novel models and algorithms for systems reliability modeling and optimization. (Doctoral Dissertation). Wayne State University. Retrieved from https://digitalcommons.wayne.edu/oa_dissertations/305

Chicago Manual of Style (16th Edition):

Cao, Dingzhou. “Novel models and algorithms for systems reliability modeling and optimization.” 2011. Doctoral Dissertation, Wayne State University. Accessed September 20, 2019. https://digitalcommons.wayne.edu/oa_dissertations/305.

MLA Handbook (7th Edition):

Cao, Dingzhou. “Novel models and algorithms for systems reliability modeling and optimization.” 2011. Web. 20 Sep 2019.

Vancouver:

Cao D. Novel models and algorithms for systems reliability modeling and optimization. [Internet] [Doctoral dissertation]. Wayne State University; 2011. [cited 2019 Sep 20]. Available from: https://digitalcommons.wayne.edu/oa_dissertations/305.

Council of Science Editors:

Cao D. Novel models and algorithms for systems reliability modeling and optimization. [Doctoral Dissertation]. Wayne State University; 2011. Available from: https://digitalcommons.wayne.edu/oa_dissertations/305


Georgia Tech

6. Xuan, Xiangdong. Analysis and design of reliable mixed-signal CMOS circuits.

Degree: PhD, Electrical and Computer Engineering, 2004, Georgia Tech

 Facing the constantly increasing reliability challenges under technology scaling, the topics in IC reliability technique have been receiving serious attention during recent years. In this… (more)

Subjects/Keywords: Reliability simulation; Design-for-reliability; IC reliability; Metal oxide semiconductors, Complementary Reliability Computer simulation; Integrated circuits Reliability Computer simulation

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APA (6th Edition):

Xuan, X. (2004). Analysis and design of reliable mixed-signal CMOS circuits. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/4776

Chicago Manual of Style (16th Edition):

Xuan, Xiangdong. “Analysis and design of reliable mixed-signal CMOS circuits.” 2004. Doctoral Dissertation, Georgia Tech. Accessed September 20, 2019. http://hdl.handle.net/1853/4776.

MLA Handbook (7th Edition):

Xuan, Xiangdong. “Analysis and design of reliable mixed-signal CMOS circuits.” 2004. Web. 20 Sep 2019.

Vancouver:

Xuan X. Analysis and design of reliable mixed-signal CMOS circuits. [Internet] [Doctoral dissertation]. Georgia Tech; 2004. [cited 2019 Sep 20]. Available from: http://hdl.handle.net/1853/4776.

Council of Science Editors:

Xuan X. Analysis and design of reliable mixed-signal CMOS circuits. [Doctoral Dissertation]. Georgia Tech; 2004. Available from: http://hdl.handle.net/1853/4776


Georgia Tech

7. Kim, Injoong. Development of a knowledge model for the computer-aided design for reliability of electronic packaging systems.

Degree: PhD, Mechanical Engineering, 2007, Georgia Tech

 Microelectronic systems such as cell phones, computers, consumer electronics, and implantable medical devices consist of subsystems which in turn consist of other subsystems and components.… (more)

Subjects/Keywords: System reliability; Knowledge model; Electronic packaging systems; Design-for-reliability; Electronic packaging; Reliability (Engineering); Mathematical models

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APA (6th Edition):

Kim, I. (2007). Development of a knowledge model for the computer-aided design for reliability of electronic packaging systems. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/22708

Chicago Manual of Style (16th Edition):

Kim, Injoong. “Development of a knowledge model for the computer-aided design for reliability of electronic packaging systems.” 2007. Doctoral Dissertation, Georgia Tech. Accessed September 20, 2019. http://hdl.handle.net/1853/22708.

MLA Handbook (7th Edition):

Kim, Injoong. “Development of a knowledge model for the computer-aided design for reliability of electronic packaging systems.” 2007. Web. 20 Sep 2019.

Vancouver:

Kim I. Development of a knowledge model for the computer-aided design for reliability of electronic packaging systems. [Internet] [Doctoral dissertation]. Georgia Tech; 2007. [cited 2019 Sep 20]. Available from: http://hdl.handle.net/1853/22708.

Council of Science Editors:

Kim I. Development of a knowledge model for the computer-aided design for reliability of electronic packaging systems. [Doctoral Dissertation]. Georgia Tech; 2007. Available from: http://hdl.handle.net/1853/22708


University of Arkansas

8. Jabo, Joseph. Reliability-Based Design and Acceptance Protocol for Driven Piles.

Degree: PhD, 2014, University of Arkansas

  The current use of the Arkansas Standard Specifications for Highway Construction Manuals (2003, 2014) for driven pile foundations faces various limitations which result in… (more)

Subjects/Keywords: Bayesian Updating; Bridge Foundations; Deep Foundations; Driven Piles; Load and Resistance Factor Design (LRFD); Reliability Analysis in Geotechnical Engineering; Reliability-Based Design and Acceptance Protocol for Driven Piles; Civil Engineering; Geotechnical Engineering; Statistics and Probability

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APA (6th Edition):

Jabo, J. (2014). Reliability-Based Design and Acceptance Protocol for Driven Piles. (Doctoral Dissertation). University of Arkansas. Retrieved from https://scholarworks.uark.edu/etd/2005

Chicago Manual of Style (16th Edition):

Jabo, Joseph. “Reliability-Based Design and Acceptance Protocol for Driven Piles.” 2014. Doctoral Dissertation, University of Arkansas. Accessed September 20, 2019. https://scholarworks.uark.edu/etd/2005.

MLA Handbook (7th Edition):

Jabo, Joseph. “Reliability-Based Design and Acceptance Protocol for Driven Piles.” 2014. Web. 20 Sep 2019.

Vancouver:

Jabo J. Reliability-Based Design and Acceptance Protocol for Driven Piles. [Internet] [Doctoral dissertation]. University of Arkansas; 2014. [cited 2019 Sep 20]. Available from: https://scholarworks.uark.edu/etd/2005.

Council of Science Editors:

Jabo J. Reliability-Based Design and Acceptance Protocol for Driven Piles. [Doctoral Dissertation]. University of Arkansas; 2014. Available from: https://scholarworks.uark.edu/etd/2005


Cranfield University

9. Bineid, Mansour. Aircraft systems design methodology and dispatch reliability prediction.

Degree: PhD, 2005, Cranfield University

 Aircraft despatch reliability was the main subject of this research in the wider content of aircraft reliability. The factors effecting dispatch reliability, aircraft delay, causes… (more)

Subjects/Keywords: 629.1; Dispatch reliability : delay rate : maintainability : aircraft availability : aircraft systems design methodology for dispatch reliability

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APA (6th Edition):

Bineid, M. (2005). Aircraft systems design methodology and dispatch reliability prediction. (Doctoral Dissertation). Cranfield University. Retrieved from http://dspace.lib.cranfield.ac.uk/handle/1826/5415 ; http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.533417

Chicago Manual of Style (16th Edition):

Bineid, Mansour. “Aircraft systems design methodology and dispatch reliability prediction.” 2005. Doctoral Dissertation, Cranfield University. Accessed September 20, 2019. http://dspace.lib.cranfield.ac.uk/handle/1826/5415 ; http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.533417.

MLA Handbook (7th Edition):

Bineid, Mansour. “Aircraft systems design methodology and dispatch reliability prediction.” 2005. Web. 20 Sep 2019.

Vancouver:

Bineid M. Aircraft systems design methodology and dispatch reliability prediction. [Internet] [Doctoral dissertation]. Cranfield University; 2005. [cited 2019 Sep 20]. Available from: http://dspace.lib.cranfield.ac.uk/handle/1826/5415 ; http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.533417.

Council of Science Editors:

Bineid M. Aircraft systems design methodology and dispatch reliability prediction. [Doctoral Dissertation]. Cranfield University; 2005. Available from: http://dspace.lib.cranfield.ac.uk/handle/1826/5415 ; http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.533417


Université de Bordeaux I

10. Bestory, Corinne. Développement de stratégies de conception en vue de la fiabilité pour la simulation et la prévision des durées de vie de circuits intégrés dès la phase de conception : Autour de la Complexité des mots.

Degree: Docteur es, Electronique, 2008, Université de Bordeaux I

La conception en vue de la fiabilité (DFR, Design for Reliability) consiste à simuler le vieillissement électrique des composants élémentaires pour évaluer la dégradation d'un… (more)

Subjects/Keywords: Conception en vue de la fiabilité; Simulation de Monte-Carlo; Radiation; Dispersions technologiques; Porteurs chauds; Modélisation comportementale; Prédiction de la durée de vie; Fiabilité; Design for reliability; Radiation; Hot carriers; Life time prediction; Monte-Carlo simulation; Statistical process dispersion; Behavioural modelling; Reliability

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APA (6th Edition):

Bestory, C. (2008). Développement de stratégies de conception en vue de la fiabilité pour la simulation et la prévision des durées de vie de circuits intégrés dès la phase de conception : Autour de la Complexité des mots. (Doctoral Dissertation). Université de Bordeaux I. Retrieved from http://www.theses.fr/2008BOR13627

Chicago Manual of Style (16th Edition):

Bestory, Corinne. “Développement de stratégies de conception en vue de la fiabilité pour la simulation et la prévision des durées de vie de circuits intégrés dès la phase de conception : Autour de la Complexité des mots.” 2008. Doctoral Dissertation, Université de Bordeaux I. Accessed September 20, 2019. http://www.theses.fr/2008BOR13627.

MLA Handbook (7th Edition):

Bestory, Corinne. “Développement de stratégies de conception en vue de la fiabilité pour la simulation et la prévision des durées de vie de circuits intégrés dès la phase de conception : Autour de la Complexité des mots.” 2008. Web. 20 Sep 2019.

Vancouver:

Bestory C. Développement de stratégies de conception en vue de la fiabilité pour la simulation et la prévision des durées de vie de circuits intégrés dès la phase de conception : Autour de la Complexité des mots. [Internet] [Doctoral dissertation]. Université de Bordeaux I; 2008. [cited 2019 Sep 20]. Available from: http://www.theses.fr/2008BOR13627.

Council of Science Editors:

Bestory C. Développement de stratégies de conception en vue de la fiabilité pour la simulation et la prévision des durées de vie de circuits intégrés dès la phase de conception : Autour de la Complexité des mots. [Doctoral Dissertation]. Université de Bordeaux I; 2008. Available from: http://www.theses.fr/2008BOR13627


Cranfield University

11. Bineid, Mansour. Aircraft systems design methodology and dispatch reliability prediction.

Degree: PhD, 2005, Cranfield University

 Aircraft despatch reliability was the main subject of this research in the wider content of aircraft reliability. The factors effecting dispatch reliability, aircraft delay, causes… (more)

Subjects/Keywords: Dispatch reliability; delay rate; maintainability; aircraft availability; aircraft systems design methodology for dispatch reliability

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Bineid, M. (2005). Aircraft systems design methodology and dispatch reliability prediction. (Doctoral Dissertation). Cranfield University. Retrieved from http://dspace.lib.cranfield.ac.uk/handle/1826/5415

Chicago Manual of Style (16th Edition):

Bineid, Mansour. “Aircraft systems design methodology and dispatch reliability prediction.” 2005. Doctoral Dissertation, Cranfield University. Accessed September 20, 2019. http://dspace.lib.cranfield.ac.uk/handle/1826/5415.

MLA Handbook (7th Edition):

Bineid, Mansour. “Aircraft systems design methodology and dispatch reliability prediction.” 2005. Web. 20 Sep 2019.

Vancouver:

Bineid M. Aircraft systems design methodology and dispatch reliability prediction. [Internet] [Doctoral dissertation]. Cranfield University; 2005. [cited 2019 Sep 20]. Available from: http://dspace.lib.cranfield.ac.uk/handle/1826/5415.

Council of Science Editors:

Bineid M. Aircraft systems design methodology and dispatch reliability prediction. [Doctoral Dissertation]. Cranfield University; 2005. Available from: http://dspace.lib.cranfield.ac.uk/handle/1826/5415


Université de Bordeaux I

12. Barnat, Samed. Etude prédictive de fiabilité de nouveaux concepts d’assemblage pour des « system-in-package » hétérogènes : Predictive reliability study of new assembly concepts for heterogeneous "system-in-package".

Degree: Docteur es, Electronique, 2011, Université de Bordeaux I

Ce projet de thèse se situe dans le cadre de l'étude de la fiabilité prédictive de nouveaux concepts d'assemblages microélectroniques de type « system in… (more)

Subjects/Keywords: Test bille sur anneau; Test trois points; Prototypage virtuel; Simulation thermomécanique; Microassemblages; Méthodologie de fiabilité prédictive; Résistance mécanique du silicium; Boitier électronique; Plans d’expérience; Ball-on-ring test; Three point bend test; Silicon strength; Die crack; Virtual prototyping; Thermo mechanical simulation; Design for reliability; Predictive reliability methodology; System in package; Underfill; Design of experiments

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APA (6th Edition):

Barnat, S. (2011). Etude prédictive de fiabilité de nouveaux concepts d’assemblage pour des « system-in-package » hétérogènes : Predictive reliability study of new assembly concepts for heterogeneous "system-in-package". (Doctoral Dissertation). Université de Bordeaux I. Retrieved from http://www.theses.fr/2011BOR14243

Chicago Manual of Style (16th Edition):

Barnat, Samed. “Etude prédictive de fiabilité de nouveaux concepts d’assemblage pour des « system-in-package » hétérogènes : Predictive reliability study of new assembly concepts for heterogeneous "system-in-package".” 2011. Doctoral Dissertation, Université de Bordeaux I. Accessed September 20, 2019. http://www.theses.fr/2011BOR14243.

MLA Handbook (7th Edition):

Barnat, Samed. “Etude prédictive de fiabilité de nouveaux concepts d’assemblage pour des « system-in-package » hétérogènes : Predictive reliability study of new assembly concepts for heterogeneous "system-in-package".” 2011. Web. 20 Sep 2019.

Vancouver:

Barnat S. Etude prédictive de fiabilité de nouveaux concepts d’assemblage pour des « system-in-package » hétérogènes : Predictive reliability study of new assembly concepts for heterogeneous "system-in-package". [Internet] [Doctoral dissertation]. Université de Bordeaux I; 2011. [cited 2019 Sep 20]. Available from: http://www.theses.fr/2011BOR14243.

Council of Science Editors:

Barnat S. Etude prédictive de fiabilité de nouveaux concepts d’assemblage pour des « system-in-package » hétérogènes : Predictive reliability study of new assembly concepts for heterogeneous "system-in-package". [Doctoral Dissertation]. Université de Bordeaux I; 2011. Available from: http://www.theses.fr/2011BOR14243

13. Lahbib, Insaf. Contribution à l'analyse des effets de vieillissement de composants actifs et de circuits intégrés sous contraintes DC et RF en vue d'une approche prédictive : Contribution to the analysis of aging effects of active components and integrated circuits under DC and RF constraints for a predictive approach.

Degree: Docteur es, Electronique, microelectronique, optique et lasers, optoelectronique microondes, 2017, Normandie

Les travaux de cette thèse portent sur la simulation de la dégradation des paramètres électriques des transistors MOS et bipolaires sous stress statiques et dynamiques.… (more)

Subjects/Keywords: Prédiction de la dégradation; Stress DC, Stress RF; Dégradation des paramètres DC et RF; Mécanismes de dégradation HCI, BTI, MMD et RVBE; TranEstimation de la durée de viesistors MOS et bipolaires; Conception en tenant compte de la fiabilité; Reliability simulation; Prediction of degradation under DC and RF stress; DC and RF parameters degradation; Degradation mechanisms HCI, BTI, MMD and RVBE in MOS and Bipolar transistors; MMD and RVBE in MOS and Bipolar transistors; Lifetime estimation; Transistor-level reliability; Circuit-level reliability; Design for reliability

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APA (6th Edition):

Lahbib, I. (2017). Contribution à l'analyse des effets de vieillissement de composants actifs et de circuits intégrés sous contraintes DC et RF en vue d'une approche prédictive : Contribution to the analysis of aging effects of active components and integrated circuits under DC and RF constraints for a predictive approach. (Doctoral Dissertation). Normandie. Retrieved from http://www.theses.fr/2017NORMC256

Chicago Manual of Style (16th Edition):

Lahbib, Insaf. “Contribution à l'analyse des effets de vieillissement de composants actifs et de circuits intégrés sous contraintes DC et RF en vue d'une approche prédictive : Contribution to the analysis of aging effects of active components and integrated circuits under DC and RF constraints for a predictive approach.” 2017. Doctoral Dissertation, Normandie. Accessed September 20, 2019. http://www.theses.fr/2017NORMC256.

MLA Handbook (7th Edition):

Lahbib, Insaf. “Contribution à l'analyse des effets de vieillissement de composants actifs et de circuits intégrés sous contraintes DC et RF en vue d'une approche prédictive : Contribution to the analysis of aging effects of active components and integrated circuits under DC and RF constraints for a predictive approach.” 2017. Web. 20 Sep 2019.

Vancouver:

Lahbib I. Contribution à l'analyse des effets de vieillissement de composants actifs et de circuits intégrés sous contraintes DC et RF en vue d'une approche prédictive : Contribution to the analysis of aging effects of active components and integrated circuits under DC and RF constraints for a predictive approach. [Internet] [Doctoral dissertation]. Normandie; 2017. [cited 2019 Sep 20]. Available from: http://www.theses.fr/2017NORMC256.

Council of Science Editors:

Lahbib I. Contribution à l'analyse des effets de vieillissement de composants actifs et de circuits intégrés sous contraintes DC et RF en vue d'une approche prédictive : Contribution to the analysis of aging effects of active components and integrated circuits under DC and RF constraints for a predictive approach. [Doctoral Dissertation]. Normandie; 2017. Available from: http://www.theses.fr/2017NORMC256

14. Dubourg, Vincent. Méta-modèles adaptatifs pour l'analyse de fiabilité et l'optimisation sous contrainte fiabiliste : Adaptive surrogate models for reliability analysis and reliability-based design optimization.

Degree: Docteur es, Génie Mécanique, 2011, Université Blaise-Pascale, Clermont-Ferrand II

Cette thèse est une contribution à la résolution du problème d’optimisation sous contrainte de fiabilité. Cette méthode de dimensionnement probabiliste vise à prendre en compte… (more)

Subjects/Keywords: Méta-modélisation adaptative; Krigeage; Régression et classification probabiliste par processus Gaussiens; Analyse de fiabilité; Probabilités d’évènements rares; Échantillonnage préférentiel; Optimisation sous contrainte de fiabilité; Flambage probabiliste; Coques géométriquement imparfaites; Adaptive surrogate modelling; Kriging; Gaussian processes for regression and probabilistic classification; Reliability analysis; Rare event probabilities; Reliability-based design optimization; Importance sampling; Probabilistic buckling; Geometrically imperfect shells

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Dubourg, V. (2011). Méta-modèles adaptatifs pour l'analyse de fiabilité et l'optimisation sous contrainte fiabiliste : Adaptive surrogate models for reliability analysis and reliability-based design optimization. (Doctoral Dissertation). Université Blaise-Pascale, Clermont-Ferrand II. Retrieved from http://www.theses.fr/2011CLF22184

Chicago Manual of Style (16th Edition):

Dubourg, Vincent. “Méta-modèles adaptatifs pour l'analyse de fiabilité et l'optimisation sous contrainte fiabiliste : Adaptive surrogate models for reliability analysis and reliability-based design optimization.” 2011. Doctoral Dissertation, Université Blaise-Pascale, Clermont-Ferrand II. Accessed September 20, 2019. http://www.theses.fr/2011CLF22184.

MLA Handbook (7th Edition):

Dubourg, Vincent. “Méta-modèles adaptatifs pour l'analyse de fiabilité et l'optimisation sous contrainte fiabiliste : Adaptive surrogate models for reliability analysis and reliability-based design optimization.” 2011. Web. 20 Sep 2019.

Vancouver:

Dubourg V. Méta-modèles adaptatifs pour l'analyse de fiabilité et l'optimisation sous contrainte fiabiliste : Adaptive surrogate models for reliability analysis and reliability-based design optimization. [Internet] [Doctoral dissertation]. Université Blaise-Pascale, Clermont-Ferrand II; 2011. [cited 2019 Sep 20]. Available from: http://www.theses.fr/2011CLF22184.

Council of Science Editors:

Dubourg V. Méta-modèles adaptatifs pour l'analyse de fiabilité et l'optimisation sous contrainte fiabiliste : Adaptive surrogate models for reliability analysis and reliability-based design optimization. [Doctoral Dissertation]. Université Blaise-Pascale, Clermont-Ferrand II; 2011. Available from: http://www.theses.fr/2011CLF22184

15. Mejia Sanchez, Luis. Reliability Information and Testing Integration for New Product Design.

Degree: Industrial Engineering, 2014, Arizona State University

 In the three phases of the engineering design process (conceptual design, embodiment design and detailed design), traditional reliability information is scarce. However, there are different… (more)

Subjects/Keywords: Industrial engineering; Design for reliability; Expert elicitation; Functional Bayesian networks; New product design; Parenting process; Robust design

…106 vii LIST OF TABLES Table Page 2.1 Sources of Information for Reliability in Design… …13 3.1 Enhanced Parenting Process for Reliability Assessment in Product Design Phase… …44 4.5 Methodology Framework to Gain Reliability Insight on Design Phase for a New… …defined as buildin-reliability (BIR) or design for reliability (DFR)… …basic concepts is provided. 2.1.1 Design, Reliability and Design for Reliability Design… 

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Mejia Sanchez, L. (2014). Reliability Information and Testing Integration for New Product Design. (Doctoral Dissertation). Arizona State University. Retrieved from http://repository.asu.edu/items/25799

Chicago Manual of Style (16th Edition):

Mejia Sanchez, Luis. “Reliability Information and Testing Integration for New Product Design.” 2014. Doctoral Dissertation, Arizona State University. Accessed September 20, 2019. http://repository.asu.edu/items/25799.

MLA Handbook (7th Edition):

Mejia Sanchez, Luis. “Reliability Information and Testing Integration for New Product Design.” 2014. Web. 20 Sep 2019.

Vancouver:

Mejia Sanchez L. Reliability Information and Testing Integration for New Product Design. [Internet] [Doctoral dissertation]. Arizona State University; 2014. [cited 2019 Sep 20]. Available from: http://repository.asu.edu/items/25799.

Council of Science Editors:

Mejia Sanchez L. Reliability Information and Testing Integration for New Product Design. [Doctoral Dissertation]. Arizona State University; 2014. Available from: http://repository.asu.edu/items/25799


University of Central Florida

16. Tang, Hongxia. Study Of Design For Reliability Of Rf And Analog Circuits.

Degree: 2012, University of Central Florida

 Due to continued device dimensions scaling, CMOS transistors in the nanometer regime have resulted in major reliability and variability challenges. Reliability issues such as channel… (more)

Subjects/Keywords: Design for reliability; radio frequency; process variability; adaptive biasing; power amplifier; injection locking; voltage controlled oscillator; Electrical and Computer Engineering; Electrical and Electronics; Engineering; Dissertations, Academic  – Engineering and Computer Science, Engineering and Computer Science  – Dissertations, Academic

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tang, H. (2012). Study Of Design For Reliability Of Rf And Analog Circuits. (Doctoral Dissertation). University of Central Florida. Retrieved from https://stars.library.ucf.edu/etd/2159

Chicago Manual of Style (16th Edition):

Tang, Hongxia. “Study Of Design For Reliability Of Rf And Analog Circuits.” 2012. Doctoral Dissertation, University of Central Florida. Accessed September 20, 2019. https://stars.library.ucf.edu/etd/2159.

MLA Handbook (7th Edition):

Tang, Hongxia. “Study Of Design For Reliability Of Rf And Analog Circuits.” 2012. Web. 20 Sep 2019.

Vancouver:

Tang H. Study Of Design For Reliability Of Rf And Analog Circuits. [Internet] [Doctoral dissertation]. University of Central Florida; 2012. [cited 2019 Sep 20]. Available from: https://stars.library.ucf.edu/etd/2159.

Council of Science Editors:

Tang H. Study Of Design For Reliability Of Rf And Analog Circuits. [Doctoral Dissertation]. University of Central Florida; 2012. Available from: https://stars.library.ucf.edu/etd/2159

17. Sreedhar, Aswin. Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques.

Degree: PhD, Electrical and Computer Engineering, 2011, U of Massachusetts : PhD

  Much of today's high performance computing engines and hand-held mobile devices are products of aggressive CMOS scaling. Technology scaling in semiconductor industry is mainly… (more)

Subjects/Keywords: Control Structures; Design for Manufacturability; Electromigration; Manufacturing Yield; Photolithography; Reliability; Electrical and Computer Engineering

…ABSTRACT MANAGING LITHOGRAPHIC VARIATIONS IN DESIGN, RELIABILITY & TEST USING STATISTICAL… …defects to name a few. Design for Manufacturability (DFM) methodologies came into… …error behavior and its impact on different design parameters may prove to be effective. For… …computationally practical for use in the design process. The work also provides a methodology to perform… …introduces the concept of Design for reliable manufacturability (DFRM) to consider viii… 

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Sreedhar, A. (2011). Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques. (Doctoral Dissertation). U of Massachusetts : PhD. Retrieved from https://scholarworks.umass.edu/open_access_dissertations/358

Chicago Manual of Style (16th Edition):

Sreedhar, Aswin. “Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques.” 2011. Doctoral Dissertation, U of Massachusetts : PhD. Accessed September 20, 2019. https://scholarworks.umass.edu/open_access_dissertations/358.

MLA Handbook (7th Edition):

Sreedhar, Aswin. “Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques.” 2011. Web. 20 Sep 2019.

Vancouver:

Sreedhar A. Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques. [Internet] [Doctoral dissertation]. U of Massachusetts : PhD; 2011. [cited 2019 Sep 20]. Available from: https://scholarworks.umass.edu/open_access_dissertations/358.

Council of Science Editors:

Sreedhar A. Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques. [Doctoral Dissertation]. U of Massachusetts : PhD; 2011. Available from: https://scholarworks.umass.edu/open_access_dissertations/358


Brno University of Technology

18. Darebník, Zdeněk. Rodinný dům s podnikatelskou činností .

Degree: 2014, Brno University of Technology

 Na základě předchozí studie, jedná se o vícefunkční objekt pro bydlení s ateliérem,konstrukční systém objektu je zděný z keramických tvárnic Porotherm, strop je řešen jako… (more)

Subjects/Keywords: Rodinný dům s obytným podkrovím; s ateliérem; garáž; pochůzná zelená střecha; konstrukční spolehlivost výstižnost architektonického ztvárnění pro venkovské objekty; Family house with attic; with the atelier; hairdressers; garage; accessible greenroof; structural reliability aptness architectural design for a rural property

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Darebník, Z. (2014). Rodinný dům s podnikatelskou činností . (Thesis). Brno University of Technology. Retrieved from http://hdl.handle.net/11012/34687

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Darebník, Zdeněk. “Rodinný dům s podnikatelskou činností .” 2014. Thesis, Brno University of Technology. Accessed September 20, 2019. http://hdl.handle.net/11012/34687.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Darebník, Zdeněk. “Rodinný dům s podnikatelskou činností .” 2014. Web. 20 Sep 2019.

Vancouver:

Darebník Z. Rodinný dům s podnikatelskou činností . [Internet] [Thesis]. Brno University of Technology; 2014. [cited 2019 Sep 20]. Available from: http://hdl.handle.net/11012/34687.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Darebník Z. Rodinný dům s podnikatelskou činností . [Thesis]. Brno University of Technology; 2014. Available from: http://hdl.handle.net/11012/34687

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Delft University of Technology

19. Haron, N.Z.B. Testability and Fault Tolerance for Emerging Nanoelectronic Memories.

Degree: 2012, Delft University of Technology

 Emerging nanoelectronic memories such as Resistive Random Access Memories (RRAMs) are possible candidates to replace the conventional memory technologies such as SRAMs, DRAMs and flash… (more)

Subjects/Keywords: resistive random access memories; memory defects; quality; reliability; defect-oriented test; memory testing; design-for-Testability; fault tolerance; error correction codes; double modular redundancy; interleaving

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APA (6th Edition):

Haron, N. Z. B. (2012). Testability and Fault Tolerance for Emerging Nanoelectronic Memories. (Doctoral Dissertation). Delft University of Technology. Retrieved from http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2

Chicago Manual of Style (16th Edition):

Haron, N Z B. “Testability and Fault Tolerance for Emerging Nanoelectronic Memories.” 2012. Doctoral Dissertation, Delft University of Technology. Accessed September 20, 2019. http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2.

MLA Handbook (7th Edition):

Haron, N Z B. “Testability and Fault Tolerance for Emerging Nanoelectronic Memories.” 2012. Web. 20 Sep 2019.

Vancouver:

Haron NZB. Testability and Fault Tolerance for Emerging Nanoelectronic Memories. [Internet] [Doctoral dissertation]. Delft University of Technology; 2012. [cited 2019 Sep 20]. Available from: http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2.

Council of Science Editors:

Haron NZB. Testability and Fault Tolerance for Emerging Nanoelectronic Memories. [Doctoral Dissertation]. Delft University of Technology; 2012. Available from: http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; urn:NBN:nl:ui:24-uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2 ; http://resolver.tudelft.nl/uuid:f1f08f26-416e-4f50-a518-e4aae5fb14d2

20. Mashrafi, Sheikh. X-ray microscope performance enhancement through control architecture change.

Degree: MS, 0133, 2014, University of Illinois – Urbana-Champaign

 The goal of this thesis is to apply control algorithms to improve the performance of nanopositioning devices used on the beamline in Advanced Photon Source… (more)

Subjects/Keywords: control; Control Architecture; Advanced Photon Source (APS); Argonne National Laboratory (ANL); control algorithms; nanopositioning; nanopositioning devices; Early User Instrument (EUI); X-ray; optics; robust stability; bandwidth; resolution; disturbance rejection; noise attenuation; scanning probe microscope (SPM); closed-loop properties; Proportional Integral Derivative (PID); Glover-McFarlane h-infinity algorithm; 1DOF h-infinity controller; h-infinity; Glover-McFarlane controller; Keith Glover; Duncan McFarlane; controller; controller implementation; National Instruments (NI); CompactRIO; real-time controller; Field-Programmable Gate Array (FPGA); LabVIEW; biquads structures; closed-loop bandwidth; U.S. Department of Energy (DOE); Office of Science; DE-AC02-06CH11357; DE-SC0004283; Cross Power Spectral Density (CPSD); Power Spectral Density (PSD); Degree Of Freedom (DOF); Discrete-Time Fourier Transform (DTFT); Hardware Description language (HDL); High-Level Synthesis (HLS); Hard X-ray Nanoprobe (HXN); In Situ Nanoprobe (ISN); Laser Doppler Displacement Meter (LDDM); Physik Instrumente (PI); Reconfigurable Input/Output (RIO); Advanced Photon Source (APS) beamline; full-field imaging microscopy; fluorescence mapping; nanodiffraction; transmission imaging; reliability and repeatability of positioning systems; modeling uncertainties; insensitive modeling uncertainties; quantifying trade-offs; trade-offs; design flexibility; design methodology; feedforward; feedback; performance objectives; robustness; Advanced Photon Source (APS) user; beamline scientist; imaging resolution and bandwidth; imaging resolution; nanoprobe; model fitting; curve fitting; model reduction; feedback controllers; X-ray nanoprobe instrument; third-generation synchrotron radiation source; zone plate optics; zone plate; flexure stages; piezoelectric actuators stacks; flexure; Piezoelectric; high-stiffness stages; high-resolution weak-link stages; piezoelectric-transducer; sub-nanometer resolution; subnanometer; optical heterodyning; heterodyning; Optodyne; frequency-shifted laser beam; PID controller; digital to analog converter (DAC); analog input modules; digital input modules; analog output modules; cRIO-9118; Virtex-5; Virtex-5 LX110 FPGA chassis; NI-9223; NI-9402; NI-9263; System Identification; Identification; black-box identification; parametric model; non-parametric model; welch; pwelch; tfestimate; invfreqs; time domain data; band-limited uniform Gaussian white noise; band-limited; white noise; resonant peak; Balance Realization; minimal realization; controllability; observability; Experimental Frequency response; transfer function; Hankel singular values; Hankel norm; balanced truncation; noise histogram; Open Loop Resolution; closed Loop Resolution; Simulink simulation; LabVIEW simulation; discrete controller; continuous controllers; discrete; Tustin; tustins method; discretization; complementary sensitivity transfer function; sensitivity transfer function; robust stabilization; coprime factorization; Bezout identity; Bezout; stability margin; algebraic Riccati equation; Riccati equation; sub-optimal; suboptimal; sub-optimal controller; optimal controller; mixed-sensitivity optimization; sensitivity optimization; generalized framework; generalized controller framework; stabilizing controller; closed-loop objectives; generalized plant; nominal plant; linear fractional transformation; weighting transfer functions; weighted sensitivity; hinfsyn; bode integral law; waterbed effect; second waterbed formula; Skogestad; Poslethwaite; sensitivity weighting; sensitivity weighting transfer function; nanopositioner; nanopositioning device; nanopositioning system; second order sections; ASPE 28th Annual Meeting; American Society for Precision Engineering (ASPE); Synchrotron Radiation Instrumentation; Synchrotron; Nanoprobe Instrument

…device design is based on the prototype for the hard X-ray nanoprobe (HXN) [6, 9… …instrument design and preliminary imaging studies. Now the EUI is used as a testbed for the work in… …exploits the control design tools developed for positioning systems in scanning probe microscopy… …systems. For instance, Glover-McFarlane control design [8, 12] has resulted in greater… …reliability and repeatability of positioning systems. In this design, an add-on controller block is… 

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Mashrafi, S. (2014). X-ray microscope performance enhancement through control architecture change. (Thesis). University of Illinois – Urbana-Champaign. Retrieved from http://hdl.handle.net/2142/46671

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Mashrafi, Sheikh. “X-ray microscope performance enhancement through control architecture change.” 2014. Thesis, University of Illinois – Urbana-Champaign. Accessed September 20, 2019. http://hdl.handle.net/2142/46671.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Mashrafi, Sheikh. “X-ray microscope performance enhancement through control architecture change.” 2014. Web. 20 Sep 2019.

Vancouver:

Mashrafi S. X-ray microscope performance enhancement through control architecture change. [Internet] [Thesis]. University of Illinois – Urbana-Champaign; 2014. [cited 2019 Sep 20]. Available from: http://hdl.handle.net/2142/46671.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Mashrafi S. X-ray microscope performance enhancement through control architecture change. [Thesis]. University of Illinois – Urbana-Champaign; 2014. Available from: http://hdl.handle.net/2142/46671

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

.