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1. Zimmermann, Jonathan Thomas. Frequency Constraints on D.C. Biasing in Deep Submicron Technologies.

Degree: MS, Electrical Engineering, 2015, Rochester Institute of Technology

The progression of technology has required smaller devices to achieve faster circuits and more power-efficient systems. However, with supply voltage and device intrinsic gain decreasing, device biasing in deep sub-micron technologies can be challenging. A low-voltage current source is analyzed in a 28 nm CMOS, 0.85 V supply, technology to take into account undesirable effects introduced by aggressively scaled technologies. The analysis includes intrinsic gain degradation as well as short-channel effects to create a more accurate design methodology. Amplifier design challenges in deep sub-micron technologies are discussed along with a DAC bias correction technique. Frequency dependence of output resistance for a simple and a proposed current source is presented. For the proposed current source the frequency dependence of output resistance was found to be dictated by the frequency response of the amplifier. To demonstrate the relevance of current source resistance bandwidth a common-mode logic circuit is considered, and fabrication plans are discussed along with future work. Advisors/Committee Members: P. R. Mukund, James Moon, Jing Zhang.

Subjects/Keywords: 28nm; Biasing; CML buffer; Current source; Frequency response; Submicron

…expressions. . . . . . . . . . . . . 26 CML buffer with representative current source… …27 3.7 CML buffer with split equivalent current source. . . . . . . . 28 4.1 Amplifier… …46 4.11 Comparison of simple and designed biasing on CML buffer CMRR. (tttt corner… …current source and the impact it has on key CML buffer properties. The second chapter provides… …performed and a CML buffer is used as a sample application of high-frequency biasing. The impact… 

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Zimmermann, J. T. (2015). Frequency Constraints on D.C. Biasing in Deep Submicron Technologies. (Masters Thesis). Rochester Institute of Technology. Retrieved from http://scholarworks.rit.edu/theses/8636

Chicago Manual of Style (16th Edition):

Zimmermann, Jonathan Thomas. “Frequency Constraints on D.C. Biasing in Deep Submicron Technologies.” 2015. Masters Thesis, Rochester Institute of Technology. Accessed November 22, 2017. http://scholarworks.rit.edu/theses/8636.

MLA Handbook (7th Edition):

Zimmermann, Jonathan Thomas. “Frequency Constraints on D.C. Biasing in Deep Submicron Technologies.” 2015. Web. 22 Nov 2017.

Vancouver:

Zimmermann JT. Frequency Constraints on D.C. Biasing in Deep Submicron Technologies. [Internet] [Masters thesis]. Rochester Institute of Technology; 2015. [cited 2017 Nov 22]. Available from: http://scholarworks.rit.edu/theses/8636.

Council of Science Editors:

Zimmermann JT. Frequency Constraints on D.C. Biasing in Deep Submicron Technologies. [Masters Thesis]. Rochester Institute of Technology; 2015. Available from: http://scholarworks.rit.edu/theses/8636

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