Advanced search options

Advanced Search Options 🞨

Browse by author name (“Author name starts with…”).

Find ETDs with:

in
/  
in
/  
in
/  
in

Written in Published in Earliest date Latest date

Sorted by

Results per page:

Sorted by: relevance · author · university · dateNew search

You searched for subject:(Breakdown Electricity ). Showing records 1 – 19 of 19 total matches.

Search Limiters

Last 2 Years | English Only

No search limiters apply to these results.

▼ Search Limiters


McGill University

1. Rudinskas, Victor Edwin. A statistical investigation of electric breakdown in askarel.

Degree: M. Eng., Department of Electrical Engineering, 1977, McGill University

Subjects/Keywords: Breakdown (Electricity)

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Rudinskas, V. E. (1977). A statistical investigation of electric breakdown in askarel. (Masters Thesis). McGill University. Retrieved from http://digitool.library.mcgill.ca/thesisfile54634.pdf

Chicago Manual of Style (16th Edition):

Rudinskas, Victor Edwin. “A statistical investigation of electric breakdown in askarel.” 1977. Masters Thesis, McGill University. Accessed May 20, 2019. http://digitool.library.mcgill.ca/thesisfile54634.pdf.

MLA Handbook (7th Edition):

Rudinskas, Victor Edwin. “A statistical investigation of electric breakdown in askarel.” 1977. Web. 20 May 2019.

Vancouver:

Rudinskas VE. A statistical investigation of electric breakdown in askarel. [Internet] [Masters thesis]. McGill University; 1977. [cited 2019 May 20]. Available from: http://digitool.library.mcgill.ca/thesisfile54634.pdf.

Council of Science Editors:

Rudinskas VE. A statistical investigation of electric breakdown in askarel. [Masters Thesis]. McGill University; 1977. Available from: http://digitool.library.mcgill.ca/thesisfile54634.pdf


University of Arizona

2. Britt, Edward Joseph, 1941-. ELECTRICAL CONDUCTIVITY AND DIELECTRIC BREAKDOWN PHENOMENA IN METAL OXIDEINSULATORS .

Degree: 1971, University of Arizona

Subjects/Keywords: Breakdown (Electricity)

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Britt, Edward Joseph, 1. (1971). ELECTRICAL CONDUCTIVITY AND DIELECTRIC BREAKDOWN PHENOMENA IN METAL OXIDEINSULATORS . (Doctoral Dissertation). University of Arizona. Retrieved from http://hdl.handle.net/10150/287763

Chicago Manual of Style (16th Edition):

Britt, Edward Joseph, 1941-. “ELECTRICAL CONDUCTIVITY AND DIELECTRIC BREAKDOWN PHENOMENA IN METAL OXIDEINSULATORS .” 1971. Doctoral Dissertation, University of Arizona. Accessed May 20, 2019. http://hdl.handle.net/10150/287763.

MLA Handbook (7th Edition):

Britt, Edward Joseph, 1941-. “ELECTRICAL CONDUCTIVITY AND DIELECTRIC BREAKDOWN PHENOMENA IN METAL OXIDEINSULATORS .” 1971. Web. 20 May 2019.

Vancouver:

Britt, Edward Joseph 1. ELECTRICAL CONDUCTIVITY AND DIELECTRIC BREAKDOWN PHENOMENA IN METAL OXIDEINSULATORS . [Internet] [Doctoral dissertation]. University of Arizona; 1971. [cited 2019 May 20]. Available from: http://hdl.handle.net/10150/287763.

Council of Science Editors:

Britt, Edward Joseph 1. ELECTRICAL CONDUCTIVITY AND DIELECTRIC BREAKDOWN PHENOMENA IN METAL OXIDEINSULATORS . [Doctoral Dissertation]. University of Arizona; 1971. Available from: http://hdl.handle.net/10150/287763


Columbia University

3. Misra, Mayank. Molecular Modeling for Rational Design of Polymer Dielectrics.

Degree: 2017, Columbia University

 The state-of-the-art in high voltage and high energy density capacitors is dominated by biaxially oriented polypropylene (BOPP), a linear dielectric with electronic polarizability but low… (more)

Subjects/Keywords: Chemical engineering; Dielectrics; Breakdown (Electricity); Polymers

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Misra, M. (2017). Molecular Modeling for Rational Design of Polymer Dielectrics. (Doctoral Dissertation). Columbia University. Retrieved from https://doi.org/10.7916/D86M3DSH

Chicago Manual of Style (16th Edition):

Misra, Mayank. “Molecular Modeling for Rational Design of Polymer Dielectrics.” 2017. Doctoral Dissertation, Columbia University. Accessed May 20, 2019. https://doi.org/10.7916/D86M3DSH.

MLA Handbook (7th Edition):

Misra, Mayank. “Molecular Modeling for Rational Design of Polymer Dielectrics.” 2017. Web. 20 May 2019.

Vancouver:

Misra M. Molecular Modeling for Rational Design of Polymer Dielectrics. [Internet] [Doctoral dissertation]. Columbia University; 2017. [cited 2019 May 20]. Available from: https://doi.org/10.7916/D86M3DSH.

Council of Science Editors:

Misra M. Molecular Modeling for Rational Design of Polymer Dielectrics. [Doctoral Dissertation]. Columbia University; 2017. Available from: https://doi.org/10.7916/D86M3DSH


Hong Kong University of Science and Technology

4. Cheung, Chi Wai. Application of fracture mechanics to dielectric breakdown in air, silicone oil and silicone rubber.

Degree: 2009, Hong Kong University of Science and Technology

 Fracture Mechanics have been well developed to predict the fracture of materials with crack or any feature where stress concentration exists. On the other hand,… (more)

Subjects/Keywords: Fracture mechanics; Breakdown (Electricity); Composite materials  – Fracture; Silicone rubber  – Fracture

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Cheung, C. W. (2009). Application of fracture mechanics to dielectric breakdown in air, silicone oil and silicone rubber. (Thesis). Hong Kong University of Science and Technology. Retrieved from https://doi.org/10.14711/thesis-b1041122 ; http://repository.ust.hk/ir/bitstream/1783.1-5980/1/th_redirect.html

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Cheung, Chi Wai. “Application of fracture mechanics to dielectric breakdown in air, silicone oil and silicone rubber.” 2009. Thesis, Hong Kong University of Science and Technology. Accessed May 20, 2019. https://doi.org/10.14711/thesis-b1041122 ; http://repository.ust.hk/ir/bitstream/1783.1-5980/1/th_redirect.html.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Cheung, Chi Wai. “Application of fracture mechanics to dielectric breakdown in air, silicone oil and silicone rubber.” 2009. Web. 20 May 2019.

Vancouver:

Cheung CW. Application of fracture mechanics to dielectric breakdown in air, silicone oil and silicone rubber. [Internet] [Thesis]. Hong Kong University of Science and Technology; 2009. [cited 2019 May 20]. Available from: https://doi.org/10.14711/thesis-b1041122 ; http://repository.ust.hk/ir/bitstream/1783.1-5980/1/th_redirect.html.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Cheung CW. Application of fracture mechanics to dielectric breakdown in air, silicone oil and silicone rubber. [Thesis]. Hong Kong University of Science and Technology; 2009. Available from: https://doi.org/10.14711/thesis-b1041122 ; http://repository.ust.hk/ir/bitstream/1783.1-5980/1/th_redirect.html

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Missouri – Columbia

5. Yeckel, Christopher. Experimental and Simulation Analysis of the Jitter Response of a Single-Shot Oil Switch with a High-K Particle Suspension.

Degree: 2012, University of Missouri – Columbia

 This dissertation investigates an oil switching system to address and reduce the jitter observed in the breakdown electric field strength of a pressurized, oil dielectric.… (more)

Subjects/Keywords: Liquid dielectrics; Breakdown (Electricity); Electric insulators and insulation  – Oils  – Testing

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Yeckel, C. (2012). Experimental and Simulation Analysis of the Jitter Response of a Single-Shot Oil Switch with a High-K Particle Suspension. (Thesis). University of Missouri – Columbia. Retrieved from http://hdl.handle.net/10355/46131

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Yeckel, Christopher. “Experimental and Simulation Analysis of the Jitter Response of a Single-Shot Oil Switch with a High-K Particle Suspension.” 2012. Thesis, University of Missouri – Columbia. Accessed May 20, 2019. http://hdl.handle.net/10355/46131.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Yeckel, Christopher. “Experimental and Simulation Analysis of the Jitter Response of a Single-Shot Oil Switch with a High-K Particle Suspension.” 2012. Web. 20 May 2019.

Vancouver:

Yeckel C. Experimental and Simulation Analysis of the Jitter Response of a Single-Shot Oil Switch with a High-K Particle Suspension. [Internet] [Thesis]. University of Missouri – Columbia; 2012. [cited 2019 May 20]. Available from: http://hdl.handle.net/10355/46131.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Yeckel C. Experimental and Simulation Analysis of the Jitter Response of a Single-Shot Oil Switch with a High-K Particle Suspension. [Thesis]. University of Missouri – Columbia; 2012. Available from: http://hdl.handle.net/10355/46131

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Arizona

6. Tan, Leong Hin, 1957-. Two-dimensional device simulation of junction termination structures for determination of breakdown behavior .

Degree: 1989, University of Arizona

 In this work, we have investigated numerical techniques to determine the breakdown behavior of complex semiconductor devices using two-dimensional simulation. In particular, we have augmented… (more)

Subjects/Keywords: Breakdown (Electricity); Semiconductors  – Computer simulation.

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tan, Leong Hin, 1. (1989). Two-dimensional device simulation of junction termination structures for determination of breakdown behavior . (Masters Thesis). University of Arizona. Retrieved from http://hdl.handle.net/10150/277067

Chicago Manual of Style (16th Edition):

Tan, Leong Hin, 1957-. “Two-dimensional device simulation of junction termination structures for determination of breakdown behavior .” 1989. Masters Thesis, University of Arizona. Accessed May 20, 2019. http://hdl.handle.net/10150/277067.

MLA Handbook (7th Edition):

Tan, Leong Hin, 1957-. “Two-dimensional device simulation of junction termination structures for determination of breakdown behavior .” 1989. Web. 20 May 2019.

Vancouver:

Tan, Leong Hin 1. Two-dimensional device simulation of junction termination structures for determination of breakdown behavior . [Internet] [Masters thesis]. University of Arizona; 1989. [cited 2019 May 20]. Available from: http://hdl.handle.net/10150/277067.

Council of Science Editors:

Tan, Leong Hin 1. Two-dimensional device simulation of junction termination structures for determination of breakdown behavior . [Masters Thesis]. University of Arizona; 1989. Available from: http://hdl.handle.net/10150/277067


McGill University

7. Anis, Hussein Ibrahim. A probabilistic study of insulation breakdown under switching surges.

Degree: PhD, Department of Electrical Engineering, 1972, McGill University

Subjects/Keywords: Electric insulators and insulation; Transients (Electricity); Breakdown (Electricity)

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Anis, H. I. (1972). A probabilistic study of insulation breakdown under switching surges. (Doctoral Dissertation). McGill University. Retrieved from http://digitool.library.mcgill.ca/thesisfile70792.pdf

Chicago Manual of Style (16th Edition):

Anis, Hussein Ibrahim. “A probabilistic study of insulation breakdown under switching surges.” 1972. Doctoral Dissertation, McGill University. Accessed May 20, 2019. http://digitool.library.mcgill.ca/thesisfile70792.pdf.

MLA Handbook (7th Edition):

Anis, Hussein Ibrahim. “A probabilistic study of insulation breakdown under switching surges.” 1972. Web. 20 May 2019.

Vancouver:

Anis HI. A probabilistic study of insulation breakdown under switching surges. [Internet] [Doctoral dissertation]. McGill University; 1972. [cited 2019 May 20]. Available from: http://digitool.library.mcgill.ca/thesisfile70792.pdf.

Council of Science Editors:

Anis HI. A probabilistic study of insulation breakdown under switching surges. [Doctoral Dissertation]. McGill University; 1972. Available from: http://digitool.library.mcgill.ca/thesisfile70792.pdf


Virginia Tech

8. Hamby, David William. Breakdown characteristics of nonuniform electric fields in crossflows.

Degree: MS, Mechanical Engineering, 1993, Virginia Tech

  An experimental evaluation of the breakdown characteristics of the nonunifonn electric fields established between two spheres and between two points in a crossflow was… (more)

Subjects/Keywords: Breakdown (Electricity); LD5655.V855 1993.H362

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Hamby, D. W. (1993). Breakdown characteristics of nonuniform electric fields in crossflows. (Masters Thesis). Virginia Tech. Retrieved from http://hdl.handle.net/10919/46298

Chicago Manual of Style (16th Edition):

Hamby, David William. “Breakdown characteristics of nonuniform electric fields in crossflows.” 1993. Masters Thesis, Virginia Tech. Accessed May 20, 2019. http://hdl.handle.net/10919/46298.

MLA Handbook (7th Edition):

Hamby, David William. “Breakdown characteristics of nonuniform electric fields in crossflows.” 1993. Web. 20 May 2019.

Vancouver:

Hamby DW. Breakdown characteristics of nonuniform electric fields in crossflows. [Internet] [Masters thesis]. Virginia Tech; 1993. [cited 2019 May 20]. Available from: http://hdl.handle.net/10919/46298.

Council of Science Editors:

Hamby DW. Breakdown characteristics of nonuniform electric fields in crossflows. [Masters Thesis]. Virginia Tech; 1993. Available from: http://hdl.handle.net/10919/46298


University of New Mexico

9. Carbajal, Armida J. Airborne particulate contamination effect on high voltage breakdowns during tube conditioning.

Degree: Mathematics & Statistics, 2010, University of New Mexico

 In this research we examine high voltage breakdowns (HVBs) during neutron tube conditioning which has been a problem for decades. In the recent past there… (more)

Subjects/Keywords: Neutron sources; Contamination (Technology); Breakdown (Electricity); Air – Pollution – Measurement – Instruments; Air quality monitoring stations

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Carbajal, A. J. (2010). Airborne particulate contamination effect on high voltage breakdowns during tube conditioning. (Masters Thesis). University of New Mexico. Retrieved from http://hdl.handle.net/1928/10806

Chicago Manual of Style (16th Edition):

Carbajal, Armida J. “Airborne particulate contamination effect on high voltage breakdowns during tube conditioning.” 2010. Masters Thesis, University of New Mexico. Accessed May 20, 2019. http://hdl.handle.net/1928/10806.

MLA Handbook (7th Edition):

Carbajal, Armida J. “Airborne particulate contamination effect on high voltage breakdowns during tube conditioning.” 2010. Web. 20 May 2019.

Vancouver:

Carbajal AJ. Airborne particulate contamination effect on high voltage breakdowns during tube conditioning. [Internet] [Masters thesis]. University of New Mexico; 2010. [cited 2019 May 20]. Available from: http://hdl.handle.net/1928/10806.

Council of Science Editors:

Carbajal AJ. Airborne particulate contamination effect on high voltage breakdowns during tube conditioning. [Masters Thesis]. University of New Mexico; 2010. Available from: http://hdl.handle.net/1928/10806


McGill University

10. Bulcke, Julien Joseph Gustave. Breakdown of liquid dielectrics.

Degree: M. Eng., Department of Electrical Engineering, 1972, McGill University

Subjects/Keywords: Breakdown (Electricity); Electric insulators and insulation; Engineering, General.

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Bulcke, J. J. G. (1972). Breakdown of liquid dielectrics. (Masters Thesis). McGill University. Retrieved from http://digitool.library.mcgill.ca/thesisfile45837.pdf

Chicago Manual of Style (16th Edition):

Bulcke, Julien Joseph Gustave. “Breakdown of liquid dielectrics.” 1972. Masters Thesis, McGill University. Accessed May 20, 2019. http://digitool.library.mcgill.ca/thesisfile45837.pdf.

MLA Handbook (7th Edition):

Bulcke, Julien Joseph Gustave. “Breakdown of liquid dielectrics.” 1972. Web. 20 May 2019.

Vancouver:

Bulcke JJG. Breakdown of liquid dielectrics. [Internet] [Masters thesis]. McGill University; 1972. [cited 2019 May 20]. Available from: http://digitool.library.mcgill.ca/thesisfile45837.pdf.

Council of Science Editors:

Bulcke JJG. Breakdown of liquid dielectrics. [Masters Thesis]. McGill University; 1972. Available from: http://digitool.library.mcgill.ca/thesisfile45837.pdf


Virginia Tech

11. Saed, Mohammed Ali. Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC).

Degree: PhD, Electrical Engineering, 1987, Virginia Tech

Subjects/Keywords: LD5655.V856 1987.S234; Breakdown (Electricity); Dielectric measurements

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Saed, M. A. (1987). Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC). (Doctoral Dissertation). Virginia Tech. Retrieved from http://hdl.handle.net/10919/52317

Chicago Manual of Style (16th Edition):

Saed, Mohammed Ali. “Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC).” 1987. Doctoral Dissertation, Virginia Tech. Accessed May 20, 2019. http://hdl.handle.net/10919/52317.

MLA Handbook (7th Edition):

Saed, Mohammed Ali. “Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC).” 1987. Web. 20 May 2019.

Vancouver:

Saed MA. Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC). [Internet] [Doctoral dissertation]. Virginia Tech; 1987. [cited 2019 May 20]. Available from: http://hdl.handle.net/10919/52317.

Council of Science Editors:

Saed MA. Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC). [Doctoral Dissertation]. Virginia Tech; 1987. Available from: http://hdl.handle.net/10919/52317


University of New Mexico

12. Castro, Palmarin, Jr. Studies of dielectric breakdown under pulsed power conditions.

Degree: Electrical and Computer Engineering, 2010, University of New Mexico

 In an effort to develop transmission lines with higher energy storage capabilities for compact pulsed power applications, the electrical breakdown strength (BDS) of ceramic dielectrics,… (more)

Subjects/Keywords: Breakdown (Electricity); Pulsed power systems; Titanium dioxide – Electric properties; Ceramic-matrix composites – Electric properties; Electric insulators and insulation – Epoxy resins

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Castro, Palmarin, J. (2010). Studies of dielectric breakdown under pulsed power conditions. (Masters Thesis). University of New Mexico. Retrieved from http://hdl.handle.net/1928/10807

Chicago Manual of Style (16th Edition):

Castro, Palmarin, Jr. “Studies of dielectric breakdown under pulsed power conditions.” 2010. Masters Thesis, University of New Mexico. Accessed May 20, 2019. http://hdl.handle.net/1928/10807.

MLA Handbook (7th Edition):

Castro, Palmarin, Jr. “Studies of dielectric breakdown under pulsed power conditions.” 2010. Web. 20 May 2019.

Vancouver:

Castro, Palmarin J. Studies of dielectric breakdown under pulsed power conditions. [Internet] [Masters thesis]. University of New Mexico; 2010. [cited 2019 May 20]. Available from: http://hdl.handle.net/1928/10807.

Council of Science Editors:

Castro, Palmarin J. Studies of dielectric breakdown under pulsed power conditions. [Masters Thesis]. University of New Mexico; 2010. Available from: http://hdl.handle.net/1928/10807


MIT

13. Bart, Stephen F. The mechanism of electrosurgical coagulation : steam evolution versus dielectric breakdown .

Degree: Electrical Engineering and Computer Science, 1982, MIT

Subjects/Keywords: Electrical Engineering and Computer Science.; Cell membranes; Electrosurgery; Electrocoagulation; Breakdown (Electricity); Body fluids

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Bart, S. F. (1982). The mechanism of electrosurgical coagulation : steam evolution versus dielectric breakdown . (Thesis). MIT. Retrieved from http://hdl.handle.net/1721.1/17173

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Bart, Stephen F. “The mechanism of electrosurgical coagulation : steam evolution versus dielectric breakdown .” 1982. Thesis, MIT. Accessed May 20, 2019. http://hdl.handle.net/1721.1/17173.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Bart, Stephen F. “The mechanism of electrosurgical coagulation : steam evolution versus dielectric breakdown .” 1982. Web. 20 May 2019.

Vancouver:

Bart SF. The mechanism of electrosurgical coagulation : steam evolution versus dielectric breakdown . [Internet] [Thesis]. MIT; 1982. [cited 2019 May 20]. Available from: http://hdl.handle.net/1721.1/17173.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Bart SF. The mechanism of electrosurgical coagulation : steam evolution versus dielectric breakdown . [Thesis]. MIT; 1982. Available from: http://hdl.handle.net/1721.1/17173

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Indian Institute of Science

14. Thomas, Benny. Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films.

Degree: 1997, Indian Institute of Science

Subjects/Keywords: Electric Insulators And Insulation; Polypropylene Films; Electric Discharges; Breakdown (Electricity); Partial Discharge; Electrical Engineering

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Thomas, B. (1997). Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films. (Thesis). Indian Institute of Science. Retrieved from http://hdl.handle.net/2005/1822

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Thomas, Benny. “Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films.” 1997. Thesis, Indian Institute of Science. Accessed May 20, 2019. http://hdl.handle.net/2005/1822.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Thomas, Benny. “Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films.” 1997. Web. 20 May 2019.

Vancouver:

Thomas B. Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films. [Internet] [Thesis]. Indian Institute of Science; 1997. [cited 2019 May 20]. Available from: http://hdl.handle.net/2005/1822.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Thomas B. Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films. [Thesis]. Indian Institute of Science; 1997. Available from: http://hdl.handle.net/2005/1822

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Indian Institute of Science

15. Thomas, Benny. Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films.

Degree: 1997, Indian Institute of Science

Subjects/Keywords: Electric Insulators And Insulation; Polypropylene Films; Electric Discharges; Breakdown (Electricity); Partial Discharge; Electrical Engineering

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Thomas, B. (1997). Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films. (Thesis). Indian Institute of Science. Retrieved from http://etd.iisc.ernet.in/handle/2005/1822 ; http://etd.ncsi.iisc.ernet.in/abstracts/2359/G14782-Abs.pdf

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Thomas, Benny. “Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films.” 1997. Thesis, Indian Institute of Science. Accessed May 20, 2019. http://etd.iisc.ernet.in/handle/2005/1822 ; http://etd.ncsi.iisc.ernet.in/abstracts/2359/G14782-Abs.pdf.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Thomas, Benny. “Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films.” 1997. Web. 20 May 2019.

Vancouver:

Thomas B. Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films. [Internet] [Thesis]. Indian Institute of Science; 1997. [cited 2019 May 20]. Available from: http://etd.iisc.ernet.in/handle/2005/1822 ; http://etd.ncsi.iisc.ernet.in/abstracts/2359/G14782-Abs.pdf.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Thomas B. Investigations Into Internal Partial Discharge Ageing And Breakdown Of Thin Polypropylene Films. [Thesis]. Indian Institute of Science; 1997. Available from: http://etd.iisc.ernet.in/handle/2005/1822 ; http://etd.ncsi.iisc.ernet.in/abstracts/2359/G14782-Abs.pdf

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Université Catholique de Louvain

16. Snaps, Tanguy. Conception et réalisation d'un banc de tests pour micro-onduleurs sur un simulateur temps réel.

Degree: 2017, Université Catholique de Louvain

La transition énergétique, sûrement l'un des plus grands défis de ce siècle, a permis de voir se développer de nouvelles sources d'énergie. L'une des plus… (more)

Subjects/Keywords: Onduleur; Inverter; Micro-onduleur; Micro-inverter; Test; Simulateur; Simulator; Temps réel; Real time; Banc d'essai; Testing bench; Laborelec; Engie; Engie-Lab; Harmonique; Harmonic; Tests en temps réel; Défaillance réseau; Electricity network breakdown; Emulateur; Emulateur réseau; Electrical grid emulator; Emulateur panneaux photovoltaïques; Solar panels emulator

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Snaps, T. (2017). Conception et réalisation d'un banc de tests pour micro-onduleurs sur un simulateur temps réel. (Thesis). Université Catholique de Louvain. Retrieved from http://hdl.handle.net/2078.1/thesis:10613

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Snaps, Tanguy. “Conception et réalisation d'un banc de tests pour micro-onduleurs sur un simulateur temps réel.” 2017. Thesis, Université Catholique de Louvain. Accessed May 20, 2019. http://hdl.handle.net/2078.1/thesis:10613.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Snaps, Tanguy. “Conception et réalisation d'un banc de tests pour micro-onduleurs sur un simulateur temps réel.” 2017. Web. 20 May 2019.

Vancouver:

Snaps T. Conception et réalisation d'un banc de tests pour micro-onduleurs sur un simulateur temps réel. [Internet] [Thesis]. Université Catholique de Louvain; 2017. [cited 2019 May 20]. Available from: http://hdl.handle.net/2078.1/thesis:10613.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Snaps T. Conception et réalisation d'un banc de tests pour micro-onduleurs sur un simulateur temps réel. [Thesis]. Université Catholique de Louvain; 2017. Available from: http://hdl.handle.net/2078.1/thesis:10613

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Texas – Austin

17. Kim, Young-Hee. Interface engineering and reliability characteristics of HfO₂ with poly Si gate and dual metal (Ru-Ta alloy, Ru) gate electrode for beyond 65nm technology.

Degree: Electrical and Computer Engineering, 2004, University of Texas – Austin

 Chip density and performance improvements have been driven by aggressive scaling of semiconductor devices. In both logic and memory applications, SiO2 gate dielectrics has reached… (more)

Subjects/Keywords: Dielectrics; Hafnium oxide; Electrodes; Breakdown (Electricity); Interfaces (Physical sciences); Tantalum alloys; Ruthenium compounds; Silicon oxide

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Kim, Y. (2004). Interface engineering and reliability characteristics of HfO₂ with poly Si gate and dual metal (Ru-Ta alloy, Ru) gate electrode for beyond 65nm technology. (Thesis). University of Texas – Austin. Retrieved from http://hdl.handle.net/2152/2044

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Kim, Young-Hee. “Interface engineering and reliability characteristics of HfO₂ with poly Si gate and dual metal (Ru-Ta alloy, Ru) gate electrode for beyond 65nm technology.” 2004. Thesis, University of Texas – Austin. Accessed May 20, 2019. http://hdl.handle.net/2152/2044.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Kim, Young-Hee. “Interface engineering and reliability characteristics of HfO₂ with poly Si gate and dual metal (Ru-Ta alloy, Ru) gate electrode for beyond 65nm technology.” 2004. Web. 20 May 2019.

Vancouver:

Kim Y. Interface engineering and reliability characteristics of HfO₂ with poly Si gate and dual metal (Ru-Ta alloy, Ru) gate electrode for beyond 65nm technology. [Internet] [Thesis]. University of Texas – Austin; 2004. [cited 2019 May 20]. Available from: http://hdl.handle.net/2152/2044.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Kim Y. Interface engineering and reliability characteristics of HfO₂ with poly Si gate and dual metal (Ru-Ta alloy, Ru) gate electrode for beyond 65nm technology. [Thesis]. University of Texas – Austin; 2004. Available from: http://hdl.handle.net/2152/2044

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Georgia Tech

18. Tirino, Louis. Transport Properties of Wide Band Gap Semiconductors.

Degree: PhD, Electrical and Computer Engineering, 2004, Georgia Tech

 Transport Properties of Wide Band Gap Semiconductors Louis Tirino III 155 pages Directed by Dr. Kevin F. Brennan The objective of this research has been… (more)

Subjects/Keywords: Wide band gap semiconductors; Monte Carlo; Transport properties; Impact ionization; Avalanche photodiode; Termperature-dependent electrical transport; Breakdown (Electricity); Wide gap semiconductors Transport properties

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tirino, L. (2004). Transport Properties of Wide Band Gap Semiconductors. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/5210

Chicago Manual of Style (16th Edition):

Tirino, Louis. “Transport Properties of Wide Band Gap Semiconductors.” 2004. Doctoral Dissertation, Georgia Tech. Accessed May 20, 2019. http://hdl.handle.net/1853/5210.

MLA Handbook (7th Edition):

Tirino, Louis. “Transport Properties of Wide Band Gap Semiconductors.” 2004. Web. 20 May 2019.

Vancouver:

Tirino L. Transport Properties of Wide Band Gap Semiconductors. [Internet] [Doctoral dissertation]. Georgia Tech; 2004. [cited 2019 May 20]. Available from: http://hdl.handle.net/1853/5210.

Council of Science Editors:

Tirino L. Transport Properties of Wide Band Gap Semiconductors. [Doctoral Dissertation]. Georgia Tech; 2004. Available from: http://hdl.handle.net/1853/5210

19. Bashir, Muhammad Muqarrab. Modeling reliability in copper/low-k interconnects and variability in cmos.

Degree: PhD, Electrical and Computer Engineering, 2011, Georgia Tech

 The impact of physical design characteristics on backend dielectric reliability was modeled. The impact of different interconnect geometries on backend low-k time dependent dielectric breakdown(more)

Subjects/Keywords: Weibull; Copper interconnects; Low-k TDDB; Dielectric breakdown; Interconnect reliability; Low-k dielectrics; CMOS variation; Systematic variation; Random variation; With-die variation; System reliability; Chip reliability; Weibull distribution; Breakdown (Electricity); Integrated circuits

…Frequent interconnect geometries in ISCAS benchmark circuits and breakdown sites… …Tantalum Nitride TDDB Time-Dependent Dielectric Breakdown TEM Transmission Electron… …on backend dielectric reliability. Backend dielectric breakdown is a concern for a number… …to backend dielectric breakdown. The impact of these physical design parameters on backend… …low-k time-dependent dielectric breakdown will be modeled. The insights gathered from this… 

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Bashir, M. M. (2011). Modeling reliability in copper/low-k interconnects and variability in cmos. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/41092

Chicago Manual of Style (16th Edition):

Bashir, Muhammad Muqarrab. “Modeling reliability in copper/low-k interconnects and variability in cmos.” 2011. Doctoral Dissertation, Georgia Tech. Accessed May 20, 2019. http://hdl.handle.net/1853/41092.

MLA Handbook (7th Edition):

Bashir, Muhammad Muqarrab. “Modeling reliability in copper/low-k interconnects and variability in cmos.” 2011. Web. 20 May 2019.

Vancouver:

Bashir MM. Modeling reliability in copper/low-k interconnects and variability in cmos. [Internet] [Doctoral dissertation]. Georgia Tech; 2011. [cited 2019 May 20]. Available from: http://hdl.handle.net/1853/41092.

Council of Science Editors:

Bashir MM. Modeling reliability in copper/low-k interconnects and variability in cmos. [Doctoral Dissertation]. Georgia Tech; 2011. Available from: http://hdl.handle.net/1853/41092

.