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You searched for subject:(BioMEMS AFM AFP Aspirating Force Probe Nanofluidics). Showing records 1 – 30 of 7629 total matches.

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1. Schoenwald, David Kipp. Microfabrication of a high sensitivity fluidic AFM probe.

Degree: PhD, Mechanical Engineering, 2015, Georgia Tech

 This dissertation presents significant advancements in AFM probe fabrication technologies toward an AFM based assay that combines a spectrum of AFM capabilities into a comprehensive… (more)

Subjects/Keywords: BioMEMS AFM AFP Aspirating Force Probe Nanofluidics

…133 Figure 5-3 Spermatozoa Assay 134 xii NOMENCLATURE AFP aspirating force probe AFM… …AFP) introduces the additional capacity to measure mass. An aspirating force probe… …AFP Probe Mounted to AFM System Chuck 96 Figure 3-20 Two Pressure Systems Evaluated for… …retraction of the probe, employing the aspirating capability of the probe to impose a tensile force… …of the described system. Figure 1-3 Multimodal Analysis: An aspirating force probe (… 

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APA (6th Edition):

Schoenwald, D. K. (2015). Microfabrication of a high sensitivity fluidic AFM probe. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/56210

Chicago Manual of Style (16th Edition):

Schoenwald, David Kipp. “Microfabrication of a high sensitivity fluidic AFM probe.” 2015. Doctoral Dissertation, Georgia Tech. Accessed June 15, 2019. http://hdl.handle.net/1853/56210.

MLA Handbook (7th Edition):

Schoenwald, David Kipp. “Microfabrication of a high sensitivity fluidic AFM probe.” 2015. Web. 15 Jun 2019.

Vancouver:

Schoenwald DK. Microfabrication of a high sensitivity fluidic AFM probe. [Internet] [Doctoral dissertation]. Georgia Tech; 2015. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/1853/56210.

Council of Science Editors:

Schoenwald DK. Microfabrication of a high sensitivity fluidic AFM probe. [Doctoral Dissertation]. Georgia Tech; 2015. Available from: http://hdl.handle.net/1853/56210


IUPUI

2. Karingula, Varun Kumar. MANUFACTURING PROCESS OF NANOFLUIDICS USING AFM PROBE.

Degree: 2015, IUPUI

Indiana University-Purdue University Indianapolis (IUPUI)

A new process for fabricating a nano fluidic device that can be used in medical application is developed and demonstrated.… (more)

Subjects/Keywords: Nanofluidics; nano fabrication; Atomic Force Microscopy (AFM); micro fabrication; photolithography; pdms bonding

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APA (6th Edition):

Karingula, V. K. (2015). MANUFACTURING PROCESS OF NANOFLUIDICS USING AFM PROBE. (Thesis). IUPUI. Retrieved from http://hdl.handle.net/1805/7917

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Karingula, Varun Kumar. “MANUFACTURING PROCESS OF NANOFLUIDICS USING AFM PROBE.” 2015. Thesis, IUPUI. Accessed June 15, 2019. http://hdl.handle.net/1805/7917.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Karingula, Varun Kumar. “MANUFACTURING PROCESS OF NANOFLUIDICS USING AFM PROBE.” 2015. Web. 15 Jun 2019.

Vancouver:

Karingula VK. MANUFACTURING PROCESS OF NANOFLUIDICS USING AFM PROBE. [Internet] [Thesis]. IUPUI; 2015. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/1805/7917.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Karingula VK. MANUFACTURING PROCESS OF NANOFLUIDICS USING AFM PROBE. [Thesis]. IUPUI; 2015. Available from: http://hdl.handle.net/1805/7917

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Universidade Nova

3. Calmeiro, Tomás R. Atomic force microscopy assisted with electron and ion beam microscopy for the direct measurement of biostructures and DNA samples.

Degree: 2013, Universidade Nova

Dissertation to obtain a Master degree in Biotechnology

Studies of atomic force microscopy (AFM), a technique commonly associated with material sciences, in the field of… (more)

Subjects/Keywords: Atomic force microscopy; AFM; Bionanotechnology; DNA-protein interaction; AFM probe modifications; Focused ion beam

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APA (6th Edition):

Calmeiro, T. R. (2013). Atomic force microscopy assisted with electron and ion beam microscopy for the direct measurement of biostructures and DNA samples. (Thesis). Universidade Nova. Retrieved from https://www.rcaap.pt/detail.jsp?id=oai:run.unl.pt:10362/10851

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Calmeiro, Tomás R. “Atomic force microscopy assisted with electron and ion beam microscopy for the direct measurement of biostructures and DNA samples.” 2013. Thesis, Universidade Nova. Accessed June 15, 2019. https://www.rcaap.pt/detail.jsp?id=oai:run.unl.pt:10362/10851.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Calmeiro, Tomás R. “Atomic force microscopy assisted with electron and ion beam microscopy for the direct measurement of biostructures and DNA samples.” 2013. Web. 15 Jun 2019.

Vancouver:

Calmeiro TR. Atomic force microscopy assisted with electron and ion beam microscopy for the direct measurement of biostructures and DNA samples. [Internet] [Thesis]. Universidade Nova; 2013. [cited 2019 Jun 15]. Available from: https://www.rcaap.pt/detail.jsp?id=oai:run.unl.pt:10362/10851.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Calmeiro TR. Atomic force microscopy assisted with electron and ion beam microscopy for the direct measurement of biostructures and DNA samples. [Thesis]. Universidade Nova; 2013. Available from: https://www.rcaap.pt/detail.jsp?id=oai:run.unl.pt:10362/10851

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Canterbury

4. Banerjee, Steven. A 3D microrobotic actuator for micro and nano manipulation.

Degree: Mechanical Engineering, 2015, University of Canterbury

 Following the invention of the atomic force microscopy, AFM has revolutionised not only surface sciences but also biological sciences more recently. From being used as… (more)

Subjects/Keywords: manipulation; single cell; parallel; MEMS; AFM; Atomic Force Microscope; array; BioMEMS; NEMS; microneedle; sensor; actuator; drug delivery

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APA (6th Edition):

Banerjee, S. (2015). A 3D microrobotic actuator for micro and nano manipulation. (Thesis). University of Canterbury. Retrieved from http://hdl.handle.net/10092/11376

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Banerjee, Steven. “A 3D microrobotic actuator for micro and nano manipulation.” 2015. Thesis, University of Canterbury. Accessed June 15, 2019. http://hdl.handle.net/10092/11376.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Banerjee, Steven. “A 3D microrobotic actuator for micro and nano manipulation.” 2015. Web. 15 Jun 2019.

Vancouver:

Banerjee S. A 3D microrobotic actuator for micro and nano manipulation. [Internet] [Thesis]. University of Canterbury; 2015. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/10092/11376.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Banerjee S. A 3D microrobotic actuator for micro and nano manipulation. [Thesis]. University of Canterbury; 2015. Available from: http://hdl.handle.net/10092/11376

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Brno University of Technology

5. Mojrová, Barbora. Využití měřicí metody SPM v technologii výroby krystalických solárních článků .

Degree: 2013, Brno University of Technology

 Tato práce se zabývá využitím technik mikroskopie atomárních sil (AFM) a mikroskopie Kelvinovou sondou (KPFM) ve výrobě solárních článků. Obě techniky zjišťují požadované vlastnosti povrchu… (more)

Subjects/Keywords: Mikroskopie rastrující sondou; SPM; mikroskopie atomárních sil; AFM; mikroskopie Kelvinovou sondou; KPFM; solární článek.; Scanning Probe Microscopy; SPM; Atomic Force Microscopy; AFM; Kelvin Probe Force Microscopy; KPFM; Solar cell.

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APA (6th Edition):

Mojrová, B. (2013). Využití měřicí metody SPM v technologii výroby krystalických solárních článků . (Thesis). Brno University of Technology. Retrieved from http://hdl.handle.net/11012/27352

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Mojrová, Barbora. “Využití měřicí metody SPM v technologii výroby krystalických solárních článků .” 2013. Thesis, Brno University of Technology. Accessed June 15, 2019. http://hdl.handle.net/11012/27352.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Mojrová, Barbora. “Využití měřicí metody SPM v technologii výroby krystalických solárních článků .” 2013. Web. 15 Jun 2019.

Vancouver:

Mojrová B. Využití měřicí metody SPM v technologii výroby krystalických solárních článků . [Internet] [Thesis]. Brno University of Technology; 2013. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/11012/27352.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Mojrová B. Využití měřicí metody SPM v technologii výroby krystalických solárních článků . [Thesis]. Brno University of Technology; 2013. Available from: http://hdl.handle.net/11012/27352

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Johannes Gutenberg Universität Mainz

6. Sun, Ling. Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy.

Degree: 2010, Johannes Gutenberg Universität Mainz

Conjugated polymers and conjugated polymer blends have attracted great interest due to their potential applications in biosensors and organic electronics. The sub-100 nm morphology of… (more)

Subjects/Keywords: PPy, Kelvin probe force microscopy, conductive AFM, conjugated polymer blends; Chemistry and allied sciences

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APA (6th Edition):

Sun, L. (2010). Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy. (Doctoral Dissertation). Johannes Gutenberg Universität Mainz. Retrieved from http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/

Chicago Manual of Style (16th Edition):

Sun, Ling. “Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy.” 2010. Doctoral Dissertation, Johannes Gutenberg Universität Mainz. Accessed June 15, 2019. http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/.

MLA Handbook (7th Edition):

Sun, Ling. “Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy.” 2010. Web. 15 Jun 2019.

Vancouver:

Sun L. Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy. [Internet] [Doctoral dissertation]. Johannes Gutenberg Universität Mainz; 2010. [cited 2019 Jun 15]. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/.

Council of Science Editors:

Sun L. Nanoscopic studies of conjugated polymer blends by (electric) scanning probe microscopy. [Doctoral Dissertation]. Johannes Gutenberg Universität Mainz; 2010. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2010/2326/


Clemson University

7. Thompson, Gary. ELECTROMECHANICS OF BIOLOGICAL SYSTEMS STUDIED BY SCANNING PROBE MICROSCOPY.

Degree: PhD, Bioengineering, 2011, Clemson University

 The functional role of piezoelectricity and of other modes of electromechanical coupling across the hierarchical structures of biological materials garnered interest many years ago. Many… (more)

Subjects/Keywords: Atomic force microscopy AFM; Bacteria; Band excitation; Electromechanical; Piezoelectric; Scanning probe microscopy SPM; Biomechanics

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APA (6th Edition):

Thompson, G. (2011). ELECTROMECHANICS OF BIOLOGICAL SYSTEMS STUDIED BY SCANNING PROBE MICROSCOPY. (Doctoral Dissertation). Clemson University. Retrieved from https://tigerprints.clemson.edu/all_dissertations/722

Chicago Manual of Style (16th Edition):

Thompson, Gary. “ELECTROMECHANICS OF BIOLOGICAL SYSTEMS STUDIED BY SCANNING PROBE MICROSCOPY.” 2011. Doctoral Dissertation, Clemson University. Accessed June 15, 2019. https://tigerprints.clemson.edu/all_dissertations/722.

MLA Handbook (7th Edition):

Thompson, Gary. “ELECTROMECHANICS OF BIOLOGICAL SYSTEMS STUDIED BY SCANNING PROBE MICROSCOPY.” 2011. Web. 15 Jun 2019.

Vancouver:

Thompson G. ELECTROMECHANICS OF BIOLOGICAL SYSTEMS STUDIED BY SCANNING PROBE MICROSCOPY. [Internet] [Doctoral dissertation]. Clemson University; 2011. [cited 2019 Jun 15]. Available from: https://tigerprints.clemson.edu/all_dissertations/722.

Council of Science Editors:

Thompson G. ELECTROMECHANICS OF BIOLOGICAL SYSTEMS STUDIED BY SCANNING PROBE MICROSCOPY. [Doctoral Dissertation]. Clemson University; 2011. Available from: https://tigerprints.clemson.edu/all_dissertations/722


Georgia Tech

8. Parlak, Zehra. Quantitative imaging of subsurface structures and mechanical properties at nanoscale using atomic force microscope.

Degree: PhD, Electrical and Computer Engineering, 2010, Georgia Tech

 This dissertation focuses on quantitative subsurface and mechanical properties imaging potential of AFM probes. Extensive modeling of AFM probes are presented for thorough understanding of… (more)

Subjects/Keywords: Atomic force microscope; AFM; Ultrasonic AFM; Nanoscale subsurface imaging; Mechanical property imaging; Tapping mode; FIRAT; Scanning probe microscopy; Imaging systems

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APA (6th Edition):

Parlak, Z. (2010). Quantitative imaging of subsurface structures and mechanical properties at nanoscale using atomic force microscope. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/37181

Chicago Manual of Style (16th Edition):

Parlak, Zehra. “Quantitative imaging of subsurface structures and mechanical properties at nanoscale using atomic force microscope.” 2010. Doctoral Dissertation, Georgia Tech. Accessed June 15, 2019. http://hdl.handle.net/1853/37181.

MLA Handbook (7th Edition):

Parlak, Zehra. “Quantitative imaging of subsurface structures and mechanical properties at nanoscale using atomic force microscope.” 2010. Web. 15 Jun 2019.

Vancouver:

Parlak Z. Quantitative imaging of subsurface structures and mechanical properties at nanoscale using atomic force microscope. [Internet] [Doctoral dissertation]. Georgia Tech; 2010. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/1853/37181.

Council of Science Editors:

Parlak Z. Quantitative imaging of subsurface structures and mechanical properties at nanoscale using atomic force microscope. [Doctoral Dissertation]. Georgia Tech; 2010. Available from: http://hdl.handle.net/1853/37181


Brno University of Technology

9. Štefko, Marcel. Zdokonalení řídících a analyzačních technik vývojového modelu SPM .

Degree: 2015, Brno University of Technology

 Bakalářská práce se zabývá zdokonalováním výukového modelu mikroskopu atomárních sil (AFM). Součástí práce je rešerše stávajících analogii mezi makroskopickými jevy a fenomény spojenými s mikroskopii… (more)

Subjects/Keywords: Mikroskopie rastrovací sondou; SPM; mikroskopie atomárních sil; AFM; model; analogie; Scanning Probe Microscopy; SPM; Atomic Force Microscopy; AFM; model; analogy

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APA (6th Edition):

Štefko, M. (2015). Zdokonalení řídících a analyzačních technik vývojového modelu SPM . (Thesis). Brno University of Technology. Retrieved from http://hdl.handle.net/11012/40208

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Štefko, Marcel. “Zdokonalení řídících a analyzačních technik vývojového modelu SPM .” 2015. Thesis, Brno University of Technology. Accessed June 15, 2019. http://hdl.handle.net/11012/40208.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Štefko, Marcel. “Zdokonalení řídících a analyzačních technik vývojového modelu SPM .” 2015. Web. 15 Jun 2019.

Vancouver:

Štefko M. Zdokonalení řídících a analyzačních technik vývojového modelu SPM . [Internet] [Thesis]. Brno University of Technology; 2015. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/11012/40208.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Štefko M. Zdokonalení řídících a analyzačních technik vývojového modelu SPM . [Thesis]. Brno University of Technology; 2015. Available from: http://hdl.handle.net/11012/40208

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Université Catholique de Louvain

10. Yin, Jun. Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy.

Degree: 2016, Université Catholique de Louvain

 Electrification and electrostatic discharge (ESD) phenomena are known as serious risks in many applications, such as sophisticated microelectronic devices in electronics industry, in the chemical… (more)

Subjects/Keywords: Scanning Probe Microscopy (SPM); Stainless steel fiber; Polyester fiber; Charge decay; Charge contact electrification; Charge conduction and dissipation; Atomic Force Microscopy (AFM); Current Sensing AFM (CS-AFM); Kelvin Probe Force Microscopy (KPFM); I-V Spectroscopy; ResisCope module; Bekinox fiber

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APA (6th Edition):

Yin, J. (2016). Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy. (Thesis). Université Catholique de Louvain. Retrieved from http://hdl.handle.net/2078.1/182154

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Yin, Jun. “Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy.” 2016. Thesis, Université Catholique de Louvain. Accessed June 15, 2019. http://hdl.handle.net/2078.1/182154.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Yin, Jun. “Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy.” 2016. Web. 15 Jun 2019.

Vancouver:

Yin J. Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy. [Internet] [Thesis]. Université Catholique de Louvain; 2016. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/2078.1/182154.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Yin J. Charge conduction and dissipation in fibers and felts : study by scanning probe microscopy. [Thesis]. Université Catholique de Louvain; 2016. Available from: http://hdl.handle.net/2078.1/182154

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


The Ohio State University

11. Jeong, Younkoo. HIGH SPEED ATOMIC FORCE MICROSCOPY.

Degree: PhD, Mechanical Engineering, 2009, The Ohio State University

 Since its introduction more than twenty years ago, Atomic Force Microscopy (AFM) has extended its application areas from material science to biology or biophysics, based… (more)

Subjects/Keywords: Mechanical Engineering; Atomic Force Microscopy; Multi-axis Actuation; High bandwidth Actuation; Active AFM Probe; High speed Imaging

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APA (6th Edition):

Jeong, Y. (2009). HIGH SPEED ATOMIC FORCE MICROSCOPY. (Doctoral Dissertation). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109

Chicago Manual of Style (16th Edition):

Jeong, Younkoo. “HIGH SPEED ATOMIC FORCE MICROSCOPY.” 2009. Doctoral Dissertation, The Ohio State University. Accessed June 15, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109.

MLA Handbook (7th Edition):

Jeong, Younkoo. “HIGH SPEED ATOMIC FORCE MICROSCOPY.” 2009. Web. 15 Jun 2019.

Vancouver:

Jeong Y. HIGH SPEED ATOMIC FORCE MICROSCOPY. [Internet] [Doctoral dissertation]. The Ohio State University; 2009. [cited 2019 Jun 15]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109.

Council of Science Editors:

Jeong Y. HIGH SPEED ATOMIC FORCE MICROSCOPY. [Doctoral Dissertation]. The Ohio State University; 2009. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109


Indian Institute of Science

12. Mrinalini, R Sri Muthu. A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology.

Degree: 2017, Indian Institute of Science

 With increase in the number of three dimensional (3-D) nanometer-scale objects that are being either fabricated or studied, there is a need to accurately characterize… (more)

Subjects/Keywords: Nanometrology; Metrology Naostructures; Three Dimensional Nano-metrology- Replaceable Tips; AFM Probe; Atomic Force Microscopy; Multiple Motion Measurement; Instrumentation and Applied Physics

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APA (6th Edition):

Mrinalini, R. S. M. (2017). A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology. (Thesis). Indian Institute of Science. Retrieved from http://etd.iisc.ernet.in/2005/3711 ; http://etd.iisc.ernet.in/abstracts/4581/G28317-Abs.pdf

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Mrinalini, R Sri Muthu. “A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology.” 2017. Thesis, Indian Institute of Science. Accessed June 15, 2019. http://etd.iisc.ernet.in/2005/3711 ; http://etd.iisc.ernet.in/abstracts/4581/G28317-Abs.pdf.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Mrinalini, R Sri Muthu. “A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology.” 2017. Web. 15 Jun 2019.

Vancouver:

Mrinalini RSM. A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology. [Internet] [Thesis]. Indian Institute of Science; 2017. [cited 2019 Jun 15]. Available from: http://etd.iisc.ernet.in/2005/3711 ; http://etd.iisc.ernet.in/abstracts/4581/G28317-Abs.pdf.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Mrinalini RSM. A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology. [Thesis]. Indian Institute of Science; 2017. Available from: http://etd.iisc.ernet.in/2005/3711 ; http://etd.iisc.ernet.in/abstracts/4581/G28317-Abs.pdf

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Delft University of Technology

13. De Laat, M.L.C. In situ stiffness adjustment for AFM probes:.

Degree: 2016, Delft University of Technology

 The choice on which cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Usually, the cantilevers have… (more)

Subjects/Keywords: stiffness; cantilever; AFM; probe; adjustment

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APA (6th Edition):

De Laat, M. L. C. (2016). In situ stiffness adjustment for AFM probes:. (Masters Thesis). Delft University of Technology. Retrieved from http://resolver.tudelft.nl/uuid:9cac1794-a3d7-46de-bb95-6b0b11133273

Chicago Manual of Style (16th Edition):

De Laat, M L C. “In situ stiffness adjustment for AFM probes:.” 2016. Masters Thesis, Delft University of Technology. Accessed June 15, 2019. http://resolver.tudelft.nl/uuid:9cac1794-a3d7-46de-bb95-6b0b11133273.

MLA Handbook (7th Edition):

De Laat, M L C. “In situ stiffness adjustment for AFM probes:.” 2016. Web. 15 Jun 2019.

Vancouver:

De Laat MLC. In situ stiffness adjustment for AFM probes:. [Internet] [Masters thesis]. Delft University of Technology; 2016. [cited 2019 Jun 15]. Available from: http://resolver.tudelft.nl/uuid:9cac1794-a3d7-46de-bb95-6b0b11133273.

Council of Science Editors:

De Laat MLC. In situ stiffness adjustment for AFM probes:. [Masters Thesis]. Delft University of Technology; 2016. Available from: http://resolver.tudelft.nl/uuid:9cac1794-a3d7-46de-bb95-6b0b11133273


McMaster University

14. Marway, Heera. INVESTIGATION OF NANOCELLULOSE MECHANICAL PROPERTIES AND INTERACTIONS IN SALT AND SURFACTANT SOLUTIONS MEASURED BY ATOMIC FORCE MICROSCOPY.

Degree: MASc, 2016, McMaster University

This understanding of nanocellulose can be directly applied in future formulation design to use nanocellulose in polymer nanocomposites, foams, emulsions, latexes, gels and biomedical materials.… (more)

Subjects/Keywords: Cellulose; Cellulose Nanocrystals; Atomic Force Microscopy; Adhesion; DLVO; Surfactant; Interactions; Counterion; AM-FM AFM; AFM; Colloid; Colloid Probe Microscopy; Nanoparticles; Nanocellulose; Nanotechnology; Salt

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APA (6th Edition):

Marway, H. (2016). INVESTIGATION OF NANOCELLULOSE MECHANICAL PROPERTIES AND INTERACTIONS IN SALT AND SURFACTANT SOLUTIONS MEASURED BY ATOMIC FORCE MICROSCOPY. (Masters Thesis). McMaster University. Retrieved from http://hdl.handle.net/11375/20791

Chicago Manual of Style (16th Edition):

Marway, Heera. “INVESTIGATION OF NANOCELLULOSE MECHANICAL PROPERTIES AND INTERACTIONS IN SALT AND SURFACTANT SOLUTIONS MEASURED BY ATOMIC FORCE MICROSCOPY.” 2016. Masters Thesis, McMaster University. Accessed June 15, 2019. http://hdl.handle.net/11375/20791.

MLA Handbook (7th Edition):

Marway, Heera. “INVESTIGATION OF NANOCELLULOSE MECHANICAL PROPERTIES AND INTERACTIONS IN SALT AND SURFACTANT SOLUTIONS MEASURED BY ATOMIC FORCE MICROSCOPY.” 2016. Web. 15 Jun 2019.

Vancouver:

Marway H. INVESTIGATION OF NANOCELLULOSE MECHANICAL PROPERTIES AND INTERACTIONS IN SALT AND SURFACTANT SOLUTIONS MEASURED BY ATOMIC FORCE MICROSCOPY. [Internet] [Masters thesis]. McMaster University; 2016. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/11375/20791.

Council of Science Editors:

Marway H. INVESTIGATION OF NANOCELLULOSE MECHANICAL PROPERTIES AND INTERACTIONS IN SALT AND SURFACTANT SOLUTIONS MEASURED BY ATOMIC FORCE MICROSCOPY. [Masters Thesis]. McMaster University; 2016. Available from: http://hdl.handle.net/11375/20791

15. McBride, Sean P. Surface science experiments involving the atomic force microscope.

Degree: PhD, Department of Physics, 2012, Kansas State University

 Three diverse first author surfaces science experiments conducted by Sean P. McBride 1-3 will be discussed in detail and supplemented by secondary co-author projects by… (more)

Subjects/Keywords: Line tension; Surface science; Slip length; Atomic force microscope (AFM); Colloidal probe AFM; Residuals calibration; Condensed Matter Physics (0611); Nanoscience (0565); Physics (0605)

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APA (6th Edition):

McBride, S. P. (2012). Surface science experiments involving the atomic force microscope. (Doctoral Dissertation). Kansas State University. Retrieved from http://hdl.handle.net/2097/13459

Chicago Manual of Style (16th Edition):

McBride, Sean P. “Surface science experiments involving the atomic force microscope.” 2012. Doctoral Dissertation, Kansas State University. Accessed June 15, 2019. http://hdl.handle.net/2097/13459.

MLA Handbook (7th Edition):

McBride, Sean P. “Surface science experiments involving the atomic force microscope.” 2012. Web. 15 Jun 2019.

Vancouver:

McBride SP. Surface science experiments involving the atomic force microscope. [Internet] [Doctoral dissertation]. Kansas State University; 2012. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/2097/13459.

Council of Science Editors:

McBride SP. Surface science experiments involving the atomic force microscope. [Doctoral Dissertation]. Kansas State University; 2012. Available from: http://hdl.handle.net/2097/13459


Université de Grenoble

16. Spadafora, Evan. Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics.

Degree: Docteur es, Nanophysique, 2011, Université de Grenoble

La nanostructure et les propriétés électroniques de matériaux modèles pour le photovoltaïque organique, ont été étudiées en utilisant la Microscopie à Force Atomique en mode… (more)

Subjects/Keywords: AFM non contact; ,photovoltaïque organique; Auto-assemblages moléculaires; Microscopie à sonde de Kelvin; NC-AFM; Organic photovoltaics; MOLECULAR SELF-ASSEMBLIES; Kelvin Probe Force Microscopy; 530

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APA (6th Edition):

Spadafora, E. (2011). Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics. (Doctoral Dissertation). Université de Grenoble. Retrieved from http://www.theses.fr/2011GRENY050

Chicago Manual of Style (16th Edition):

Spadafora, Evan. “Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics.” 2011. Doctoral Dissertation, Université de Grenoble. Accessed June 15, 2019. http://www.theses.fr/2011GRENY050.

MLA Handbook (7th Edition):

Spadafora, Evan. “Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics.” 2011. Web. 15 Jun 2019.

Vancouver:

Spadafora E. Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics. [Internet] [Doctoral dissertation]. Université de Grenoble; 2011. [cited 2019 Jun 15]. Available from: http://www.theses.fr/2011GRENY050.

Council of Science Editors:

Spadafora E. Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique : Noncontact Atomic Force Microscopy and Kelvin Probe Force Microscopy investigations of model materials for organic photovoltaics. [Doctoral Dissertation]. Université de Grenoble; 2011. Available from: http://www.theses.fr/2011GRENY050

17. Roche, Roland. Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination.

Degree: Docteur es, Sciences des Matériaux, Physique, Chimie et Nanosciences, 2014, Aix Marseille Université

Afin de répondre à des besoins croissants en nano-caractérisation, nous avons développé une plateforme multifonctionnelle combinant des techniques de microscopie optique et de microscopies en… (more)

Subjects/Keywords: Développement instrumental; Microscopies à sondes locales (SPM); Microscopie à force atomique (AFM); Microscopie à sonde de Kelvin (KPFM); Matériaux organiques; Alignement énergétiques aux interfaces; Photovoltaïque; Instrumental developpment; Scannin prob microscopies (SPM); Atomic force microscopy (AFM); Kelvin probe force microscopy (KPFM); Organic materials; Interfacial energetic alignment; Photovoltaïc; 530

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APA (6th Edition):

Roche, R. (2014). Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination. (Doctoral Dissertation). Aix Marseille Université. Retrieved from http://www.theses.fr/2014AIXM4045

Chicago Manual of Style (16th Edition):

Roche, Roland. “Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination.” 2014. Doctoral Dissertation, Aix Marseille Université. Accessed June 15, 2019. http://www.theses.fr/2014AIXM4045.

MLA Handbook (7th Edition):

Roche, Roland. “Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination.” 2014. Web. 15 Jun 2019.

Vancouver:

Roche R. Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination. [Internet] [Doctoral dissertation]. Aix Marseille Université 2014. [cited 2019 Jun 15]. Available from: http://www.theses.fr/2014AIXM4045.

Council of Science Editors:

Roche R. Plateforme multifonctionnelle de microscopies à sonde locale sous illumination : Scanning Probe Microscopies platform under Illumination. [Doctoral Dissertation]. Aix Marseille Université 2014. Available from: http://www.theses.fr/2014AIXM4045


University of Alberta

18. Wang, Shengqun. Understanding stability of water-in-diluted bitumen emulsions by colloidal force measurements.

Degree: PhD, Department of Chemical and Materials Engineering, 2011, University of Alberta

 Removal of emulsified water is a challenge in oil sands and heavy oil processing. The flocculation and coagulation of emulsified water droplets depend on the… (more)

Subjects/Keywords: bitumen; AFM; colloidal force; emulsion

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APA (6th Edition):

Wang, S. (2011). Understanding stability of water-in-diluted bitumen emulsions by colloidal force measurements. (Doctoral Dissertation). University of Alberta. Retrieved from https://era.library.ualberta.ca/files/p2676v69j

Chicago Manual of Style (16th Edition):

Wang, Shengqun. “Understanding stability of water-in-diluted bitumen emulsions by colloidal force measurements.” 2011. Doctoral Dissertation, University of Alberta. Accessed June 15, 2019. https://era.library.ualberta.ca/files/p2676v69j.

MLA Handbook (7th Edition):

Wang, Shengqun. “Understanding stability of water-in-diluted bitumen emulsions by colloidal force measurements.” 2011. Web. 15 Jun 2019.

Vancouver:

Wang S. Understanding stability of water-in-diluted bitumen emulsions by colloidal force measurements. [Internet] [Doctoral dissertation]. University of Alberta; 2011. [cited 2019 Jun 15]. Available from: https://era.library.ualberta.ca/files/p2676v69j.

Council of Science Editors:

Wang S. Understanding stability of water-in-diluted bitumen emulsions by colloidal force measurements. [Doctoral Dissertation]. University of Alberta; 2011. Available from: https://era.library.ualberta.ca/files/p2676v69j


Texas A&M University

19. Allen, Robert Grover. Structural Characterization of Micromechanical Properties in Asphalt Using Atomic Force Microscopy.

Degree: 2012, Texas A&M University

 The purpose of this study was to characterize the micromechanical properties of various structural components in asphalt using Atomic Force Microscopy (AFM). The focus of… (more)

Subjects/Keywords: Asphalt; Atomic Force Microscopy (AFM)

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APA (6th Edition):

Allen, R. G. (2012). Structural Characterization of Micromechanical Properties in Asphalt Using Atomic Force Microscopy. (Thesis). Texas A&M University. Retrieved from http://hdl.handle.net/1969.1/ETD-TAMU-2010-12-8749

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Allen, Robert Grover. “Structural Characterization of Micromechanical Properties in Asphalt Using Atomic Force Microscopy.” 2012. Thesis, Texas A&M University. Accessed June 15, 2019. http://hdl.handle.net/1969.1/ETD-TAMU-2010-12-8749.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Allen, Robert Grover. “Structural Characterization of Micromechanical Properties in Asphalt Using Atomic Force Microscopy.” 2012. Web. 15 Jun 2019.

Vancouver:

Allen RG. Structural Characterization of Micromechanical Properties in Asphalt Using Atomic Force Microscopy. [Internet] [Thesis]. Texas A&M University; 2012. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/1969.1/ETD-TAMU-2010-12-8749.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Allen RG. Structural Characterization of Micromechanical Properties in Asphalt Using Atomic Force Microscopy. [Thesis]. Texas A&M University; 2012. Available from: http://hdl.handle.net/1969.1/ETD-TAMU-2010-12-8749

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

20. Botton, Julien. Nanolithographie par sonde locale catalytique : une approche bottom-up pour la nanostructuration de surfaces organominérales : Catalytic scanning probe lithography : a bottom-up approach allowing the nanostructuration of organomineral surfaces.

Degree: Docteur es, Sciences Chimiques, 2015, Aix Marseille Université

Face à la quête constante de miniaturisation, les nanosciences ont connu un essor fulgurant lors de la dernière décennie. Au sein de ces dernières, les… (more)

Subjects/Keywords: Nanolithographie par sonde locale catalytique (cSPL); Catalyse organométallique; Époxydation localisée; Microscopie à force atomique (AFM); Nanostructuration 3D; Monocouche auto-Assemblée (SAM); Catalytic scanning probe lithography (cSPL); Organometallic catalysis; Localized epoxidation; Atomic force microscopy (AFM); 3D nanostructuration; Self-Assembled monolayers (SAM)

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APA (6th Edition):

Botton, J. (2015). Nanolithographie par sonde locale catalytique : une approche bottom-up pour la nanostructuration de surfaces organominérales : Catalytic scanning probe lithography : a bottom-up approach allowing the nanostructuration of organomineral surfaces. (Doctoral Dissertation). Aix Marseille Université. Retrieved from http://www.theses.fr/2015AIXM4389

Chicago Manual of Style (16th Edition):

Botton, Julien. “Nanolithographie par sonde locale catalytique : une approche bottom-up pour la nanostructuration de surfaces organominérales : Catalytic scanning probe lithography : a bottom-up approach allowing the nanostructuration of organomineral surfaces.” 2015. Doctoral Dissertation, Aix Marseille Université. Accessed June 15, 2019. http://www.theses.fr/2015AIXM4389.

MLA Handbook (7th Edition):

Botton, Julien. “Nanolithographie par sonde locale catalytique : une approche bottom-up pour la nanostructuration de surfaces organominérales : Catalytic scanning probe lithography : a bottom-up approach allowing the nanostructuration of organomineral surfaces.” 2015. Web. 15 Jun 2019.

Vancouver:

Botton J. Nanolithographie par sonde locale catalytique : une approche bottom-up pour la nanostructuration de surfaces organominérales : Catalytic scanning probe lithography : a bottom-up approach allowing the nanostructuration of organomineral surfaces. [Internet] [Doctoral dissertation]. Aix Marseille Université 2015. [cited 2019 Jun 15]. Available from: http://www.theses.fr/2015AIXM4389.

Council of Science Editors:

Botton J. Nanolithographie par sonde locale catalytique : une approche bottom-up pour la nanostructuration de surfaces organominérales : Catalytic scanning probe lithography : a bottom-up approach allowing the nanostructuration of organomineral surfaces. [Doctoral Dissertation]. Aix Marseille Université 2015. Available from: http://www.theses.fr/2015AIXM4389


The Ohio State University

21. Doutt, Daniel R. THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE.

Degree: PhD, Physics, 2013, The Ohio State University

  ZnO has received renewed interest in recent years due to its exciting semiconductor properties and remarkable ability to grow nanostructures. As a wide band… (more)

Subjects/Keywords: Condensed Matter Physics; Electrical Engineering; Materials Science; Nanoscience; Physics; Solid State Physics; ZnO; GZO; Cathodoluminescence; Scanning Probe Microscopy; SPM; Atomic Force Microscopy; AFM; Kelvin Probe Force Microscopy; KPFM; Surface Photovoltage Spectroscopy; SPS; X-ray Photoemission Spectroscopy; XPS; Schottky Barriers; Surfaces and Interfaces

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APA (6th Edition):

Doutt, D. R. (2013). THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE. (Doctoral Dissertation). The Ohio State University. Retrieved from http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639

Chicago Manual of Style (16th Edition):

Doutt, Daniel R. “THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE.” 2013. Doctoral Dissertation, The Ohio State University. Accessed June 15, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639.

MLA Handbook (7th Edition):

Doutt, Daniel R. “THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE.” 2013. Web. 15 Jun 2019.

Vancouver:

Doutt DR. THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE. [Internet] [Doctoral dissertation]. The Ohio State University; 2013. [cited 2019 Jun 15]. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639.

Council of Science Editors:

Doutt DR. THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE. [Doctoral Dissertation]. The Ohio State University; 2013. Available from: http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639


Johannes Gutenberg Universität Mainz

22. Pfeifer-Lehmann, Olga. Untersuchung der Adhäsionskräfte in interaktiven Pulvermischungen zur Inhalation und deren Veränderung in Abhängigkeit von der Dichtigkeit der Verpackung.

Degree: 2010, Johannes Gutenberg Universität Mainz

Die Untersuchung der Adhäsionskräfte mit Colloid Probe Technik, einer Weiterentwicklung der Rasterkraftmikroskopie (Atomic Force Microscopy=AFM), an erzeugten Carrier- und Wirkstoffkristallen bei Laborbedingungen und unter Einfluss… (more)

Subjects/Keywords: Rasterkraftmikroskopie, Adhäsionskräfte, inhalative interaktive Pulvermischung, aerodynamische Eigenschaften, Tiotropiumbromid, Lactose, Mannitol; AFM, colloid probe, adhesion force, inhalation, DPI, interactive mixture, aerodynamic performance, tiotropium bromide, lactose, mannitol; Natural sciences and mathematics

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APA (6th Edition):

Pfeifer-Lehmann, O. (2010). Untersuchung der Adhäsionskräfte in interaktiven Pulvermischungen zur Inhalation und deren Veränderung in Abhängigkeit von der Dichtigkeit der Verpackung. (Doctoral Dissertation). Johannes Gutenberg Universität Mainz. Retrieved from http://ubm.opus.hbz-nrw.de/volltexte/2011/2555/

Chicago Manual of Style (16th Edition):

Pfeifer-Lehmann, Olga. “Untersuchung der Adhäsionskräfte in interaktiven Pulvermischungen zur Inhalation und deren Veränderung in Abhängigkeit von der Dichtigkeit der Verpackung.” 2010. Doctoral Dissertation, Johannes Gutenberg Universität Mainz. Accessed June 15, 2019. http://ubm.opus.hbz-nrw.de/volltexte/2011/2555/.

MLA Handbook (7th Edition):

Pfeifer-Lehmann, Olga. “Untersuchung der Adhäsionskräfte in interaktiven Pulvermischungen zur Inhalation und deren Veränderung in Abhängigkeit von der Dichtigkeit der Verpackung.” 2010. Web. 15 Jun 2019.

Vancouver:

Pfeifer-Lehmann O. Untersuchung der Adhäsionskräfte in interaktiven Pulvermischungen zur Inhalation und deren Veränderung in Abhängigkeit von der Dichtigkeit der Verpackung. [Internet] [Doctoral dissertation]. Johannes Gutenberg Universität Mainz; 2010. [cited 2019 Jun 15]. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2011/2555/.

Council of Science Editors:

Pfeifer-Lehmann O. Untersuchung der Adhäsionskräfte in interaktiven Pulvermischungen zur Inhalation und deren Veränderung in Abhängigkeit von der Dichtigkeit der Verpackung. [Doctoral Dissertation]. Johannes Gutenberg Universität Mainz; 2010. Available from: http://ubm.opus.hbz-nrw.de/volltexte/2011/2555/

23. Rupasinghe, R-A- Thilini Perera. Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy.

Degree: PhD, Chemistry, 2015, University of Iowa

  Studying physical properties of nanoscale materials has gained a significant attention owing to their applications in the fields such as electronics, medicine, pharmaceutical industry,… (more)

Subjects/Keywords: Atomic Force Microscopy; Conductive Probe AFM; Nanoindentation; Nanomaterials; Chemistry

…Representative force-displacement curve used in force spectroscopy showing AFM probe moving towards… …used in force spectroscopy showing AFM probe moving towards (red) and away (… …conductive probe atomic force microscopy (CP-AFM). The SCSC reaction generates a 1D… …the probe and the surface. In a single force-displacement curve the AFM probe approaches the… …limited. In this context, development of atomic force microscopy (AFM) based… 

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APA (6th Edition):

Rupasinghe, R. T. P. (2015). Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy. (Doctoral Dissertation). University of Iowa. Retrieved from https://ir.uiowa.edu/etd/2268

Chicago Manual of Style (16th Edition):

Rupasinghe, R-A- Thilini Perera. “Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy.” 2015. Doctoral Dissertation, University of Iowa. Accessed June 15, 2019. https://ir.uiowa.edu/etd/2268.

MLA Handbook (7th Edition):

Rupasinghe, R-A- Thilini Perera. “Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy.” 2015. Web. 15 Jun 2019.

Vancouver:

Rupasinghe RTP. Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy. [Internet] [Doctoral dissertation]. University of Iowa; 2015. [cited 2019 Jun 15]. Available from: https://ir.uiowa.edu/etd/2268.

Council of Science Editors:

Rupasinghe RTP. Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy. [Doctoral Dissertation]. University of Iowa; 2015. Available from: https://ir.uiowa.edu/etd/2268

24. SUBBIAH JEGADESAN. Fabrication of nanostructures using atomic force microscope assisted nanolithography.

Degree: 2007, National University of Singapore

Subjects/Keywords: Scanning probe lithography; electroactive polymer; atomic force microscope; electrochemical Nanolithography; conductive AFM; electropolymerization.

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APA (6th Edition):

JEGADESAN, S. (2007). Fabrication of nanostructures using atomic force microscope assisted nanolithography. (Thesis). National University of Singapore. Retrieved from http://scholarbank.nus.edu.sg/handle/10635/23205

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

JEGADESAN, SUBBIAH. “Fabrication of nanostructures using atomic force microscope assisted nanolithography.” 2007. Thesis, National University of Singapore. Accessed June 15, 2019. http://scholarbank.nus.edu.sg/handle/10635/23205.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

JEGADESAN, SUBBIAH. “Fabrication of nanostructures using atomic force microscope assisted nanolithography.” 2007. Web. 15 Jun 2019.

Vancouver:

JEGADESAN S. Fabrication of nanostructures using atomic force microscope assisted nanolithography. [Internet] [Thesis]. National University of Singapore; 2007. [cited 2019 Jun 15]. Available from: http://scholarbank.nus.edu.sg/handle/10635/23205.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

JEGADESAN S. Fabrication of nanostructures using atomic force microscope assisted nanolithography. [Thesis]. National University of Singapore; 2007. Available from: http://scholarbank.nus.edu.sg/handle/10635/23205

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Louisiana State University

25. LeJeune, Zorabel Mallorca. Investigations of Structure / Property Interrelationships of Organic Thin Films Using Scanning Probe Microscopy and Nanolithography.

Degree: PhD, Chemistry, 2010, Louisiana State University

 Studies of the surface assembly and molecular organization of organic thin films were studied using scanning probe microscopy (SPM) and scanning probe lithography (SPL). Systems… (more)

Subjects/Keywords: Scanning Probe Microscopy; nanolithography; self-assembly; AFM

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APA (6th Edition):

LeJeune, Z. M. (2010). Investigations of Structure / Property Interrelationships of Organic Thin Films Using Scanning Probe Microscopy and Nanolithography. (Doctoral Dissertation). Louisiana State University. Retrieved from etd-11182010-192232 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1151

Chicago Manual of Style (16th Edition):

LeJeune, Zorabel Mallorca. “Investigations of Structure / Property Interrelationships of Organic Thin Films Using Scanning Probe Microscopy and Nanolithography.” 2010. Doctoral Dissertation, Louisiana State University. Accessed June 15, 2019. etd-11182010-192232 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1151.

MLA Handbook (7th Edition):

LeJeune, Zorabel Mallorca. “Investigations of Structure / Property Interrelationships of Organic Thin Films Using Scanning Probe Microscopy and Nanolithography.” 2010. Web. 15 Jun 2019.

Vancouver:

LeJeune ZM. Investigations of Structure / Property Interrelationships of Organic Thin Films Using Scanning Probe Microscopy and Nanolithography. [Internet] [Doctoral dissertation]. Louisiana State University; 2010. [cited 2019 Jun 15]. Available from: etd-11182010-192232 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1151.

Council of Science Editors:

LeJeune ZM. Investigations of Structure / Property Interrelationships of Organic Thin Films Using Scanning Probe Microscopy and Nanolithography. [Doctoral Dissertation]. Louisiana State University; 2010. Available from: etd-11182010-192232 ; https://digitalcommons.lsu.edu/gradschool_dissertations/1151


Louisiana State University

26. Daniels, Stephanie Loletha. Application of Scanning Probe Microscopy for New Physical Measurements and Studies of Surface Chemical Reactions of Materials at the Molecular Level.

Degree: PhD, Chemistry, 2011, Louisiana State University

 Scanning probe microscopy (SPM) provides unique capabilities for surface visualization and measurements that reach atomic and molecular dimensions. My research focus is directed toward applying… (more)

Subjects/Keywords: scanning probe microscopy; ferritin; corrosion; AFM; MSM

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APA (6th Edition):

Daniels, S. L. (2011). Application of Scanning Probe Microscopy for New Physical Measurements and Studies of Surface Chemical Reactions of Materials at the Molecular Level. (Doctoral Dissertation). Louisiana State University. Retrieved from etd-04272011-164727 ; https://digitalcommons.lsu.edu/gradschool_dissertations/4028

Chicago Manual of Style (16th Edition):

Daniels, Stephanie Loletha. “Application of Scanning Probe Microscopy for New Physical Measurements and Studies of Surface Chemical Reactions of Materials at the Molecular Level.” 2011. Doctoral Dissertation, Louisiana State University. Accessed June 15, 2019. etd-04272011-164727 ; https://digitalcommons.lsu.edu/gradschool_dissertations/4028.

MLA Handbook (7th Edition):

Daniels, Stephanie Loletha. “Application of Scanning Probe Microscopy for New Physical Measurements and Studies of Surface Chemical Reactions of Materials at the Molecular Level.” 2011. Web. 15 Jun 2019.

Vancouver:

Daniels SL. Application of Scanning Probe Microscopy for New Physical Measurements and Studies of Surface Chemical Reactions of Materials at the Molecular Level. [Internet] [Doctoral dissertation]. Louisiana State University; 2011. [cited 2019 Jun 15]. Available from: etd-04272011-164727 ; https://digitalcommons.lsu.edu/gradschool_dissertations/4028.

Council of Science Editors:

Daniels SL. Application of Scanning Probe Microscopy for New Physical Measurements and Studies of Surface Chemical Reactions of Materials at the Molecular Level. [Doctoral Dissertation]. Louisiana State University; 2011. Available from: etd-04272011-164727 ; https://digitalcommons.lsu.edu/gradschool_dissertations/4028


University of Waterloo

27. Lee, Geoffrey. Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope.

Degree: 2013, University of Waterloo

 The Kelvin Probe Force Microscope is a type of scanning probe instrument that is used to discern the different work functions of a sample. A… (more)

Subjects/Keywords: Kelvin Probe Force Microscopy; MEMS

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APA (6th Edition):

Lee, G. (2013). Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope. (Thesis). University of Waterloo. Retrieved from http://hdl.handle.net/10012/7452

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Lee, Geoffrey. “Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope.” 2013. Thesis, University of Waterloo. Accessed June 15, 2019. http://hdl.handle.net/10012/7452.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Lee, Geoffrey. “Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope.” 2013. Web. 15 Jun 2019.

Vancouver:

Lee G. Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope. [Internet] [Thesis]. University of Waterloo; 2013. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/10012/7452.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Lee G. Design, Fabrication and Validation of a CMOS-MEMS Kelvin Probe Force Microscope. [Thesis]. University of Waterloo; 2013. Available from: http://hdl.handle.net/10012/7452

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

28. Pakarinen, Olli. Scanning Force Microscopy Simulations of Nanoparticles on Insulating Surfaces.

Degree: 2008, Helsinki University of Technology

Scanning (atomic) force microscopy (SFM/AFM) is a surface science method capable of imaging surfaces with atomic resolution. SFM is a local probe method, closely related… (more)

Subjects/Keywords: force microscopy; SFM; AFM; nc-AFM; DFM; nanoclusters; atomivoimamikroskopia; SFM; AFM; nc-AFM; DFM; nanohiukkaset

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APA (6th Edition):

Pakarinen, O. (2008). Scanning Force Microscopy Simulations of Nanoparticles on Insulating Surfaces. (Thesis). Helsinki University of Technology. Retrieved from http://lib.tkk.fi/Diss/2008/isbn9789512292226/

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Pakarinen, Olli. “Scanning Force Microscopy Simulations of Nanoparticles on Insulating Surfaces.” 2008. Thesis, Helsinki University of Technology. Accessed June 15, 2019. http://lib.tkk.fi/Diss/2008/isbn9789512292226/.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Pakarinen, Olli. “Scanning Force Microscopy Simulations of Nanoparticles on Insulating Surfaces.” 2008. Web. 15 Jun 2019.

Vancouver:

Pakarinen O. Scanning Force Microscopy Simulations of Nanoparticles on Insulating Surfaces. [Internet] [Thesis]. Helsinki University of Technology; 2008. [cited 2019 Jun 15]. Available from: http://lib.tkk.fi/Diss/2008/isbn9789512292226/.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Pakarinen O. Scanning Force Microscopy Simulations of Nanoparticles on Insulating Surfaces. [Thesis]. Helsinki University of Technology; 2008. Available from: http://lib.tkk.fi/Diss/2008/isbn9789512292226/

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


University of Waterloo

29. Zheng, Shuo. Nanofabrication of direct positioning atomic force microscope (AFM) probes and a novel method to attain controllable lift-off.

Degree: 2017, University of Waterloo

 This thesis focuses on nanofabrication and its applications in the area related to atomic force microscope (AFM) probes and a novel way of constructing the… (more)

Subjects/Keywords: AFM probe; Lift-off; direct positioning AFM tip

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APA (6th Edition):

Zheng, S. (2017). Nanofabrication of direct positioning atomic force microscope (AFM) probes and a novel method to attain controllable lift-off. (Thesis). University of Waterloo. Retrieved from http://hdl.handle.net/10012/11251

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Zheng, Shuo. “Nanofabrication of direct positioning atomic force microscope (AFM) probes and a novel method to attain controllable lift-off.” 2017. Thesis, University of Waterloo. Accessed June 15, 2019. http://hdl.handle.net/10012/11251.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Zheng, Shuo. “Nanofabrication of direct positioning atomic force microscope (AFM) probes and a novel method to attain controllable lift-off.” 2017. Web. 15 Jun 2019.

Vancouver:

Zheng S. Nanofabrication of direct positioning atomic force microscope (AFM) probes and a novel method to attain controllable lift-off. [Internet] [Thesis]. University of Waterloo; 2017. [cited 2019 Jun 15]. Available from: http://hdl.handle.net/10012/11251.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Zheng S. Nanofabrication of direct positioning atomic force microscope (AFM) probes and a novel method to attain controllable lift-off. [Thesis]. University of Waterloo; 2017. Available from: http://hdl.handle.net/10012/11251

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Université de Grenoble

30. Fuchs, Franz. Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy.

Degree: Docteur es, Nanophysique, 2014, Université de Grenoble

Pour cette thèse, des systèmes donneur-accepteur (DA) modèles pour le photovoltaïque organique ont été étudiés par microscopie à force atomique en mode non contact (nc-AFM)… (more)

Subjects/Keywords: AFM non contact; Microscopie à Sonde de Kelvin; Matériaux Pi-Conjugués; Interfaces Donneur-Accepteur; Microscopie à Effet Tunnel; Photovoltaïque Organique; Non-contact AFM; Kelvin Probe Force Microscopy; Pi-Conjugated Materials; Donor-Acceptor Interfaces; Scanning Tunneling Microscopy; Organic Photovoltaics; 530

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APA (6th Edition):

Fuchs, F. (2014). Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy. (Doctoral Dissertation). Université de Grenoble. Retrieved from http://www.theses.fr/2014GRENY036

Chicago Manual of Style (16th Edition):

Fuchs, Franz. “Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy.” 2014. Doctoral Dissertation, Université de Grenoble. Accessed June 15, 2019. http://www.theses.fr/2014GRENY036.

MLA Handbook (7th Edition):

Fuchs, Franz. “Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy.” 2014. Web. 15 Jun 2019.

Vancouver:

Fuchs F. Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy. [Internet] [Doctoral dissertation]. Université de Grenoble; 2014. [cited 2019 Jun 15]. Available from: http://www.theses.fr/2014GRENY036.

Council of Science Editors:

Fuchs F. Systèmes modèles donneur accepteur pour le photovoltaïque organique étudiés par microscopie à sonde locale : Model Donor-Acceptor Systems for Organic Photovoltaics Investigated by Scanning Probe Microscopy. [Doctoral Dissertation]. Université de Grenoble; 2014. Available from: http://www.theses.fr/2014GRENY036

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