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You searched for +publisher:"Vanderbilt University" +contributor:("Mike Alles"). Showing records 1 – 2 of 2 total matches.

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Vanderbilt University

1. Paxton, William Francis. Thermionic Electron Emission Properties of Nitrogen-Incorporated Polycrystalline Diamond Films.

Degree: PhD, Electrical Engineering, 2013, Vanderbilt University

Thermionic energy conversion (TEC) is a potentially practical method for the efficient conversion of thermal energy directly into electrical energy. Standard TEC configurations consist of a cathode and an anode separated by some interelectrode gap and electrical connections between the two. When thermal energy is imparted to the cathode, electrons with sufficient energy are thermionically emitted and traverse the interelectrode gap. These electrons are then collected by the cooler anode and cycled back to the cathode through an external load. From this simple description, it is clear that the performance of a TEC device depends on the cathode√Ęs ability to undergo thermionic emission which leads to the purpose of this research. Diamond has several favorable material properties for use in TEC such as low to negative electron affinity, high thermal conductivity, and radiation tolerance. This research investigated diamond√Ęs thermionic emission properties such that an all-diamond TEC device could be realized. A fabrication method was first developed to deposit nitrogen-incorporated diamond thermionic cathodes using microwave plasma-enhanced chemical vapor deposition. Raman spectroscopy indicated that the diamond samples were predominantly diamond with minimal other carbonaceous content. A testing apparatus was then designed capable of accurately studying the thermionic emission operation of the fabricated diamond cathodes in both vacuum and various low pressure gaseous environments. Potential failure mechanisms of diamond cathodes that would inhibit implementation into practical thermionic devices were then identified. To overcome these failure mechanisms, portions of the research were directed toward a better understanding of the emission process from diamond as well as factors that influence it. Finally, new methods were developed that allowed for increased performance, reliability, and operational lifetime. The results obtained in this research were then used to predict the performance of an all-diamond thermionic energy converter. Advisors/Committee Members: Jim Davidson (chair), Weng P. Kang (committee member), Norman Tolk (committee member), Greg Walker (committee member), Mike Alles (committee member).

Subjects/Keywords: Diamond; Thermionic Emission; Energy Conversion; Nitrogen

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Paxton, W. F. (2013). Thermionic Electron Emission Properties of Nitrogen-Incorporated Polycrystalline Diamond Films. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu//available/etd-03262013-131559/ ;

Chicago Manual of Style (16th Edition):

Paxton, William Francis. “Thermionic Electron Emission Properties of Nitrogen-Incorporated Polycrystalline Diamond Films.” 2013. Doctoral Dissertation, Vanderbilt University. Accessed April 22, 2019. http://etd.library.vanderbilt.edu//available/etd-03262013-131559/ ;.

MLA Handbook (7th Edition):

Paxton, William Francis. “Thermionic Electron Emission Properties of Nitrogen-Incorporated Polycrystalline Diamond Films.” 2013. Web. 22 Apr 2019.

Vancouver:

Paxton WF. Thermionic Electron Emission Properties of Nitrogen-Incorporated Polycrystalline Diamond Films. [Internet] [Doctoral dissertation]. Vanderbilt University; 2013. [cited 2019 Apr 22]. Available from: http://etd.library.vanderbilt.edu//available/etd-03262013-131559/ ;.

Council of Science Editors:

Paxton WF. Thermionic Electron Emission Properties of Nitrogen-Incorporated Polycrystalline Diamond Films. [Doctoral Dissertation]. Vanderbilt University; 2013. Available from: http://etd.library.vanderbilt.edu//available/etd-03262013-131559/ ;


Vanderbilt University

2. Weeden-Wright, Stephanie LuAnn. Resistive RAM for Space Applications & the Impact of Scaling Access Circuitry.

Degree: PhD, Electrical Engineering, 2014, Vanderbilt University

Resistive random access memories (RRAM) have gained interest in recent years as a contender for the future of nonvolatile memory (NVM) due to their ease of integration into the CMOS process, for their scaling potential, the possibilities of which have yet to be fully realized, and for their robust radiation tolerance. To be used as a viable memory, RRAMs require a significant amount of additional CMOS-based circuitry. Recent work reported shows that single event effects in peripheral circuitry, in fact, dominate the single event response of a commercial RRAM embedded memory. However, the bulk of the work published on radiation effects in RRAM has focused on the response of the resistive element alone, particularly for TID and DD studies. This work considers the implication of the presence of access circuitry on TID and DD tolerance and the impact of variability on the efficacy of error rate predictions. Not accounting for variability in energy deposition results in drastic discrepancies for error rate predictions (nearly an order of magnitude) and will become increasingly important for highly scaled CMOS circuitry and subsequently the reliability of RRAMs. Despite the presence of an unhardened access transistor, RRAM memory cells were observed to be robust against TID and DD up to large total exposures. Radiation-induced degradation in the access transistor is likely to be a limiting factor for TID and DD effects, despite the highly robust RRAM memory element. Advisors/Committee Members: Ronald Schrimpf (chair), Robert Reed (committee member), Robert Weller (committee member), Mike Alles (committee member), Sokrates Pantelidis (committee member), Robert Bauman (committee member).

Subjects/Keywords: linear energy transfer; displacement damage; radiation effects; RRAM; energy straggling

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Weeden-Wright, S. L. (2014). Resistive RAM for Space Applications & the Impact of Scaling Access Circuitry. (Doctoral Dissertation). Vanderbilt University. Retrieved from http://etd.library.vanderbilt.edu/available/etd-11232014-203645/ ;

Chicago Manual of Style (16th Edition):

Weeden-Wright, Stephanie LuAnn. “Resistive RAM for Space Applications & the Impact of Scaling Access Circuitry.” 2014. Doctoral Dissertation, Vanderbilt University. Accessed April 22, 2019. http://etd.library.vanderbilt.edu/available/etd-11232014-203645/ ;.

MLA Handbook (7th Edition):

Weeden-Wright, Stephanie LuAnn. “Resistive RAM for Space Applications & the Impact of Scaling Access Circuitry.” 2014. Web. 22 Apr 2019.

Vancouver:

Weeden-Wright SL. Resistive RAM for Space Applications & the Impact of Scaling Access Circuitry. [Internet] [Doctoral dissertation]. Vanderbilt University; 2014. [cited 2019 Apr 22]. Available from: http://etd.library.vanderbilt.edu/available/etd-11232014-203645/ ;.

Council of Science Editors:

Weeden-Wright SL. Resistive RAM for Space Applications & the Impact of Scaling Access Circuitry. [Doctoral Dissertation]. Vanderbilt University; 2014. Available from: http://etd.library.vanderbilt.edu/available/etd-11232014-203645/ ;

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