Advanced search options

Advanced Search Options 🞨

Browse by author name (“Author name starts with…”).

Find ETDs with:

in
/  
in
/  
in
/  
in

Written in Published in Earliest date Latest date

Sorted by

Results per page:

Sorted by: relevance · author · university · dateNew search

You searched for +publisher:"University of Guelph" +contributor:("Qin, Xiaorong"). Showing records 1 – 2 of 2 total matches.

Search Limiters

Last 2 Years | English Only

No search limiters apply to these results.

▼ Search Limiters


University of Guelph

1. Cuthbert, Daniel. Investigation of the Si(111)-√3x√3R30° Surface Reconstruction by Scanning Tunnelling Microscopy .

Degree: 2019, University of Guelph

A scanning tunnelling microscopy (STM) study of the B induced phase transition between the (7x7) and √3x√3R30° reconstructions on a Si(111) surface is presented. STM images indicate that this phase transition takes upwards of two hours of thermal annealing at temperatures greater than 1100°C to induce a long range ordered √3x√3R30° surface. During the annealing procedure, many different atomic arrangements are observed to coexist on the surface including another dimer, adatom, stacking-fault (DAS) surface reconstruction similar to the (7x7), known as the (5x5). Large stable clusters of Si atoms were observed to exist on top of the disordered regions of the surface, which propagate the surface reconstructions along the step edges. The results obtained assist in our understanding of the formation of the Si(111)-√3 surface, which will aid in our ability to produce a clean, defect free surface for use in industrial applications. Advisors/Committee Members: Qin, Xiaorong (advisor).

Subjects/Keywords: Scanning Tunnelling Microscopy; Si(111); √3x√3R30°; Si Magic Clusters

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Cuthbert, D. (2019). Investigation of the Si(111)-√3x√3R30° Surface Reconstruction by Scanning Tunnelling Microscopy . (Thesis). University of Guelph. Retrieved from https://atrium.lib.uoguelph.ca/xmlui/handle/10214/16090

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Cuthbert, Daniel. “Investigation of the Si(111)-√3x√3R30° Surface Reconstruction by Scanning Tunnelling Microscopy .” 2019. Thesis, University of Guelph. Accessed October 17, 2019. https://atrium.lib.uoguelph.ca/xmlui/handle/10214/16090.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Cuthbert, Daniel. “Investigation of the Si(111)-√3x√3R30° Surface Reconstruction by Scanning Tunnelling Microscopy .” 2019. Web. 17 Oct 2019.

Vancouver:

Cuthbert D. Investigation of the Si(111)-√3x√3R30° Surface Reconstruction by Scanning Tunnelling Microscopy . [Internet] [Thesis]. University of Guelph; 2019. [cited 2019 Oct 17]. Available from: https://atrium.lib.uoguelph.ca/xmlui/handle/10214/16090.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Cuthbert D. Investigation of the Si(111)-√3x√3R30° Surface Reconstruction by Scanning Tunnelling Microscopy . [Thesis]. University of Guelph; 2019. Available from: https://atrium.lib.uoguelph.ca/xmlui/handle/10214/16090

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

2. Tersigni, Andrew. Structural Characterization of Tetracene Films by Lateral Force Microscopy and Grazing-Incidence X-Ray Diffraction .

Degree: 2012, University of Guelph

Organic semiconductors show promise to yield a novel class of bendable electronic devices, and much research efforts have focused on the optimization of these films for device performance. It is well known that the structure of organic films has a large influence over the electronic properties. In particular, the carrier mobility is often highly anisotropic, and domain boundaries have a detrimental effect on charge transport. Therefore the domain structure and lattice orientation are of particular interest. However, little is known about the domain structure of organic films, and techniques to study these properties have only begun to emerge in recent years. In this thesis, we apply two experimental techniques, Grazing-Incidence X-ray Diffraction (GIXD) and Lateral Force Microscopy (LFM), toward studying the lattice and domain structure of tetracene films grown on the silicon(001)-monohydride surface. We describe the necessary steps toward optimizing the sensitivity of these techniques to the domain structure. Results show that the crystalline tetracene films form a layered morphology in which the a-b plane lies parallel to the substrate surface. The film lattice structure is similar to bulk tetracene, and the lattice is confined to two orthogonal orientations, forming a partially-commensurate relationship with the substrate surface lattice along the film 'a' axis. LFM images reveal two types of polycrystalline domains. The first type ("major domains") are tens of microns in size, and are classified by their lattice orientation. They are subdivided into the second type ("sub-domains"), which range from 0.1 to 5um in size, and are argued to represent regions of uniform molecular tilt direction. The GIXD data show that the single-crystal domains which comprise these two larger domain types are anisotropic in size, being up to two times longer along the film 'b' axis than along 'a'. The single-crystal domains range from 0.05 to 0.2um in size, depending on lattice orientation and film thickness. The mathematical basis for these single-crystal domain size calculations is presented. The single-crystal domain sizes are thickness-dependent, and are two orders of magnitude smaller than a typical surface island observed in atomic-force microscopy (AFM) topographs. Substrate steps can also significantly influence the film structure by inducing boundaries in the single-crystal domains and sub-domains, but not in the major domains. This detailed knowledge of the domain structure of organic thin-films may assist in our understanding of the factors which affect charge transport in thin films, and may help to direct research efforts in optimizing the film structure for device performance. Advisors/Committee Members: Qin, Xiaorong (advisor).

Subjects/Keywords: thin film transistors; organic semiconductors; tetracene; thin films; grazing incidence x-ray diffraction; atomic force microscopy; lateral force microscopy; transverse shear microscopy; friction force microscopy; domain imaging; thin film structure; molecular beam deposition; si(001)-2x1 surface; epitaxial growth; pentacene; polyacenes; vacuum deposition; synchrotron; canadian light source; advanced photon source

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Tersigni, A. (2012). Structural Characterization of Tetracene Films by Lateral Force Microscopy and Grazing-Incidence X-Ray Diffraction . (Thesis). University of Guelph. Retrieved from https://atrium.lib.uoguelph.ca/xmlui/handle/10214/3496

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Tersigni, Andrew. “Structural Characterization of Tetracene Films by Lateral Force Microscopy and Grazing-Incidence X-Ray Diffraction .” 2012. Thesis, University of Guelph. Accessed October 17, 2019. https://atrium.lib.uoguelph.ca/xmlui/handle/10214/3496.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Tersigni, Andrew. “Structural Characterization of Tetracene Films by Lateral Force Microscopy and Grazing-Incidence X-Ray Diffraction .” 2012. Web. 17 Oct 2019.

Vancouver:

Tersigni A. Structural Characterization of Tetracene Films by Lateral Force Microscopy and Grazing-Incidence X-Ray Diffraction . [Internet] [Thesis]. University of Guelph; 2012. [cited 2019 Oct 17]. Available from: https://atrium.lib.uoguelph.ca/xmlui/handle/10214/3496.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Tersigni A. Structural Characterization of Tetracene Films by Lateral Force Microscopy and Grazing-Incidence X-Ray Diffraction . [Thesis]. University of Guelph; 2012. Available from: https://atrium.lib.uoguelph.ca/xmlui/handle/10214/3496

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

.