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You searched for +publisher:"Texas A&M University" +contributor:("Mercer, M. Ray"). Showing records 1 – 6 of 6 total matches.

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Texas A&M University

1. Wingfield, James. Approaches to test set generation using binary decision diagrams.

Degree: 2004, Texas A&M University

 This research pursues the use of powerful BDD-based functional circuit analysis to evaluate some approaches to test set generation. Functional representations of the circuit allow… (more)

Subjects/Keywords: binary decision diagram; BDD; digital logic test; test generation; function-based test generation

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Wingfield, J. (2004). Approaches to test set generation using binary decision diagrams. (Thesis). Texas A&M University. Retrieved from http://hdl.handle.net/1969.1/20

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Wingfield, James. “Approaches to test set generation using binary decision diagrams.” 2004. Thesis, Texas A&M University. Accessed July 19, 2019. http://hdl.handle.net/1969.1/20.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Wingfield, James. “Approaches to test set generation using binary decision diagrams.” 2004. Web. 19 Jul 2019.

Vancouver:

Wingfield J. Approaches to test set generation using binary decision diagrams. [Internet] [Thesis]. Texas A&M University; 2004. [cited 2019 Jul 19]. Available from: http://hdl.handle.net/1969.1/20.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Wingfield J. Approaches to test set generation using binary decision diagrams. [Thesis]. Texas A&M University; 2004. Available from: http://hdl.handle.net/1969.1/20

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Texas A&M University

2. Trinka, Michael Robert. Defect site prediction based upon statistical analysis of fault signatures.

Degree: 2004, Texas A&M University

 Good failure analysis is the ability to determine the site of a circuit defect quickly and accurately. We propose a method for defect site prediction… (more)

Subjects/Keywords: defect; testing; circuit; fault; diagnosis

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Trinka, M. R. (2004). Defect site prediction based upon statistical analysis of fault signatures. (Thesis). Texas A&M University. Retrieved from http://hdl.handle.net/1969.1/95

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Trinka, Michael Robert. “Defect site prediction based upon statistical analysis of fault signatures.” 2004. Thesis, Texas A&M University. Accessed July 19, 2019. http://hdl.handle.net/1969.1/95.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Trinka, Michael Robert. “Defect site prediction based upon statistical analysis of fault signatures.” 2004. Web. 19 Jul 2019.

Vancouver:

Trinka MR. Defect site prediction based upon statistical analysis of fault signatures. [Internet] [Thesis]. Texas A&M University; 2004. [cited 2019 Jul 19]. Available from: http://hdl.handle.net/1969.1/95.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Trinka MR. Defect site prediction based upon statistical analysis of fault signatures. [Thesis]. Texas A&M University; 2004. Available from: http://hdl.handle.net/1969.1/95

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Texas A&M University

3. Dorsey, David Michael. Estimating the expected latency to failure due to manufacturing defects.

Degree: 2004, Texas A&M University

 Manufacturers of digital circuits test their products to find defective parts so they are not sold to customers. Despite extensive testing, some of their products… (more)

Subjects/Keywords: ATPG Testing; MTTF; ELF-MD; ELF; MPG-D; DO-RE-ME

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Dorsey, D. M. (2004). Estimating the expected latency to failure due to manufacturing defects. (Thesis). Texas A&M University. Retrieved from http://hdl.handle.net/1969.1/202

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Dorsey, David Michael. “Estimating the expected latency to failure due to manufacturing defects.” 2004. Thesis, Texas A&M University. Accessed July 19, 2019. http://hdl.handle.net/1969.1/202.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Dorsey, David Michael. “Estimating the expected latency to failure due to manufacturing defects.” 2004. Web. 19 Jul 2019.

Vancouver:

Dorsey DM. Estimating the expected latency to failure due to manufacturing defects. [Internet] [Thesis]. Texas A&M University; 2004. [cited 2019 Jul 19]. Available from: http://hdl.handle.net/1969.1/202.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Dorsey DM. Estimating the expected latency to failure due to manufacturing defects. [Thesis]. Texas A&M University; 2004. Available from: http://hdl.handle.net/1969.1/202

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Texas A&M University

4. Cobb, Bradley Douglas. Using ordered partial decision diagrams for manufacture test generation.

Degree: 2004, Texas A&M University

 Because of limited tester time and memory, a primary goal of digital circuit manufacture test generation is to create compact test sets. Test generation programs… (more)

Subjects/Keywords: binary decision diagrams; ordered partial decision diagrams; manufacture test generation

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Cobb, B. D. (2004). Using ordered partial decision diagrams for manufacture test generation. (Thesis). Texas A&M University. Retrieved from http://hdl.handle.net/1969.1/498

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Cobb, Bradley Douglas. “Using ordered partial decision diagrams for manufacture test generation.” 2004. Thesis, Texas A&M University. Accessed July 19, 2019. http://hdl.handle.net/1969.1/498.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Cobb, Bradley Douglas. “Using ordered partial decision diagrams for manufacture test generation.” 2004. Web. 19 Jul 2019.

Vancouver:

Cobb BD. Using ordered partial decision diagrams for manufacture test generation. [Internet] [Thesis]. Texas A&M University; 2004. [cited 2019 Jul 19]. Available from: http://hdl.handle.net/1969.1/498.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Cobb BD. Using ordered partial decision diagrams for manufacture test generation. [Thesis]. Texas A&M University; 2004. Available from: http://hdl.handle.net/1969.1/498

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Texas A&M University

5. Qiu, Zhiquan Frank. Advance the DNA computing.

Degree: 2004, Texas A&M University

 It has been previously shown that DNA computing can solve those problems currently intractable on even the fastest electronic computers. The algorithm design for DNA… (more)

Subjects/Keywords: DNA Computing; Parallel Computing; Molecular Computing; Divide and Conquer

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Qiu, Z. F. (2004). Advance the DNA computing. (Thesis). Texas A&M University. Retrieved from http://hdl.handle.net/1969.1/568

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Qiu, Zhiquan Frank. “Advance the DNA computing.” 2004. Thesis, Texas A&M University. Accessed July 19, 2019. http://hdl.handle.net/1969.1/568.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Qiu, Zhiquan Frank. “Advance the DNA computing.” 2004. Web. 19 Jul 2019.

Vancouver:

Qiu ZF. Advance the DNA computing. [Internet] [Thesis]. Texas A&M University; 2004. [cited 2019 Jul 19]. Available from: http://hdl.handle.net/1969.1/568.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Qiu ZF. Advance the DNA computing. [Thesis]. Texas A&M University; 2004. Available from: http://hdl.handle.net/1969.1/568

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation


Texas A&M University

6. Dworak, Jennifer Lynn. Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance.

Degree: 2004, Texas A&M University

 Manufacture testing of digital integrated circuits is essential for high quality. However, exhaustive testing is impractical, and only a small subset of all possible test… (more)

Subjects/Keywords: digital circuit testing; automatic test pattern generation; MPG-D defective part level prediction; MPG-D defect level modeling; excitation balance; DO-RE-ME deterministic observation – random excitation – MPG-D defective part level estimation

Record DetailsSimilar RecordsGoogle PlusoneFacebookTwitterCiteULikeMendeleyreddit

APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Dworak, J. L. (2004). Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance. (Thesis). Texas A&M University. Retrieved from http://hdl.handle.net/1969.1/323

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Chicago Manual of Style (16th Edition):

Dworak, Jennifer Lynn. “Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance.” 2004. Thesis, Texas A&M University. Accessed July 19, 2019. http://hdl.handle.net/1969.1/323.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

MLA Handbook (7th Edition):

Dworak, Jennifer Lynn. “Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance.” 2004. Web. 19 Jul 2019.

Vancouver:

Dworak JL. Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance. [Internet] [Thesis]. Texas A&M University; 2004. [cited 2019 Jul 19]. Available from: http://hdl.handle.net/1969.1/323.

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

Council of Science Editors:

Dworak JL. Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance. [Thesis]. Texas A&M University; 2004. Available from: http://hdl.handle.net/1969.1/323

Note: this citation may be lacking information needed for this citation format:
Not specified: Masters Thesis or Doctoral Dissertation

.