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Dates: 2010 – 2014

You searched for +publisher:"Georgia Tech" +contributor:("Milor, Linda"). Showing records 1 – 11 of 11 total matches.

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Georgia Tech

1. Gallé, William Preston. MEMS-based fabrication of power electronics components for advanced power converters.

Degree: PhD, Electrical and Computer Engineering, 2012, Georgia Tech

 Fabrication technology, based on MEMS processes, for constructing components for use in switched-mode power supplies are developed and presented. Capacitors, magnetic cores, and inductors based… (more)

Subjects/Keywords: Power converters; Capacitors; Inductors; Electroplating; MEMS; Microelectromechanical systems; DC-to-DC converters; Switching power supplies; Electric inductors

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APA (6th Edition):

Gallé, W. P. (2012). MEMS-based fabrication of power electronics components for advanced power converters. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/45821

Chicago Manual of Style (16th Edition):

Gallé, William Preston. “MEMS-based fabrication of power electronics components for advanced power converters.” 2012. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/45821.

MLA Handbook (7th Edition):

Gallé, William Preston. “MEMS-based fabrication of power electronics components for advanced power converters.” 2012. Web. 16 Jul 2019.

Vancouver:

Gallé WP. MEMS-based fabrication of power electronics components for advanced power converters. [Internet] [Doctoral dissertation]. Georgia Tech; 2012. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/45821.

Council of Science Editors:

Gallé WP. MEMS-based fabrication of power electronics components for advanced power converters. [Doctoral Dissertation]. Georgia Tech; 2012. Available from: http://hdl.handle.net/1853/45821


Georgia Tech

2. Bhatta, Debesh. Algorithms and methodology for incoherent undersampling based acquisition of high speed signal waveforms using low cost test instrumentation.

Degree: PhD, Electrical and Computer Engineering, 2014, Georgia Tech

 The objective of this research is to develop and demonstrate low-complexity, robust, frequency-scalable, wide-band waveform acquisition techniques for testing high speed com- munication systems. High… (more)

Subjects/Keywords: Incoherent undersampling; Low cost testing; Waveform acquisition; High-speed testing

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APA (6th Edition):

Bhatta, D. (2014). Algorithms and methodology for incoherent undersampling based acquisition of high speed signal waveforms using low cost test instrumentation. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/54262

Chicago Manual of Style (16th Edition):

Bhatta, Debesh. “Algorithms and methodology for incoherent undersampling based acquisition of high speed signal waveforms using low cost test instrumentation.” 2014. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/54262.

MLA Handbook (7th Edition):

Bhatta, Debesh. “Algorithms and methodology for incoherent undersampling based acquisition of high speed signal waveforms using low cost test instrumentation.” 2014. Web. 16 Jul 2019.

Vancouver:

Bhatta D. Algorithms and methodology for incoherent undersampling based acquisition of high speed signal waveforms using low cost test instrumentation. [Internet] [Doctoral dissertation]. Georgia Tech; 2014. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/54262.

Council of Science Editors:

Bhatta D. Algorithms and methodology for incoherent undersampling based acquisition of high speed signal waveforms using low cost test instrumentation. [Doctoral Dissertation]. Georgia Tech; 2014. Available from: http://hdl.handle.net/1853/54262


Georgia Tech

3. Cheng, Peng. Reliability of SiGe HBTs for extreme environment and RF applications.

Degree: PhD, Electrical and Computer Engineering, 2010, Georgia Tech

 The objective of the proposed research is to characterize the safe-operating-area of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) under radiofrequency (RF) operation and extreme environments.… (more)

Subjects/Keywords: Extreme environment; SiGe HBTs; RF; Power amplifier; Bipolar transistors; Heterojunctions; Semiconductors; Silicones; Germanium; Transistors

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APA (6th Edition):

Cheng, P. (2010). Reliability of SiGe HBTs for extreme environment and RF applications. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/42836

Chicago Manual of Style (16th Edition):

Cheng, Peng. “Reliability of SiGe HBTs for extreme environment and RF applications.” 2010. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/42836.

MLA Handbook (7th Edition):

Cheng, Peng. “Reliability of SiGe HBTs for extreme environment and RF applications.” 2010. Web. 16 Jul 2019.

Vancouver:

Cheng P. Reliability of SiGe HBTs for extreme environment and RF applications. [Internet] [Doctoral dissertation]. Georgia Tech; 2010. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/42836.

Council of Science Editors:

Cheng P. Reliability of SiGe HBTs for extreme environment and RF applications. [Doctoral Dissertation]. Georgia Tech; 2010. Available from: http://hdl.handle.net/1853/42836

4. Chen, Chang-Chih. System-level modeling and reliability analysis of microprocessor systems.

Degree: PhD, Electrical and Computer Engineering, 2014, Georgia Tech

 Frontend and backend wearout mechanisms are major reliability concerns for modern microprocessors. In this research, a framework which contains modules for negative bias temperature instability… (more)

Subjects/Keywords: Microprocessor; Reliability; Modeling; Negative bias temperature instability; Positive bias temperature instability; Hot carrier injection; Timing analysis; Aging; SRAM; Cache; Gate oxide breakdown; Wearout; Electromigration; Stress-induced voiding; Stress migration; Time-dependent backend dielectric breakdown

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APA (6th Edition):

Chen, C. (2014). System-level modeling and reliability analysis of microprocessor systems. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/53033

Chicago Manual of Style (16th Edition):

Chen, Chang-Chih. “System-level modeling and reliability analysis of microprocessor systems.” 2014. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/53033.

MLA Handbook (7th Edition):

Chen, Chang-Chih. “System-level modeling and reliability analysis of microprocessor systems.” 2014. Web. 16 Jul 2019.

Vancouver:

Chen C. System-level modeling and reliability analysis of microprocessor systems. [Internet] [Doctoral dissertation]. Georgia Tech; 2014. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/53033.

Council of Science Editors:

Chen C. System-level modeling and reliability analysis of microprocessor systems. [Doctoral Dissertation]. Georgia Tech; 2014. Available from: http://hdl.handle.net/1853/53033

5. Majid, Ashraf Muhammad. Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies.

Degree: PhD, Electrical and Computer Engineering, 2011, Georgia Tech

 Methods for Extending High-Performance Automated Test Equipment (ATE) using Multi-Gigahertz FPGA Technologies Ashraf M. Majid 264 Pages Directed by Dr. David Keezer This thesis presents… (more)

Subjects/Keywords: FPGA based testing; Test enhancement; High-speed digital test; Automated test equipment; Test module; Multi-GHz testing; Field programmable gate arrays; Integrated circuits; Semiconductors

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APA (6th Edition):

Majid, A. M. (2011). Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/39562

Chicago Manual of Style (16th Edition):

Majid, Ashraf Muhammad. “Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies.” 2011. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/39562.

MLA Handbook (7th Edition):

Majid, Ashraf Muhammad. “Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies.” 2011. Web. 16 Jul 2019.

Vancouver:

Majid AM. Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies. [Internet] [Doctoral dissertation]. Georgia Tech; 2011. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/39562.

Council of Science Editors:

Majid AM. Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies. [Doctoral Dissertation]. Georgia Tech; 2011. Available from: http://hdl.handle.net/1853/39562

6. Kook, Se Hun. Low-cost testing of high-precision analog-to-digital converters.

Degree: PhD, Electrical and Computer Engineering, 2011, Georgia Tech

 The advent of deep submicron technology has resulted in a new generation of highly integrated mixed-signal system-on-chips (SoCs) and system-on-packages (SoPs). As a result, the… (more)

Subjects/Keywords: Sigma Delta ADC; Incremental ADC; High-resolution ADC testing; Analog-to-digital converters; Test; Data converters; Analog-to-digital converters; Testing

…research work and enjoying fun time with me for the duration of my stay at Georgia Tech. Most of… …love and confidence, I would not have been able to achieve my goals while studying at Georgia… …Tech. At last, I would like to give my special thanks to my fiancé, Joung Min Leah Choi, who… 

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APA (6th Edition):

Kook, S. H. (2011). Low-cost testing of high-precision analog-to-digital converters. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/41170

Chicago Manual of Style (16th Edition):

Kook, Se Hun. “Low-cost testing of high-precision analog-to-digital converters.” 2011. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/41170.

MLA Handbook (7th Edition):

Kook, Se Hun. “Low-cost testing of high-precision analog-to-digital converters.” 2011. Web. 16 Jul 2019.

Vancouver:

Kook SH. Low-cost testing of high-precision analog-to-digital converters. [Internet] [Doctoral dissertation]. Georgia Tech; 2011. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/41170.

Council of Science Editors:

Kook SH. Low-cost testing of high-precision analog-to-digital converters. [Doctoral Dissertation]. Georgia Tech; 2011. Available from: http://hdl.handle.net/1853/41170

7. Gray, Carl Edward. An fpga based architecture for native protocol testing of multi-gbps source-synchronous devices.

Degree: PhD, Electrical and Computer Engineering, 2012, Georgia Tech

 This thesis presents methods for developing FPGA-based test solutions that solve the challenges of evaluating source-synchronous and protocol-laden systems and devices at multi-gigabit per second… (more)

Subjects/Keywords: Test architecture; Digital systems; High-speed; Field programmable gate arrays; Gigabit communications; Digital communications Testing; Computer networks Testing

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APA (6th Edition):

Gray, C. E. (2012). An fpga based architecture for native protocol testing of multi-gbps source-synchronous devices. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/44858

Chicago Manual of Style (16th Edition):

Gray, Carl Edward. “An fpga based architecture for native protocol testing of multi-gbps source-synchronous devices.” 2012. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/44858.

MLA Handbook (7th Edition):

Gray, Carl Edward. “An fpga based architecture for native protocol testing of multi-gbps source-synchronous devices.” 2012. Web. 16 Jul 2019.

Vancouver:

Gray CE. An fpga based architecture for native protocol testing of multi-gbps source-synchronous devices. [Internet] [Doctoral dissertation]. Georgia Tech; 2012. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/44858.

Council of Science Editors:

Gray CE. An fpga based architecture for native protocol testing of multi-gbps source-synchronous devices. [Doctoral Dissertation]. Georgia Tech; 2012. Available from: http://hdl.handle.net/1853/44858

8. Devarakond , Shyam Kumar. Signature driven low cost test, diagnosis and tuning of wireless systems.

Degree: PhD, Electrical and Computer Engineering, 2013, Georgia Tech

 With increased and varied performance demands, it is essential that complex multi-standard radio/systems coexist on a same chip. To have cost and performance benefits, these… (more)

Subjects/Keywords: Analog/RF self-tuning; Spice-level diagnosis; Analog/RF test; Wireless communication systems; Radio; Radio frequency; Mixed signal circuits

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APA (6th Edition):

Devarakond , S. K. (2013). Signature driven low cost test, diagnosis and tuning of wireless systems. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/47594

Chicago Manual of Style (16th Edition):

Devarakond , Shyam Kumar. “Signature driven low cost test, diagnosis and tuning of wireless systems.” 2013. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/47594.

MLA Handbook (7th Edition):

Devarakond , Shyam Kumar. “Signature driven low cost test, diagnosis and tuning of wireless systems.” 2013. Web. 16 Jul 2019.

Vancouver:

Devarakond SK. Signature driven low cost test, diagnosis and tuning of wireless systems. [Internet] [Doctoral dissertation]. Georgia Tech; 2013. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/47594.

Council of Science Editors:

Devarakond SK. Signature driven low cost test, diagnosis and tuning of wireless systems. [Doctoral Dissertation]. Georgia Tech; 2013. Available from: http://hdl.handle.net/1853/47594

9. Aftabjahani, Seyed-Abdollah. Compact variation-aware standard cells for statistical static timing analysis.

Degree: PhD, Electrical and Computer Engineering, 2011, Georgia Tech

 This dissertation reports on a new methodology to characterize and simulate a standard cell library to be used for statistical static timing analysis. A compact… (more)

Subjects/Keywords: Variation-aware standard cell modeling; Process and environmental variation; Variation-aware waveform modeling; Statistical static timing analysis; Static timing analysis; Integrated circuits; Microelectronics; Standard cells

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APA (6th Edition):

Aftabjahani, S. (2011). Compact variation-aware standard cells for statistical static timing analysis. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/41129

Chicago Manual of Style (16th Edition):

Aftabjahani, Seyed-Abdollah. “Compact variation-aware standard cells for statistical static timing analysis.” 2011. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/41129.

MLA Handbook (7th Edition):

Aftabjahani, Seyed-Abdollah. “Compact variation-aware standard cells for statistical static timing analysis.” 2011. Web. 16 Jul 2019.

Vancouver:

Aftabjahani S. Compact variation-aware standard cells for statistical static timing analysis. [Internet] [Doctoral dissertation]. Georgia Tech; 2011. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/41129.

Council of Science Editors:

Aftabjahani S. Compact variation-aware standard cells for statistical static timing analysis. [Doctoral Dissertation]. Georgia Tech; 2011. Available from: http://hdl.handle.net/1853/41129

10. Ahmed, Fahad. Invasive and non-invasive detection of bias temperature instability.

Degree: PhD, Electrical and Computer Engineering, 2014, Georgia Tech

 Invasive and non-invasive methods of BTI monitoring and wearout preemption have been proposed. We propose a novel, simple to use, test structure for NBTI /PBTI… (more)

Subjects/Keywords: Wearout; BTI; NBTI; PBTI; Compiler; Monitor; Sensor

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APA (6th Edition):

Ahmed, F. (2014). Invasive and non-invasive detection of bias temperature instability. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/52227

Chicago Manual of Style (16th Edition):

Ahmed, Fahad. “Invasive and non-invasive detection of bias temperature instability.” 2014. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/52227.

MLA Handbook (7th Edition):

Ahmed, Fahad. “Invasive and non-invasive detection of bias temperature instability.” 2014. Web. 16 Jul 2019.

Vancouver:

Ahmed F. Invasive and non-invasive detection of bias temperature instability. [Internet] [Doctoral dissertation]. Georgia Tech; 2014. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/52227.

Council of Science Editors:

Ahmed F. Invasive and non-invasive detection of bias temperature instability. [Doctoral Dissertation]. Georgia Tech; 2014. Available from: http://hdl.handle.net/1853/52227

11. Cho, Minki. Design methodology to characterize and compensate for process and temperature variation in digital systems.

Degree: PhD, Electrical and Computer Engineering, 2012, Georgia Tech

 The main objective of this dissertation is to investigate a design methodology that can characterize and compensate for process and temperature variation. First, a design… (more)

Subjects/Keywords: VLSI; Temperature; Process; Variation; Digital system; Three-dimensional integrated circuits; Interconnects (Integrated circuit technology)

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APA (6th Edition):

Cho, M. (2012). Design methodology to characterize and compensate for process and temperature variation in digital systems. (Doctoral Dissertation). Georgia Tech. Retrieved from http://hdl.handle.net/1853/50148

Chicago Manual of Style (16th Edition):

Cho, Minki. “Design methodology to characterize and compensate for process and temperature variation in digital systems.” 2012. Doctoral Dissertation, Georgia Tech. Accessed July 16, 2019. http://hdl.handle.net/1853/50148.

MLA Handbook (7th Edition):

Cho, Minki. “Design methodology to characterize and compensate for process and temperature variation in digital systems.” 2012. Web. 16 Jul 2019.

Vancouver:

Cho M. Design methodology to characterize and compensate for process and temperature variation in digital systems. [Internet] [Doctoral dissertation]. Georgia Tech; 2012. [cited 2019 Jul 16]. Available from: http://hdl.handle.net/1853/50148.

Council of Science Editors:

Cho M. Design methodology to characterize and compensate for process and temperature variation in digital systems. [Doctoral Dissertation]. Georgia Tech; 2012. Available from: http://hdl.handle.net/1853/50148

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