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You searched for +publisher:"Delft University of Technology" +contributor:("Van Spengen, W.M."). Showing records 1 – 2 of 2 total matches.

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1. Pluimers, L.M. (author). Feasibility Study for AFM Probe Calibration using the Probe’s Electrostatic Pull-in Stability.

Degree: 2013, Delft University of Technology

Precision and Microsystems Engineering

Mechanical, Maritime and Materials Engineering

Advisors/Committee Members: Van Spengen, W.M. (mentor).

Subjects/Keywords: AFM Probe; Calibration; Electrostatic; Pull-in; Stability

…Presicion and Microsystem Engieering master programme at Delft University of Technology, the… 

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Pluimers, L. M. (. (2013). Feasibility Study for AFM Probe Calibration using the Probe’s Electrostatic Pull-in Stability. (Masters Thesis). Delft University of Technology. Retrieved from http://resolver.tudelft.nl/uuid:e19c09fd-ec28-4a54-bd5e-affd2dc428da

Chicago Manual of Style (16th Edition):

Pluimers, L M (author). “Feasibility Study for AFM Probe Calibration using the Probe’s Electrostatic Pull-in Stability.” 2013. Masters Thesis, Delft University of Technology. Accessed April 21, 2021. http://resolver.tudelft.nl/uuid:e19c09fd-ec28-4a54-bd5e-affd2dc428da.

MLA Handbook (7th Edition):

Pluimers, L M (author). “Feasibility Study for AFM Probe Calibration using the Probe’s Electrostatic Pull-in Stability.” 2013. Web. 21 Apr 2021.

Vancouver:

Pluimers LM(. Feasibility Study for AFM Probe Calibration using the Probe’s Electrostatic Pull-in Stability. [Internet] [Masters thesis]. Delft University of Technology; 2013. [cited 2021 Apr 21]. Available from: http://resolver.tudelft.nl/uuid:e19c09fd-ec28-4a54-bd5e-affd2dc428da.

Council of Science Editors:

Pluimers LM(. Feasibility Study for AFM Probe Calibration using the Probe’s Electrostatic Pull-in Stability. [Masters Thesis]. Delft University of Technology; 2013. Available from: http://resolver.tudelft.nl/uuid:e19c09fd-ec28-4a54-bd5e-affd2dc428da


Delft University of Technology

2. Kokorian, J. Measuring adhesion and friction in mems.

Degree: 2020, Delft University of Technology

The strange and unpredictable behavior of meso-scale adhesion and friction forces is a practical problem for the development of microelectromechanical systems (MEMS) with contacting surfaces. To overcome the associated limitations when designingMEMS devices, the first obstacle to remove is the fact that it is hard to measure displacements and forces in MEMS with sufficient resolution to discern atomic scale details from these meso-scale measurements. In this PhD thesis we show how an non-invasive, optical method can be used to measure forces and displacements inMEMS with sub-nanometer resolution. It is fundamentally impossible to opticallymeasure topological details below 500 nmin size, due to the wavelike nature of light. However, the location of a moving feature can be tracked with a much higher resolution, by curve-fitting a mathematical function to its shape. Advisors/Committee Members: Staufer, U., van Spengen, W.M., Delft University of Technology.

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APA · Chicago · MLA · Vancouver · CSE | Export to Zotero / EndNote / Reference Manager

APA (6th Edition):

Kokorian, J. (2020). Measuring adhesion and friction in mems. (Doctoral Dissertation). Delft University of Technology. Retrieved from http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; 14746f2d-786f-4176-8418-25b75e2c19b6 ; 10.4233/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:isbn:978-94-6366-348-9 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6

Chicago Manual of Style (16th Edition):

Kokorian, J. “Measuring adhesion and friction in mems.” 2020. Doctoral Dissertation, Delft University of Technology. Accessed April 21, 2021. http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; 14746f2d-786f-4176-8418-25b75e2c19b6 ; 10.4233/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:isbn:978-94-6366-348-9 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6.

MLA Handbook (7th Edition):

Kokorian, J. “Measuring adhesion and friction in mems.” 2020. Web. 21 Apr 2021.

Vancouver:

Kokorian J. Measuring adhesion and friction in mems. [Internet] [Doctoral dissertation]. Delft University of Technology; 2020. [cited 2021 Apr 21]. Available from: http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; 14746f2d-786f-4176-8418-25b75e2c19b6 ; 10.4233/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:isbn:978-94-6366-348-9 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6.

Council of Science Editors:

Kokorian J. Measuring adhesion and friction in mems. [Doctoral Dissertation]. Delft University of Technology; 2020. Available from: http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; 14746f2d-786f-4176-8418-25b75e2c19b6 ; 10.4233/uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; urn:isbn:978-94-6366-348-9 ; urn:NBN:nl:ui:24-uuid:14746f2d-786f-4176-8418-25b75e2c19b6 ; http://resolver.tudelft.nl/uuid:14746f2d-786f-4176-8418-25b75e2c19b6

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